Download or read book Implementation of a Testability Analysis Procedure for LSI VLSI Circuits written by Vijay J. Bhatt and published by . This book was released on 1988 with total page 210 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book A Method to Increase Testability of LSI VLSI Circuits written by Babak Nikoomanesh and published by . This book was released on 1986 with total page 150 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book The Implementation of a Complete Test Generation System for LSI VLSI Circuits written by Albers H. Wang and published by . This book was released on 1987 with total page 190 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book LSI VLSI Design for Testability Analysis and General Approach written by and published by . This book was released on 1982 with total page 131 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book LSI VLSI Testability Design written by Frank F. Tsui and published by McGraw-Hill Companies. This book was released on 1987 with total page 730 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book LSI Large Scale Integrated Design for Testability Final Report of Design Demonstration and Testability Analysis written by R. D. Groves and published by . This book was released on 1983 with total page 301 pages. Available in PDF, EPUB and Kindle. Book excerpt: The objective of this effort was to demonstrate IBM Level Sensitive Scan Design methodology as an approach for improving the testability of military LSI/VLSI circuits. LSSD was demonstrated in an LSI component AP101C test bed to be a viable and attractive design approach for military LSI/VLSI components. (Author).

Download or read book State of the Art Assessment of Testing and Testability of Custom LSI VLSI Circuits Volume VII Built In Testing BIT and Built In Test Equipment BITE written by Al J. Carlan and published by . This book was released on 1982 with total page 42 pages. Available in PDF, EPUB and Kindle. Book excerpt: Concurrent testing and nonconcurrent testing are the two major BIT techniques employed in VSLI circuit design; concurrent testing and nonconcurrent testing. concurrent testing allows circuit checkout during normal system; and may employ error detecting codes, self checking circuits, replication or electrical monitoring. Nonconcurrent testing requires a special test mode during which normal system operation is halted. Circuits must be added to generate the test patterns used during test mode. Circuits must be added to generate the test patterns used during test mode. Nonconcurrent testing is initiated by hardware implemented BITE or diagnostic software. (Author).

Download or read book State of the Art Assessment of Testing and Testability of Custom LSI VLSI Circuits Volume IV Test Generation written by M. A. Breuer and published by . This book was released on 1982 with total page 67 pages. Available in PDF, EPUB and Kindle. Book excerpt: Two major approaches are considered for generating tests for digital systems: methods based on detailed circuit models of the unit under test (UUT) and methods based primarily on a functional description of the UUT. In addition to test generation of general digital systems, the testing requirements of microprocessors, semiconductor memories and PLA are examined. The D-algorithm and several variants are discussed as a basis for practical test generation procedures. (Author).

Download or read book State of the Art Assessment of Testing and Testability of Custom LSI VLSI Circuits Volume V Design for Testability written by A. J. Carlan and published by . This book was released on 1982 with total page 68 pages. Available in PDF, EPUB and Kindle. Book excerpt: Designing for testability if needed to reduce costs associated with testing and maintaining electronic systems. Two approaches are considered: (1) modification of established circuits and (2) general design of new circuits where testability is a major consideration. Computer programs TMEAS and SCOAP, developed for evaluating testability in established circuits, are discussed. In the design of new circuits only a few techniques are known that yield highly testable circuits without sacrificing other desirable traits, two, IBM's LSSD method and bit slicing, are discussed. (Author).

Download or read book Tutorial VLSI Testing Validation Techniques written by Hassan K. Reghbati and published by . This book was released on 1985 with total page 630 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1994 with total page 892 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book State of the Art Assessment of Testing and Testability of Custom LSI VLSI Circuits Volume I Executive Summary written by M. A. Breuer and published by . This book was released on 1982 with total page 24 pages. Available in PDF, EPUB and Kindle. Book excerpt: This project is a two-phase study dealing with testing and testability of custom LSI/VLSI circuits. The tasks summarized and evaluated in this report consisted of compiling and documenting a survey and assessment of the state-of-the-art for each of seven topics. Each of these topics has resulted in a formal report and are listed below: Vol. 2: Hardware Design Verification; Vol. 3: Fault Mode Analysis; Vol. 4: Test Generation; Vol. 5: Design for Testability; Vol. 6: Redundancy, Testing Circuits, and Codes; Vol. 7: Built-in Testing (BIT) and Built-in Test Equipment (BITE); and Vol. 8: Fault Simulation.

Download or read book Computer Aided Procedure for Easily Testable LSI VLSI Circuits written by Neetha Hegde and published by . This book was released on 1991 with total page 108 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Tutorial Test Generation for VLSI Chips written by Vishwani D. Agrawal and published by IEEE Computer Society Press. This book was released on 1988 with total page 426 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book State of the Art Assessment of Testing and Testability of Custom LSI VLSI Circuits Volume III Fault Model Analysis written by M. A. Breuer and published by . This book was released on 1982 with total page 43 pages. Available in PDF, EPUB and Kindle. Book excerpt: Physical failure in LSI/VSLI circuits is highly dependent on the fabrication technology being used and result in a very complex faulty behavior. To reduce numbers and types of faults that must be handled for test generating and fault simulation, logic fault models are used. The most popular fault model is the single stuck line (SSL) which can emulate many common physical faults. Non-standard faults like short circuits are more difficult to model-usually require modification to the original circuit to allow use of SSL software. This approach is also ideal for handling Complementary Metal oxide Semiconductors faults. (Author).

Download or read book Advanced VLSI Design and Testability Issues written by Suman Lata Tripathi and published by CRC Press. This book was released on 2020-08-19 with total page 391 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book facilitates the VLSI-interested individuals with not only in-depth knowledge, but also the broad aspects of it by explaining its applications in different fields, including image processing and biomedical. The deep understanding of basic concepts gives you the power to develop a new application aspect, which is very well taken care of in this book by using simple language in explaining the concepts. In the VLSI world, the importance of hardware description languages cannot be ignored, as the designing of such dense and complex circuits is not possible without them. Both Verilog and VHDL languages are used here for designing. The current needs of high-performance integrated circuits (ICs) including low power devices and new emerging materials, which can play a very important role in achieving new functionalities, are the most interesting part of the book. The testing of VLSI circuits becomes more crucial than the designing of the circuits in this nanometer technology era. The role of fault simulation algorithms is very well explained, and its implementation using Verilog is the key aspect of this book. This book is well organized into 20 chapters. Chapter 1 emphasizes on uses of FPGA on various image processing and biomedical applications. Then, the descriptions enlighten the basic understanding of digital design from the perspective of HDL in Chapters 2–5. The performance enhancement with alternate material or geometry for silicon-based FET designs is focused in Chapters 6 and 7. Chapters 8 and 9 describe the study of bimolecular interactions with biosensing FETs. Chapters 10–13 deal with advanced FET structures available in various shapes, materials such as nanowire, HFET, and their comparison in terms of device performance metrics calculation. Chapters 14–18 describe different application-specific VLSI design techniques and challenges for analog and digital circuit designs. Chapter 19 explains the VLSI testability issues with the description of simulation and its categorization into logic and fault simulation for test pattern generation using Verilog HDL. Chapter 20 deals with a secured VLSI design with hardware obfuscation by hiding the IC’s structure and function, which makes it much more difficult to reverse engineer.

Download or read book An Introduction to Logic Circuit Testing written by Parag K. Lala and published by Springer Nature. This book was released on 2022-06-01 with total page 99 pages. Available in PDF, EPUB and Kindle. Book excerpt: An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References