Download or read book Microstructural Modification of Thin Films and Its Relation to the Electromigration limited Reliability of VLSI Interconnects written by Hai Pham Longworth and published by . This book was released on 1992 with total page 524 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Microstructure and Electromigration Effects in A1 and A1 Alloy Thin Films written by John Espinoza Sanchez (Jr) and published by . This book was released on 1991 with total page 276 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Microstructural Configuration Influence on Electromigration in Sn Cu Thin Films written by Yi Xu and published by . This book was released on 1994 with total page 358 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Electromigration in Thin Films and Electronic Devices written by Choong-Un Kim and published by . This book was released on 2011 with total page 329 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Effects of Microstructure Modification Induced by Laser Interference Patterning of Thin Films written by Rodolphe Catrin and published by . This book was released on 2012-07-13 with total page 129 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Fundamentals of Electromigration Aware Integrated Circuit Design written by Jens Lienig and published by Springer. This book was released on 2018-02-23 with total page 171 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. It introduces the physical process of electromigration, which gives the reader the requisite understanding and knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration’s negative impact on circuit reliability.
Download or read book IEEE International Integrated Reliability Workshop Final Report written by and published by . This book was released on 1997 with total page 178 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book PVD for Microelectronics Sputter Desposition to Semiconductor Manufacturing written by and published by Elsevier. This book was released on 1998-10-29 with total page 434 pages. Available in PDF, EPUB and Kindle. Book excerpt: Physics of Thin Films is one of the longest running continuing series in thin film science, consisting of 25 volumes since 1963. The series contains quality studies of the properties of various thin films materials and systems.In order to be able to reflect the development of today's science and to cover all modern aspects of thin films, the series, starting with Volume 20, has moved beyond the basic physics of thin films. It now addresses the most important aspects of both inorganic and organic thin films, in both their theoretical as well as technological aspects. Therefore, in order to reflect the modern technology-oriented problems, the title has been slightly modified from Physics of Thin Films to Thin Films.This volume, part of the Thin Films Series, has been wholly written by two authors instead of showcasing several edited manuscripts.
Download or read book Microstructural Evolution in Thin Films written by Atwater and published by . This book was released on 1998-12-01 with total page 450 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Metals Abstracts written by and published by . This book was released on 1992 with total page 1796 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Effects of Film Microstructure and Line Geometry on the Reliability of Passivated Copper Interconnects written by Julie Ann Nucci and published by . This book was released on 1996 with total page 398 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Thin Film Interconnect Electromigration Reliability Determined by Abrupt Changes in Resistance written by Craig Carl Frank Fahrenkrug and published by . This book was released on 1998 with total page 322 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Evolution of Surface and Thin Film Microstructure Volume 280 written by Harry A. Atwater and published by Mrs Proceedings. This book was released on 1993-10-27 with total page 784 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Download or read book Morphological and Compositional Evolution of Thin Films Volume 749 written by Michael J. Aziz and published by Mrs Proceedings. This book was released on 2003 with total page 448 pages. Available in PDF, EPUB and Kindle. Book excerpt: "The papers compiled in this volume were presented in Symposium W, 'Morphological and Compositional Evolution of Thin Films, ' held December 2-5 at the 2002 MRS Fall Meeting in Boston Massachusetts. They are organized in the order that they were presented."--P. xiii.
Download or read book PVD for Microelectronics Sputter Desposition to Semiconductor Manufacturing written by and published by Academic Press. This book was released on 1998-11-06 with total page 419 pages. Available in PDF, EPUB and Kindle. Book excerpt: Physics of Thin Films is one of the longest running continuing series in thin film science, consisting of 25 volumes since 1963. The series contains quality studies of the properties of various thin films materials and systems. In order to be able to reflect the development of today's science and to cover all modern aspects of thin films, the series, starting with Volume 20, has moved beyond the basic physics of thin films. It now addresses the most important aspects of both inorganic and organic thin films, in both their theoretical as well as technological aspects. Therefore, in order to reflect the modern technology-oriented problems, the title has been slightly modified from Physics of Thin Films to Thin Films. This volume, part of the Thin Films Series, has been wholly written by two authors instead of showcasing several edited manuscripts.
Download or read book Mechanisms of Thin Film Evolution Volume 317 written by Steven M. Yalisove and published by . This book was released on 1994-05-11 with total page 664 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Download or read book Electrical Electronics Abstracts written by and published by . This book was released on 1997 with total page 1904 pages. Available in PDF, EPUB and Kindle. Book excerpt:
