Download or read book Materials Reliability in Microelectronics IV written by Materials Research Society and published by Materials Research Society. This book was released on 1994-01-01 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Materials Reliability in Microelectronics IV written by Materials Research Society. Spring Meeting and published by . This book was released on 1994 with total page 666 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Materials Reliability in Microelectronics written by and published by . This book was released on 1999 with total page 392 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Materials Reliability in Microelectronics IV Volume 338 written by Peter Børgesen and published by Materials Research Society. This book was released on 1994-10-19 with total page 629 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Download or read book Materials Reliability in Microelectronics VI Volume 428 written by William F. Filter and published by . This book was released on 1996-11-18 with total page 616 pages. Available in PDF, EPUB and Kindle. Book excerpt: MRS books on materials reliability in microelectronics have become the snapshot of progress in this field. Reduced feature size, increased speed, and larger area are all factors contributing to the continual performance and functionality improvements in integrated circuit technology. These same factors place demands on the reliability of the individual components that make up the IC. Achieving increased reliability requires an improved understanding of both thin-film and patterned-feature materials properties and their degradation mechanisms, how materials and processes used to fabricate ICs interact, and how they may be tailored to enable reliability improvements. This book focuses on the physics and materials science of microelectronics reliability problems rather than the traditional statistical, accelerated electrical testing aspects. Studies are grouped into three large sections covering electromigration, gate oxide reliability and mechanical stress behavior. Topics include: historical summary; reliability issues for Cu metallization; characterization of electromigration phenomena; modelling; microstructural evolution and influences; oxide and device reliability; thin oxynitride dielectrics; noncontact diagnostics; stress effects in thin films and interconnects and microbeam X-ray techniques for stress measurements.

Download or read book Materials Reliability in Microelectronics written by and published by . This book was released on 1997 with total page 488 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Materials Reliability Issues in Microelectronics Volume 225 written by James R. Lloyd and published by Mrs Proceedings. This book was released on 1991-10-22 with total page 390 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Download or read book Materials Reliability Issues in Microelectronics written by and published by . This book was released on 1991 with total page 392 pages. Available in PDF, EPUB and Kindle. Book excerpt: Proceedings of the "MRS Symposium on Materials Reliability Issues in Microelectronics"--Dedication, p. xiii.

Download or read book Reliability of Organic Compounds in Microelectronics and Optoelectronics written by Willem Dirk van Driel and published by Springer Nature. This book was released on 2022-01-31 with total page 552 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book aims to provide a comprehensive reference into the critical subject of failure and degradation in organic materials, used in optoelectronics and microelectronics systems and devices. Readers in different industrial sectors, including microelectronics, automotive, lighting, oil/gas, and petrochemical will benefit from this book. Several case studies and examples are discussed, which readers will find useful to assess and mitigate similar failure cases. More importantly, this book presents methodologies and useful approaches in analyzing a failure and in relating a failure to the reliability of materials and systems.

Download or read book Materials Reliability in Microelectronics V Volume 391 written by Anthony S. Oates and published by . This book was released on 1995-10-24 with total page 552 pages. Available in PDF, EPUB and Kindle. Book excerpt: This long-standing proceedings series is highly regarded as a premier forum for the discussion of microelectronics reliability issues. In this fifth book, emphasis is on the fundamental understanding of failure phenomena in thin-film materials. Special attention is given to electromigration and mechanical stress effects. The reliability of thin dielectrics and hot carrier degradation of transistors are also featured. Topics include: modeling and simulation of failure mechanisms; reliability issues for submicron IC technologies and packaging; stresses in thin films/lines; gate oxides; barrier layers; electromigration mechanisms; reliability issues for Cu metallizations; electromigration and microstructure; electromigration and stress voiding in circuit interconnects; and resistance measurements of electromigration damage.

Download or read book Materials Reliability in Microelectronics VI written by and published by . This book was released on 1996 with total page 583 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Materials Reliability in Microelectronics written by Cynthia A. Volkert and published by . This book was released on 1999 with total page 311 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Materials Reliability in Microelectronics VIII written by John C. Bravman and published by . This book was released on 1998 with total page 392 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Materials Reliability in Microelectronics IX written by and published by . This book was released on 1999 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Materials Reliability in Microelectronics III written by Kenneth P. Rodbell and published by Cambridge University Press. This book was released on 2014-06-05 with total page 514 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Download or read book Materials Reliability in Microelectronics II Volume 265 written by C. V. Thompson and published by . This book was released on 1992-09-30 with total page 352 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Download or read book Materials Reliability in Microelectronics written by J. Joseph Clement and published by . This book was released on 1997 with total page 457 pages. Available in PDF, EPUB and Kindle. Book excerpt: