Download or read book On the Feasibility of Observing In situ Thin Film Dielectric Breakdown in a Transmission Electron Microscope written by João Lombardi Vargas and published by . This book was released on 1988 with total page 330 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book In situ Transmission electron microscopic Observations of Fracture Propagation in Thin Electrodeposited Nickel Films written by Jing Jong Chiu and published by . This book was released on 1979 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book In Situ Transmission Electron Microscopy Observations of Rapid Solidification of Aluminum Thin Films written by and published by . This book was released on 2010 with total page 11 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Characterization of Dielectric Breakdown Behavior by in Situ Transmission Electron Microscopy written by Cecile Semana Bonifacio and published by . This book was released on 2013 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Dielectric breakdown (BD) is the loss of capacitance upheld by an insulating material through defect formation and charge trapping. Dielectric BD is well-studied in the framework of reliability physics for semiconductor applications, and presents itself as a viable mechanism during materials processing by electric field assisted sintering (EFAS). So far a mechanistic understanding of dielectric BD is incomplete due to the limitations in nanoscale defect characterization techniques. The recent development of novel in situ transmission electron microscopy (TEM) capabilities enables the atomic-scale characterization of dielectric BD mechanisms, which was the subject of this dissertation.As the technology of semiconductor devices moves toward the sub-25 nm technology the electronic properties of gate oxide layers are affected eventually leading to device failure by dielectric BD. This study aimed to provide a systematic approach of simultaneous imaging and local application of electrical stress using in situ TEM by contacting an electrically biased Scanning Tunnelling Microscopy (STM) probe directly to the TEM sample. This experimental setup therefore allows a correlation of electrical signatures with defect structure evolution. In situ TEM experiments carried out with a single SiO2-based field effect transistor resulted to catastrophic failure of the dielectric layer consistent with descriptions of soft dielectric breakdown (SBD) and hard dielectric breakdown (HBD).A variety of in situ TEM techniques was further utilized to investigate whether electric field induced dielectric breakdown may contribute to densification of metallic powder particles during EFAS. in situ heating and STM-TEM experiments were systematically applied to separately study thermal and athermal effects during densification, respectively. Nanometric metal powders used for sintering typically possess surface oxides that affect the thermodynamics and kinetics of neck formation during the initial stage of sintering. The thermal effects were found to be driven by reduction-oxidation reactions of nickel oxide with carbon. The presence of carbon promotes the removal of surface oxides at lower temperatures and, therefore, can accelerate densification. By the controlled application of electrical bias, EFAS conditions were reproduced during in situ TEM and revealed reduction of ultra-thin nickel oxide surface layers by electric field-induced dielectric breakdown. The results provide evidence for previously suggested effects of local electric field amplification at inter-particle contact areas, which, hence, triggers surface cleaning through electric field-induced dielectric breakdown.

Download or read book In situ TEM a Tool for Quantitative Observations of Deformation Behavior in Thin Films and Nano structured Materials written by and published by . This book was released on 2001 with total page 5 pages. Available in PDF, EPUB and Kindle. Book excerpt: This paper highlights future developments in the field of in-situ transmission electron microscopy, as applied specifically to the issues of deformation in thin films and nanostructured materials. Emphasis is place on the forthcoming technical advances that will aid in extraction of improved quantitative experimental data using this technique.

Download or read book Transmission Electron Microscopy and Diffractometry of Materials written by Brent Fultz and published by Springer Science & Business Media. This book was released on 2002 with total page 778 pages. Available in PDF, EPUB and Kindle. Book excerpt: Inelastic electron scattering and spectroscopy. Diffraction from crystals. Electron diffraction and crystallography.

Download or read book Dielectric Breakdown in Gigascale Electronics written by Juan Pablo Borja and published by Springer. This book was released on 2016-09-16 with total page 109 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book focuses on the experimental and theoretical aspects of the time-dependent breakdown of advanced dielectric films used in gigascale electronics. Coverage includes the most important failure mechanisms for thin low-k films, new and established experimental techniques, recent advances in the area of dielectric failure, and advanced simulations/models to resolve and predict dielectric breakdown, all of which are of considerable importance for engineers and scientists working on developing and integrating present and future chip architectures. The book is specifically designed to aid scientists in assessing the reliability and robustness of electronic systems employing low-k dielectric materials such as nano-porous films. Similarly, the models presented here will help to improve current methodologies for estimating the failure of gigascale electronics at device operating conditions from accelerated lab test conditions. Numerous graphs, tables, and illustrations are included to facilitate understanding of the topics. Readers will be able to understand dielectric breakdown in thin films along with the main failure modes and characterization techniques. In addition, they will gain expertise on conventional as well as new field acceleration test models for predicting long term dielectric degradation.

Download or read book Transmission Electron Microscopy Study of Cascade Collapse in Copper During In situ Ion irradiation at Elevated Temperatures written by and published by . This book was released on 1998 with total page 7 pages. Available in PDF, EPUB and Kindle. Book excerpt: The basic mechanisms driving the collapse of point defects produced in collision cascades are investigated by transmission electron microscope (TEM) characterization of defect microstructure produced in fcc-Cu irradiated with low-fluences of heavy (100 keV Kr) ions at elevated temperature (23--600 C). Areal defect yields are determined from direct TEM observation of the total defect production integrated over the duration of the in-situ ion-irradiation. They are unequivocally demonstrated to decrease with increasing lattice temperature. This decrease in defect yield indicates a proportional decrease in the probability of collapse of cascade regions into defects of size where visible contrast is produced in a TEM.

Download or read book Scanning Transmission Electron Microscopy written by Alina Bruma and published by CRC Press. This book was released on 2020-12-22 with total page 162 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications The information comprised in this book is focused on discussing the latest approaches in the recording of high-fidelity quantitative annular dark-field (ADF) data. It showcases the application of machine learning in electron microscopy and the latest advancements in image processing and data interpretation for materials notoriously difficult to analyze using scanning transmission electron microscopy (STEM). It also highlights strategies to record and interpret large electron diffraction datasets for the analysis of nanostructures. This book: Discusses existing approaches for experimental design in the recording of high-fidelity quantitative ADF data Presents the most common types of scintillator-photomultiplier ADF detectors, along with their strengths and weaknesses. Proposes strategies to minimize the introduction of errors from these detectors and avenues for dealing with residual errors Discusses the practice of reliable multiframe imaging, along with the benefits and new experimental opportunities it presents in electron dose or dose-rate management Focuses on supervised and unsupervised machine learning for electron microscopy Discusses open data formats, community-driven software, and data repositories Proposes methods to process information at both global and local scales, and discusses avenues to improve the storage, transfer, analysis, and interpretation of multidimensional datasets Provides the spectrum of possibilities to study materials at the resolution limit by means of new developments in instrumentation Recommends methods for quantitative structural characterization of sensitive nanomaterials using electron diffraction techniques and describes strategies to collect electron diffraction patterns for such materials This book helps academics, researchers, and industry professionals in materials science, chemistry, physics, and related fields to understand and apply computer-science–derived analysis methods to solve problems regarding data analysis and interpretation of materials properties.

Download or read book Transmission Electron Microscope In Situ Straining Technique to Directly Observe Defects and Interfaces During Deformation in Magnesium written by and published by . This book was released on 2015 with total page 8 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Characterization of Electrochemical and Electronic Materials by in Situ and Aberration corrected Transmission Electron Microscopy written by Megan Elizabeth Holtz and published by . This book was released on 2017 with total page 426 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning transmission electron microscopy (STEM) is a key tool in the advancement of materials science. As nanoscale materials and atomically sharp interfaces become increasingly technologically relevant, STEM provides feedback on the individual atoms, defects and interfaces that matter in the material. Two areas where STEM characterization is critical for materials advancement are electrochemical energy materials, such as battery electrodes and fuel cell electrocatalysts, and complex oxide materials, which exhibit a diverse array of properties. Electrochemical energy systems, including battery electrodes and electrocatalysts for fuel cells, are critical for the future of clean transportation. For these materials, investigation of the nanoscale processes which occur in liquid electrolytes is critical for understanding their performance in real devices. Encapsulating a thin layer of liquid in the TEM for in situ characterization is an exciting approach for gaining a detailed understanding of the underlying mechanisms of energy conversion and storage. The first half of this dissertation discusses the development and use of liquid-cell and electrochemical-cell TEM. First, I discuss the limitations and opportunities of EELS in thick liquids. I further discuss an electrochemical cell for the TEM, and its application to fuel cell electrocatalysts and battery materials. I was able to observe Pt-Ni octahedral catalyst particles degrade and lose their shape, and detect lithium ions move in a charging and discharging battery cathode (LiFePO4) with nanoscale detail by mapping the electronic structure. The second part of the dissertation focuses on complex oxides, which host a wide range of electronic and magnetic properties. Oxide interfaces, such as thin-film heterostructures and domain walls, are often atomically abrupt and produce novel functionalities. In particular, ferroelectric domain walls are rich sources of emergent phenomena – such as two-dimensional conductive sheets that form in an otherwise insulating solid – due to their unusual electronic properties or symmetry breaking. We probed how ferroelectric distortions change at domain walls with STEM for ErMnO3. From the STEM images, we calculated the order parameter at many domain walls in ErMnO3 to create a statistical picture of the ferroelectricity at these topological defects, and also observed how the order parameter changes near vortex structures. We further apply these methods to lutetium ferrite superlattices, where we use feedback from STEM to design a near-room-temperature multiferroic material in which ferroelectricity enhances the magnetism. We find that there are confined charged domain walls in the superlattice that additionally boost magnetism.

Download or read book Dielectric Films for Advanced Microelectronics written by Mikhail Baklanov and published by John Wiley & Sons. This book was released on 2007-04-04 with total page 508 pages. Available in PDF, EPUB and Kindle. Book excerpt: The topic of thin films is an area of increasing importance in materials science, electrical engineering and applied solid state physics; with both research and industrial applications in microelectronics, computer manufacturing, and physical devices. Advanced, high-performance computers, high-definition TV, broadband imaging systems, flat-panel displays, robotic systems, and medical electronics and diagnostics are a few examples of the miniaturized device technologies that depend on the utilization of thin film materials. This book presents an in-depth overview of the novel developments made by the scientific leaders in the area of modern dielectric films for advanced microelectronic applications. It contains clear, concise explanations of material science of dielectric films and their problem for device operation, including high-k, low-k, medium-k dielectric films and also specific features and requirements for dielectric films used in the packaging technology. A broad range of related topics are covered, from physical principles to design, fabrication, characterization, and applications of novel dielectric films.

Download or read book In Situ Transmission Electron Microscopy Observations of Room temperature Plasticity in Sub micron size TaC 100 and TaC 011 Single Crystals written by and published by . This book was released on 2015 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Understanding in Situ Transmission Electron Microscopy of Nanoparticulate and Electrochemical Systems written by David Alan Welch and published by . This book was released on 2015 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: In situ transmission electron microscopy (TEM) is a technique used to image the features of biological and inorganic specimens in near-native environments at sub-nanometer resolution. At the same time, this technique is limited by complications that are due to several environmental factors. Theoretical techniques combat some of these limitations by enhancing image interpretation and assisting experimental design. To provide understanding of in situ TEM experiments, assessment is here performed for spatial resolution limits, microscope/holder design, interfacial imaging capabilities, specimen structure, and specimen behavior. In the experimental imaging of PbS nanoparticles, the spatial resolution claimed to occur for small particles is shown to be possible given the imaging conditions used. Additionally, the influence of specimen holder design on image features is determined. The ability of the microscope to image the electrical double layer is calculated, with results not being promising. Lastly, the preferred attachment behavior of silver nanorods in water, which was once thought to possibly be a result of electron beam effects, is determined to be a fundamental result of solvation forces. Throughout these works of modeling, structure-based relationships (for image contrast and behavioral mechanisms) are assessed for specimens in the in situ TEM environment.

Download or read book In situ Transmission Electron Microscopy written by Eric Andrew Stach and published by . This book was released on 1998 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book A Method of Determining the High Frequency Dielectric Properties of Thin Films Using In situ Structures written by Kirk Garrett Laursen and published by . This book was released on 1997 with total page 252 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Investigation of Parallel Planar Defects and Texture Transformation in Electron Beam Evaporated Silver Thin Films written by Shelby Leigh Johnson and published by . This book was released on 2015 with total page 128 pages. Available in PDF, EPUB and Kindle. Book excerpt: Texture transformation is a known phenomenon which occurs in face-centered cubic metal thin films. This phenomenon entails a transition of film texture from (111) in as-deposited films to (100) in post-annealed films depending on film thickness; thinner films maintain the as-deposited (111) texture while thicker films transform to (100) texture after heat treatment. Texture transformation was previously theorized to result from minimization of surface and interface energies and strain energy; however, additional evidence contradicts this theory, suggesting that an alternative driving force for texture transformation exists. Nanotwin defects have been observed in numerous face-centered cubic metal thin films and may be a driving force for texture transformation; whether or not film nanotwin density is affected by changes in deposition parameters is not yet agreed upon. The influence of deposition rate on nanotwin density and texture transformation of silver thin films is investigated in this work. Silver thin films were synthesized at varied deposition rates using electron beam evaporation. Film samples were annealed to induce texture transformation using two setups; the first setup was used to analyze texture transformation of samples with different thicknesses deposited at different rates and the second setup was used to analyze texture transformation of samples with identical thickness deposited at different rates in situ over time. The texture of thin film samples was analyzed using x-ray diffraction. To identify and characterize nanotwins in our thin films cross-sections of film samples were studied using transmission electron microscopy. X-ray diffraction measurements indicated that the as-deposited silver thin films had strong (111) texture and that thicker films developed partial or transformed completely to (100) texture after heat treatment. Investigation of x-ray diffraction measurements of samples deposited at different rates revealed that changes in deposition rate influence texture transformation in thin film samples. Increasing deposition rate was found to increase texture transformation in film samples; samples of identical thickness deposited at faster rates were found to have a higher (100) texture post anneal than samples deposited at slower rates and from the in situ study samples of identical thickness deposited at faster rates were found to have transformed in less time than samples deposited at slower rates. Transmission electron microscopy results for as-deposited silver film samples showed that nanotwins were in our evaporated silver thin films parallel to the substrate. Investigation of samples deposited at different rates revealed that changes in deposition rate influence nanotwin spacing in film samples. Increasing deposition rate was found to decrease nanotwin spacing in silver thin film samples. Nanotwins are found to be a viable driving force for texture transformation in facecentered cubic metal thin films in this work. A model based on classical nucleation theory modified for formation of twinned and untwined nuclei from a vapor phase was assessed as a method for predicting nanotwin spacing in thin films. Results from applying this model were found to closely match experimental nanotwin spacing measurements in our silver thin films samples; however, the use of this model is still questionable.