Download or read book Information Technology written by Ricardo Reis and published by Springer Science & Business Media. This book was released on 2004-07-27 with total page 337 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains a selection of tutorials on hot topics in information technology, which were presented at the IFIP World Computer Congress. WCC2004 took place at the Centre de Congrès Pierre Baudis, in Toulouse, France, from 22 to 27 August 2004. The 11 chapters included in the book were chosen from tutorials proposals submitted to WCC2004. These papers report on several important and state-of-the-art topics on information technology such as: Quality of Service in Information Networks Risk-Driven Development of Security-Critical Systems Using UMLsec Developing Portable Software Formal Reasoning About Systems, Software and Hardware Using Functionals, Predicates and Relations The Problematic of Distributed Systems Supervision Software Rejuvenation - Modeling and Analysis Test and Design-for-Test of Mixed-Signal Integrated Circuits Web Services Applications of Multi-Agent Systems Discrete Event Simulation Human-Centered Automation We hereby would like to thank IFIP and more specifically WCC2004 Tutorials Committee and the authors for their contribution. We also would like to thank the congress organizers who have done a great job. Ricardo Reis Editor QUALITY OF SERVICE IN INFORMATION NETWORKS Augusto Casaca IST/INESC, R. Alves Redol, 1000-029, Lisboa, Portugal. Abstract: This article introduces the problems concerned with the provision of end-- end quality of service in IP networks, which are the basis of information networks, describes the existing solutions for that provision and presents some of the current research items on the subject. Key words: Information networks, IP networks, Integrated Services, Differentiated Services, Multiprotocol Label Switching, UMTS.
Download or read book IEEE Std 1149 4 1999 written by and published by . This book was released on 2000 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Microelectronic Failure Analysis Desk Reference written by and published by ASM International. This book was released on 2001-01-01 with total page 162 pages. Available in PDF, EPUB and Kindle. Book excerpt: Developed by the Electronic Device Failure Analysis Society (EDFAS) Publications Committee.
Download or read book IEEE Instrumentation and Measurement Technology Conferencer 1999 written by IEEE Instrumentation and Measurement Society and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 1999 with total page 672 pages. Available in PDF, EPUB and Kindle. Book excerpt: The conference will cover all aspects of theory and practice of metrology, measurement technologies, instrumentation, and related applications.
Download or read book Analog and Mixed Signal Boundary Scan written by Adam Osseiran and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 171 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains more than the IEEE Standard 1149.4. It also contains the thoughts of those who developed the standard. Adam Osseiran has edited the original writings of Brian Wilkins, Colin Maunder, Rod Tulloss, Steve Sunter, Mani Soma, Keith Lofstrom and John McDermid, all of whom have personally contributed to this standard. To preserve the original spirit, only minor changes were made, and the reader will sense a chapter-to-chapter variation in the style of expression. This may appear awkward to some, although I found the Iack of monotonicity refreshing. A system consists of a specific organization of parts. The function of the system cannot be performed by an individual part or even a disorganized collection ofthe same parts. Testing has a system-like characteristic. Testing of a system does not follow directly from the testing of its parts, and a system built with testable parts can sometimes be impossible to test. Therefore, testability of the system must be organized. Some years ago, the IEEE published the boundary-scan Standard 1149.1. That Standard provided an architecture for digital VLSI chips. The chips designed with the 1149.1 architecture can be integrated into a testable system. However, many systems today contain both analog and digital chips. Even if all digital chips are compliant with the standard, the testability of a mixed-signal system cannot be guaranteed. The new Standard 1149.4, described in this book, extends the previous architecture to mixed-signal systems.
Download or read book Proceedings of the IEEE Instrumentation and Measurement Technology Conference written by and published by . This book was released on 2004 with total page 874 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book IEEE Std 1450 1999 written by and published by . This book was released on 1999 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Design of Hardware Software Embedded Systems written by Eugenio Villar Bonet and published by Ed. Universidad de Cantabria. This book was released on 2001 with total page 180 pages. Available in PDF, EPUB and Kindle. Book excerpt: Este libro presenta los desafíos planteados por las nuevas y sumamente poderosas tecnologías de integración de sistemas electrónicos, que están en la base de los cambios sociales hacia lo que llaman la Sociedad de la Información; en la que los dispositivos electrónicos se harán una parte incorporada de la vida diaria, encajados en casi cada producto. Es necesario un conocimiento cuidadoso de los desafíos para aprovechar la amplia gama de ocasiones ofrecidas por tales capacidades de integración y las correspondientes posibilidades de diseño de sistemas electrónicos.
Download or read book Integrated Circuit Test Engineering written by Ian A. Grout and published by Springer Science & Business Media. This book was released on 2005-12-08 with total page 380 pages. Available in PDF, EPUB and Kindle. Book excerpt: Using the book and the software provided with it, the reader can build his/her own tester arrangement to investigate key aspects of analog-, digital- and mixed system circuits Plan of attack based on traditional testing, circuit design and circuit manufacture allows the reader to appreciate a testing regime from the point of view of all the participating interests Worked examples based on theoretical bookwork, practical experimentation and simulation exercises teach the reader how to test circuits thoroughly and effectively
Download or read book The Boundary Scan Handbook written by Kenneth P. Parker and published by Springer Science & Business Media. This book was released on 2007-05-08 with total page 307 pages. Available in PDF, EPUB and Kindle. Book excerpt: Boundary-Scan, formally known as IEEE/ANSI Standard 1149.1-1990, is a collection of design rules applied principally at the Integrated Circuit (IC) level that allow software to alleviate the growing cost of designing, producing and testing digital systems. A fundamental benefit of the standard is its ability to transform extremely difficult printed circuit board testing problems that could only be attacked with ad-hoc testing methods into well-structured problems that software can easily deal with. IEEE standards, when embraced by practicing engineers, are living entities that grow and change quickly. The Boundary-Scan Handbook, Second Edition: Analog and Digital is intended to describe these standards in simple English rather than the strict and pedantic legalese encountered in the standards. The 1149.1 standard is now over eight years old and has a large infrastructure of support in the electronics industry. Today, the majority of custom ICs and programmable devices contain 1149.1. New applications for the 1149.1 protocol have been introduced, most notably the `In-System Configuration' (ISC) capability for Field Programmable Gate Arrays (FPGAs). The Boundary-Scan Handbook, Second Edition: Analog and Digital updates the information about IEEE Std. 1149.1, including the 1993 supplement that added new silicon functionality and the 1994 supplement that formalized the BSDL language definition. In addition, the new second edition presents completely new information about the newly approved 1149.4 standard often termed `Analog Boundary-Scan'. Along with this is a discussion of Analog Metrology needed to make use of 1149.1. This forms a toolset essential for testing boards and systems of the future.
Download or read book Debugging Systems on Chip written by Bart Vermeulen and published by Springer. This book was released on 2014-07-14 with total page 314 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes an approach and supporting infrastructure to facilitate debugging the silicon implementation of a System-on-Chip (SOC), allowing its associated product to be introduced into the market more quickly. Readers learn step-by-step the key requirements for debugging a modern, silicon SOC implementation, nine factors that complicate this debugging task, and a new debug approach that addresses these requirements and complicating factors. The authors’ novel communication-centric, scan-based, abstraction-based, run/stop-based (CSAR) debug approach is discussed in detail, showing how it helps to meet debug requirements and address the nine, previously identified factors that complicate debugging silicon implementations of SOCs. The authors also derive the debug infrastructure requirements to support debugging of a silicon implementation of an SOC with their CSAR debug approach. This debug infrastructure consists of a generic on-chip debug architecture, a configurable automated design-for-debug flow to be used during the design of an SOC, and customizable off-chip debugger software. Coverage includes an evaluation of the efficiency and effectiveness of the CSAR approach and its supporting infrastructure, using six industrial SOCs and an illustrative, example SOC model. The authors also quantify the hardware cost and design effort to support their approach.
Download or read book System on Package written by Rao Tummala and published by McGraw Hill Professional. This book was released on 2007-07-22 with total page 807 pages. Available in PDF, EPUB and Kindle. Book excerpt: System-on-Package (SOP) is an emerging microelectronic technology that places an entire system on a single chip-size package. Where “systems” used to be bulky boxes housing hundreds of components, SOP saves interconnection time and heat generation by keep a full system with computing, communications, and consumer functions all in a single chip. Written by the Georgia Tech developers of the technology, this book explains the basic parameters, design functions, and manufacturing issues, showing electronic designers how this radical new packaging technology can be used to solve pressing electronics design challenges.
Download or read book Nanometer Technology Designs written by Nisar Ahmed and published by Springer Science & Business Media. This book was released on 2010-02-26 with total page 288 pages. Available in PDF, EPUB and Kindle. Book excerpt: Traditional at-speed test methods cannot guarantee high quality test results as they face many new challenges. Supply noise effects on chip performance, high test pattern volume, small delay defect test pattern generation, high cost of test implementation and application, and utilizing low-cost testers are among these challenges. This book discusses these challenges in detail and proposes new techniques and methodologies to improve the overall quality of the transition fault test.
Download or read book Advances in Computer Systems Architecture written by Lynn Choi and published by Springer Science & Business Media. This book was released on 2007-07-30 with total page 411 pages. Available in PDF, EPUB and Kindle. Book excerpt: The refereed proceedings of the 12th Asia-Pacific Computer Systems Architecture Conference are presented in this volume. Twenty-six full papers are presented together with two keynote and eight invited lectures. Collectively, they represent some of the most important developments in computer systems architecture. The papers emphasize hardware and software techniques for state-of-the-art, multi-core and multi-threaded architectures.
Download or read book Surface Impedance Boundary Conditions written by Sergey V. Yuferev and published by CRC Press. This book was released on 2018-09-03 with total page 412 pages. Available in PDF, EPUB and Kindle. Book excerpt: Surface Impedance Boundary Conditions is perhaps the first effort to formalize the concept of SIBC or to extend it to higher orders by providing a comprehensive, consistent, and thorough approach to the subject. The product of nearly 12 years of research on surface impedance, this book takes the mystery out of the largely overlooked SIBC. It provides an understanding that will help practitioners select, use, and develop these efficient modeling tools for their own applications. Use of SIBC has often been viewed as an esoteric issue, and they have been applied in a very limited way, incorporated in computation as an ad hoc means of simplifying the treatment for specific problems. Apply a Surface Impedance "Toolbox" to Develop SIBCs for Any Application The book not only outlines the need for SIBC but also offers a simple, systematic method for constructing SIBC of any order based on a perturbation approach. The formulation of the SIBC within common numerical techniques—such as the boundary integral equations method, the finite element method, and the finite difference method—is discussed in detail and elucidated with specific examples. Since SIBC are often shunned because their implementation usually requires extensive modification of existing software, the authors have mitigated this problem by developing SIBCs, which can be incorporated within existing software without system modification. The authors also present: Conditions of applicability, and errors to be expected from SIBC inclusion Analysis of theoretical arguments and mathematical relationships Well-known numerical techniques and formulations of SIBC A practical set of guidelines for evaluating SIBC feasibility and maximum errors their use will produce A careful mix of theory and practical aspects, this is an excellent tool to help anyone acquire a solid grasp of SIBC and maximize their implementation potential.
Download or read book Modern Nonparametric Robust and Multivariate Methods written by Klaus Nordhausen and published by Springer. This book was released on 2015-10-05 with total page 513 pages. Available in PDF, EPUB and Kindle. Book excerpt: Written by leading experts in the field, this edited volume brings together the latest findings in the area of nonparametric, robust and multivariate statistical methods. The individual contributions cover a wide variety of topics ranging from univariate nonparametric methods to robust methods for complex data structures. Some examples from statistical signal processing are also given. The volume is dedicated to Hannu Oja on the occasion of his 65th birthday and is intended for researchers as well as PhD students with a good knowledge of statistics.
Download or read book System on Chip Test Architectures written by Laung-Terng Wang and published by Morgan Kaufmann. This book was released on 2010-07-28 with total page 893 pages. Available in PDF, EPUB and Kindle. Book excerpt: Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. - Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. - Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. - Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. - Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. - Practical problems at the end of each chapter for students.
