Download or read book Hardening Electronic Devices Against Very High Total Dose Radiation Environments written by and published by . This book was released on 1972 with total page 6 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Seeing Photons written by National Research Council and published by National Academies Press. This book was released on 2010-09-28 with total page 194 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Department of Defense recently highlighted intelligence, surveillance, and reconnaissance (ISR) capabilities as a top priority for U.S. warfighters. Contributions provided by ISR assets in the operational theaters in Iraq and Afghanistan have been widely documented in press reporting. While the United States continues to increase investments in ISR capabilities, other nations not friendly to the United States will continue to seek countermeasures to U.S. capabilities. The Technology Warning Division of the Defense Intelligence Agency's (DIA) Defense Warning Office (DWO) has the critical responsibility, in collaborations with other components of the intelligence community (IC), for providing U.S. policymakers insight into technological developments that may impact future U.S. warfighting capabilities. To this end, the IC requested that the National Research Council (NRC) investigate and report on key visible and infrared detector technologies, with potential military utility, that are likely to be developed in the next 10-15 years. This study is the eighth in a series sponsored by the DWO and executed under the auspices of the NRC TIGER (Technology Insight-Gauge, Evaluate, and Review) Standing Committee.
Download or read book Fundamentals of Nuclear Hardening of Electronic Equipment written by L. W. Ricketts and published by John Wiley & Sons. This book was released on 1972 with total page 598 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Integrated Circuit Design for Radiation Environments written by Stephen J. Gaul and published by John Wiley & Sons. This book was released on 2019-12-03 with total page 392 pages. Available in PDF, EPUB and Kindle. Book excerpt: A practical guide to the effects of radiation on semiconductor components of electronic systems, and techniques for the designing, laying out, and testing of hardened integrated circuits This book teaches the fundamentals of radiation environments and their effects on electronic components, as well as how to design, lay out, and test cost-effective hardened semiconductor chips not only for today’s space systems but for commercial terrestrial applications as well. It provides a historical perspective, the fundamental science of radiation, and the basics of semiconductors, as well as radiation-induced failure mechanisms in semiconductor chips. Integrated Circuits Design for Radiation Environments starts by introducing readers to semiconductors and radiation environments (including space, atmospheric, and terrestrial environments) followed by circuit design and layout. The book introduces radiation effects phenomena including single-event effects, total ionizing dose damage and displacement damage) and shows how technological solutions can address both phenomena. Describes the fundamentals of radiation environments and their effects on electronic components Teaches readers how to design, lay out and test cost-effective hardened semiconductor chips for space systems and commercial terrestrial applications Covers natural and man-made radiation environments, space systems and commercial terrestrial applications Provides up-to-date coverage of state-of-the-art of radiation hardening technology in one concise volume Includes questions and answers for the reader to test their knowledge Integrated Circuits Design for Radiation Environments will appeal to researchers and product developers in the semiconductor, space, and defense industries, as well as electronic engineers in the medical field. The book is also helpful for system, layout, process, device, reliability, applications, ESD, latchup and circuit design semiconductor engineers, along with anyone involved in micro-electronics used in harsh environments.
Download or read book Radiation Tolerant Electronics written by Paul Leroux and published by MDPI. This book was released on 2019-08-26 with total page 210 pages. Available in PDF, EPUB and Kindle. Book excerpt: Research on radiation-tolerant electronics has increased rapidly over the past few years, resulting in many interesting approaches to modeling radiation effects and designing radiation-hardened integrated circuits and embedded systems. This research is strongly driven by the growing need for radiation-hardened electronics for space applications, high-energy physics experiments such as those on the Large Hadron Collider at CERN, and many terrestrial nuclear applications including nuclear energy and nuclear safety. With the progressive scaling of integrated circuit technologies and the growing complexity of electronic systems, their susceptibility to ionizing radiation has raised many exciting challenges, which are expected to drive research in the coming decade. In this book we highlight recent breakthroughs in the study of radiation effects in advanced semiconductor devices, as well as in high-performance analog, mixed signal, RF, and digital integrated circuits. We also focus on advances in embedded radiation hardening in both FPGA and microcontroller systems and apply radiation-hardened embedded systems for cryptography and image processing, targeting space applications.
