Download or read book Measurement of Carrier Lifetime in Semiconductors written by W. Murray Bullis and published by . This book was released on 1968 with total page 68 pages. Available in PDF, EPUB and Kindle. Book excerpt: About 300 papers concerned with the measurement and interpretation of carrier lifetime in semiconductors are listed together with key words and a brief comment for each. Eight types of entries are included: Description of Methods, Analysis of Results, Standard Methods, Experimental Results, Theroetical Models, Auxiliary Procedures and Data, Reviews, and Books. Emphasis is placed on methods of carrying out measurements of carrier lifetime. Hence complete coverage was attempted and nearly two thirds of the entries appear in the first three categories. A large fraction of the papers listed describe the photoconductivity or photoconductive decay methods. The other most popular methods are based on diode characteristics or the photomagnetoelectric effect. In all, 35 methods for measuring carrier lifetime are represented by entries. In addition, representative papers which describe various models for recombination are included together with a number of papers which discuss the influence of surface recombination and trapping phenomena. Auxiliary procedures such as surface preparation, formation of ohmic contacts, control of temperature, and the like are described in some of the entries. Two indexes, a Key Word Index and an Author Index, are provided together with a classification of the various methods for measuring carrier lifetime. (Author).
Download or read book Recombination Lifetime Measurements in Silicon written by Dinesh C. Gupta and published by ASTM International. This book was released on 1998 with total page 389 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Lifetime in Semiconductors written by Frank Wenzel Georg Rose and published by . This book was released on 1958 with total page 4 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Carrier Lifetime Measurement by the Photoconductive Decay Method written by Richard L. Mattis and published by . This book was released on 1972 with total page 56 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book The Measurement of Carrier Lifetime in Silicon and Germanium Semiconductors written by Vir Abhimanyu Singh Dhaka and published by . This book was released on 1959 with total page 88 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Measurement of Carrier Lifetime in Semiconductors written by W. Murray Bullis and published by . This book was released on 1968 with total page 70 pages. Available in PDF, EPUB and Kindle. Book excerpt: About 300 papers concerned with the measurement and interpretation of carrier lifetime in semiconductors are listed together with key words and a brief comment for each. Eight types of papers are included: Description of Methods, Analysis of Results, Standard Methods, Experimental Results, Theoretical Models, Auxiliary Procedures and Data, Reviews, and Books. Emphasis is placed on methods of carrying out measurements of carrier lifetime. Hence complete coverage was attempted and nearly two thirds of the entries appear in the first three categories. A large fraction of the papers listed describe the photoconductivity or photoconductive decay methods. The other most popular methods are based on diode characteristics or the photomagnetoelectric effect. In all, 35 methods for measuring carrier lifetime are represented by entries. In addition, representative papers which describe various models for recombination are included together with a number of papers which discuss the influence of surface recombination and trapping phenomena. Auxiliary procedures such as surface preparation, formation of ohmic contacts, control of temperature, and the like are described in some of the entries. Two indexes: a Key Word Index and an Author Index, are provided together with a classification of the various methods for measuring carrier lifetime. (Author).
Download or read book Photovoltaic Solar Energy written by Angèle Reinders and published by John Wiley & Sons. This book was released on 2017-02-06 with total page 755 pages. Available in PDF, EPUB and Kindle. Book excerpt: Solar PV is now the third most important renewable energy source, after hydro and wind power, in terms of global installed capacity. Bringing together the expertise of international PV specialists Photovoltaic Solar Energy: From Fundamentals to Applications provides a comprehensive and up-to-date account of existing PV technologies in conjunction with an assessment of technological developments. Key features: Written by leading specialists active in concurrent developments in material sciences, solar cell research and application-driven R&D. Provides a basic knowledge base in light, photons and solar irradiance and basic functional principles of PV. Covers characterization techniques, economics and applications of PV such as silicon, thin-film and hybrid solar cells. Presents a compendium of PV technologies including: crystalline silicon technologies; chalcogenide thin film solar cells; thin-film silicon based PV technologies; organic PV and III-Vs; PV concentrator technologies; space technologies and economics, life-cycle and user aspects of PV technologies. Each chapter presents basic principles and formulas as well as major technological developments in a contemporary context with a look at future developments in this rapidly changing field of science and engineering. Ideal for industrial engineers and scientists beginning careers in PV as well as graduate students undertaking PV research and high-level undergraduate students.
Download or read book Measurement of Carrier Lifetime in Semiconductors written by W. Murray Bullis and published by Forgotten Books. This book was released on 2018-09-11 with total page 70 pages. Available in PDF, EPUB and Kindle. Book excerpt: Excerpt from Measurement of Carrier Lifetime in Semiconductors: An Annotated Bibliography Covering the Period 1949-1967 A large fraction of the papers listed describe the photo conductivity or photoconductive decay methods. About the Publisher Forgotten Books publishes hundreds of thousands of rare and classic books. Find more at www.forgottenbooks.com This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.
Download or read book Measurement of Minority Carrier Lifetime in Silicon Crystals by the Photoconductive Decay Technique written by AR. Gerhard and published by . This book was released on 1980 with total page 10 pages. Available in PDF, EPUB and Kindle. Book excerpt: A Nd:YAG laser was used to produce excess minority carriers in large-diameter silicon single crystals. The rate of decay of these carriers was then used as a measure of the minority carrier recombination lifetime. The high photon fluxes available from the laser made possible measurements on material of medium resistivity, generally not measureable with traditional instrumentation. The present apparatus includes: a laser light source modulated electronically, a low-noise preamplifier, and sampling and averaging instrumentation. This permits resulting signals as low as a few microvolts to be easily read and interpreted. The system has measured material ranging in lifetime from 50 to 4000 ?s and represents a state-of-the-art approach to photoconductive decay measurements.
Download or read book Measurement of Semiconductor Minority Current Carrier Lifetimes by Observing the Photoconductive Decay of Spreading Resistance Under a Point Contact written by Shou-wu Wang and published by . This book was released on 1965 with total page 28 pages. Available in PDF, EPUB and Kindle. Book excerpt: A new method for measuring the lifetime of minority current carriers in semiconductors is described. Measurements are made by observing the photoconductive decay of the spreading resistance under a point contact. This method has the following advantages; (1) it is not necessary to cut the specimen to a special shape; (2) it is not necessary to make a fixed electrode for the specimen; (3) it is applicable for testing non-homogeneous specimens; (4) no particular surface treatment is necessary; (5) the apparatus used is simple and easy to operate; (6) the technique delivers sufficient accuracy. A theoretical analysis of the effects of surface recombination rate and varying absorption depth of light in the specimen is given. Experimental details and discussion are given for Ge and Si specimens. The results are in good agreement with those obtained by other methods. (Author).
Download or read book Lifetime Spectroscopy written by Stefan Rein and published by Springer Science & Business Media. This book was released on 2005-11-25 with total page 513 pages. Available in PDF, EPUB and Kindle. Book excerpt: Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy.
Download or read book Semiconductors Carrier Lifetime Measurement Using Photothermal Radiometry written by S. Amirhaghi and published by . This book was released on 1996 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Measurement of Minority Carrier Lifetimes in Semiconductors written by Y. Nishina and published by . This book was released on 1957 with total page 40 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book The Electrical Characterization of Semiconductors written by John Wilfred Orton and published by . This book was released on 1990 with total page 320 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is the first comprehensive and unified treatment to describe the physical principles behind experimental techniques used for measuring the electrical properties of semiconductors. The principles involved are illustrated by reference to selected examples drawn from the world of semiconductor materials. By concentrating on the physical principles of each technique and enumerating its inherent limitations the authors have produced a text that will be helpful in solving a variety of problems in semiconductor characterization and one that will not be quickly outdated by developments in the materials themselves. Emphasizes the physics and theory underlying the experimental characterization of semicondutors**Deals with the measurement of minority lifetimes and diffusion length**Discusses electrical and optical methods***INCLUDED IN PHYSICS TODAY, SEPT 90***INCLUDED IN MRS BULLETIN, NOVEMBER 90***INCLUDED IN JRNL OF VACUUM SCI, DECEMBER 90***INCLUDED IN PHYSICS TODAY, FEBRUARY 91
Download or read book Methods of Measurement for Semiconductor Materials Process Control and Devices written by United States. National Bureau of Standards and published by . This book was released on 1968-10 with total page 44 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Minority Carrier Lifetime Measurement in Silicon and Its Improvement with Annealing written by Nevand H. Godhwani and published by . This book was released on 1971 with total page 42 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Methods of Measurement for Semiconductor Materials Process Control and Devices written by W. Murray Bullis and published by . This book was released on 1969 with total page 52 pages. Available in PDF, EPUB and Kindle. Book excerpt:
