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EBookClubs

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Book Proceedings of the 14th International Symposium on the Physical Failure Analysis of Integrated Circuits

Download or read book Proceedings of the 14th International Symposium on the Physical Failure Analysis of Integrated Circuits written by Souvik Mahapatra and published by IEEE Computer Society Press. This book was released on 2007-01-01 with total page 309 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Proceedings of the 14th International Symposium on the Physical Failure Analysis of Integrated Circuits IPFA 2007

Download or read book Proceedings of the 14th International Symposium on the Physical Failure Analysis of Integrated Circuits IPFA 2007 written by Souvik Mahapatra and published by . This book was released on 2007 with total page 309 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book ISTFA 2009

Download or read book ISTFA 2009 written by and published by ASM International. This book was released on 2009-01-01 with total page 371 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.

Book ISTFA 2012

Download or read book ISTFA 2012 written by ASM International and published by ASM International. This book was released on 2012 with total page 643 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Thirty fourth International Symposium for Testing and Failure Analysis

Download or read book Thirty fourth International Symposium for Testing and Failure Analysis written by ASM International and published by ASM International. This book was released on 2008-01-01 with total page 551 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book ISTFA 2019 Proceedings of the 45th International Symposium for Testing and Failure Analysis

Download or read book ISTFA 2019 Proceedings of the 45th International Symposium for Testing and Failure Analysis written by and published by ASM International. This book was released on 2019-12-01 with total page 540 pages. Available in PDF, EPUB and Kindle. Book excerpt: The theme for the 2019 conference is Novel Computing Architectures. Papers will include discussions on the advent of Artificial Intelligence and the promise of quantum computing that are driving disruptive computing architectures; Neuromorphic chip designs on one hand, and Quantum Bits on the other, still in R&D, will introduce new computing circuitry and memory elements, novel materials, and different test methodologies. These novel computing architectures will require further innovation which is best achieved through a collaborative Failure Analysis community composed of chip manufacturers, tool vendors, and universities.

Book Advances in Analog Circuits

Download or read book Advances in Analog Circuits written by Esteban Tlelo-Cuautle and published by BoD – Books on Demand. This book was released on 2011-02-02 with total page 384 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book highlights key design issues and challenges to guarantee the development of successful applications of analog circuits. Researchers around the world share acquired experience and insights to develop advances in analog circuit design, modeling and simulation. The key contributions of the sixteen chapters focus on recent advances in analog circuits to accomplish academic or industrial target specifications.

Book ISTFA 2010

Download or read book ISTFA 2010 written by and published by ASM International. This book was released on 2010-01-01 with total page 487 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book ISTFA 2018 Proceedings from the 44th International Symposium for Testing and Failure Analysis

Download or read book ISTFA 2018 Proceedings from the 44th International Symposium for Testing and Failure Analysis written by and published by ASM International. This book was released on 2018-12-01 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: The International Symposium for Testing and Failure Analysis (ISTFA) 2018 is co-located with the International Test Conference (ITC) 2018, October 28 to November 1, in Phoenix, Arizona, USA at the Phoenix Convention Center. The theme for the November 2018 conference is "Failures Worth Analyzing." While technology advances fast and the market demands the latest and the greatest, successful companies strive to stay competitive and remain profitable.

Book Proceedings of the 10th International Symposium on the Physical Failure Analysis of Integrated Circuits

Download or read book Proceedings of the 10th International Symposium on the Physical Failure Analysis of Integrated Circuits written by International Symposium on the Physical & Failure Analysis of Integrated Circuits and published by . This book was released on 2003 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Failure Analysis of Integrated Circuits

Download or read book Failure Analysis of Integrated Circuits written by Lawrence C. Wagner and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 256 pages. Available in PDF, EPUB and Kindle. Book excerpt: This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.