Download or read book Novel Control Diagnostics for Plasma Processing written by Helen Louise Maynard and published by . This book was released on 1993 with total page 380 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Plasma Diagnostics written by Orlando Auciello and published by Academic Press. This book was released on 2013-10-22 with total page 470 pages. Available in PDF, EPUB and Kindle. Book excerpt: Plasma Diagnostics, Volume 1: Discharge Parameters and Chemistry covers seven chapters on the important diagnostic techniques for plasmas and details their use in particular applications. The book discusses optical diagnostic techniques for low pressure plasmas and plasma processing; plasma diagnostics for electrical discharge light sources; as well as Langmuir probes. The text also describes the mass spectroscopy of plasmas, microwave diagnostics, paramagnetic resonance diagnostics, and diagnostics in thermal plasma processing. Electrical engineers, nuclear engineers, microwave engineers, chemists, and technical personnel in universities, industry, and national laboratories will find the book invaluable.
Download or read book Advanced Plasma Diagnostics for Plasma Processing written by Mikhail Victorovich Malyshev and published by . This book was released on 1999 with total page 468 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Plasma Diagnostics written by Orlando Auciello and published by . This book was released on with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Handbook of Advanced Plasma Processing Techniques written by R.J. Shul and published by Springer Science & Business Media. This book was released on 2011-06-28 with total page 664 pages. Available in PDF, EPUB and Kindle. Book excerpt: Pattern transfer by dry etching and plasma-enhanced chemical vapor de position are two of the cornerstone techniques for modern integrated cir cuit fabrication. The success of these methods has also sparked interest in their application to other techniques, such as surface-micromachined sen sors, read/write heads for data storage and magnetic random access memory (MRAM). The extremely complex chemistry and physics of plasmas and their interactions with the exposed surfaces of semiconductors and other materi als is often overlooked at the manufacturing stage. In this case, the process is optimized by an informed "trial-and-error" approach which relies heavily on design-of-experiment techniques and the intuition of the process engineer. The need for regular cleaning of plasma reactors to remove built-up reaction or precursor gas products adds an extra degree of complexity because the interaction of the reactive species in the plasma with the reactor walls can also have a strong effect on the number of these species available for etching or deposition. Since the microelectronics industry depends on having high process yields at each step of the fabrication process, it is imperative that a full understanding of plasma etching and deposition techniques be achieved.
Download or read book Langmuir Probe in Theory and Practice written by Evgeny V. Shun'ko and published by Universal-Publishers. This book was released on 2009 with total page 251 pages. Available in PDF, EPUB and Kindle. Book excerpt: From flat-panel televisions to thermonuclear fusion for energy production, plasmas currently have numerous and wide applications in sciences and industry. A diversity of plasma diagnostics is available to physicists and engineers to measure and control plasma parameters. Among them, the Langmuir probe is the most inexpensive and most popular instrument and method. The Langmuir probe is a small electrode which is submerged in plasma in order to measure the probe current-voltage characteristic. The same characteristic is processed further to derive the electron and ion concentration, the electron distribution function, and the plasma potential at the probe location. Langmuir probe diagnostics afford rapid measurements of the electron distribution function and plasma potential at a good time resolution, 10-8 seconds in a wide range of plasma densities 10+3 - 10+14 cm-3, and the electron energy from the room temperature to hundreds of electron-volts - qualities which are essential for researchers. In view of these facts, Langmuir probe diagnostics are applied very frequently to measuring plasma parameters. This book will be useful in teaching plasma diagnostics to undergraduate and graduate students in plasma physics courses. And it will also serve as a practical reference manual for physicists and engineers working in the growing area of plasma physics. The reader of this book will learn what kind of plasma parameters the Langmuir probe can measure, how to develop the probe diagnostics for specific cases, and how the probe data obtained should be processed to deduce reliable plasma parameters. In this book, the reader can find not only the basic physics information important to understanding the principles of probe operation, but also how the "real" probe disturbs plasma, and how it is possible to reconstruct undisturbed plasma parameters with available probe data.
Download or read book Plasma Processing of Semiconductors written by Paul Williams and published by Springer Science & Business Media. This book was released on 1997-05-31 with total page 634 pages. Available in PDF, EPUB and Kindle. Book excerpt: Plasma Processing of Semiconductors contains 28 contributions from 18 experts and covers plasma etching, plasma deposition, plasma-surface interactions, numerical modelling, plasma diagnostics, less conventional processing applications of plasmas, and industrial applications. Audience: Coverage ranges from introductory to state of the art, thus the book is suitable for graduate-level students seeking an introduction to the field as well as established workers wishing to broaden or update their knowledge.
Download or read book Database Needs for Modeling and Simulation of Plasma Processing written by Panel on Database Needs in Plasma Processing and published by National Academies Press. This book was released on 1996-11-04 with total page 75 pages. Available in PDF, EPUB and Kindle. Book excerpt: In spite of its high cost and technical importance, plasma equipment is still largely designed empirically, with little help from computer simulation. Plasma process control is rudimentary. Optimization of plasma reactor operation, including adjustments to deal with increasingly stringent controls on plant emissions, is performed predominantly by trial and error. There is now a strong and growing economic incentive to improve on the traditional methods of plasma reactor and process design, optimization, and control. An obvious strategy for both chip manufacturers and plasma equipment suppliers is to employ large-scale modeling and simulation. The major roadblock to further development of this promising strategy is the lack of a database for the many physical and chemical processes that occur in the plasma. The data that are currently available are often scattered throughout the scientific literature, and assessments of their reliability are usually unavailable. "Database Needs for Modeling and Simulation of Plasma Processing" identifies strategies to add data to the existing database, to improve access to the database, and to assess the reliability of the available data. In addition to identifying the most important needs, this report assesses the experimental and theoretical/computational techniques that can be used, or must be developed, in order to begin to satisfy these needs.
Download or read book Multivariable Process Diagnostics for Plasma Systems written by David Coates and published by . This book was released on 2021 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Plasma processing has played a crucial and pivotal role in a number of industries, but probably one of the more significant has been the semiconductor sector. With plasma etching and surface treatment being key steps in wafer manufacturing, modest improvements in methods, methodologies, processes or control at the low level have very significant outcomes in the overall production of semiconductors and their varied uses. This work takes a multi-pronged approach from design and analysis of recently developed radio emission spectra capture to system level data acquisition over multi-sensors (which includes novel sensor approaches) for insertion into a hierarchical time series database structure, built upon a novel message-based network bus subsystem. Early work focused on the development of an optical viewport to obtain a planar view of the plasma. This was followed by the development of the non-invasive E and B-field radio probe technique for plasma monitoring RES (Radio Emission Spectroscopy), leading to the development of two branches of the sensor: the time-domain (TRES) and the frequency-domain (FRES). The two techniques can be applied in parallel to the commonly acquired data, but the processing techniques are somewhat different. The investigation of arcing within the chamber, which is very much a transient event, lends itself to TRES processing. TRES processing is by the application of novel near field B- and E-field analysis to detect these time-variant events where the frequency variation is small. The continuous operation of the plasma can be observed by applying digital signal processing (DSP) techniques to the FRES data, where the main measurement is frequency variant and the time resolution is large. Our approach is to use non-invasive measurement techniques from a range of sensors both in real time and in analytical modes. The analytical mode can be instantiated as an analysis technique, field-deployed, and as such can trigger a direct response to the process. The non-invasive sensors can be used as standalone to monitor operating processes and with simple thresholding can produce notifications of significant events. The work on the development of the novel FRES and the TRES sensor systems led to the investigation of the underlying scientific principles for the emission of such waves when driven by a single frequency. This FRES and TRES sensor subsystem has also been a commercial success with the technology being taken up by major semiconductor manufacturers for the determination of plasma conditions while processing wafers. The combination of novel non-invasive sensors, the real time alarm notification, the analysis over the broad-spectrum data and the instantiation of analytic blocks permits a very powerful and cost-effective tool in the control, maintainability and accounting of the production of semiconductor devices in a modern plant.
Download or read book Topics in Plasma Diagnostics written by I. Podgornyi and published by Springer. This book was released on 1971 with total page 240 pages. Available in PDF, EPUB and Kindle. Book excerpt: The present volume is essentially a qualitative survey of modern trends in the diagnostics of high-temperature plasmas, with particular orientation toward laboratory plasmas of interest in connection with research in controlled thermonuclear fusion. Among the broad topics considered are probe diagnostics, optical methods (including the use of lasers and holography), microwave diagnostics, and diagnostics with particle beams. Having infor mation on these methods available in compact form and in one place, as is the case in the present volume, should make it pos sible to evaluate different diagnostic approaches to specific prob lems. The volume will be useful as an introduction for advanced students making their first contact with experimental plasma physics and for physicists and engineers who are entering the field and desire a rapid survey of principles and modern trends in the diagnostics of high-temperature plasmas. v Foreword to the American Edition The material in this book is based on lectures given at Mos cow State University. It is intended to acquaint the reader with the basic aspects of plasma diagnostics and contains information re quired for the experimental physicist who wishes to carry out straightforward measurements of laboratory plasmas. It will be evident that in choosing the material we have been guided pri marily by the scientific interests of the author, and the great bulk of the material is based on work carried out in the USSR.
Download or read book Principles of Plasma Diagnostics written by I. H. Hutchinson and published by Cambridge University Press. This book was released on 2005-07-14 with total page 460 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a systematic introduction to the physics of plasma diagnostics measurements. It develops from first principles the concepts needed to plan, execute and interpret plasma measurements, making it a suitable book for graduate students and professionals with little plasma physics background. The book will also be a valuable reference for seasoned plasma physicists, both experimental and theoretical, as well as those with an interest in space and astrophysical applications. This second edition is thoroughly revised and updated, with new sections and chapters covering recent developments in the field.
Download or read book Plasma Diagnostics and Plasma Surface Interactions in Inductively Coupled Plasmas written by Monica Joy Titus and published by . This book was released on 2010 with total page 430 pages. Available in PDF, EPUB and Kindle. Book excerpt: The semiconductor industry's continued trend of manufacturing device features on the nanometer scale requires increased plasma processing control and improved understanding of plasma characteristics and plasma-surface interactions. This dissertation presents a series of experimental results for focus studies conducted in an inductively coupled plasma (ICP) system. First novel "on-wafer" diagnostic tools are characterized and related to plasma characteristics. Second, plasma-polymer interactions are characterized as a function of plasma species and processing parameters. Complimentary simulations accompany each focus study to supplement experimental findings. Wafer heating mechanisms in inductively coupled molecular gas plasmas are explored with PlasmaTempTM, a novel "on-wafer" diagnostic tool. Experimental wafer measurements are obtained with the PlasmaTempTM wafer processed in argon (Ar) and argon-oxygen (Ar/O2) mixed plasmas. Wafer heating mechanisms were determined by combining the experimental measurements with a 3-dimensional heat transfer model of the wafer. Comparisons between pure Ar and Ar/O2 plasmas demonstrate that two additional wafer heating mechanisms can be important in molecular gas plasmas compared to atomic gas discharges. Thermal heat conduction from the neutral gas and O-atom recombination on wafer surface can contribute as much as 60 % to wafer heating under conditions of low-energy ion bombardment in molecular plasmas. Measurements of a second novel "on-wafer" diagnostic sensor, the PlasmaVoltTM, were tested and validated in the ICP system for Ar plasmas varying in power and pressure. Sensor measurements were interpreted with a numerical sheath simulation and comparison to scaling laws derived from the inhomogeneous sheath model. The study demonstrates sensor measurements are proportional to the RF-current through the sheath and the scaling is a function of sheath impedance. PlasmaVoltTM sensor measurements are proportional to the square root of the plasma density at the plasma-sheath interface, one-fourth root of the electron temperature, and one-fourth root of the RF bias voltage under conditions where the sheath is predominantly capacitive. When the sheath impedance becomes increasingly resistive, the sensor measurements deviate from the scaling law and tend to be directly proportional to the plasma density. Vacuum ultraviolet (VUV) emissions in Ar ICPs are characterized and the chemical and physical modifications to 193 nm photoresist (PR) polymer materials processed in Ar ICPs are investigated. Fourier transform infrared (FTIR) transmission measurements as a function of VUV photon fluence demonstrate that VUV-induced bond breaking occurs over a period of time. A numerical model demonstrates that VUV photons deplete near-surface O-containing bonds, leading to deeper, subsequent penetration and more bond losses, while the remaining near-surface C-C bonds absorb the incident radiation and slow VUV photon penetration. The roughening mechanism of blanket and patterned 193 nm PR samples are explored in a well characterized Ar ICP. FTIR and atomic force microscopy (AFM) analysis of plasma processed 193 nm PR suggests that ion-induced generation of a graphitized layer at high energies, combined with VUV bulk modification of 193 nm PR may initiate PR roughening. The roughness of blanket samples increases as a function of VUV fluence, ion energy, and substrate temperature. Line width roughness (LWR) measurements of patterned samples demonstrate a similar trend suggesting that LWR may correlate with surface roughness of patterns. The results are compared to PR studies previously conducted in an ultra-high vacuum beam system demonstrating that the vacuum beam system is a useful tool that can deconvolute and simplify complex plasma systems.
Download or read book Advanced Concepts and Architectures for Plasma Enabled Material Processing written by Oleg O. Baranov and published by Morgan & Claypool Publishers. This book was released on 2020-09-30 with total page 92 pages. Available in PDF, EPUB and Kindle. Book excerpt: Plasma-based techniques are widely and successfully used across the field of materials processing, advanced nanosynthesis, and nanofabrication. The diversity of currently available processing architectures based on or enhanced by the use of plasmas is vast, and one can easily get lost in the opportunities presented by each of these configurations. This mini-book provides a concise outline of the most important concepts and architectures in plasma-assisted processing of materials, helping the reader navigate through the fundamentals of plasma system selection and optimization. Architectures discussed in this book range from the relatively simple, user-friendly types of plasmas produced using direct current, radio-frequency, microwave, and arc systems, to more sophisticated advanced systems based on incorporating and external substrate architectures, and complex control mechanisms of configured magnetic fields and distributed plasma sources.
Download or read book Plasma Diagnostics written by Orlando Auciello and published by Academic Press. This book was released on 2013-10-22 with total page 349 pages. Available in PDF, EPUB and Kindle. Book excerpt: Plasmas and their interaction with materials have become subjects of major interest because of their importance in modern forefront technologies such as microelectronics, fusion energy, and space. Plasmas are used in microelectronics to process semiconductors (etching of patterns for microcircuits, plasma-induced deposition of thin films, etc.); plasmas produce deleterious erosion effects on surfaces of materials used for fusion devices and spaceships exposed to the low earth environment.Diagnostics of plasmas and materials exposed to them are fundamental to the understanding of the physical and chemical phenomena involved. Plasma Diagnostics provides a comprehensive treatment of the subject.short version, TJE_Plasmas and their interaction with materials have become subjects of major interest because of their importance in modern forefront technologies such as microelectronics, fusion energy, and space. Diagnostics of plasmas and materials exposed to them are fundamental to the understanding of the physical and chemical phenomena involved. Plasma Diagnostics provides a comprehensive treatment of the subject.
Download or read book Plasma Processing of Materials written by National Research Council and published by National Academies Press. This book was released on 1991-02-01 with total page 88 pages. Available in PDF, EPUB and Kindle. Book excerpt: Plasma processing of materials is a critical technology to several of the largest manufacturing industries in the worldâ€"electronics, aerospace, automotive, steel, biomedical, and toxic waste management. This book describes the relationship between plasma processes and the many industrial applications, examines in detail plasma processing in the electronics industry, highlights the scientific foundation underlying this technology, and discusses education issues in this multidisciplinary field. The committee recommends a coordinated, focused, and well-funded research program in this area that involves the university, federal laboratory, and industrial sectors of the community. It also points out that because plasma processing is an integral part of the infrastructure of so many American industries, it is important for both the economy and the national security that America maintain a strong leadership role in this technology.
Download or read book Advanced Plasma Technology written by Riccardo d'Agostino and published by John Wiley & Sons. This book was released on 2008-09-08 with total page 479 pages. Available in PDF, EPUB and Kindle. Book excerpt: A panel of internationally renowned scientists discuss the latest results in plasma technology. This volume has been compiled with both a didactic approach and an overview of the newest achievements for industrial applications. It is divided into two main sections. One is focused on fundamental technology, including plasma production and control, high-pressure discharges, modeling and simulation, diagnostics, dust control, and etching. The section on application technology covers polymer treatments, silicon solar cell, coating and spray, biomaterials, sterilization and waste treatment, plasma propulsion, plasma display panels, and anti-corrosion coatings. The result is an indispensable work for physicists, chemists and engineers involved in the field of plasma technology.
Download or read book Introduction to Plasma Physics and Controlled Fusion written by Francis F. Chen and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 427 pages. Available in PDF, EPUB and Kindle. Book excerpt: TO THE SECOND EDITION In the nine years since this book was first written, rapid progress has been made scientifically in nuclear fusion, space physics, and nonlinear plasma theory. At the same time, the energy shortage on the one hand and the exploration of Jupiter and Saturn on the other have increased the national awareness of the important applications of plasma physics to energy production and to the understanding of our space environment. In magnetic confinement fusion, this period has seen the attainment 13 of a Lawson number nTE of 2 x 10 cm -3 sec in the Alcator tokamaks at MIT; neutral-beam heating of the PL T tokamak at Princeton to KTi = 6. 5 keV; increase of average ß to 3%-5% in tokamaks at Oak Ridge and General Atomic; and the stabilization of mirror-confined plasmas at Livermore, together with injection of ion current to near field-reversal conditions in the 2XIIß device. Invention of the tandem mirror has given magnetic confinement a new and exciting dimension. New ideas have emerged, such as the compact torus, surface-field devices, and the EßT mirror-torus hybrid, and some old ideas, such as the stellarator and the reversed-field pinch, have been revived. Radiofrequency heat ing has become a new star with its promise of dc current drive. Perhaps most importantly, great progress has been made in the understanding of the MHD behavior of toroidal plasmas: tearing modes, magnetic Vll Vlll islands, and disruptions.
