Download or read book Investigation of Variables Affecting Focused Ion Beam Milling as Applied to Specimen Preparation for Electron Microscopy written by Brenda I. Prenitzer and published by . This book was released on 1999 with total page 212 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Introduction to Focused Ion Beams written by Lucille A. Giannuzzi and published by Springer Science & Business Media. This book was released on 2006-05-18 with total page 362 pages. Available in PDF, EPUB and Kindle. Book excerpt: Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.
Download or read book FIB Nanostructures written by Zhiming M. Wang and published by Springer Science & Business Media. This book was released on 2014-01-04 with total page 536 pages. Available in PDF, EPUB and Kindle. Book excerpt: FIB Nanostructures reviews a range of methods, including milling, etching, deposition, and implantation, applied to manipulate structures at the nanoscale. Focused Ion Beam (FIB) is an important tool for manipulating the structure of materials at the nanoscale, and substantially extends the range of possible applications of nanofabrication. FIB techniques are widely used in the semiconductor industry and in materials research for deposition and ablation, including the fabrication of nanostructures such as nanowires, nanotubes, nanoneedles, graphene sheets, quantum dots, etc. The main objective of this book is to create a platform for knowledge sharing and dissemination of the latest advances in novel areas of FIB for nanostructures and related materials and devices, and to provide a comprehensive introduction to the field and directions for further research. Chapters written by leading scientists throughout the world create a fundamental bridge between focused ion beam and nanotechnology that is intended to stimulate readers' interest in developing new types of nanostructures for application to semiconductor technology. These applications are increasingly important for the future development of materials science, energy technology, and electronic devices. The book can be recommended for physics, electrical engineering, and materials science departments as a reference on materials science and device design.
Download or read book American Doctoral Dissertations written by and published by . This book was released on 1998 with total page 784 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book ISTFA 2019 Proceedings of the 45th International Symposium for Testing and Failure Analysis written by and published by ASM International. This book was released on 2019-12-01 with total page 540 pages. Available in PDF, EPUB and Kindle. Book excerpt: The theme for the 2019 conference is Novel Computing Architectures. Papers will include discussions on the advent of Artificial Intelligence and the promise of quantum computing that are driving disruptive computing architectures; Neuromorphic chip designs on one hand, and Quantum Bits on the other, still in R&D, will introduce new computing circuitry and memory elements, novel materials, and different test methodologies. These novel computing architectures will require further innovation which is best achieved through a collaborative Failure Analysis community composed of chip manufacturers, tool vendors, and universities.
Download or read book Dissertation Abstracts International written by and published by . This book was released on 1999 with total page 700 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Vacuum and Ultravacuum written by Igor Bello and published by CRC Press. This book was released on 2017-11-02 with total page 1036 pages. Available in PDF, EPUB and Kindle. Book excerpt: Vacuum technology has enormous impact on human life in many aspects and fields, such as metallurgy, material development and production, food and electronic industry, microelectronics, device fabrication, physics, materials science, space science, engineering, chemistry, technology of low temperature, pharmaceutical industry, and biology. All decorative coatings used in jewelries and various daily products—including shiny decorative papers, the surface finish of watches, and light fixtures—are made using vacuum technological processes. Vacuum analytical techniques and vacuum technologies are pillars of the technological processes, material synthesis, deposition, and material analyses—all of which are used in the development of novel materials, increasing the value of industrial products, controlling the technological processes, and ensuring the high product quality. Based on physical models and calculated examples, the book provides a deeper look inside the vacuum physics and technology.
Download or read book Modern Electron Microscopy in Physical and Life Sciences written by Milos Janecek and published by BoD – Books on Demand. This book was released on 2016-02-18 with total page 302 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book brings a broad review of recent global developments in theory, instrumentation, and practical applications of electron microscopy. It was created by 13 contributions from experts in different fields of electron microscopy and technology from over 20 research institutes worldwide.
Download or read book Analytical Techniques for Semiconductor Materials and Process Characterization 6 ALTECH 2009 written by Bernd O. Kolbesen and published by The Electrochemical Society. This book was released on 2009-09 with total page 479 pages. Available in PDF, EPUB and Kindle. Book excerpt: The proceedings of ALTECH 2009 address recent developments and applications of analytical techniques for semiconductor materials, processes and devices. The papers comprise techniques of elemental and structural analysis for bulk and surface impurities and defects, thin films as well as dopants in ultra-shallow junctions.
Download or read book Metrology and Diagnostic Techniques for Nanoelectronics written by Zhiyong Ma and published by CRC Press. This book was released on 2017-03-27 with total page 843 pages. Available in PDF, EPUB and Kindle. Book excerpt: Nanoelectronics is changing the way the world communicates, and is transforming our daily lives. Continuing Moore’s law and miniaturization of low-power semiconductor chips with ever-increasing functionality have been relentlessly driving R&D of new devices, materials, and process capabilities to meet performance, power, and cost requirements. This book covers up-to-date advances in research and industry practices in nanometrology, critical for continuing technology scaling and product innovation. It holistically approaches the subject matter and addresses emerging and important topics in semiconductor R&D and manufacturing. It is a complete guide for metrology and diagnostic techniques essential for process technology, electronics packaging, and product development and debugging—a unique approach compared to other books. The authors are from academia, government labs, and industry and have vast experience and expertise in the topics presented. The book is intended for all those involved in IC manufacturing and nanoelectronics and for those studying nanoelectronics process and assembly technologies or working in device testing, characterization, and diagnostic techniques.
Download or read book Focused Ion Beam Scanning Electron Microscopy Applied to Electrically Insulating Materials written by and published by . This book was released on 2015 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Correlative Light and Electron Microscopy IV written by and published by Academic Press. This book was released on 2021-03-09 with total page 452 pages. Available in PDF, EPUB and Kindle. Book excerpt: Correlative Light and Electron Microscopy IV, Volume 162, a new volume in the Methods in Cell Biology series, continues the legacy of this premier serial with quality chapters authored by leaders in the field. Besides the detailed description of protocols for CLEM technologies including time-resolution, Super resolution LM and Volume EM, new chapters cover Workflow (dis)-advantages/spiderweb, Serial section LM + EM, Platinum clusters as CLEM probes, Correlative Light Electron Microscopy with a transition metal complex as a single probe, SEM-TEM-SIMS, HPF-CLEM, A new workflow for high-throughput screening of mitotic mammalian cells for electron microscopy using classic histological dyes, and more. Contains contributions from experts in the field Covers topics using nano-SIMS and EDX for CLEM Presents recent advances and currently applied correlative approaches Gives detailed protocols, allowing for the application of workflows in one’s own laboratory setting Covers CLEM approaches in the context of specific applications Aims to stimulate the use of new combinations of imaging modalities
Download or read book Handbook of Sample Preparation for Scanning Electron Microscopy and X Ray Microanalysis written by Patrick Echlin and published by Springer Science & Business Media. This book was released on 2011-04-14 with total page 329 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of the incoming electrons go to ground. The formation of the image depends on collecting the different signals that are scattered as a consequence of the high energy beam interacting with the sample. Backscattered electrons and secondary electrons are generated within the primary beam-sample interactive volume and are the two principal signals used to form images. The backscattered electron coefficient ( ? ) increases with increasing atomic number of the specimen, whereas the secondary electron coefficient ( ? ) is relatively insensitive to atomic number. This fundamental diff- ence in the two signals can have an important effect on the way samples may need to be prepared. The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
Download or read book Three Dimensional Electron Microscopy written by and published by Academic Press. This book was released on 2019-07-18 with total page 303 pages. Available in PDF, EPUB and Kindle. Book excerpt: Three-Dimensional Electron Microscopy, Volume 152 in the Methods in Cell Biology series, highlights new advances in the field, with this new volume presenting interesting chapters focusing on FIB-SEM of mouse nervous tissue: fast and slow sample preparation, Serial-section electron microscopy using ATUM - Automated Tape collecting Ultra-Microtome, Software for automated acquisition of electron tomography tilt series, Scanning electron tomography of biological samples embedded in plastic, Cryo-STEM tomography for Biology, CryoCARE: Content-aware denoising of cryo-EM images and tomograms using artificial neural networks, Expedited large-volume 3-D SEM workflows for comparative vertebrate microanatomical imaging, and many other interesting topics. Provides the authority and expertise of leading contributors from an international board of authors Presents the latest release in the Methods in Cell Biology series Includes the latest information on the Three-Dimensional Electron Microscopy technique
Download or read book Principles and Practice of Variable Pressure Environmental Scanning Electron Microscopy VP ESEM written by Debbie Stokes and published by John Wiley & Sons. This book was released on 2008-12-22 with total page 247 pages. Available in PDF, EPUB and Kindle. Book excerpt: Offers a simple starting point to VPSEM, especially for new users, technicians and students containing clear, concise explanations Crucially, the principles and applications outlined in this book are completely generic: i.e. applicable to all types of VPSEM, irrespective of manufacturer. Information presented will enable reader to turn principles into practice Published in association with the Royal Microscopical Society (RMS) -www.rms.org.uk
Download or read book Wear of Materials written by Peter J. Blau and published by Elsevier. This book was released on 2003-10 with total page 1540 pages. Available in PDF, EPUB and Kindle. Book excerpt: The 14th International Conference on Wear of Materials took place in Washington, DC, USA, 30 March - 3 April 2003. These proceedings contain over two-hundred peer reviewed papers containing the best research, technical developments and engineering case studies from around the world. Biomaterials and nano-tribology receive special attention in this collection reflecting the general trends in the field. Further highlights include a focus on the new generation of instrumentation to probe wear at increasingly small scales. Approximately ninety communications and case studies, a popular format for the academic community have also been included, enabling the inclusion of the most up-to-date research. Over 200 peer-reviewed papers including hot topics such as biomaterials and nano-tribology Keeping you up-to-date with the latest research from leading experts Includes communications and case studies
Download or read book Scanning Microscopy for Nanotechnology written by Weilie Zhou and published by Springer Science & Business Media. This book was released on 2007-03-09 with total page 533 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.
