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Book Logic Synthesis for Concurrent Error Detection

Download or read book Logic Synthesis for Concurrent Error Detection written by Stanford University. Computer Systems Laboratory and published by . This book was released on 1993 with total page 30 pages. Available in PDF, EPUB and Kindle. Book excerpt: Abstract: "The structure of a circuit determines how the effects of a fault can propagate and hence affects the cost of concurrent error detection. By considering circuit structure during logic optimization, the overall cost of a concurrently checked circuit can be minimized. This report presents a new technique called structure-constrained logic optimization (SCLO) that optimizes a circuit under the constraint that faults in the resulting circuit can produce only a prescribed set of errors. Using SCLO, circuits can be optimized for various concurrent error detection schemes allowing the overall cost for each scheme to be compared. A technique for quickly estimating the size of a circuit under different structural constraints is described. This technique enables rapid exploration of the design space for concurrently checked circuits. A new method for the automated synthesis of self-checking circuit implementations for arbitrary combinational circuits is also presented. It consists of an algorithm that determines the best parity-check code for encoding the output of a given circuit, and then uses SCLO to produce the functional circuit which is augmented with a checker to form a self-checking circuit. This synthesis method provides fully automated design, explores a larger design space than other methods, and uses simple checkers. It has been implemented by making modifications to SIS (an updated version of MIS [Brayton 87a]), and results for several MCNC combinational benchmark circuits are given. In most cases, a substantial reduction in overhead compared to a duplicate-and-compare implementation is achieved."

Book Logic Synthesis Techniques for Reduced Area Implementation of Multilevel Circuits with Concurrent Error Detection

Download or read book Logic Synthesis Techniques for Reduced Area Implementation of Multilevel Circuits with Concurrent Error Detection written by Stanford University. Computer Systems Laboratory and published by . This book was released on 1994 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book New Methods of Concurrent Checking

Download or read book New Methods of Concurrent Checking written by Michael Gössel and published by Springer Science & Business Media. This book was released on 2008-04-26 with total page 186 pages. Available in PDF, EPUB and Kindle. Book excerpt: Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Internet connection, cell phone owners, hospital patients, inhabitants in the vicinity of a nuclear power station, students in a digital library or customers in a supermarket are dependent on their correct operation. Computers are incredibly fast, inexpensive and equipped with almost unimag- able large storage capacity. Up to 100 million transistors per chip are quite common today - a single transistor for each citizen of a large capital city in the world can be 2 easily accommodated on an ordinary chip. The size of such a chip is less than 1 cm . This is a fantastic achievement for an unbelievably low price. However, the very small and rapidly decreasing dimensions of the transistors and their connections over the years are also the reason for growing problems with reliability that will dramatically increase for the nano-technologies in the near future. Can we always trust computers? Are computers always reliable? Are chips suf- ciently tested with respect to all possible permanent faults if we buy them at a low price or have errors due to undetected permanent faults to be discovered by c- current checking? Besides permanent faults, many temporary or transient faults are also to be expected.

Book Design for Concurrent Error Detection in Storage logic Arrays

Download or read book Design for Concurrent Error Detection in Storage logic Arrays written by Marc David Spaulding and published by . This book was released on 1987 with total page 58 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Concurrent Error Detection in Arithmetic and Logic Units

Download or read book Concurrent Error Detection in Arithmetic and Logic Units written by Leona Yuk-Ye Fung and published by . This book was released on 1982 with total page 126 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Synthesis of Low cost Concurrent Error Detecting FSM

Download or read book Synthesis of Low cost Concurrent Error Detecting FSM written by Anita Chowdhry and published by . This book was released on 1993 with total page 212 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Computer Science Handbook

Download or read book Computer Science Handbook written by Allen B. Tucker and published by CRC Press. This book was released on 2004-06-28 with total page 2742 pages. Available in PDF, EPUB and Kindle. Book excerpt: When you think about how far and fast computer science has progressed in recent years, it's not hard to conclude that a seven-year old handbook may fall a little short of the kind of reference today's computer scientists, software engineers, and IT professionals need. With a broadened scope, more emphasis on applied computing, and more than 70 chap

Book Design for Concurrent Error Detection and Testability in Large Storage logic Arrays

Download or read book Design for Concurrent Error Detection and Testability in Large Storage logic Arrays written by Howard Victor Savin and published by . This book was released on 1988 with total page 68 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Automated Methods in Cryptographic Fault Analysis

Download or read book Automated Methods in Cryptographic Fault Analysis written by Jakub Breier and published by Springer. This book was released on 2019-03-19 with total page 342 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents a collection of automated methods that are useful for different aspects of fault analysis in cryptography. The first part focuses on automated analysis of symmetric cipher design specifications, software implementations, and hardware circuits. The second part provides automated deployment of countermeasures. The third part provides automated evaluation of countermeasures against fault attacks. Finally, the fourth part focuses on automating fault attack experiments. The presented methods enable software developers, circuit designers, and cryptographers to test and harden their products.

Book Design and Test Technology for Dependable Systems on chip

Download or read book Design and Test Technology for Dependable Systems on chip written by Raimund Ubar and published by IGI Global. This book was released on 2011-01-01 with total page 550 pages. Available in PDF, EPUB and Kindle. Book excerpt: "This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--

Book On Line Testing for VLSI

Download or read book On Line Testing for VLSI written by Michael Nicolaidis and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 152 pages. Available in PDF, EPUB and Kindle. Book excerpt: Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.

Book System on Chip Test Architectures

Download or read book System on Chip Test Architectures written by Laung-Terng Wang and published by Morgan Kaufmann. This book was released on 2010-07-28 with total page 893 pages. Available in PDF, EPUB and Kindle. Book excerpt: Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. - Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. - Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. - Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. - Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. - Practical problems at the end of each chapter for students.

Book                                  CRL

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  • Release : 2010
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Download or read book CRL written by and published by . This book was released on 2010 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Small and Medium Enterprises

Download or read book Small and Medium Enterprises written by Information Resources Management Association and published by IGI Global. This book was released on 2013-04-30 with total page 2031 pages. Available in PDF, EPUB and Kindle. Book excerpt: "This book provides a comprehensive collection of research on current technological developments and organizational perspectives on the scale of small and medium enterprises"--Provided by publisher.

Book Proceedings of the     ACM Great Lakes Symposium on VLSI

Download or read book Proceedings of the ACM Great Lakes Symposium on VLSI written by and published by . This book was released on 2007 with total page 636 pages. Available in PDF, EPUB and Kindle. Book excerpt: