Download or read book Performance of a Parallel Automatic Test Pattern Generation System for Sequential Circuits written by Jessica L. Handy and published by . This book was released on 1997 with total page 156 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book The Implementation of a Parallel Automatic Test Pattern Generation System for Sequential Circuits written by Donald E. Edenfeld and published by . This book was released on 1996 with total page 282 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Sequential Circuit Test Pattern Generation Using Empirical Partial Scan and Distributed Computation written by Kee Sup Kim and published by . This book was released on 1992 with total page 386 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Time Efficient Automatic Test Pattern Generation Systems written by Byungse So and published by . This book was released on 1994 with total page 296 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book A Study of Automatic Test Pattern Generation Systems written by Kyuchull Kim and published by . This book was released on 1992 with total page 348 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book High performance computing and networking written by Wolfgang Gentzsch and published by Springer Science & Business Media. This book was released on 1994 with total page 484 pages. Available in PDF, EPUB and Kindle. Book excerpt: Annotation High-performance computing and networking (HPCN) is driven by several initiatives in Europe, the United States, and Japan. In Europe several groups encouraged the Commission of the European Communities to start an HPCN programme. This two-volume work presents the proceedings of HPCN Europe 1994. Volume 1 includes sections on: keynote talks, HPCN and visualization in industry, algorithms for engineering applications, electrical computer-aided engineering, computational fluid dynamics, computational chemistry, materials science, weather simulations, environmental applications and climate, high-energy physics and astrophysics, neuroscience and neural networks, and database applications.

Download or read book Parallel Virtual Machine EuroPVM 96 written by Arndt Bode and published by Springer Science & Business Media. This book was released on 1996-09-25 with total page 388 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the refereed proceedings of the Third European Conference on the Parallel Virtual Machine, EuroPVM '96, the 1996 European PVM users' group meeting, held in Munich, Germany, in October 1996. The parallel virtual machine, PVM, was developed at the University of Tennessee and Oak Ridge National Laboratory in cooperation with Emory University and Carnegie Mellon University to support distributed computing. This volume comprises 51 revised full contributions devoted to PVM. The papers are organized in topical sections on evaluation of PVM; Applications: CFD solvers; tools for PVM; non-numerical applications; extensions to PVM; etc.

Download or read book Modeling the Difficulty of Automatic Test Pattern Generation for Sequential Circuits written by Thomas E. Marchok and published by . This book was released on 1995 with total page 138 pages. Available in PDF, EPUB and Kindle. Book excerpt: Abstract: "Several manufacturing challenges have accompanied the explosive growth in the scale of integration for VLSI circuits. One of these is the increased difficulty of generating manufacturing test sets, which has resulted from the vast increase in the ratio of the number of transistors to the number of I/O pins. The difficulty of test generation is crucial since it impacts both the resultant product quality and time to market, both of which continue to gain importance in the present day semiconductor industry. Design for testability (DFT) techniques can be used to offset this difficulty. The mechanics of such techniques are well understood. DFT techniques are also known to increase other manufacturing costs and to decrease performance. Thus the relevant issue facing designers is not how to use DFT, but rather if such techniques should be applied. The correct decision is a matter of economics. Integrated circuit (IC) designers must balance manufacturing costs, performance, time to market, and product quality concerns. Achieving the desired balance requires the ability to quantify trade-offs in the different manufacturing costs which various DFT techniques would affect. Unfortunately, test generation cost is among the least predictable of these affected costs, even though the principal reason that DFT techniques are often applied is to reduce the difficulty of test generation. Furthermore, there does not exist a complete understanding of which circuit attributes influence the difficulty of test generation. In this thesis, a model is developed which predicts the difficulty of automatic test generation for non-scan sequential circuits. This model is based on a newly recognized circuit attribute, termed density of encoding, which differs from those notions which have been used to describe this difficulty in the past. This thesis also discusses how the concept of the density of encoding can be applied to devise more powerful sequential automatic test pattern generation algorithms, more efficient DFT techniques, and more effective synthesis for testability schemes."

Download or read book Parallel Computing Fundamentals Applications and New Directions written by E.H. D'Hollander and published by Elsevier. This book was released on 1998-07-22 with total page 765 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume gives an overview of the state-of-the-art with respect to the development of all types of parallel computers and their application to a wide range of problem areas. The international conference on parallel computing ParCo97 (Parallel Computing 97) was held in Bonn, Germany from 19 to 22 September 1997. The first conference in this biannual series was held in 1983 in Berlin. Further conferences were held in Leiden (The Netherlands), London (UK), Grenoble (France) and Gent (Belgium). From the outset the aim with the ParCo (Parallel Computing) conferences was to promote the application of parallel computers to solve real life problems. In the case of ParCo97 a new milestone was reached in that more than half of the papers and posters presented were concerned with application aspects. This fact reflects the coming of age of parallel computing. Some 200 papers were submitted to the Program Committee by authors from all over the world. The final programme consisted of four invited papers, 71 contributed scientific/industrial papers and 45 posters. In addition a panel discussion on Parallel Computing and the Evolution of Cyberspace was held. During and after the conference all final contributions were refereed. Only those papers and posters accepted during this final screening process are included in this volume. The practical emphasis of the conference was accentuated by an industrial exhibition where companies demonstrated the newest developments in parallel processing equipment and software. Speakers from participating companies presented papers in industrial sessions in which new developments in parallel computing were reported.

Download or read book Automatic Test Pattern Generation for Synchronous Sequential Circuits written by Marinus Hendrik Konijnenburg and published by . This book was released on 1998 with total page 226 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Automatic test pattern generation for hierarchical sequential circuits written by Heinrich Theodor Vierhaus and published by . This book was released on 1993 with total page 19 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Parallel Problem Solving from Nature PPSN IX written by Thomas Philip Runarsson and published by Springer Science & Business Media. This book was released on 2006-09-13 with total page 1079 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the refereed proceedings of the 9th International Conference on Parallel Problem Solving from Nature, PPSN 2006. The book presents 106 revised full papers covering a wide range of topics, from evolutionary computation to swarm intelligence and bio-inspired computing to real-world applications. These are organized in topical sections on theory, new algorithms, applications, multi-objective optimization, evolutionary learning, as well as representations, operators, and empirical evaluation.

Download or read book Deterministic Automatic Test Pattern Generation for Built in Self Test System written by Muhammad Nazir Mohammed Khalid and published by . This book was released on 2006 with total page 186 pages. Available in PDF, EPUB and Kindle. Book excerpt: With a great growing use of electronic products in many aspects of society, it is evident that these products must perform reliably. Their reliability depends on the testing whether or not they have been manufactured properly and behave correctly. To ease testing, digital systems are commonly designed with Built-In Self Test facility. For this reason, development of test pattern for BIST based on combination of Linear Feedback Shift Register (LFSR) and deterministic ATPG (DATPG) approach could provide more solutions, such as reduce testing time, high fault coverage and low area overhead. One of the key challenges in BIST is the design of the Test Pattern Generation (TPG) that promised high fault coverage. The test pattern generation can be generated either manually or automatically. Problems related to ATPG are linked to the controllability and observability of the nodes in circuits. As far as the single stuck-at fault model is considered, efficient algorithms have been devised for combinational circuit. To illustrate that, the DATPG algorithm for digital combinational circuit using VHDL language is designed to generate the test patterns. Altera Max+plus II software is used to simulate the DATPG design to achieve the minimum test patterns for digital combinational circuit. The simulation result will be presented in the form of waveform. The results of DATPG for digital combinational circuit show that the sequence of LFSR has been reduced significantly. In BIST application, the minimum test patterns are applied to the adder/substractor (A/S) known as circuit under test (CUT). A parallel A/S is chosen as a CUT due to the simplicity of the circuit architecture. The A/S is used to verify the proposed DATPG performance. Only one basic cell of the parallel A/S is required to determine the test pattern by considering the data flow from one cell to another. Identical test data can then be applied to both A/S inputs simultaneously. By reducing the number of test pattern, the testing time to market and manufacturing time is expected to reduce leading to reduction in the product cost.

Download or read book IEEE VLSI Test Symposium written by and published by . This book was released on 2000 with total page 526 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Test Generation and Test Application Time Reduction for Sequential Circuits written by Soo Y. Lee and published by . This book was released on 1994 with total page 252 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Combinational Test Generation for Sequential Circuits written by Yong Chang Kim and published by . This book was released on 2002 with total page 172 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Electronic Design Automation for IC System Design Verification and Testing written by Luciano Lavagno and published by CRC Press. This book was released on 2017-12-19 with total page 644 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first of two volumes in the Electronic Design Automation for Integrated Circuits Handbook, Second Edition, Electronic Design Automation for IC System Design, Verification, and Testing thoroughly examines system-level design, microarchitectural design, logic verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for integrated circuit (IC) designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. New to This Edition: Major updates appearing in the initial phases of the design flow, where the level of abstraction keeps rising to support more functionality with lower non-recurring engineering (NRE) costs Significant revisions reflected in the final phases of the design flow, where the complexity due to smaller and smaller geometries is compounded by the slow progress of shorter wavelength lithography New coverage of cutting-edge applications and approaches realized in the decade since publication of the previous edition—these are illustrated by new chapters on high-level synthesis, system-on-chip (SoC) block-based design, and back-annotating system-level models Offering improved depth and modernity, Electronic Design Automation for IC System Design, Verification, and Testing provides a valuable, state-of-the-art reference for electronic design automation (EDA) students, researchers, and professionals.