Download or read book Imaging Nanoscale Electronic Inhomogeneity with Microwave Impedance Microscopy written by Worasom Kundhikanjana and published by . This book was released on 2013 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Ability to measure local dielectric constant and conductivity at nanoscale is desir- able for many research disciplines. Traditional transport measurements and many scanning probe techniques require ohmic contacts to the sample, which further com- plicates the sample preparation and is a low throughput process. Techniques based on high-frequency coupling is advantageous over these techniques since the measure- ments rely on the capacitive coupling between the tip and the sample. Among the high-frequency probes, near-field microwave microscopy sits on the sweet spot with the advantages from the high frequency coupling, but still maintains high contrast between metal and insulator. Implementing microwave microscopy technique is no trivial task. The first part of this thesis describes various engineering aspects during the developmental stage of our microwave microscopy, which we call microwave impedance microscope (MIM). We will begin with introduction to the principle of near-field microscopy, and follow by describing various components of MIIM. The second part of the thesis devotes to the study of nanoscale electronic inhomogeneity both at room temperature and low temperature. The room temperature works provide examples of application of MIM for nanoscale electrical characterization in nano graphene and semiconductor devices. The low temperature studies focus on the phase transition in pervoskite manganites and edge states of two-dimensional electron gas. In pervoskite manganites, we provide direct observation of the phase-separation and the glassy behavior of manganites. In the two-dimensional systems, we study the formation edge states during quantum Hall and quantum spin Hall effects. Finally, we concludes the thesis with plans for future developments and scientific problems.
Download or read book Nanoscale Electronic Inhomogeneity in In 2Se 3 Nanoribbons Revealed by Microwave Impedance Microscopy written by and published by . This book was released on 2010 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Driven by interactions due to the charge, spin, orbital, and lattice degrees of freedom, nanoscale inhomogeneity has emerged as a new theme for materials with novel properties near multiphase boundaries. As vividly demonstrated in complex metal oxides and chalcogenides, these microscopic phases are of great scientific and technological importance for research in hightemperature superconductors, colossal magnetoresistance effect, phase-change memories, and domain switching operations. Direct imaging on dielectric properties of these local phases, however, presents a big challenge for existing scanning probe techniques. Here, we report the observation of electronic inhomogeneity in indium selenide (In2Se3) nanoribbons by near-field scanning microwave impedance microscopy. Multiple phases with local resistivity spanning six orders of magnitude are identified as the coexistence of superlattice, simple hexagonal lattice and amorphous structures with (almost equal to)100nm inhomogeneous length scale, consistent with high-resolution transmission electron microscope studies. The atomic-force-microscope-compatible microwave probe is able to perform quantitative sub-surface electronic study in a noninvasive manner. Finally, the phase change memory function in In2Se3 nanoribbon devices can be locally recorded with big signal of opposite signs.
Download or read book Electrical Atomic Force Microscopy for Nanoelectronics written by Umberto Celano and published by Springer. This book was released on 2019-08-01 with total page 408 pages. Available in PDF, EPUB and Kindle. Book excerpt: The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). However, ultra-scaled semiconductor devices require nanometer control of the many parameters essential for their fabrication. Through the years, this created a strong alliance between microscopy techniques and IC manufacturing. This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development. The operation principles of many techniques are introduced, and the associated metrology challenges described. Blending the expertise of industrial specialists and academic researchers, the chapters are dedicated to various AFM methods and their impact on the development of emerging nanoelectronic devices. The goal is to introduce the major electrical AFM methods, following the journey that has seen our lives changed by the advent of ubiquitous nanoelectronics devices, and has extended our capability to sense matter on a scale previously inaccessible.
Download or read book Imaging Electromechanical Phenomena with Microwave Impedance Microscopy written by Lu Zheng (Ph. D.) and published by . This book was released on 2020 with total page 240 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electromechanics combines processes from electrical and mechanical systems and focuses on their interactions, which lead to wide applications in modern electronics. The observation of microscale and nanoscale electromechanical phenomena is critical for understanding the underlying physics and inspiring scientific and technological innovations. Near-field scanning microscopy is a promising tool that utilizes evanescent waves to detect local physical properties at a length scale much smaller than the far-field resolution limit. This dissertation demonstrates the discoveries of novel electromechanical phenomena revealed by microwave impedance microscopy (MIM) and shows the invention and application of new scanning microwave microscopy technique inspired by the discoveries. In this dissertation, I first introduce the development of near field scanning probe microscopy. In Chapter 2, I begin by reviewing the basic components and the system design of microwave impedance microscopy (MIM), followed by a description of data analysis and its main application - local conductivity mapping. I then elaborate its other applications in the following chapters, categorized by the different properties probed by the technique. Chapter 3 demonstrates the discovery of a unique phonon mode existing in the ferroelectric domain walls. Chapter 4 shows a novel electromechanical transduction phenomenon in the ferroelectric domains of LiNbO3. In Chapter 5, I present the invention of a new microwave microscopy technique, transmission-mode MIM (T-MIM), which can be used to visualize the microwave field directly and has achieved great success on mapping surface acoustic wave (SAW). I conclude the thesis in Chapter 6 with a summary of the published discoveries and an outlook of the ongoing projects and future plans in this area
Download or read book Electronics and Signal Processing written by Gang Zhang and published by Frontiers Media SA. This book was released on 2022-09-14 with total page 157 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Development and Applications of Microwave Impedance Microscopy for Imaging Emergent Properties in Quantum Materials written by Xiaoyu Wu (Ph. D.) and published by . This book was released on 2018 with total page 256 pages. Available in PDF, EPUB and Kindle. Book excerpt: Near-field scanning microwave microscopy (NSMM) detects local physical properties of materials through electromagnetic interaction between the tip and the sample at a length scale much smaller than the freespace wavelength of the microwave radiation. However, previous implementations of NSMM have suffered from poor resolutions, low sensitivity, and unreliable tip-sample contact conditions. In this dissertation, I will first briefly review the prior research of NSMM (Chapter 1) and then naturally move on to the main theme — the basic principles and technical details of the recently developed microwave impedance microscope (MIM) (Chapter 2). I will present the development of MIM instrumentation including quantitative measurement with tuning-fork-based probes, broadband impedance microcopy, and implementation in cryogenic environment (Chapter 3), which are utilized in research described in the following chapters. The application of MIM will be demonstrated by a number of scientific studies in two general categories, emergent phenomena at ferroelectric domain walls and electrical inhomogeneity in nanodevices. Chapter 4 describes the discovery of low-energy structural dynamics of ferroelectric domain walls in hexagonal rare-earth manganites (h-RMnO3) by broadband impedance microscopy. Chapter 5 includes direct visualization of sketched conductive nanostructures at the LaAlO3/SrTiO3 heterostructure and nanoscale conductance evolution in ion-gel-gated oxide transistors, demonstrating the capability of MIM to image buried structures. I will conclude the dissertation with a short summary and outlook for the future.
Download or read book Atomic Force Microscopy for Energy Research written by Cai Shen and published by CRC Press. This book was released on 2022-04-26 with total page 457 pages. Available in PDF, EPUB and Kindle. Book excerpt: Atomic force microscopy (AFM) can be used to analyze and measure the physical properties of all kinds of materials at nanoscale in the atmosphere, liquid phase, and ultra-high vacuum environment. It has become an important tool for nanoscience research. In this book, the basic principles of functional AFM techniques and their applications in energy materials—such as lithium-ion batteries, solar cells, and other energy-related materials—are addressed. FEATURES First book to focus on application of AFM for energy research Details the use of advanced AFM and addresses many types of functional AFM tools Enables readers to operate an AFM instrument successfully and to understand the data obtained Covers new achievements in AFM instruments, including electrochemical strain microscopy, and how AFM is being combined with other new methods such as infrared (IR) spectroscopy With its substantial content and logical structure, Atomic Force Microscopy for Energy Research is a valuable reference for researchers in materials science, chemistry, and physics who are working with AFM or planning to use it in their own fields of research, especially energy research.
Download or read book Modeling Nanoscale Imaging in Electron Microscopy written by Thomas Vogt and published by Springer Science & Business Media. This book was released on 2012-03-02 with total page 190 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents advances in nanoscale imaging capabilities of scanning transmission electron microscopes, along with superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.
Download or read book Seeing Through Walls at the Nanoscale written by and published by . This book was released on 2016 with total page 9 pages. Available in PDF, EPUB and Kindle. Book excerpt: Here, noninvasive in situ nanoscale imaging in liquid environments is a current imperative in the analysis of delicate biomedical objects and electrochemical processes at reactive liquid-solid interfaces. Microwaves of a few gigahertz frequencies offer photons with energies of ≈10 [mu]eV, which can affect neither electronic states nor chemical bonds in condensed matter. Here, we describe an implementation of scanning near-field microwave microscopy for imaging in liquids using ultrathin molecular impermeable membranes separating scanning probes from samples enclosed in environmental cells. We imaged a model electroplating reaction as well as individual live cells. Through a side-by-side comparison of the microwave imaging with scanning electron microscopy, we demonstrate the advantage of microwaves for artifact-free imaging.
Download or read book Imaging Competing Electronic Phases During Metal Insulator Transitions in Transition Metal Oxides Using Microwave Impedance Microscopy written by Ashish Gangshettiwar and published by . This book was released on 2022 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Metal-Insulator transitions are accompanied by huge resistivity changes, sometimes over ten orders of magnitude, and are widely observed in condensed-matter systems. Particularly important are the transitions driven by correlation effects associated with the electron-electron interaction. The insulating phase caused by the correlation effects is known as the Mott Insulator. Despite a long history of investigations, the driving force of the MIT and the exact nature of the ground state are still controversial. Using microwave impedance microscopy, we will study the coexisting metallic and insulating phases in different strongly correlated compounds which might carry important information on the transition in these materials. In this dissertation, I will begin by discussing Microwave Impedance Microscopy which will be the prime research tool used in the study of these materials. I will present the technical specifications of this tool and how it can be modified to be used on cryogenic setups, mainly, using tuning fork microscopy for topography feedback. The application of MIM to study Metal-Insulator Phase transitions in strongly correlated systems is demonstrated by studying doped Ruthenate oxides. Chapter 4 describes the insights gathered on Ti doped Bilayer Calcium Ruthenates which includes the discovery of a new stripe-phase at the MIT phase boundary. Followed by a chapter discussing the comparison with the MIT in Mn-doped bilayer Calcium ruthenate. I will conclude the dissertation with a short summary of our contribution to the field and an outlook where I would highlight the directions needed to pursue further research and come up with an overall picture of the phase transition in this class of material
Download or read book Imaging Photo carrier Dynamics and Correlated States in Two dimensional Semiconductors written by Zhaodong Chu and published by . This book was released on 2021 with total page 200 pages. Available in PDF, EPUB and Kindle. Book excerpt: Two-dimensional (2D) semiconducting transition-metal dichalcogenides (TMDs) exhibit remarkable electrical and optical properties, such as strong light-matter interaction and high photoresponsivity. Moreover, moiré superlattices composed of TMD offer a fantastic platform to manipulate the correlated quantum states of matter. A comprehensive understanding of photo-excited carrier dynamics and electronic correlation in TMDs and their heterostructures at nanoscale is critical for fundamental science and novel nano-electronic applications. This thesis presents several scientific advances that lead to the successful visualization of nanoscale photoconductivity distribution, defect-mediated photo-carrier dynamics, and correlated insulator states in 2D lattices. First, using light-illuminated microwave impedance microscopy (iMIM), I performed the intrinsic photoconductivity imaging in TMD materials and revealed many interesting results. For instance, we demonstrated that, due to the photo-excited carrier diffusion and confinement into the alloy region, the local photoconductivity in the alloy region could be tailored and enhanced by two orders of magnitude over pure WS2 in monolayer WS2/WS2 [subscript (1-x)] Se2 [subscript x] /WS2 lateral heterostructures. Secondly, to reveal the intrinsic time and length scales of photocarriers, I built iMIM and time-resolved iMIM in a helium-flow cryostat. The diffusion length and lifetime of photo-carrier were directly measured by performing spatiotemporal photoconductivity imaging. Time-resolved experiments indicate that the critical process for photo-carriers in TMD materials is the escape of holes from defect-induced trap states, which prolong the apparent lifetime of mobile electrons in the conduction band. Finally, I performed the nanoscale conductivity imaging of correlated electronic states in TMD moiré superlattices. The noncontact microwave probe allows us to observe the Mott insulating state at both hole-doped and electron-doped sides that persists for temperatures up to 150 K. Appreciable inhomogeneity of the correlated states is directly visualized in the hetero-bilayer region, indicative of local disorders in the moiré superlattice potential or electrostatic doping. These works provide essential insights into TMD-based optoelectronics and 2D correlated physics down to the microscopic level
Download or read book Developments in Surface Contamination and Cleaning Volume 12 written by Rajiv Kohli and published by Elsevier. This book was released on 2019-06-08 with total page 276 pages. Available in PDF, EPUB and Kindle. Book excerpt: Developments in Surface Contamination and Cleaning: Methods for Assessment and Verification of Cleanliness of Surfaces and Characterization of Surface Contaminants, Volume Twelve, the latest release in the Developments in Surface Contamination and Cleaning series, provides best practices on determining surface cleanliness. Chapters include an introduction to the nature and size of particles, a discussion of cleanliness levels, detailed coverage of measurement methods, characterization methods and analytical methods for evaluating surfaces, and an overview of analysis methods for various contaminants. As a whole, the series creates a unique and comprehensive knowledge base for those in research and development in a variety of industries. Manufacturing, quality control and procurement specification professionals in the aerospace, automotive, biomedical, defense, energy, manufacturing, microelectronics, optics and xerography industries will find this book to be very helpful. In addition, researchers in an academic setting will also find these volumes excellent source books. Includes an extensive listing, with a description of available methods for the assessment of surface cleanliness Provides a single source of information on methods for verification of surface cleanliness Serves as a guide to the selection, assessment and verification of methods for specific applications
Download or read book Materials Characterization Using Nondestructive Evaluation NDE Methods written by Gerhard Huebschen and published by Woodhead Publishing. This book was released on 2016-03-23 with total page 322 pages. Available in PDF, EPUB and Kindle. Book excerpt: Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures. Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries. Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress. Gives an overview of established and new NDT techniques, including scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques Reviews the determination of microstructural and mechanical properties Focuses on materials used in the automotive, aerospace, power plants, and infrastructure construction industries Serves as a highly desirable resource for both long-term monitoring and short-term assessment of materials
Download or read book Scanning Probe Microscopy written by Sergei V. Kalinin and published by Springer Science & Business Media. This book was released on 2007-04-03 with total page 1002 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs.
Download or read book Conductive Atomic Force Microscopy written by Mario Lanza and published by John Wiley & Sons. This book was released on 2017-12-04 with total page 382 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale. To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM. With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research.
Download or read book Nanoscale Science and Technology written by Robert Kelsall and published by John Wiley & Sons. This book was released on 2005-11-01 with total page 472 pages. Available in PDF, EPUB and Kindle. Book excerpt: Nanotechnology is a vital new area of research and development addressing the control, modification and fabrication of materials, structures and devices with nanometre precision and the synthesis of such structures into systems of micro- and macroscopic dimensions. Future applications of nanoscale science and technology include motors smaller than the diameter of a human hair and single-celled organisms programmed to fabricate materials with nanometer precision. Miniaturisation has revolutionised the semiconductor industry by making possible inexpensive integrated electronic circuits comprised of devices and wires with sub-micrometer dimensions. These integrated circuits are now ubiquitous, controlling everything from cars to toasters. The next level of miniaturisation, beyond sub-micrometer dimensions into nanoscale dimensions (invisible to the unaided human eye) is a booming area of research and development. This is a very hot area of research with large amounts of venture capital and government funding being invested worldwide, as such Nanoscale Science and Technology has a broad appeal based upon an interdisciplinary approach, covering aspects of physics, chemistry, biology, materials science and electronic engineering. Kelsall et al present a coherent approach to nanoscale sciences, which will be invaluable to graduate level students and researchers and practising engineers and product designers.
Download or read book Atomic Force Microscopy written by Peter Eaton and published by Oxford University Press. This book was released on 2010-03-25 with total page 257 pages. Available in PDF, EPUB and Kindle. Book excerpt: Atomic force microscopes are very important tools for the advancement of science and technology. This book provides an introduction to the microscopes so that scientists and engineers can learn both how to use them, and what they can do.
