Download or read book Microcircuit Device Reliability written by and published by . This book was released on 1984 with total page 436 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Microcircuit Device Reliability written by Rome Air Development Center. Reliability Analysis Center and published by . This book was released on 1979 with total page 208 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Microcircuit Device Reliability Linear Interface Data written by RELIABILITY ANALYSIS CENTER GRIFFISS AFB NY. and published by . This book was released on 1979 with total page 274 pages. Available in PDF, EPUB and Kindle. Book excerpt: This microcircuit device reliability compendium provides failure rate data on linear and interface monolithic microcircuits.

Download or read book Microcircuit Device Reliability written by Kieron A. Dey and published by . This book was released on 1981 with total page 462 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains data on memory and digital LSI device failure rates. The raw data is presented as well as a series of summaries designed to bring out the salient points. Where possible, graphical aids are used to depict the data. Comparison of predicted with observed failure rates is given, predictions being carried out to MIL-HDBK-217C. This book includes a new section on failure analysis results not included in previous editions. (Author).

Download or read book Microcircuit Device Reliability Digital Evaluation and Generic Failure Analysis Data written by David B. Nicholls and published by . This book was released on 1979 with total page 354 pages. Available in PDF, EPUB and Kindle. Book excerpt: This report of digital evaluation and generic failure analysis data is one of a series of annual microcircuit device reliability data publications compiled by the Reliability Analysis Center. This compendium provides burn-in and environmental/screening data on SSI and MSI digital microcircuits. Each document in the series contains analyzed reliability information in addition to a detailed presentation of field and test results. This information aids in determining device fallout rates and the operational test and field characteristics of devices. Life test results can be reviewed. The relative risks of screening decisions may also be determined. Additionally, information is available to form the foundation for failure mode effects and criticality analyses(FMECA). Through the data presented, these publications are intended to actively complement such publications as MIL-STD-883 and MIL-HDBK-217B. The user is cautioned, however, that the listed data may not be used in lieu of contractually cited references.

Download or read book Microcircuit Device Reliability written by Mark R. Klein and published by . This book was released on 1978 with total page 344 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Microcircuit Device Reliability Digital Generic Data written by Roy C. Walker and published by . This book was released on 1975 with total page 260 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Digital failure rate data written by David B. Nicholls and published by . This book was released on 1979 with total page 416 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Microcircuit Device Reliability Digital Detailed Data written by Mark R. Klein and published by . This book was released on 1976 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Microcircuit Device Reliability written by Gene A. Hommey and published by . This book was released on 1977 with total page 234 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Microcircuit Device Reliability written by Steven J. Flint and published by . This book was released on 1979 with total page 262 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Microcircuit Device Reliability written by Wayne E. Turkowski and published by . This book was released on 1984 with total page 333 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Microcircuit Device Reliability written by Mark R. Klein and published by . This book was released on 1978 with total page 344 pages. Available in PDF, EPUB and Kindle. Book excerpt: This compendium of microcircuit device reliability is separated into two parts: Digital Failure Rate Summarized Data and Digital Device Data - Detailed Listings. The summaries pertain to warranty experience, plastic encapsulated I.C. lot acceptance information, and generic field, reliability demonstration, equipment checkout and life test data. The detailed listings consist of field, reliability demonstration, and equipment checkout experience as well as life test results arranged by operational type, manufacturer, and part number. MIL-HDBK-217B parameters have been incorporated into the entries to permit comparisons with predicted values. (Author).

Download or read book Microcircuit Reliability Bibliography written by and published by . This book was released on 1978 with total page 412 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Linear interface Data written by Steven J. Flint and published by . This book was released on 1978 with total page 262 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Microcircuit Device Reliability Hybrid Circuit Data written by Timothy E. Turner and published by . This book was released on 1978 with total page 210 pages. Available in PDF, EPUB and Kindle. Book excerpt: This compendium of Hybrid Microcircuit Reliability Data contains both detailed and summarized information. The detailed data have been collected from both military and commercial applications and consist of field experience, reliability demonstration results, screening fallout, life tests, and equipment check-out results. A full description of the construction of each device as well as the manufacturer and all test parameters have been included. The summarized data show the distribution of failure causes for hybrids subjected to various conditions, failure rates of components used within hybrids, the screening fallout distribution and a comparison between field data and MIL-HDBK-217B predictions. (Author).

Download or read book Microcircuit Device Reliability Hybrid Circuit Data written by Timothy E. Turner and published by . This book was released on 1976 with total page 407 pages. Available in PDF, EPUB and Kindle. Book excerpt: