Download or read book Materials Characterisation 3 Volume Set written by Duncan W. Bruce and published by Wiley. This book was released on 2014-09-15 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: This new 3-volume set from the Inorganic Materials Series is made up of the three stand-alone volumes: Local Structural Characterisation; Multi Length-Scale Characterisation; and Structure from Diffraction Methods. Each volume contains five carefully chosen chapters which illustrate state-of-the-art techniques for materials characterisation. They emphasise the interplay of chemical synthesis and physical characterisation, and address spectroscopic, diffraction and surface techniques that examine the structure of materials on all length scales, from local atomic structure to long-range crystallographic order. Local Structural Characterisation covers: Solid State NMR Spectroscopy; X-Ray Absorption and Emission Spectroscopy; Neutrons and Neutron Spectroscopy; EPR Spectroscopy of Inorganic Materials and Analysis of Functional Materials by X-Ray Photoelectron Spectroscopy. Multi Length-Scale Characterisation contains: Measurement of Bulk Magnetic Properties; Thermal Methods; Atomic Force Microscopy; Gas Sorption in the Analysis of Nanoporous Solids and Dynamic Light Scattering. Structure from Diffraction Methods includes: Powder Diffraction; X-Ray and Neutron Single-Crystal Diffraction; PDF Analysis of Nanoparticles; Electron Crystallography and Small-Angle Scattering.

Download or read book Characterization of Materials written by John Wiley & Sons Inc and published by John Wiley & Sons. This book was released on 2002-10-15 with total page 1390 pages. Available in PDF, EPUB and Kindle. Book excerpt: "A thoroughly updated and expanded new edition, this work features a logical, detailed, and self-contained coverage of the latest materials characterization techniques. Reflecting the enormous progress in the field since the last edition, this book details a variety of new powerful and accessible tools, improvements in methods arising from new instrumentation and approaches to sample preparation, and characterization techniques for new types of materials, such as nanomaterials. Researchers in materials science and related fields will be able to identify and apply the most appropriate method in their work"--

Download or read book Encyclopedia of Materials Characterization written by Charles A. Evans and published by Gulf Professional Publishing. This book was released on 1992 with total page 784 pages. Available in PDF, EPUB and Kindle. Book excerpt: "This is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the series."--Knovel.

Download or read book Materials Characterization written by Yang Leng and published by John Wiley & Sons. This book was released on 2009-03-04 with total page 384 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.

Download or read book Characterization of Materials 3 Volume Set written by Elton N. Kaufmann and published by Wiley. This book was released on 2012-11-05 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: A thoroughly updated and expanded new edition, this work features a logical, detailed, and self-contained coverage of the latest materials characterization techniques. Reflecting the enormous progress in the field since the last edition, this book details a variety of new powerful and accessible tools, improvements in methods arising from new instrumentation and approaches to sample preparation, and characterization techniques for new types of materials, such as nanomaterials. Researchers in materials science and related fields will be able to identify and apply the most appropriate method in their work.

Download or read book Handbook of Materials Characterization written by Surender Kumar Sharma and published by Springer. This book was released on 2018-09-18 with total page 613 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book focuses on the widely used experimental techniques available for the structural, morphological, and spectroscopic characterization of materials. Recent developments in a wide range of experimental techniques and their application to the quantification of materials properties are an essential side of this book. Moreover, it provides concise but thorough coverage of the practical and theoretical aspects of the analytical techniques used to characterize a wide variety of functional nanomaterials. The book provides an overview of widely used characterization techniques for a broad audience: from beginners and graduate students, to advanced specialists in both academia and industry.

Download or read book Materials Characterization Techniques written by Sam Zhang and published by CRC Press. This book was released on 2008-12-22 with total page 344 pages. Available in PDF, EPUB and Kindle. Book excerpt: Experts must be able to analyze and distinguish all materials, or combinations of materials, in use today-whether they be metals, ceramics, polymers, semiconductors, or composites. To understand a material's structure, how that structure determines its properties, and how that material will subsequently work in technological applications, researche

Download or read book Materials Characterization Using Nondestructive Evaluation NDE Methods written by Gerhard Huebschen and published by Woodhead Publishing. This book was released on 2016-03-23 with total page 322 pages. Available in PDF, EPUB and Kindle. Book excerpt: Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures. Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries. Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress. Gives an overview of established and new NDT techniques, including scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques Reviews the determination of microstructural and mechanical properties Focuses on materials used in the automotive, aerospace, power plants, and infrastructure construction industries Serves as a highly desirable resource for both long-term monitoring and short-term assessment of materials

Download or read book Microstructural Characterization of Materials written by David Brandon and published by John Wiley & Sons. This book was released on 2013-03-21 with total page 517 pages. Available in PDF, EPUB and Kindle. Book excerpt: Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis. The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutions manual available at http://develop.wiley.co.uk/microstructural2e/ Microstructural Characterization of Materials, 2nd Edition will appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, who will find the book a useful and comprehensive general reference source.

Download or read book Semiconductor Material and Device Characterization written by Dieter K. Schroder and published by John Wiley & Sons. This book was released on 2015-06-29 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.

Download or read book Materials Characterization written by Naryanaswami (Mohan) Ranganathan and published by Pan Stanford. This book was released on 2015-08-31 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book highlights methods of characterizing material properties at nano, micro, and macro levels. Chapter 1 addresses nanaoindentation techniques comprehensively. Chapter 2 concerns polymer surface properties using nanoindentation techniques. Chapter 3 deals with the wear properties of dental composites. Chapter 4 compares global and local properties of a lead free solder. Chapter 5 discusses methods of determining plastic zones at the crack tip. Fatigue resistance of a synthetic polymer under different loading conditions is dealt with in Chapter 6. Chapter 7 is a review of methods of measuring fatigue crack growth resistance. Chapter 8 treats bulk and surface properties of coated materials. Chapter 9 presents a method for determining elastic constants using a resonance technique. This book gives a comprehensive state-of-the-art treatment to nanoindentation techniques and applications (four chapters cover metals, polymers, and rubber—novel applications such as creep and impact tests results at micro/nano level are considered). In fact Chapter 1 is a thorough analysis of this technique, its possibilities, and future developments. There are two chapters regarding corrosion and abrasion resistance of metals and dental composites and three chapters treating fatigue—one on rubber that highlights a hitherto unknown mechanism in a chloroprene rubber. There is one chapter on a very precise technique for modulus measurements up to 1200 °C.

Download or read book X ray Characterization of Materials written by Eric Lifshin and published by John Wiley & Sons. This book was released on 2008-07-11 with total page 277 pages. Available in PDF, EPUB and Kindle. Book excerpt: Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composition and crystal and grain structures of all types of materials. The challenge to the materials characterization expert is to understand how specific instruments and analytical techniques can provide detailed information about what makes each material unique. The challenge to the materials scientist, chemist, or engineer is to know what information is needed to fully characterize each material and how to use this information to explain its behavior, develop new and improved properties, reduce costs, or ensure compliance with regulatory requirements. This comprehensive handbook presents all the necessary background to understand the applications of X-ray analysis to materials characterization with particular attention to the modern approach to these methods.

Download or read book Characterisation Methods in Solid State and Materials Science written by Kelly Morrison and published by . This book was released on 2019 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents a comprehensive overview of the various characterisation techniques involved in solid state research. The generalised approach offers a deeper understanding of the benefits, drawbacks and overlap within different characterisation techniques. In particular, the book examines techniques within diffraction, microscopy and spectroscopy and discusses thermal, electric and magnetic characterisation.

Download or read book In situ Materials Characterization written by Alexander Ziegler and published by Springer Science & Business Media. This book was released on 2014-04-01 with total page 265 pages. Available in PDF, EPUB and Kindle. Book excerpt: The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical and x-ray microscopies (e.g. scanning, transmission and low-energy electron microscopy and scanning probe microscopy) or in the scattering realm with x-ray, neutron and electron diffraction.

Download or read book A Guide to Materials Characterization and Chemical Analysis written by John P. Sibilia and published by John Wiley & Sons. This book was released on 1996-12-17 with total page 404 pages. Available in PDF, EPUB and Kindle. Book excerpt: Written both for the novice and for the experienced scientist, this miniature encyclopedia concisely describes over one hundred materials methodologies, including evaluation, chemical analysis, and physical testing techniques. Each technique is presented in terms of its use, sample requirements, and the engineering principles behind its methodology. Real life industrial and academic applications are also described to give the reader an understanding of the significance and utilization of technique. There is also a discussion of the limitations of each technique.

Download or read book Materials Characterisation and Mechanism of Micro Cutting in Ultra Precision Diamond Turning written by Sandy Suet To and published by Springer. This book was released on 2017-05-23 with total page 269 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents an in-depth study and elucidation on the mechanisms of the micro-cutting process, with particular emphasis and a novel viewpoint on materials characterization and its influences on ultra-precision machining. Ultra-precision single point diamond turning is a key technology in the manufacture of mechanical, optical and opto-electronics components with a surface roughness of a few nanometers and form accuracy in the sub-micrometric range. In the context of subtractive manufacturing, ultra-precision diamond turning is based on the pillars of materials science, machine tools, modeling and simulation technologies, etc., making the study of such machining processes intrinsically interdisciplinary. However, in contrast to the substantial advances that have been achieved in machine design, laser metrology and control systems, relatively little research has been conducted on the material behavior and its effects on surface finish, such as the material anisotropy of crystalline materials. The feature of the significantly reduced depth of cut on the order of a few micrometers or less, which is much smaller than the average grain size of work-piece materials, unavoidably means that conventional metal cutting theories can only be of limited value in the investigation of the mechanisms at work in micro-cutting processes in ultra-precision diamond turning.

Download or read book Characterisation of Radiation Damage by Transmission Electron Microscopy written by M.L Jenkins and published by CRC Press. This book was released on 2000-11-21 with total page 233 pages. Available in PDF, EPUB and Kindle. Book excerpt: Characterization of Radiation Damage by Transmission Electron Microscopy details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. The book focuses on the methods used to characterize small point-defect clus