Download or read book IEEE European Test Workshop 1997 written by European Test Workshop (2, 1997, Cagliari) and published by . This book was released on 1997 with total page 220 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book IEEE European Test Workshop 1997 written by IEEE Computer Society. Test Technology Technical Committee and published by . This book was released on 1997 with total page 214 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book European Test Workshop 1999 written by Hans-Joachim Wunderlich and published by IEEE Computer Society Press. This book was released on 1999 with total page 194 pages. Available in PDF, EPUB and Kindle. Book excerpt: Annotation This proceedings contains extended version of a selected subset of the contributions presented at the May 1999 IEEE workshop. The 27 papers share research and development (RandD) results in electronic testing. Topics include calculating efficient LFSR seeds for built-in self test, functional and structural testing of switched-current circuits, compaction of IDDQ test sequence using reassignment method, debug facilities in the TriMedia CPU64 architecture, deterministic BIST with partial scan, and using the BS register for capturing and storing n-bit sequences in real-time. Other papers address MEMs, switched capacitors, ATPG and fault modeling, fault simulation and fault coverage of analog circuits, FPGAs and regular arrays, and low power BIST. No subject index. Annotation copyrighted by Book News, Inc., Portland, OR.

Download or read book Computer Aided Systems Theory EUROCAST 97 written by Franz Pichler and published by Springer Science & Business Media. This book was released on 1997-11-05 with total page 644 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes a refereed post-workshop selection of papers presented at the 6th International Workshop on Computer-Aided Systems Theory, EUROCAST'97, held in Las Palmas de Gran Canaria, Spain, in February 1997. The 50 revised full papers presented were carefully selected for inclusion in the volume. The book is divided into sections on design environments and tools, theory and methods, engineering systems, intelligent systems, signal processing, and specific methods and applications.

Download or read book IEEE European Test Workshop Montpellier France June 12 14 1996 written by and published by . This book was released on 1996 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Evolutionary Image Analysis Signal Processing and Telecommunications written by Riccardo Poli and published by Springer. This book was released on 2006-10-11 with total page 235 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book consitutes the refereed joint proceedings of the First European Workshop on Evolutionary Computation in Image Analysis and Signal Processing, EvoIASP '99 and of the First European Workshop on Evolutionary Telecommunications, EuroEcTel '99, held in Göteborg, Sweden in May 1999. The 18 revised full papers presented were carefully reviewed and selected for inclusion in the volume. The book presents state-of-the-art research results applying techniques from evolutionary computing in the specific application areas.

Download or read book SOC System on a Chip Testing for Plug and Play Test Automation written by Krishnendu Chakrabarty and published by Springer Science & Business Media. This book was released on 2013-04-17 with total page 202 pages. Available in PDF, EPUB and Kindle. Book excerpt: System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.

Download or read book Special Issue on the IEEE European Test Workshop 2000 written by Paolo Prinetto and published by . This book was released on 2001 with total page 153 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Random Testing of Digital Circuits written by Rene David and published by CRC Press. This book was released on 2020-11-25 with total page 496 pages. Available in PDF, EPUB and Kindle. Book excerpt: "Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "

Download or read book Engineering Applications of Bio Inspired Artificial Neural Networks written by Jose Mira and published by Springer Science & Business Media. This book was released on 1999-05-19 with total page 942 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes, together with its compagnion LNCS 1606, the refereed proceedings of the International Work-Conference on Artificial and Neural Networks, IWANN'99, held in Alicante, Spain in June 1999. The 91 revised papers presented were carefully reviewed and selected for inclusion in the book. This volume is devoted to applications of biologically inspired artificial neural networks in various engineering disciplines. The papers are organized in parts on artificial neural nets simulation and implementation, image processing, and engineering applications.

Download or read book Special Issue on 2001 IEEE European Test Workshop written by and published by . This book was released on 2002 with total page 152 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Design of Systems on a Chip Design and Test written by Ricardo Reis and published by Springer Science & Business Media. This book was released on 2007-05-06 with total page 237 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is the second of two volumes addressing the design challenges associated with new generations of semiconductor technology. The various chapters are compiled from tutorials presented at workshops in recent years by prominent authors from all over the world. Technology, productivity and quality are the main aspects under consideration to establish the major requirements for the design and test of upcoming systems on a chip.

Download or read book DCIS2002 written by Salvador Bracho del Pino and published by Ed. Universidad de Cantabria. This book was released on 2002 with total page 756 pages. Available in PDF, EPUB and Kindle. Book excerpt: Este libro contiene las presentaciones de la XVII Conferencia de Diseño de Circuitos y Sistemas Integrados celebrado en el Palacio de la Magdalena, Santander, en noviembre de 2002. Esta Conferencia ha alcanzado un alto nivel de calidad, como consecuencia de su tradición y madurez, que lo convierte en uno de los acontecimientos más importantes para los circuitos de microelectrónica y la comunidad de diseño de sistemas en el sur de Europa. Desde su origen tiene una gran contribución de Universidades españolas, aunque hoy los autores participan desde catorce países

Download or read book Design and Test Technology for Dependable Systems on chip written by Raimund Ubar and published by IGI Global. This book was released on 2011-01-01 with total page 550 pages. Available in PDF, EPUB and Kindle. Book excerpt: "This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--

Download or read book On Line Testing for VLSI written by Michael Nicolaidis and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 152 pages. Available in PDF, EPUB and Kindle. Book excerpt: Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.

Download or read book Nanometer Technology Designs written by Nisar Ahmed and published by Springer Science & Business Media. This book was released on 2010-02-26 with total page 288 pages. Available in PDF, EPUB and Kindle. Book excerpt: Traditional at-speed test methods cannot guarantee high quality test results as they face many new challenges. Supply noise effects on chip performance, high test pattern volume, small delay defect test pattern generation, high cost of test implementation and application, and utilizing low-cost testers are among these challenges. This book discusses these challenges in detail and proposes new techniques and methodologies to improve the overall quality of the transition fault test.

Download or read book Integrated Circuit Test Engineering written by Ian A. Grout and published by Springer Science & Business Media. This book was released on 2005-08-22 with total page 396 pages. Available in PDF, EPUB and Kindle. Book excerpt: Using the book and the software provided with it, the reader can build his/her own tester arrangement to investigate key aspects of analog-, digital- and mixed system circuits Plan of attack based on traditional testing, circuit design and circuit manufacture allows the reader to appreciate a testing regime from the point of view of all the participating interests Worked examples based on theoretical bookwork, practical experimentation and simulation exercises teach the reader how to test circuits thoroughly and effectively