Download or read book Iterative Cell Switch Design for Hybrid Redundancy written by Stanford University Stanford Electronics Laboratories and published by . This book was released on 1971 with total page 72 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Switch Designs for Hybrid Redundancy written by Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory and published by . This book was released on 1971 with total page 46 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Fault tolerance of the iterative cell array switch for hybrid redundancy through the use of failsafe logic written by Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory and published by . This book was released on 1973 with total page 80 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Self Checking and Fault Tolerant Digital Design written by Parag K. Lala and published by Morgan Kaufmann. This book was released on 2001 with total page 238 pages. Available in PDF, EPUB and Kindle. Book excerpt: With VLSI chip transistors getting smaller and smaller, today's digital systems are more complex than ever before. This increased complexity leads to more cross-talk, noise, and other sources of transient errors during normal operation. Traditional off-line testing strategies cannot guarantee detection of these transient faults. And with critical applications relying on faster, more powerful chips, fault-tolerant, self-checking mechanisms must be built in to assure reliable operation. Self-Checking and Fault-Tolerant Digital Design deals extensively with self-checking design techniques and is the only book that emphasizes major techniques for hardware fault tolerance. Graduate students in VLSI design courses as well as practicing designers will appreciate this balanced treatment of the concepts and theory underlying fault tolerance along with the practical techniques used to create fault-tolerant systems. Features: Introduces reliability theory and the importance of maintainability Presents coding and the construction of several error detecting and correcting codes Discusses in depth, the available techniques for fail-safe design of combinational circuits Details checker design techniques for detecting erroneous bits and encoding output of self-checking circuits Demonstrates how to design self-checking sequential circuits, including a technique for fail-safe state machine design
Download or read book Reliable Computer Systems written by Daniel P. Siewiorek and published by CRC Press. This book was released on 1998-12-15 with total page 908 pages. Available in PDF, EPUB and Kindle. Book excerpt: This classic reference work is a comprehensive guide to the design, evaluation, and use of reliable computer systems. It includes case studies of reliable systems from manufacturers, such as Tandem, Stratus, IBM, and Digital. It covers special systems such as the Galileo Orbiter fault protection system and AT&T telephone switching system processors
Download or read book Reliability analysis of hybrid redundant systems with nonperfect switches written by Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory and published by . This book was released on 1974 with total page 222 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Reliable Computer Systems written by Daniel Siewiorek and published by Digital Press. This book was released on 2014-06-28 with total page 929 pages. Available in PDF, EPUB and Kindle. Book excerpt: Enhance your hardware/software reliability Enhancement of system reliability has been a major concern of computer users and designers ¦ and this major revision of the 1982 classic meets users' continuing need for practical information on this pressing topic. Included are case studies of reliable systems from manufacturers such as Tandem, Stratus, IBM, and Digital, as well as coverage of special systems such as the Galileo Orbiter fault protection system and AT&T telephone switching processors.
Download or read book Advanced Simulation and Test Methodologies for VLSI Design written by G. Russell and published by Springer Science & Business Media. This book was released on 1989-02-28 with total page 406 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book T I S C A Technical Information Indexes written by United States. Naval Air Systems Command and published by . This book was released on 1975 with total page 122 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book VLSI Testing written by Stanley Leonard Hurst and published by IET. This book was released on 1998 with total page 560 pages. Available in PDF, EPUB and Kindle. Book excerpt: Hurst, an editor at the Microelectronics Journal, analyzes common problems that electronics engineers and circuit designers encounter while testing integrated circuits and the systems in which they are used, and explains a variety of solutions available for overcoming them in both digital and mixed circuits. Among his topics are faults in digital circuits, generating a digital test pattern, signatures and self-tests, structured design for testability, testing structured digital circuits and microprocessors, and financial aspects of testing. The self- contained reference is also suitable as a textbook in a formal course on the subject. Annotation copyrighted by Book News, Inc., Portland, OR
Download or read book 1972 International Symposium on Fault Tolerant Computing written by and published by . This book was released on 1972 with total page 242 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book The Evolution of Fault Tolerant Computing written by A. Avizienis and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 467 pages. Available in PDF, EPUB and Kindle. Book excerpt: For the editors of this book, as well as for many other researchers in the area of fault-tolerant computing, Dr. William Caswell Carter is one of the key figures in the formation and development of this important field. We felt that the IFIP Working Group 10.4 at Baden, Austria, in June 1986, which coincided with an important step in Bill's career, was an appropriate occasion to honor Bill's contributions and achievements by organizing a one day "Symposium on the Evolution of Fault-Tolerant Computing" in the honor of William C. Carter. The Symposium, held on June 30, 1986, brought together a group of eminent scientists from all over the world to discuss the evolu tion, the state of the art, and the future perspectives of the field of fault-tolerant computing. Historic developments in academia and industry were presented by individuals who themselves have actively been involved in bringing them about. The Symposium proved to be a unique historic event and these Proceedings, which contain the final versions of the papers presented at Baden, are an authentic reference document.
Download or read book The State of the Art from Device Testing to Reconfigurable Systems written by and published by . This book was released on 1973 with total page 198 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Technical Information Indexes written by and published by . This book was released on 1975 with total page 126 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Fault Tolerance of the Sequential Cell Array Switch for Hybrid Redundancy written by John Wen-chia Shen and published by . This book was released on 1974 with total page 76 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book A Highly Efficient Redundancy Scheme Self purging Redundancy written by Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory and published by . This book was released on 1975 with total page 86 pages. Available in PDF, EPUB and Kindle. Book excerpt: The goals of this paper are to present an efficient redundancy scheme for highly reliable systems, to give a method to compute the exact reliability of such schemes and to compare this scheme with other redundancy schemes. This redundancy scheme is self-purging redundancy; a scheme that uses a threshold voter and that purges the failed modules. Switches for self-purging systems are extremely simple: there is no replacement of failed modules and module purging is quite simply implemented. Because of switch simplicity, exact reliability calculations are possible. The effects of switch reliability are quantitatively examined. For short mission times, switch reliability is the most important factor: self-purging systems have a probability of failure several times larger than the figure obtained when switches are assumed to be perfect. The influence of the relative frequency of the diverse types of failures (permanent, intermittent, stuck-at,...) are also investigated. Reliability functions, mission time improvements and switch efficiency are displayed. Self-purging systems are compared with ot her redundant systems, like hybrid or NMR, for their relative merits in reliability gain, simplicity, cost and confidence in the reliability estimation. The high confidence in the reliability evaluation of self-purging systems makes them a standard for the validation of several models that have been proposed to take into account switch reliability. The accuracy of models using coverage factors can be evaluated that way.
Download or read book Semi annual Status Report No 122 January Through June 1972 written by Stanford University. Stanford Electronics Laboratories and published by . This book was released on 1972 with total page 176 pages. Available in PDF, EPUB and Kindle. Book excerpt:
