Download or read book Microcircuit Device Reliability Trend Analysis written by and published by . This book was released on 1985 with total page 371 pages. Available in PDF, EPUB and Kindle. Book excerpt: MDR-21 is a study of microcircuit field failure data based on various microcircuit types (digital SSI, MSI, LSI, linear, interface, memory and VLSI). The report includes failure rate data based on actual field failure records (data acquired from MDR-21A) calculated with Bayesian statistics. Failure distribution information is also presented in a quantifiable assembly of descriptive failure-related terms. Equipment-level comparisons were made to determine the impact on reliability relative to variations in manufacturers requirements. The text is complete with graphical representations and narratives in support of the study findings. Keywords include: Reliability trends; Bayesian statistics; Failure indicator/Mode distributions; Chi-square; Equipment manufacturer; and Influences.
Download or read book Microcircuit Device Reliability Digital Evaluation and Generic Failure Analysis Data written by David B. Nicholls and published by . This book was released on 1979 with total page 354 pages. Available in PDF, EPUB and Kindle. Book excerpt: This report of digital evaluation and generic failure analysis data is one of a series of annual microcircuit device reliability data publications compiled by the Reliability Analysis Center. This compendium provides burn-in and environmental/screening data on SSI and MSI digital microcircuits. Each document in the series contains analyzed reliability information in addition to a detailed presentation of field and test results. This information aids in determining device fallout rates and the operational test and field characteristics of devices. Life test results can be reviewed. The relative risks of screening decisions may also be determined. Additionally, information is available to form the foundation for failure mode effects and criticality analyses(FMECA). Through the data presented, these publications are intended to actively complement such publications as MIL-STD-883 and MIL-HDBK-217B. The user is cautioned, however, that the listed data may not be used in lieu of contractually cited references.
Download or read book Microcircuit Device Reliability written by and published by . This book was released on 1984 with total page 436 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Digital failure rate data written by David B. Nicholls and published by . This book was released on 1979 with total page 416 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Microcircuit Device Reliability written by Mark R. Klein and published by . This book was released on 1978 with total page 344 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Microcircuit Device Reliability Digital Generic Data written by Roy C. Walker and published by . This book was released on 1975 with total page 260 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Microcircuit Device Reliability written by Mark R. Klein and published by . This book was released on 1976 with total page 226 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Microcircuit Device Reliability written by Wayne E. Turkowski and published by . This book was released on 1984 with total page 333 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Microcircuit Device Reliability written by Steven J. Flint and published by . This book was released on 1979 with total page 262 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Microcircuit Device Reliability written by Gene A. Hommey and published by . This book was released on 1977 with total page 234 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Microcircuit Device Reliability Linear interface Data written by Thomas E. Paquette and published by . This book was released on 1975 with total page 290 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Microcircuit Device Reliability Field Experience Data Book written by David J. Mahar and published by . This book was released on 1985 with total page 688 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Microcircuit Device Reliability Field Experience Database written by David J. Mahar and published by . This book was released on 1985 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Microcircuit Device Reliability Hybrid Circuit Data written by Timothy E. Turner and published by . This book was released on 1976 with total page 407 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Microcircuit Device Reliability Digital Failure Rate Data written by RELIABILITY ANALYSIS CENTER GRIFFISS AFB NY. and published by . This book was released on 1981 with total page 403 pages. Available in PDF, EPUB and Kindle. Book excerpt: This report concerns itself with the presentation and analysis of digital microcircuit reliability data, which has been compiled from a wide spectrum of military and commercial sources. The individual data elements represent both component life test and equipment reliability demonstration results, as well as actual field experience. For analysis purposes, this report separates these sources into two major sections. The first section presents the summarized results of test and field data, while the second section contains failure information derived from failure analysis of digital devices. In each of these sections, the data summaries are followed by a detailed listing of line entries which allow the reader to make the maximum use of the information compiled in this compendium. In addition to providing field and test results, MDR-17 presents comparisons between actual field experienced failure rates and MIL-HDBK-217C, Notice 1, predicted failure rates. The use of tables and graphs results in high visibility into the parameters which affect device failure rates, allowing correlation between observed and predicted failure rates to be made effectively. (Author).
Download or read book Microcircuit Device Reliability Hybrid Circuit Data written by Timothy E. Turner and published by . This book was released on 1978 with total page 210 pages. Available in PDF, EPUB and Kindle. Book excerpt: This compendium of Hybrid Microcircuit Reliability Data contains both detailed and summarized information. The detailed data have been collected from both military and commercial applications and consist of field experience, reliability demonstration results, screening fallout, life tests, and equipment check-out results. A full description of the construction of each device as well as the manufacturer and all test parameters have been included. The summarized data show the distribution of failure causes for hybrids subjected to various conditions, failure rates of components used within hybrids, the screening fallout distribution and a comparison between field data and MIL-HDBK-217B predictions. (Author).
Download or read book Microcircuit Device Reliability Linear Interface Data written by and published by . This book was released on 1984 with total page 342 pages. Available in PDF, EPUB and Kindle. Book excerpt: This report, a compendium of linear/interface microcircuit reliability data, contains data accumulated on the testing and field experience of these part types. The data is separated into two major sections; one section containing the field activity, testing performed, and subsequent results; the other section contains only verified failure information obtained from failure analysis studies. In each of the two sections, the detailed data is presented along with summaries prepared from the detailed section for each functional group, linear or interface. The summaries of the field data along with residual plots provide a quick insight into a comparison of the observed field failure rates and MIL-HDBK-217 predicted values. Originator-supplied keywords include: Linear integrated circuits; Interface circuits; Reliability; Failure mode; and Failure analysis results.
