Download or read book Nondestructive Evaluation of Semiconductor Materials and Devices written by Jay N. Zemel and published by . This book was released on 1979 with total page 782 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Nondestructive Evaluation of Semiconductor Materials and Devices written by J. Zemel and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 791 pages. Available in PDF, EPUB and Kindle. Book excerpt: From September 19-29, a NATO Advanced Study Institute on Non destructive Evaluation of Semiconductor Materials and Devices was held at the Villa Tuscolano in Frascati, Italy. A total of 80 attendees and lecturers participated in the program which covered many of the important topics in this field. The subject matter was divided to emphasize the following different types of problems: electrical measurements; acoustic measurements; scanning techniques; optical methods; backscatter methods; x-ray observations; accele rated life tests. It would be difficult to give a full discussion of such an Institute without going through the major points of each speaker. Clearly this is the proper task of the eventual readers of these Proceedings. Instead, it would be preferable to stress some general issues. What came through very clearly is that the measurements of the basic scientists in materials and device phenomena are of sub stantial immediate concern to the device technologies and end users.

Download or read book Semiconductor Material and Device Characterization written by Dieter K. Schroder and published by John Wiley & Sons. This book was released on 2015-06-29 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.

Download or read book Quality Technology Handbook written by R S Sharpe and published by Butterworth-Heinemann. This book was released on 2017-03-28 with total page 492 pages. Available in PDF, EPUB and Kindle. Book excerpt: Quality Technology Handbook, Fourth Edition offers a wide discussion on technology and its related subtopics. After giving some information on its background, content, and authors, the book then informs the readers about the quality problem check-list and enumerates the questions one has to ask to ensure that a problem will be solved. This part is followed by a discussion on non-destructive testing (NDT) and the several committees formed for it, among which are the British National Committee and the Harwell NDT Center. The book also includes information on two organizations that are closely related to the topic, the Institute of Quality Assurance (IQA) and The Welding Institute (TWI). A directory of international organizations related to quality assurance and non-destructive testing is provided in the latter part of the text. The book serves as valuable reference to undergraduates or postgraduates of courses that are related to science and technology.

Download or read book Publications of the National Institute of Standards and Technology Catalog written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 1981 with total page 680 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book NBS Special Publication written by and published by . This book was released on 1968 with total page 684 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Publications written by United States. National Bureau of Standards and published by . This book was released on 1975 with total page 540 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Journal of Research of the National Bureau of Standards written by United States. National Bureau of Standards and published by . This book was released on 1980 with total page 572 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Publications of the National Bureau of Standards Catalog written by United States. National Bureau of Standards and published by . This book was released on 1975 with total page 540 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book written by 国立国会図書館 (Japan) and published by . This book was released on 1972 with total page 672 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Ion Implantation Science and Technology written by J.F. Ziegler and published by Elsevier. This book was released on 2012-12-02 with total page 509 pages. Available in PDF, EPUB and Kindle. Book excerpt: Ion Implantation Science and Technology: Second Edition, just like the first edition, serves as both an introduction and tutorial to the science, techniques, and machines involved in the subject. The book is divided into two parts - Part 1: Ion Implantation Science and Part 2: Ion Implantation Technology. Part 1 covers topics such as the stopping and range of ions in solids; ion implantation damage in silicon; experimental annealing and activation; and the measurement on ion implantation. Part 2 includes ion optics and focusing on implanter design; photoresist problems and particle contamination; ion implantation diagnostics and process control; and emission of ionizing radiation from ion implanters. The text is recommended for engineers who would like to be acquainted with the principles and processes behind ion implantation or make studies on the field.

Download or read book Nondestructive Tests Used to Insure the Integrity of Semiconductor Devices with Emphasis on Acoustic Emission Techniques written by George G. Harman and published by . This book was released on 1979 with total page 80 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Semiconductor Measurement Technology written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 1990 with total page 128 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Semiconductor Measurement Technology written by United States. National Bureau of Standards and published by . This book was released on 1988 with total page 116 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Analytical and Diagnostic Techniques for Semiconductor Materials Devices and Processes written by Bernd O. Kolbesen (Chemiker.) and published by The Electrochemical Society. This book was released on 1999 with total page 568 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Electronics Reliability and Measurement Technology written by Joseph S. Heyman and published by Elsevier. This book was released on 1998-12-31 with total page 145 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.

Download or read book Review of Progress in Quantitative Nondestructive Evaluation written by Donald O. Thompson and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 2462 pages. Available in PDF, EPUB and Kindle. Book excerpt: These Proceedings, consisting of Parts A and B, contain the edited versions of most of the papers presented at the annual Review of Progress in Quantitative Nondestructive Evaluation held at Snowmass Village, Colorado, on July 31 to August 4, 1994. The Review was organized by the Center for NDE at Iowa State University, in cooperation with the Ames Laboratory of the US DOE, the Materials Directorate of the Wright Laboratory, Wright-Patterson Air Force Base, the American Society of Nondestructive Testing, the Department of Energy, the National Institute of Standards and Technology, the Federal Aviation Administration, the National Science Foundation Industry/University Cooperative Research Centers, and the Working Group in Quantitative NDE. This year's Review of Progress in QNDE was attended by approximately 450 participants from the U.S. and many foreign countries who presented over 360 papers. The meeting was divided into 36 sessions, with as many as four sessions running concurrently. The Review covered all phases of NDE research and development from fundamental investigations to engineering applications or inspection systems, and it included many important methods of inspection science from acoustics to x-rays. In the last eight to ten years, the Review has stabilized at about its current size, which most participants seem to agree is large enough to permit a full-scale overview of the latest developments, but still small enough to retain the collegial atmosphere which has marked the Review since its inception.