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Book Monte Carlo Modeling for Electron Microscopy and Microanalysis

Download or read book Monte Carlo Modeling for Electron Microscopy and Microanalysis written by David C. Joy and published by Oxford University Press. This book was released on 1995-04-13 with total page 225 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis. Computer programs for two basic types of Monte Carlo simulation are developed from physical models of the electron scattering process--a single scattering program capable of high accuracy but requiring long computation times, and a plural scattering program which is less accurate but much more rapid. Optimized for use on personal computers, the programs provide a real time graphical display of the interaction. The programs are then used as the starting point for the development of programs aimed at studying particular effects in the electron microscope, including backscattering, secondary electron production, EBIC and cathodo-luminescence imaging, and X-ray microanalysis. The computer code is given in a fully annotated format so that it may be readily modified for specific problems. Throughout, the author includes numerous examples of how such applications can be used. Students and professionals using electron microscopes will want to read this important addition to the literature.

Book Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron Microscopy

Download or read book Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron Microscopy written by ETATS UNIS. National Bureau of Standards and published by . This book was released on 1976 with total page 164 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Monte Carlo Simulation in Electron Microscopy and Spectroscopy

Download or read book Monte Carlo Simulation in Electron Microscopy and Spectroscopy written by Vladimír Stary and published by . This book was released on 2011 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Monte-Carlo Simulation in Electron Microscopy and Spectroscopy.

Book Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron Microscopy Proceedings of a Workshop Gaithersburg Md 1975

Download or read book Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron Microscopy Proceedings of a Workshop Gaithersburg Md 1975 written by K. F. J. Heinrich and published by . This book was released on 1977 with total page 165 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron Microscopy

Download or read book Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron Microscopy written by Kurt F. J. Heinrich and published by Forgotten Books. This book was released on 2018-10-02 with total page 176 pages. Available in PDF, EPUB and Kindle. Book excerpt: Excerpt from Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron, Microscopy: Proceedings of a Workshop Held at the National Bureau of Standards Gaithersburg, Maryland, October, 1-3, 1975 The Analytical Chemistry Division of the Institute for Materials Research, National Bureau of Standards, seeks to develop new techniques of chemical analysis and improve existing techniques. Part of the mission of nbs is to disseminate knowledge in the scientific and technical community. To aid in reaching this objective, the Analytical Chemistry Division has sponsored a series of workshops on various topics in analytical chemistry. The workshop topics are chosen to fulfill current needs for detailed discussions on sharply defined subjects in a wide variety of specialist areas. The objective is to bring together specialists from throughout the world to concentrate intensively on a particular subject in order to advance the state-of-the-art. It is often very difficult to achieve this goal at large international meetings where the size and diversity of topics presented often limits detailed discussion of special subjects. Past topics of these workshops and the published proceedings include: Quantitative Electron Probe Microanalysis (nbs Special Publication 298, available from editors), Aerosol Measurements (nbs Special Publication 4l2), Oil Pollution Monitoring (nbs Special Publication and Secondary Ion Mass Spectrometry (nbs Special Publication These proceedings are available from the Superintendent of Documents, Government Printing Office, washington, DC 20402. Further information on the workshops can be obtained by writing to the Division Office, Analytical Chemistry Division, National Bureau of Standards, Washington, DC 20234. This volume contains the proceedings of a Workshop on the Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron Microscopy. The three-day meeting involved participants from the United States and Europe. The workshop format consisted of a keynote talk on each topic followed by extensive discussions. The papers in this volume are based on the keynote talks augmented with some points raised in the discussion. About the Publisher Forgotten Books publishes hundreds of thousands of rare and classic books. Find more at www.forgottenbooks.com This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.

Book WORKSHOP ON USE OF MONTE CARLO CALCULATIONS IN ELECTRON PROBE MICROANALYSIS AND SCANNING ELECTRON MICROSCOPY Gaithersburg Md Oct 1 3 1975 Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron Microscopy Edited by Kur

Download or read book WORKSHOP ON USE OF MONTE CARLO CALCULATIONS IN ELECTRON PROBE MICROANALYSIS AND SCANNING ELECTRON MICROSCOPY Gaithersburg Md Oct 1 3 1975 Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron Microscopy Edited by Kur written by and published by . This book was released on 1976 with total page 164 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book USE OF MONTE CARLO CALCULATIONS IN ELECTRON PROBE MICROANALYSIS AND SCANNING ELECTRON MICROSCOPY PROCEEDINGS OF A WORKSHOP NATIONAL BUREAU OF STANDARDS INSTITUTE FOR MATERIALS RESEARCH ANALYTICAL CHEMISTRY DIVISION

Download or read book USE OF MONTE CARLO CALCULATIONS IN ELECTRON PROBE MICROANALYSIS AND SCANNING ELECTRON MICROSCOPY PROCEEDINGS OF A WORKSHOP NATIONAL BUREAU OF STANDARDS INSTITUTE FOR MATERIALS RESEARCH ANALYTICAL CHEMISTRY DIVISION written by and published by . This book was released on with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Improved Electron Microscopy with Monte Carlo Simulations

Download or read book Improved Electron Microscopy with Monte Carlo Simulations written by and published by . This book was released on 2005 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Application of Parallel Computing to the Monte Carlo Simulation of Electron Scattering in Solids

Download or read book Application of Parallel Computing to the Monte Carlo Simulation of Electron Scattering in Solids written by and published by . This book was released on 1990 with total page 19 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray microanalysis by analytical electron microscopy (AEM) has proven to be a powerful tool for characterizing the spatial distribution of solute elements in materials. True compositional variations over spatial scales smaller than the actual resolution for microanalysis can be determined if the measured composition profile is deconvoluted. Explicit deconvolutions of such data, via conventional techniques such as Fourier transforms, are not possible due to statistical noise in AEM microanalytical data. Hence, the method of choice is to accomplish the deconvolution via iterative convolutions. In this method, a function describing the assumed true composition profile, calculated by physically permissible thermodynamic and kinetic modeling, is convoluted with the x-ray generation function and the result compared to the measured composition profile. If the measured and calculated profiles agree within experimental error, it is assumed that the true compositional profile has been determined. If the measured and calculated composition profiles are in disagreement, the assumptions in the physical model are adjusted and the convolution process repeated. To employ this procedure it is necessary to calculate the x-ray generation function explicitly. While a variety of procedures are available for calculating this function, the most accurate procedure is to use Monte Carlo modeling of electron scattering.

Book NBS Special Publication

Download or read book NBS Special Publication written by and published by . This book was released on 1976 with total page 184 pages. Available in PDF, EPUB and Kindle. Book excerpt: