Download or read book Hybrid Code Based Test Data Compression and Decompression for VLSI Circuits written by Kalamani Chinnappa Gounder and published by GRIN Verlag. This book was released on 2018-06-27 with total page 217 pages. Available in PDF, EPUB and Kindle. Book excerpt: Doctoral Thesis / Dissertation from the year 2018 in the subject Computer Science - Applied, grade: 6, Anna University, course: PhD, language: English, abstract: Test data compression is an effective method for reducing test data volume and memory requirement with relatively small cost. An effective test structure for embedded hard cores is easy to implement and it is also capable of producing high-quality tests as part of the design flow. The purpose of Test data compression intends to reduce Test data volume by using Test Stimulus Compression such as Code-based schemes, Linear-decompression-based schemes and Broadcast-scan-based schemes. The research work addresses the problem of the test data volume and memory requirements. The primary objective of this study is to introduce novel techniques that improve the compression ratio by reducing test data volume during at-speed test in scan designs. This in turn diminishes the tester memory requirement and hence chip area is reduced for Built-in-Self Test environment. The aim of this research is to introduce various compression algorithms by combining the existing data compression techniques. The algorithms are designed to reduce the volume of test patterns of input that is essential to guarantee an acceptable level of fault coverage which is a key parameter to evaluate the quality of testing.

Download or read book Power Constrained Testing of VLSI Circuits written by Nicola Nicolici and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 182 pages. Available in PDF, EPUB and Kindle. Book excerpt: This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.

Download or read book VLSI Test Principles and Architectures written by Laung-Terng Wang and published by Elsevier. This book was released on 2006-08-14 with total page 809 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-date coverage of design for testability. - Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. - Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

Download or read book Proceedings International Symposium on VLSI Design written by and published by . This book was released on 2005 with total page 938 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Digital Core Output Test Data Compression Architecture Based on Switching Theory Concepts written by Mansour Hanna Assaf and published by . This book was released on 2003 with total page 432 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book GLSVLSI 2002 written by ACM Great Lakes Symposium on VLSI and published by . This book was released on 2002 with total page 200 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Test Data Compression and Decompression Techniques for System on a chip written by Anshuman Chandra and published by . This book was released on 2000 with total page 184 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Trustworthy Computing written by Mehmet Sahinoglu and published by John Wiley & Sons. This book was released on 2007-07-09 with total page 344 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is based on the author's advanced undergraduate or beginning graduate course, Computer Security and Reliability, which he has been teaching for the past six years. The author takes an index based quantitative approach to the subject as opposed to the usual verbal or qualitative or subjective case histories. The TWC-Solver, available on an accompanying CD-ROM, contains 10 java-coded, main applications and hundreds of subitems, and assists the reader in understanding the numerical implementations of the book chapters.

Download or read book Asian Test Symposium written by and published by . This book was released on 2005 with total page 526 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Design and Implementation of VLSI Chip for LZ based Data Compression written by Michael F. Sullivan and published by . This book was released on 1992 with total page 228 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book IEEE VLSI Test Symposium written by and published by . This book was released on 2003 with total page 474 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Test Compaction Technique for Built in Self test in VLSI Circuits written by Thanh Huong Ho and published by . This book was released on 1994 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: In recent years, many test output data compression techniques have been introduced, which reduce the storage requirements of reference signatures for the circuit under test. A major problem, however, is that the compression always results in loss of error coverage. This work proposes a space compression technique for digital circuits with the objective of minimizing the storage for the circuits under test while maintaining the fault coverage information. The technique introduced is called a Modified Dynamic Space Compression method. For a circuit under test, a compaction tree is generated based on its structure. The detectable error probability was calculated by using the Boolean Difference Method. The output data modification was employed to minimize the number of faulty output data patterns which have the same compressed form as the fault free patterns. The compressed outputs were then fed into a syndrome counter to derive the signature for the circuit. A design program is written in C language and executed on PC which combines the space compression, output data modification, and faults testing. Simulations were performed on known combinational circuits and the results indicate that the loss in fault coverage caused by compression is rather small.

Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1995 with total page 464 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book 17th IEEE VLSI Test Symposium written by and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 1999 with total page 534 pages. Available in PDF, EPUB and Kindle. Book excerpt: The theme of the April 1999 symposium Scaling deeper to submicron: test technology challenges reflects the issues being created by the move toward nanometer technologies. Many creative and novel ideas and approaches to the current and future electronic circuit testing-related problems are explored

Download or read book System on Chip Test Architectures written by Laung-Terng Wang and published by Morgan Kaufmann. This book was released on 2010-07-28 with total page 893 pages. Available in PDF, EPUB and Kindle. Book excerpt: Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. - Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. - Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. - Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. - Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. - Practical problems at the end of each chapter for students.

Download or read book The H 264 Advanced Video Compression Standard written by Iain E. Richardson and published by John Wiley & Sons. This book was released on 2011-08-24 with total page 357 pages. Available in PDF, EPUB and Kindle. Book excerpt: H.264 Advanced Video Coding or MPEG-4 Part 10 is fundamental to a growing range of markets such as high definition broadcasting, internet video sharing, mobile video and digital surveillance. This book reflects the growing importance and implementation of H.264 video technology. Offering a detailed overview of the system, it explains the syntax, tools and features of H.264 and equips readers with practical advice on how to get the most out of the standard. Packed with clear examples and illustrations to explain H.264 technology in an accessible and practical way. Covers basic video coding concepts, video formats and visual quality. Explains how to measure and optimise the performance of H.264 and how to balance bitrate, computation and video quality. Analyses recent work on scalable and multi-view versions of H.264, case studies of H.264 codecs and new technological developments such as the popular High Profile extensions. An invaluable companion for developers, broadcasters, system integrators, academics and students who want to master this burgeoning state-of-the-art technology. "[This book] unravels the mysteries behind the latest H.264 standard and delves deeper into each of the operations in the codec. The reader can implement (simulate, design, evaluate, optimize) the codec with all profiles and levels. The book ends with extensions and directions (such as SVC and MVC) for further research." Professor K. R. Rao, The University of Texas at Arlington, co-inventor of the Discrete Cosine Transform

Download or read book Digital Integrated Circuit Design written by Hubert Kaeslin and published by Cambridge University Press. This book was released on 2008-04-28 with total page 878 pages. Available in PDF, EPUB and Kindle. Book excerpt: This practical, tool-independent guide to designing digital circuits takes a unique, top-down approach, reflecting the nature of the design process in industry. Starting with architecture design, the book comprehensively explains the why and how of digital circuit design, using the physics designers need to know, and no more.