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Book Measurement of Transistor Parameters in the VHF UHF Range

Download or read book Measurement of Transistor Parameters in the VHF UHF Range written by William Laurie Faulkenberry (LCDR, USCG.) and published by . This book was released on 1960 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Measurement of Transistor Parameters in the VHF UHF Range

Download or read book Measurement of Transistor Parameters in the VHF UHF Range written by William Laurie Faulkenberry and published by . This book was released on 1960 with total page 82 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Measurement of Transistor Parameters

Download or read book Measurement of Transistor Parameters written by Reinhold Paul and published by . This book was released on 1969 with total page 364 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Accurate Measurement of Transistor Parameters at V H F   30 300 MHZ

Download or read book Accurate Measurement of Transistor Parameters at V H F 30 300 MHZ written by Mohamed Mahmoud Mansour and published by . This book was released on 1971 with total page 198 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Small signal Transistor Characterization for the Hf and Vhf Range

Download or read book Small signal Transistor Characterization for the Hf and Vhf Range written by Richard L. Brayden and published by . This book was released on 1965 with total page 36 pages. Available in PDF, EPUB and Kindle. Book excerpt: A technique for the high-frequency characterization of small-signal transistors in the range of 3 to 300 Mc is proposed. The approach presented substitutes relatively accurate low frequency measurements for the normally hard to measure high frequency four-pole parameters. These low frequency measurements in conjunction with a derived set of 'y' parameter expressions can be used to accurately characterize the frequency variation of a transistor's four-pole parameters over the specified frequency range. An equally accurate characterization based on an equivalent circuit is relatively complex. The theoretical fourpole parameters obtained for both a germanium mesa and a silicon planar transistor are compared to the measured four-pole parameters obtained from an extremely accurate measuring set. The results show that an inaccuracy of five percent can be expected in most cases between the predicted and measured fourpole parameters. (Author).

Book Technical Abstract Bulletin

Download or read book Technical Abstract Bulletin written by and published by . This book was released on with total page 912 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book The Measurement of Small signal Parameters of Transistors at VHF

Download or read book The Measurement of Small signal Parameters of Transistors at VHF written by Bliss LaMar Diamond and published by . This book was released on 1962 with total page 21 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book U S  Government Research Reports

Download or read book U S Government Research Reports written by and published by . This book was released on 1964 with total page 1416 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Measurement Techniques for Radio Frequency Nanoelectronics

Download or read book Measurement Techniques for Radio Frequency Nanoelectronics written by T. Mitch Wallis and published by Cambridge University Press. This book was released on 2017-09-14 with total page 329 pages. Available in PDF, EPUB and Kindle. Book excerpt: Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials. • Learn the techniques needed for characterizing the performance of devices and their constituent building blocks, including semiconducting nanowires, graphene, and other two dimensional materials such as transition metal dichalcogenides • Gain practical insights into instrumentation, including on-wafer measurement platforms and scanning microwave microscopy • Discover how measurement techniques can be applied to solve real-world problems, in areas such as passive and active nanoelectronic devices, semiconductor dopant profiling, subsurface nanoscale tomography, nanoscale magnetic device engineering, and broadband, spatially localized measurements of biological materials Featuring numerous practical examples, and written in a concise yet rigorous style, this is the ideal resource for researchers, practicing engineers, and graduate students new to the field of radio frequency nanoelectronics.

Book Measurements of Low Frequency Small signal Transistor Parameters and Their Relation to Theory

Download or read book Measurements of Low Frequency Small signal Transistor Parameters and Their Relation to Theory written by Jacques Gilbert and published by . This book was released on 1957 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: "The purpose intended by the author in this work is an investigation of the adequacy of the first-order theory of junction transistor action to predict within an acceptable degree of accuracy the behaviour with operating conditions of the various parameters of the junction transistor equivalent circuit. A large amount of work has already been done in this direction, but the object of the majority of the experimenters was to arrive at a suitable set of design equations. [...]" --

Book A Time Domain Method of Measuring Transistor Parameters for Complete Small Signal Characterization Up to 1 Gc

Download or read book A Time Domain Method of Measuring Transistor Parameters for Complete Small Signal Characterization Up to 1 Gc written by Frank Richard Davis and published by . This book was released on 1965 with total page 96 pages. Available in PDF, EPUB and Kindle. Book excerpt: This report describes a method of measuring transistor small signal parameters over a wide frequency range using time domain techniques. A sampling oscilloscope and tunnel diode pulse generator are used to obtain five times response curves from the transistor which is inserted into a 50 ohm coaxial air-dielectric transmission line. A digital computer is used to perform frequency spectrum analysis on the curves, and to calculate the open and short circuit parameters for complete characterization of the transistor. The hybrid parameters of an RC network and three transistors were measured and compared with measurements made in the frequency domain. Good agreement was obtained between methods up to 500 Mc with reduced accuracy to 1 Gc. (Author).

Book Measurement of Transistor Scattering Parameters

Download or read book Measurement of Transistor Scattering Parameters written by George J. Rogers and published by . This book was released on 1975 with total page 60 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book NBS Special Publication

Download or read book NBS Special Publication written by and published by . This book was released on 1968 with total page 468 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Official Gazette of the United States Patent Office

Download or read book Official Gazette of the United States Patent Office written by United States. Patent Office and published by . This book was released on 1974 with total page 1728 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book An Index of U S  Voluntary Engineering Standards

Download or read book An Index of U S Voluntary Engineering Standards written by William J. Slattery and published by . This book was released on 1972 with total page 468 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book High Dielectric Constant Materials

Download or read book High Dielectric Constant Materials written by Howard Huff and published by Springer Science & Business Media. This book was released on 2005 with total page 740 pages. Available in PDF, EPUB and Kindle. Book excerpt: Issues relating to the high-K gate dielectric are among the greatest challenges for the evolving International Technology Roadmap for Semiconductors (ITRS). More than just an historical overview, this book will assess previous and present approaches related to scaling the gate dielectric and their impact, along with the creative directions and forthcoming challenges that will define the future of gate dielectric scaling technology. Topics include: an extensive review of Moore's Law, the classical regime for SiO2 gate dielectrics; the transition to silicon oxynitride gate dielectrics; the transition to high-K gate dielectrics (including the drive towards equivalent oxide thickness in the single-digit nanometer regime); and future directions and issues for ultimate technology generation scaling. The vision, wisdom, and experience of the team of authors will make this book a timely, relevant, and interesting, resource focusing on fundamentals of the 45 nm Technology Generation and beyond.

Book Measurement of Transistors in the VHF Range

Download or read book Measurement of Transistors in the VHF Range written by Walter Isfried Landauer and published by . This book was released on 1958 with total page 148 pages. Available in PDF, EPUB and Kindle. Book excerpt: