Download or read book Microelectronic Test Structures for CMOS Technology written by Manjul Bhushan and published by Springer Science & Business Media. This book was released on 2011-08-26 with total page 401 pages. Available in PDF, EPUB and Kindle. Book excerpt: Microelectronic Test Structures for CMOS Technology and Products addresses the basic concepts of the design of test structures for incorporation within test-vehicles, scribe-lines, and CMOS products. The role of test structures in the development and monitoring of CMOS technologies and products has become ever more important with the increased cost and complexity of development and manufacturing. In this timely volume, IBM scientists Manjul Bhushan and Mark Ketchen emphasize high speed characterization techniques for digital CMOS circuit applications and bridging between circuit performance and characteristics of MOSFETs and other circuit elements. Detailed examples are presented throughout, many of which are equally applicable to other microelectronic technologies as well. The authors’ overarching goal is to provide students and technology practitioners alike a practical guide to the disciplined design and use of test structures that give unambiguous information on the parametrics and performance of digital CMOS technology.

Download or read book Latchup written by Steven H. Voldman and published by John Wiley & Sons. This book was released on 2008-04-15 with total page 472 pages. Available in PDF, EPUB and Kindle. Book excerpt: Interest in latchup is being renewed with the evolution of complimentary metal-oxide semiconductor (CMOS) technology, metal-oxide-semiconductor field-effect transistor (MOSFET) scaling, and high-level system-on-chip (SOC) integration. Clear methodologies that grant protection from latchup, with insight into the physics, technology and circuit issues involved, are in increasing demand. This book describes CMOS and BiCMOS semiconductor technology and their sensitivity to present day latchup phenomena, from basic over-voltage and over-current conditions, single event latchup (SEL) and cable discharge events (CDE), to latchup domino phenomena. It contains chapters focusing on bipolar physics, latchup theory, latchup and guard ring characterization structures, characterization testing, product level test systems, product level testing and experimental results. Discussions on state-of-the-art semiconductor processes, design layout, and circuit level and system level latchup solutions are also included, as well as: latchup semiconductor process solutions for both CMOS to BiCMOS, such as shallow trench, deep trench, retrograde wells, connecting implants, sub-collectors, heavily-doped buried layers, and buried grids – from single- to triple-well CMOS; practical latchup design methods, automated and bench-level latchup testing methods and techniques, latchup theory of logarithm resistance space, generalized alpha (a) space, beta (b) space, new latchup design methods– connecting the theoretical to the practical analysis, and; examples of latchup computer aided design (CAD) methodologies, from design rule checking (DRC) and logical-to-physical design, to new latchup CAD methodologies that address latchup for internal and external latchup on a local as well as global design level. Latchup acts as a companion text to the author’s series of books on ESD (electrostatic discharge) protection, serving as an invaluable reference for the professional semiconductor chip and system-level ESD engineer. Semiconductor device, process and circuit designers, and quality, reliability and failure analysis engineers will find it informative on the issues that confront modern CMOS technology. Practitioners in the automotive and aerospace industries will also find it useful. In addition, its academic treatment will appeal to both senior and graduate students with interests in semiconductor process, device physics, computer aided design and design integration.

Download or read book The ESD Handbook written by Steven H. Voldman and published by John Wiley & Sons. This book was released on 2021-03-02 with total page 1168 pages. Available in PDF, EPUB and Kindle. Book excerpt: A practical and comprehensive reference that explores Electrostatic Discharge (ESD) in semiconductor components and electronic systems The ESD Handbook offers a comprehensive reference that explores topics relevant to ESD design in semiconductor components and explores ESD in various systems. Electrostatic discharge is a common problem in the semiconductor environment and this reference fills a gap in the literature by discussing ESD protection. Written by a noted expert on the topic, the text offers a topic-by-topic reference that includes illustrative figures, discussions, and drawings. The handbook covers a wide-range of topics including ESD in manufacturing (garments, wrist straps, and shoes); ESD Testing; ESD device physics; ESD semiconductor process effects; ESD failure mechanisms; ESD circuits in different technologies (CMOS, Bipolar, etc.); ESD circuit types (Pin, Power, Pin-to-Pin, etc.); and much more. In addition, the text includes a glossary, index, tables, illustrations, and a variety of case studies. Contains a well-organized reference that provides a quick review on a range of ESD topics Fills the gap in the current literature by providing information from purely scientific and physical aspects to practical applications Offers information in clear and accessible terms Written by the accomplished author of the popular ESD book series Written for technicians, operators, engineers, circuit designers, and failure analysis engineers, The ESD Handbook contains an accessible reference to ESD design and ESD systems.

Download or read book ESD written by Steven H. Voldman and published by John Wiley & Sons. This book was released on 2006-11-02 with total page 420 pages. Available in PDF, EPUB and Kindle. Book excerpt: With the growth of high-speed telecommunications and wireless technology, it is becoming increasingly important for engineers to understand radio frequency (RF) applications and their sensitivity to electrostatic discharge (ESD) phenomena. This enables the development of ESD design methods for RF technology, leading to increased protection against electrical overstress (EOS) and ESD. ESD: RF Technology and Circuits: Presents methods for co-synthesizisng ESD networks for RF applications to achieve improved performance and ESD protection of semiconductor chips; discusses RF ESD design methods of capacitance load transformation, matching network co-synthesis, capacitance shunts, inductive shunts, impedance isolation, load cancellation methods, distributed loads, emitter degeneration, buffering and ballasting; examines ESD protection and design of active and passive elements in RF complementary metal-oxide-semiconductor (CMOS), RF laterally-diffused metal oxide semiconductor (LDMOS), RF BiCMOS Silicon Germanium (SiGe), RF BiCMOS Silicon Germanium Carbon (SiGeC), and Gallim Arsenide technology; gives information on RF ESD testing methodologies, RF degradation effects, and failure mechanisms for devices, circuits and systems; highlights RF ESD mixed-signal design integration of digital, analog and RF circuitry; sets out examples of RF ESD design computer aided design methodologies; covers state-of-the-art RF ESD input circuits, as well as voltage-triggered to RC-triggered ESD power clamps networks in RF technologies, as well as off-chip protection concepts. Following the authors series of books on ESD, this book will be a thorough overview of ESD in RF technology for RF semiconductor chip and ESD engineers. Device and circuit engineers working in the RF domain, and quality, reliability and failure analysis engineers will also find it a valuable reference in the rapidly growing are of RF ESD design. In addition, it will appeal to graduate students in RF microwave technology and RF circuit design.

Download or read book ESD Design and Analysis Handbook written by James E. Vinson and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 214 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electrostatic Discharge is a pervasive issue in the semiconductor industry affecting both manufacturers and users of semiconductors. This easy-to-read, practical handbook presents an overview of ESD as it effects electronic circuits and provides a concise introduction for students, engineers, circuit designers and failure analysts.

Download or read book Matching Properties of Deep Sub Micron MOS Transistors written by Jeroen A. Croon and published by Springer Science & Business Media. This book was released on 2006-06-20 with total page 214 pages. Available in PDF, EPUB and Kindle. Book excerpt: Matching Properties of Deep Sub-Micron MOS Transistors examines this interesting phenomenon. Microscopic fluctuations cause stochastic parameter fluctuations that affect the accuracy of the MOSFET. For analog circuits this determines the trade-off between speed, power, accuracy and yield. Furthermore, due to the down-scaling of device dimensions, transistor mismatch has an increasing impact on digital circuits. The matching properties of MOSFETs are studied at several levels of abstraction: A simple and physics-based model is presented that accurately describes the mismatch in the drain current. The model is illustrated by dimensioning the unit current cell of a current-steering D/A converter. The most commonly used methods to extract the matching properties of a technology are bench-marked with respect to model accuracy, measurement accuracy and speed, and physical contents of the extracted parameters. The physical origins of microscopic fluctuations and how they affect MOSFET operation are investigated. This leads to a refinement of the generally applied 1/area law. In addition, the analysis of simple transistor models highlights the physical mechanisms that dominate the fluctuations in the drain current and transconductance. The impact of process parameters on the matching properties is discussed. The impact of gate line-edge roughness is investigated, which is considered to be one of the roadblocks to the further down-scaling of the MOS transistor. Matching Properties of Deep Sub-Micron MOS Transistors is aimed at device physicists, characterization engineers, technology designers, circuit designers, or anybody else interested in the stochastic properties of the MOSFET.

Download or read book CMOS Technology for IC Biosensor and Applications written by Dr. Abdullah Tashtoush and published by Xlibris Corporation. This book was released on 2013-07-23 with total page 292 pages. Available in PDF, EPUB and Kindle. Book excerpt: About the Book The book includes a variety of techniques that are conducting biosensors as transducers. The single die has all of the biosensors implemented within it, which leads to a new generation of multibiosensors named as multi-labs-on-a-single chip (MLoC). Biosensors are analytical devices that combine a biologically sensitive element with a physical or chemical transducer to detect the presence of specific compounds selectively and quantitatively. This book explores the feasibility of microelectronic techniques in a successful attempt to get huge cost savings in mass production, fast reacting, and disposable biosensors. The book is lied in six chapters and four appendices. These sensors were implemented using CMOSP35 technology on a single-chip that covers new techniques for detecting biomedical and biological samples at low concentration level based on CMOS/MEMS technology batch process. The methodology of the proposed multibiosensors that is named by multi-lab-on-a-chip (MLoC); lies on miniaturizing transducers, which is based on optical CMOS technology, charge based capacitance measurements (CBCM), electrochemical impedance spectroscopy (EIS) and CMOS microcoils incorporating with interdigitated microelectrode array (IDMA). The aforementioned approaches technically proved their capability and reliability overwhelmingly among the used conventional techniques for that reason these techniques have been proposed to create compact and portable biosensors for sensitive and rapid detection of biomedical and biological samples. While the four proposed biosensors have common objectives they differ in the method and analysis used, and postulates engaged by a discipline to achieve the objectives; the inquiry of the principles of investigation in a particular field.

Download or read book Artificial And Natural Perception Proceedings Of The 2nd Italian Conference On Sensors And Microsystems written by Corrado Di Natale and published by World Scientific. This book was released on 1998-01-15 with total page 406 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains a number of articles concerning the artificial perception of reality, as can be perceived by a sensor, and its interaction with natural human perception through the senses. For the first time, a link between the sensor's field and the more general perception theory is attempted. Besides, the book offers a unique insight provided by the research on sensors and microsystems currently being carried out in Italy. It covers the typical area of sensors and microsystems: chemical and biological sensors, physical sensors and micromechanics.

Download or read book Measurement Instrumentation and Sensors Handbook written by John G. Webster and published by CRC Press. This book was released on 2017-12-19 with total page 1921 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Second Edition of the bestselling Measurement, Instrumentation, and Sensors Handbook brings together all aspects of the design and implementation of measurement, instrumentation, and sensors. Reflecting the current state of the art, it describes the use of instruments and techniques for performing practical measurements in engineering, physics, chemistry, and the life sciences and discusses processing systems, automatic data acquisition, reduction and analysis, operation characteristics, accuracy, errors, calibrations, and the incorporation of standards for control purposes. Organized according to measurement problem, the Electromagnetic, Optical, Radiation, Chemical, and Biomedical Measurement volume of the Second Edition: Contains contributions from field experts, new chapters, and updates to all 98 existing chapters Covers sensors and sensor technology, time and frequency, signal processing, displays and recorders, and optical, medical, biomedical, health, environmental, electrical, electromagnetic, and chemical variables A concise and useful reference for engineers, scientists, academic faculty, students, designers, managers, and industry professionals involved in instrumentation and measurement research and development, Measurement, Instrumentation, and Sensors Handbook, Second Edition: Electromagnetic, Optical, Radiation, Chemical, and Biomedical Measurement provides readers with a greater understanding of advanced applications.

Download or read book Measurement Instrumentation and Sensors Handbook Second Edition written by John G. Webster and published by CRC Press. This book was released on 2014-02-03 with total page 1925 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Second Edition of the bestselling Measurement, Instrumentation, and Sensors Handbook brings together all aspects of the design and implementation of measurement, instrumentation, and sensors. Reflecting the current state of the art, it describes the use of instruments and techniques for performing practical measurements in engineering, physics, chemistry, and the life sciences and discusses processing systems, automatic data acquisition, reduction and analysis, operation characteristics, accuracy, errors, calibrations, and the incorporation of standards for control purposes. Organized according to measurement problem, the Electromagnetic, Optical, Radiation, Chemical, and Biomedical Measurement volume of the Second Edition: Contains contributions from field experts, new chapters, and updates to all 98 existing chapters Covers sensors and sensor technology, time and frequency, signal processing, displays and recorders, and optical, medical, biomedical, health, environmental, electrical, electromagnetic, and chemical variables A concise and useful reference for engineers, scientists, academic faculty, students, designers, managers, and industry professionals involved in instrumentation and measurement research and development, Measurement, Instrumentation, and Sensors Handbook, Second Edition: Electromagnetic, Optical, Radiation, Chemical, and Biomedical Measurement provides readers with a greater understanding of advanced applications.

Download or read book VLSI SoC Research Trends in VLSI and Systems on Chip written by Giovanni De Micheli and published by Springer. This book was released on 2010-08-23 with total page 397 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains extended and revised versions of the best papers presented during the fourteenth IFIP TC 10/WG 10.5 International Conference on Very Large Scale Integration. This conference provides a forum to exchange ideas and show industrial and academic research results in microelectronics design. The current trend toward increasing chip integration and technology process advancements brings about stimulating new challenges both at the physical and system-design levels.

Download or read book Static and Dynamic Performance Limitations for High Speed D A Converters written by Anne van den Bosch and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 229 pages. Available in PDF, EPUB and Kindle. Book excerpt: Static and Dynamic Performance Limitations for High Speed D/A Converters discusses the design and implementation of high speed current-steering CMOS digital-to-analog converters. Starting from the definition of the basic specifications for a D/A converter, the elements determining the static and dynamic performance are identified. Different guidelines based on scientific derivations are suggested to optimize this performance. Furthermore, a new closed formula has been derived to account for the influence of the transistor mismatch on the achievable resolution of the current-steering D/A converter. To allow a thorough understanding of the dynamic behavior, a new factor has been introduced. Moreover, the frequency dependency of the output impedance introduces harmonic distortion components which can limit the maximum attainable spurious free dynamic range. Finally, the last part of the book gives an overview on different existing transistor mismatch models and the link with the static performance of the D/A converter.

Download or read book SOC Design Methodologies written by Michel Robert and published by Springer. This book was released on 2013-03-15 with total page 489 pages. Available in PDF, EPUB and Kindle. Book excerpt: The 11 th IFIP International Conference on Very Large Scale Integration, in Montpellier, France, December 3-5,2001, was a great success. The main focus was about IP Cores, Circuits and System Designs & Applications as well as SOC Design Methods and CAD. This book contains the best papers (39 among 70) that have been presented during the conference. Those papers deal with all aspects of importance for the design of the current and future integrated systems. System on Chip (SOC) design is today a big challenge for designers, as a SOC may contain very different blocks, such as microcontrollers, DSPs, memories including embedded DRAM, analog, FPGA, RF front-ends for wireless communications and integrated sensors. The complete design of such chips, in very deep submicron technologies down to 0.13 mm, with several hundreds of millions of transistors, supplied at less than 1 Volt, is a very challenging task if design, verification, debug and industrial test are considered. The microelectronic revolution is fascinating; 55 years ago, in late 1947, the transistor was invented, and everybody knows that it was by William Shockley, John Bardeen and Walter H. Brattein, Bell Telephone Laboratories, which received the Nobel Prize in Physics in 1956. Probably, everybody thinks that it was recognized immediately as a major invention.

Download or read book Reliability Wearout Mechanisms in Advanced CMOS Technologies written by Alvin W. Strong and published by John Wiley & Sons. This book was released on 2009-10-13 with total page 642 pages. Available in PDF, EPUB and Kindle. Book excerpt: This invaluable resource tells the complete story of failure mechanisms—from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience. It also offers the first reference book with all relevant physics, equations, and step-by-step procedures for CMOS technology reliability in one place. Practical appendices provide basic experimental procedures that include experiment design, performing stressing in the laboratory, data analysis, reliability projections, and interpreting projections.

Download or read book Silicon Optoelectronic Integrated Circuits written by Horst Zimmermann and published by Springer. This book was released on 2019-01-30 with total page 456 pages. Available in PDF, EPUB and Kindle. Book excerpt: Explains the circuit design of silicon optoelectronic integrated circuits (OEICs), which are central to advances in wireless and wired telecommunications. The essential features of optical absorption are summarized, as is the device physics of photodetectors and their integration in modern bipolar, CMOS, and BiCMOS technologies. This information provides the basis for understanding the underlying mechanisms of the OEICs described in the main part of the book. In order to cover the topic comprehensively, Silicon Optoelectronic Integrated Circuits presents detailed descriptions of many OEICs for a wide variety of applications from various optical sensors, smart sensors, 3D-cameras, and optical storage systems (DVD) to fiber receivers in deep-sub-μm CMOS. Numerous detailed illustrations help to elucidate the material.

Download or read book Non logic Devices in Logic Processes written by Yanjun Ma and published by Springer. This book was released on 2017-03-29 with total page 290 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book shows readers how to design semiconductor devices using the most common and lowest cost logic CMOS processes. Readers will benefit from the author’s extensive, industrial experience and the practical approach he describes for designing efficiently semiconductor devices that typically have to be implemented using specialized processes that are expensive, time-consuming, and low-yield. The author presents an integrated picture of semiconductor device physics and manufacturing techniques, as well as numerous practical examples of device designs that are tried and true.

Download or read book Proceedings of the IEEE International Conference on Microelectronic Test Structures written by and published by . This book was released on 1988 with total page 230 pages. Available in PDF, EPUB and Kindle. Book excerpt: