Download or read book Improved Electron Microscopy with Monte Carlo Simulations written by and published by . This book was released on 2005 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Monte Carlo Modeling for Electron Microscopy and Microanalysis written by David C. Joy and published by Oxford University Press. This book was released on 1995-04-13 with total page 225 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis. Computer programs for two basic types of Monte Carlo simulation are developed from physical models of the electron scattering process--a single scattering program capable of high accuracy but requiring long computation times, and a plural scattering program which is less accurate but much more rapid. Optimized for use on personal computers, the programs provide a real time graphical display of the interaction. The programs are then used as the starting point for the development of programs aimed at studying particular effects in the electron microscope, including backscattering, secondary electron production, EBIC and cathodo-luminescence imaging, and X-ray microanalysis. The computer code is given in a fully annotated format so that it may be readily modified for specific problems. Throughout, the author includes numerous examples of how such applications can be used. Students and professionals using electron microscopes will want to read this important addition to the literature.

Download or read book Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron Microscopy written by Kurt F. J. Heinrich and published by . This book was released on 1976 with total page 180 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Field Emission Scanning Electron Microscopy written by Nicolas Brodusch and published by Springer. This book was released on 2017-09-25 with total page 143 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage

Download or read book Monte Carlo Simulation in Electron Microscopy and Spectroscopy written by Vladimír Stary and published by . This book was released on 2011 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Monte-Carlo Simulation in Electron Microscopy and Spectroscopy.

Download or read book Advanced Computing in Electron Microscopy written by Earl J. Kirkland and published by Springer Science & Business Media. This book was released on 2010-08-12 with total page 289 pages. Available in PDF, EPUB and Kindle. Book excerpt: Preface to Second Edition Several new topics have been added, some small errors have been corrected and some new references have been added in this edition. New topics include aberration corrected instruments, scanning confocal mode of operations, Bloch wave eigenvalue methods and parallel computing techniques. The ?rst edition - cluded a CD with computer programs, which is not included in this edition. - stead the associated programs will be available on an associated web site (currently people.ccmr.cornell.edu/ ̃kirkland,but may move as time goes on). I wish to thank Mick Thomas for preparing the specimen used to record the image in Fig.5.26 and to thank Stephen P. Meisburger for suggesting an interesting biological specimen to use in Fig.7.24. Again, I apologize in advance for leaving out some undoubtedlyoutstanding r- erences. I also apologize for the as yet undiscovered errors that remain in the text. Earl J. Kirkland, December 2009 Preface to First Edition Image simulation has become a common tool in HREM (High Resolution El- tron Microscopy) in recent years. However, the literature on the subject is scattered among many different journals and conference proceedings that have occurred in the last two or three decades. It is dif?cult for beginners to get started in this ?eld.

Download or read book Modeling Nanoscale Imaging in Electron Microscopy written by Thomas Vogt and published by Springer Science & Business Media. This book was released on 2012-03-02 with total page 190 pages. Available in PDF, EPUB and Kindle. Book excerpt: Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.

Download or read book Monte Carlo Simulation of the Electron solid Interaction with Emphasis on Scanning Electron Microscopy written by David Roet and published by . This book was released on 2011 with total page 135 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Hydrodynamic Transport Simulations in Electron Microscopy written by Samantha Rudinsky and published by . This book was released on 2020 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: "This thesis describes the conception and development of a simulation method that models electron transport in an electron microscope using a hydrodynamic solution to the Schrödinger equation. Quantumtrajectories are computed from the electron wave function and map its evolution in real space. This wasused to simulate the transmission of an electron beam through a thin crystalline material as in an electronmicroscope. A simulation program was first developed in two dimensions to represent an electron beam incidenton a thin aluminum film. The electron beam was modelled by a Gaussian wave packet and propagationof the wave function through space was done by a time-dependent numerical solution, called the split-operator method. Quantum trajectories were computed from the resulting wave function using a spectraldecomposition and their evolution provided a real space representation of a variety of electron inducedphenomena. Differences in electron energy, beam tilt, and probe size were tested. In the first case, thetrajectories demonstrated the amount of backscattering as a function of electron energy. In the second,segregation of trajectories showed how electrons are diffracted in crystalline materials under ideal con-ditions. Finally, trajectories propagated from different initial probe diameters were used to evaluate themagnitude of beam broadening as a function of probe size. Atomic vibrations were then incorporated into the existing model to replicate the diffuse backgroundcommonly present in electron diffraction patterns, originating from thermal diffuse scattering (TDS). Acorrespondence was established between the magnitude of the diffuse background and material temper-ature. With a time-dependent propagation scheme, it was possible to calculate the spatial dispersion ofthe transmitted beam. It was established that modulations of the beam are highly affected by materialtemperature in both the transverse and longitudinal directions. The method was then extended to 3D,where simulations of single layer graphene were compared to experimental diffraction patterns acquiredat 2.5 keV. The geometries corresponded exactly and differences in intensity were explained through theprobe forming mechanisms of the experimental apparatus.The extension to 3D was developed further using the Bloch wave method to simulate electron propagation. Using a time-independent solution was done to improve efficiency and robustness of the code.The quantum trajectories could then be computed directly without the need of a spectral decomposition. Here, three different incident conditions were investigated: normal incidence, the two beam Braggcondition, and the systematic row. Electron channeling was explained through oscillations in the pathstaken by the trajectories and the influence of the quantum force around the atom columns. In the twobeam condition, trajectory segregation inside the material accurately represented Bragg diffraction andparallels were made between the current Bloch wave theory and the hydrodynamic interpretation. Finally, band contrast in the systematic row was explained through deviations in the calculated trajectories.As a final investigation into electron transport simulations, Monte Carlo simulations were used toestimate mass absorption coefficients (MAC) of low energy emitted X-rays. The study was done for avariety of aluminum alloys in order to isolate the phase contribution. Experimental data was obtainedin an electron microprobe using a soft X-ray emission spectrometer (SXES). The software MC X-raywas used to simulate X-ray depth distribution curves and MAC were calculated using a least squaresregression. Results demonstrated that for soft X-rays generated by outer shell ionizations, additionalparameters relating to Coster-Kronig yields and the higher order wave functions of the shell electronsmust be accounted for in the ionization cross-section"--

Download or read book Structure function Relationships in Semiconducting Polymers written by Luke Balhorn and published by . This book was released on 2022 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Improving knowledge of structure-function relationships in semiconducting polymers will help design new materials that unlock new applications. This work harnesses recent advances in transmission electron microscopy of soft materials to study length scales of microstructure in these materials that have previously been difficult to probe. Further, it combines electron microscopy with structural and charge transport simulations to study the effects of mesoscale defects on charge transport in highly ordered semicrystalline polymers. Spatially resolved nanodiffraction (4D-STEM) is used to create maps of chain direction and local order in conjugated polymers. Simulations are then built upon this experimental map, first by generating molecular geometries consistent with diffraction data, then by tracking the paths of test charges across the region. A case study in this combined method is conducted using the polymer PBTTT. Short-range charge transport is shown to be more chaotic than is often pictured, with the drift velocity accounting for a small portion of overall charge motion. Local transport is sensitive to the alignment and geometry of polymer chains. At longer length scales, the curves of this PBTTT microstructure funnel charges to specific regions, creating inhomogeneous charge distributions. While alignment generally improves mobility, these funneling effects limit the overall efficiency of charge transport. The structure is modified \textit{in silico} to explore possible design rules, showing chain stiffness and alignment to be beneficial while local homogeneity has no positive effect. These observations provide direct guidance for improving mesoscale structure for future materials.

Download or read book EMC 2008 written by Martina Luysberg and published by Springer Science & Business Media. This book was released on 2008-08-29 with total page 898 pages. Available in PDF, EPUB and Kindle. Book excerpt: Proceedings of the14th European Microscopy Congress, held in Aachen, Germany, 1-5 September 2008. Jointly organised by the European Microscopy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research Centre Jülich, the congress brings together scientists from Europe and from all over the world. The scientific programme covers all recent developments in the three major areas of instrumentation and methods, materials science and life science.

Download or read book Three Dimensional Electron Microscopy written by and published by Academic Press. This book was released on 2019-07-18 with total page 303 pages. Available in PDF, EPUB and Kindle. Book excerpt: Three-Dimensional Electron Microscopy, Volume 152 in the Methods in Cell Biology series, highlights new advances in the field, with this new volume presenting interesting chapters focusing on FIB-SEM of mouse nervous tissue: fast and slow sample preparation, Serial-section electron microscopy using ATUM - Automated Tape collecting Ultra-Microtome, Software for automated acquisition of electron tomography tilt series, Scanning electron tomography of biological samples embedded in plastic, Cryo-STEM tomography for Biology, CryoCARE: Content-aware denoising of cryo-EM images and tomograms using artificial neural networks, Expedited large-volume 3-D SEM workflows for comparative vertebrate microanatomical imaging, and many other interesting topics. Provides the authority and expertise of leading contributors from an international board of authors Presents the latest release in the Methods in Cell Biology series Includes the latest information on the Three-Dimensional Electron Microscopy technique

Download or read book ISTFA 2018 Proceedings from the 44th International Symposium for Testing and Failure Analysis written by and published by ASM International. This book was released on 2018-12-01 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: The International Symposium for Testing and Failure Analysis (ISTFA) 2018 is co-located with the International Test Conference (ITC) 2018, October 28 to November 1, in Phoenix, Arizona, USA at the Phoenix Convention Center. The theme for the November 2018 conference is "Failures Worth Analyzing." While technology advances fast and the market demands the latest and the greatest, successful companies strive to stay competitive and remain profitable.

Download or read book Methods for Reliability Improvement and Risk Reduction written by Michael Todinov and published by John Wiley & Sons. This book was released on 2018-12-10 with total page 286 pages. Available in PDF, EPUB and Kindle. Book excerpt: Reliability is one of the most important attributes for the products and processes of any company or organization. This important work provides a powerful framework of domain-independent reliability improvement and risk reducing methods which can greatly lower risk in any area of human activity. It reviews existing methods for risk reduction that can be classified as domain-independent and introduces the following new domain-independent reliability improvement and risk reduction methods: Separation Stochastic separation Introducing deliberate weaknesses Segmentation Self-reinforcement Inversion Reducing the rate of accumulation of damage Permutation Substitution Limiting the space and time exposure Comparative reliability models The domain-independent methods for reliability improvement and risk reduction do not depend on the availability of past failure data, domain-specific expertise or knowledge of the failure mechanisms underlying the failure modes. Through numerous examples and case studies, this invaluable guide shows that many of the new domain-independent methods improve reliability at no extra cost or at a low cost. Using the proven methods in this book, any company and organisation can greatly enhance the reliability of its products and operations.

Download or read book Advances in Imaging and Electron Physics written by Peter W. Hawkes and published by Elsevier. This book was released on 2011-07-29 with total page 263 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Download or read book Investigation of Variables Affecting Focused Ion Beam Milling as Applied to Specimen Preparation for Electron Microscopy written by Brenda I. Prenitzer and published by . This book was released on 1999 with total page 212 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Liquid Cell Electron Microscopy written by Frances M. Ross and published by Cambridge University Press. This book was released on 2017 with total page 529 pages. Available in PDF, EPUB and Kindle. Book excerpt: 2.6.2 Electrodes for Electrochemistry