Download or read book On Wafer Microwave Measurements and De embedding written by Errikos Lourandakis and published by Artech House. This book was released on 2016-07-31 with total page 251 pages. Available in PDF, EPUB and Kindle. Book excerpt: This new authoritative resource presents the basics of network analyzer measurement equipment and troubleshooting errors involved in the on-wafer microwave measurement process. This book bridges the gap between theoretical and practical information using real-world practices that address all aspects of on-wafer passive device characterization in the microwave frequency range up to 60GHz. Readers find data and measurements from silicon integrated passive devices fabricated and tested in advance CMOS technologies. Basic circuit equations, terms and fundamentals of time and frequency domain analysis are covered. This book also explores the basics of vector network analyzers (VNA), two port S-parameter measurement routines, signal flow graphs, network theory, error models and VNA calibrations with the use of calibration standards.

Download or read book Microwave De embedding written by Giovanni Crupi and published by Academic Press. This book was released on 2013-11-09 with total page 481 pages. Available in PDF, EPUB and Kindle. Book excerpt: This groundbreaking book is the first to give an introduction to microwave de-embedding, showing how it is the cornerstone for waveform engineering. The authors of each chapter clearly explain the theoretical concepts, providing a foundation that supports linear and non-linear measurements, modelling and circuit design. Recent developments and future trends in the field are covered throughout, including successful strategies for low-noise and power amplifier design. This book is a must-have for those wishing to understand the full potential of the microwave de-embedding concept to achieve successful results in the areas of measurements, modelling, and design at high frequencies. With this book you will learn: - The theoretical background of high-frequency de-embedding for measurements, modelling, and design - Details on applying the de-embedding concept to the transistor's linear, non-linear, and noise behaviour - The impact of de-embedding on low-noise and power amplifier design - The recent advances and future trends in the field of high-frequency de-embedding - Presents the theory and practice of microwave de-embedding, from the basic principles to recent advances and future trends - Written by experts in the field, all of whom are leading researchers in the area - Each chapter describes theoretical background and gives experimental results and practical applications - Includes forewords by Giovanni Ghione and Stephen Maas

Download or read book Microwave De embedding written by Gilles Dambrine and published by Elsevier Inc. Chapters. This book was released on 2013-11-09 with total page 42 pages. Available in PDF, EPUB and Kindle. Book excerpt: This chapter aims to describe experimental tools and techniques used for on-wafer millimeter (mm)-wave characterizations of silicon-based devices under the small-signal regime. We discuss the basics of scattering parameters (S parameters), high-frequency (HF) noise concept and measurement facilities, and expert details concerning experimental procedures. In this chapter, we describe first the basic notions of the S-parameters concept and its limitations, as well of as those HF noise. Secondly, the main experimental tools such as mm-wave vectorial network analyzer, noise setup, and on-wafer station are depicted. The third part concerns the description and the methodology of on-wafer calibration and de-embedding techniques applied for mm-wave advanced silicon devices. Finally, the last section focuses on the presentation and description of several examples of device characterizations. The main objective of this chapter is to propose a tradeoff between basic information and details of experience.

Download or read book On Wafer Microwave De Embedding Techniques written by Xi Sung Loo and published by . This book was released on 2017 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Wireless communication technology has kept evolving into higher frequency regime to take advantage of wider data bandwidth and higher speed performance. Successful RF circuit design requires accurate characterization of on-chip devices. This greatly relies on robust de-embedding technique to completely remove surrounding parasitics of pad and interconnects that connect device to measurement probes. Complex interaction of fixture parasitic at high frequency has imposed extreme challenges to de-embedding particularly for lossy complementary metal oxide semiconductor (CMOS) device. A generalized network de-embedding technique that avoids any inaccurate lumped and transmission line assumptions on the pad and interconnects of the test structure is presented. The de-embedding strategy has been validated by producing negligible de-embedding error (

Download or read book Microwave De embedding written by Giovanni Crupi and published by Elsevier Inc. Chapters. This book was released on 2013-11-09 with total page 71 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first chapter is intended primarily for those readers who are new to the de-embedding concept. To serve as a gateway into this fascinating but also challenging field of knowledge, the present chapter will show how to extract the full potential of the microwave de-embedding concept, from the theoretical background to practical applications. As a broad definition, de-embedding can be regarded as the mathematical process by which electrical reference planes can be set to desired locations. Its importance originates from the fact that electrical characteristics are not always directly measurable at the reference planes of interest. Hence, moving the electrical reference planes mathematically enables one to discover precious information. With the aim to provide an introductory and comprehensive overview of the de-embedding concept, this chapter discusses its effectiveness for different purposes: measurements, modeling, and design. Experimental results will be analyzed to act as a valuable support for gaining a clear-cut understanding.

Download or read book Microwave De embedding written by James C. Rautio and published by Elsevier Inc. Chapters. This book was released on 2013-11-09 with total page 62 pages. Available in PDF, EPUB and Kindle. Book excerpt: Just as physical microwave measurements must be de-embedded from test fixtures by means of calibration, electromagnetic analysis must likewise be calibrated so the results may be de-embedded. This chapter investigates the nature of the electromagnetic analysis port discontinuity, how it is characterized by calibration, and how it is removed (including a possible reference plane shift) by de-embedding. Both double-delay and short-open calibration are described. The theory for single port calibration and de-embedding is presented in a manner that is easily extended to treat multiple coupled ports. Additional theory shows how to extend calibration to groups of internal ports, critical, for example, in analyzing the passive planar portion of an amplifier (both the input and output matching networks in the same analysis) and having internal calibrated ports for connecting the transistor. Evaluation of error (accuracy) is covered in detail. Techniques that take advantage of calibrated ports, including circuit subdivision and port tuning, are described.

Download or read book Microwave De embedding written by Antonio Raffo and published by Elsevier Inc. Chapters. This book was released on 2013-11-09 with total page 104 pages. Available in PDF, EPUB and Kindle. Book excerpt: The chapter deals with two recently proposed characterization techniques of microwave transistors oriented to high-frequency power amplifier (PA) design. In particular, the nonlinear embedding and de-embedding design techniques are detailed, along with evidence of their advantages with respect to conventional design approaches in terms of power and frequency handling capability. The discussion also details the differences between the two techniques; despite the fact that they share the same theoretical basis, the techniques suffer from different critical facets. Finally, with the aim of guiding the reader towards full comprehension of the topic, different experimental examples are provided for transistor characterization and PA design.

Download or read book On Wafer Calibration Techniques Enabling Accurate Characterization of High Performance Silicon Devices at the mm Wave Range and Beyond written by Andrej Rumiantsev and published by CRC Press. This book was released on 2022-09-01 with total page 279 pages. Available in PDF, EPUB and Kindle. Book excerpt: The increasing demand for more content, services, and security drives the development of high-speed wireless technologies, optical communication, automotive radar, imaging and sensing systems and many other mm-wave and THz applications. S-parameter measurement at mm-wave and sub-mm wave frequencies plays a crucial role in the modern IC design debug. Most importantly, however, is the step of device characterization for development and optimization of device model parameters for new technologies. Accurate characterization of the intrinsic device in its entire operation frequency range becomes extremely important and this task is very challenging. This book presents solutions for accurate mm-wave characterization of advanced semiconductor devices. It guides through the process of development, implementation and verification of the in-situ calibration methods optimized for high-performance silicon technologies. Technical topics discussed in the book include: Specifics of S-parameter measurements of planar structures Complete mathematical solution for lumped-standard based calibration methods, including the transfer Thru-Match-Reflect (TMR) algorithms Design guideline and examples for the on-wafer calibration standards realized in both advanced SiGe BiCMOS and RF CMOS processes Methods for verification of electrical characteristics of calibration standards and accuracy of the in-situ calibration results Comparison of the new technique vs. conventional approaches: the probe-tip calibration and the pad parasitic de-embedding for various device types, geometries and model parameters New aspects of the on-wafer RF measurements at mmWave frequency range and calibration assurance.

Download or read book Microwave Systems and Applications written by Sotirios Goudos and published by BoD – Books on Demand. This book was released on 2017-01-11 with total page 436 pages. Available in PDF, EPUB and Kindle. Book excerpt: Microwave systems are key components of every modern wireless communication system. The main objective of this book was to collect as many different state-of-the-art studies as possible in order to cover in a single volume the main aspects of microwave systems and applications. This book contains 17 chapters written by acknowledged experts, researchers, academics, and microwave engineers, providing comprehensive information and covering a wide range of topics on all aspects of microwave systems and applications. This book is divided into four parts. The first part is devoted to microwave components. The second part deals with microwave ICs and innovative techniques for on-chip antenna design. The third part presents antenna design cases for microwave systems. Finally, the last part covers different applications of microwave systems.

Download or read book Handbook of Microwave Component Measurements written by Joel P. Dunsmore and published by John Wiley & Sons. This book was released on 2012-08-15 with total page 620 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides state-of-the-art coverage for making measurements on RF and Microwave Components, both active and passive. A perfect reference for R&D and Test Engineers, with topics ranging from the best practices for basic measurements, to an in-depth analysis of errors, correction methods, and uncertainty analysis, this book provides everything you need to understand microwave measurements. With primary focus on active and passive measurements using a Vector Network Analyzer, these techniques and analysis are equally applicable to measurements made with Spectrum Analyzers or Noise Figure Analyzers. The early chapters provide a theoretical basis for measurements complete with extensive definitions and descriptions of component characteristics and measurement parameters. The latter chapters give detailed examples for cases of cable, connector and filter measurements; low noise, high-gain and high power amplifier measurements, a wide range of mixer and frequency converter measurements, and a full examination of fixturing, de-embedding, balanced measurements and calibration techniques. The chapter on time-domain theory and measurements is the most complete treatment on the subject yet presented, with details of the underlying mathematics and new material on time domain gating. As the inventor of many of the methods presented, and with 30 years as a development engineer on the most modern measurement platforms, the author presents unique insights into the understanding of modern measurement theory. Key Features: Explains the interactions between the device-under-test (DUT) and the measuring equipment by demonstrating the best practices for ascertaining the true nature of the DUT, and optimizing the time to set up and measure Offers a detailed explanation of algorithms and mathematics behind measurements and error correction Provides numerous illustrations (e.g. block-diagrams for circuit connections and measurement setups) and practical examples on real-world devices, which can provide immediate benefit to the reader Written by the principle developer and designer of many of the measurement methods described This book will be an invaluable guide for RF and microwave R&D and test engineers, satellite test engineers, radar engineers, power amplifier designers, LNA designers, and mixer designers. University researchers and graduate students in microwave design and test will also find this book of interest.

Download or read book Microwave De embedding written by Manuel Yarlequé and published by Elsevier Inc. Chapters. This book was released on 2013-11-09 with total page 99 pages. Available in PDF, EPUB and Kindle. Book excerpt: This chapter aims to describe methodologies and techniques for de-embedding device measurements from extrinsic measurements by characterizing the parasitic network surrounding the intrinsic device, through the use of a three-dimensional (3D) physical model of the network and its electromagnetic (EM) analysis. The electromagnetic behavior is obtained employing 3D EM solvers and internal ports. In the first part, the de-embedding processes for field-effect transistor (FET) devices to be used for monolithic microwave integrated circuit designs are studied by four different approaches; in the second part of this chapter, the de-embedding of FET devices for hybrid circuit design purposes is described.

Download or read book Microwave De embedding written by José C. Pedro and published by Elsevier Inc. Chapters. This book was released on 2013-11-09 with total page 97 pages. Available in PDF, EPUB and Kindle. Book excerpt: This work presents an overview of the various facets of microwave device behavioral modeling technology, from the mathematical formulation to the required laboratory parameter extraction, focusing its attention on one of the less covered aspects: the embedding and de-embedding procedures associated with the behavioral model extraction process. The discussion starts with the revision of some of the most important behavioral modeling tools, explaining the three most important types of behavioral model formats (polynomial, artificial neural networks, and table-based models) and their instantiation in the context of microwave transistors. Then, it will evolve to the behavioral model parameter extraction procedures, reviewing the required specific microwave instrumentation and correspondent calibration and de-embedding of measurement data. Finally, this chapter will illustrate the use of embedding and de-embedding procedures in the behavioral modeling context, giving a particular emphasis on the needed behavioral model inversion techniques.

Download or read book Accuracy Investigation of De Embedding Techniques Based on Electromagnetic Simulation for On Wafer RF Measurements written by Takuichi Hirano and published by . This book was released on 2012 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Accuracy Investigation of De-Embedding Techniques Based on Electromagnetic Simulation for On-Wafer RF Measurements.

Download or read book RF Measurements of Die and Packages written by Scott A. Wartenberg and published by Artech House. This book was released on 2002 with total page 256 pages. Available in PDF, EPUB and Kindle. Book excerpt: The recent explosion of the RF wireless integrated circuits (IC), coupled with higher operating speeds in digital IC's has made accurate RF testing of IC's vital. This ground-breaking resource explains the fundamentals of performing accurate RF measurements of die and packages. It offers you practical advice on how to use coplanar probes and test fixtures in the lab for RF on-wafer die and package characterization. It also details how to build separate RF test systems for noise, high-power, and thermal testing as well as de-embed the test system's parasitic effects to get the die's RF performance. This book is a handy, practical resource for RFIC and MMIC designers as well as high-frequency digital IC designers, IC test engineers, and IC manufacturing test engineers.

Download or read book Microwave Circuits for 24 GHz Automotive Radar in Silicon based Technologies written by Vadim Issakov and published by Springer Science & Business Media. This book was released on 2010-08-05 with total page 218 pages. Available in PDF, EPUB and Kindle. Book excerpt: There are continuous efforts focussed on improving road traffic safety worldwide. Numerous vehicle safety features have been invented and standardized over the past decades. Particularly interesting are the driver assistance systems, since these can considerably reduce the number of accidents by supporting drivers’ perception of their surroundings. Many driver assistance features rely on radar-based sensors. Nowadays the commercially available automotive front-end sensors are comprised of discrete components, thus making the radar modules highly-priced and suitable for integration only in premium class vehicles. Realization of low-cost radar fro- end circuits would enable their implementation in inexpensive economy cars, c- siderably contributing to traffic safety. Cost reduction requires high-level integration of the microwave front-end c- cuitry, specifically analog and digital circuit blocks co-located on a single chip. - cent developments of silicon-based technologies, e.g. CMOS and SiGe:C bipolar, make them suitable for realization of microwave sensors. Additionally, these te- nologies offer the necessary integration capability. However, the required output power and temperature stability, necessary for automotive radar sensor products, have not yet been achieved in standard digital CMOS technologies. On the other hand, SiGe bipolar technology offers excellent high-frequency characteristics and necessary output power for automotive applications, but has lower potential for - alization of digital blocks than CMOS.

Download or read book Frequency Measurement Technology written by Ignacio Llamas-Garro and published by Artech House. This book was released on 2017-12-31 with total page 225 pages. Available in PDF, EPUB and Kindle. Book excerpt: This unique first-of-its-kind resource provides practical coverage of the design and implementation of frequency measurement receivers, which aid in identifying unknown signals. The technologies used in frequency measurement interferometry-based on-delay lines and filters are explored in this book. Practitioners also find concrete examples of microwave photonics implementations. The designs and concepts that cover conventional photonic instantaneous frequency measurement (IFM) circuits are explained. This book provides details on new designs for microwave photonic circuits and reconfigurable frequency measurement (RFM) circuits using diodes and MicroElectroMechanical Systems (MEMS). This book explains the many diverse applications of frequency measurement that are used in defense, radar, and communications. The instrumentation used to perform frequency measurements is explained, including the use of block analysis for network and spectrum analyzers and calibration techniques. Readers learn the advantages of using frequency measurement based on microwave/RF techniques, including immunity to electromagnetic interference, low loss, compatibility with fiber signal distribution, and parallel processing signals. Moreover, readers gain insight into the future of frequency measurement receivers. The book examines both the underpinnings and the implementation of frequency measurement receivers using many diverse technological platforms.

Download or read book Measurement and Modeling of Silicon Heterostructure Devices written by John D. Cressler and published by CRC Press. This book was released on 2018-10-03 with total page 189 pages. Available in PDF, EPUB and Kindle. Book excerpt: When you see a nicely presented set of data, the natural response is: “How did they do that; what tricks did they use; and how can I do that for myself?” Alas, usually, you must simply keep wondering, since such tricks-of- the-trade are usually held close to the vest and rarely divulged. Shamefully ignored in the technical literature, measurement and modeling of high-speed semiconductor devices is a fine art. Robust measuring and modeling at the levels of performance found in modern SiGe devices requires extreme dexterity in the laboratory to obtain reliable data, and then a valid model to fit that data. Drawn from the comprehensive and well-reviewed Silicon Heterostructure Handbook, this volume focuses on measurement and modeling of high-speed silicon heterostructure devices. The chapter authors provide experience-based tricks-of-the-trade and the subtle nuances of measuring and modeling advanced devices, making this an important reference for the semiconductor industry. It includes easy-to-reference appendices covering topics such as the properties of silicon and germanium, the generalized Moll-Ross relations, the integral charge-control model, and sample SiGe HBT compact model parameters.