Download or read book Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices written by Ronald D Schrimpf and published by World Scientific. This book was released on 2004-07-29 with total page 349 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.
Download or read book Testing at the Speed of Light written by National Academies of Sciences, Engineering, and Medicine and published by National Academies Press. This book was released on 2018-06-08 with total page 89 pages. Available in PDF, EPUB and Kindle. Book excerpt: Spacecraft depend on electronic components that must perform reliably over missions measured in years and decades. Space radiation is a primary source of degradation, reliability issues, and potentially failure for these electronic components. Although simulation and modeling are valuable for understanding the radiation risk to microelectronics, there is no substitute for testing, and an increased use of commercial-off-the- shelf parts in spacecraft may actually increase requirements for testing, as opposed to simulation and modeling. Testing at the Speed of Light evaluates the nation's current capabilities and future needs for testing the effects of space radiation on microelectronics to ensure mission success and makes recommendations on how to provide effective stewardship of the necessary radiation test infrastructure for the foreseeable future.
Download or read book Radiation Effects on Integrated Circuits and Systems for Space Applications written by Raoul Velazco and published by Springer. This book was released on 2019-04-10 with total page 401 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides readers with invaluable overviews and updates of the most important topics in the radiation-effects field, enabling them to face significant challenges in the quest for the insertion of ever-higher density and higher performance electronic components in satellite systems. Readers will benefit from the up-to-date coverage of the various primary (classical) sub-areas of radiation effects, including the space and terrestrial radiation environments, basic mechanisms of total ionizing dose, digital and analog single-event transients, basic mechanisms of single-event effects, system-level SEE analysis, device-level, circuit-level and system-level hardening approaches, and radiation hardness assurance. Additionally, this book includes in-depth discussions of several newer areas of investigation, and current challenges to the radiation effects community, such as radiation hardening by design, the use of Commercial-Off-The-Shelf (COTS) components in space missions, CubeSats and SmallSats, the use of recent generation FPGA’s in space, and new approaches for radiation testing and validation. The authors provide essential background and fundamentals, in addition to information on the most recent advances and challenges in the sub-areas of radiation effects. Provides a concise introduction to the fundamentals of radiation effects, latest research results, and new test methods and procedures; Discusses the radiation effects and mitigation solutions for advanced integrated circuits and systems designed to operate in harsh radiation environments; Includes coverage of the impact of Small Satellites in the space industry.
Download or read book Ionizing Radiation Effects in Electronics written by Marta Bagatin and published by CRC Press. This book was released on 2018-09-03 with total page 394 pages. Available in PDF, EPUB and Kindle. Book excerpt: Ionizing Radiation Effects in Electronics: From Memories to Imagers delivers comprehensive coverage of the effects of ionizing radiation on state-of-the-art semiconductor devices. The book also offers valuable insight into modern radiation-hardening techniques. The text begins by providing important background information on radiation effects, their underlying mechanisms, and the use of Monte Carlo techniques to simulate radiation transport and the effects of radiation on electronics. The book then: Explains the effects of radiation on digital commercial devices, including microprocessors and volatile and nonvolatile memories—static random-access memories (SRAMs), dynamic random-access memories (DRAMs), and Flash memories Examines issues like soft errors, total dose, and displacement damage, together with hardening-by-design solutions for digital circuits, field-programmable gate arrays (FPGAs), and mixed-analog circuits Explores the effects of radiation on fiber optics and imager devices such as complementary metal-oxide-semiconductor (CMOS) sensors and charge-coupled devices (CCDs) Featuring real-world examples, case studies, extensive references, and contributions from leading experts in industry and academia, Ionizing Radiation Effects in Electronics: From Memories to Imagers is suitable both for newcomers who want to become familiar with radiation effects and for radiation experts who are looking for more advanced material or to make effective use of beam time.
Download or read book Ionizing Radiation Effects in MOS Devices and Circuits written by T. P. Ma and published by John Wiley & Sons. This book was released on 1989-04-18 with total page 616 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process-induced radiation effects in the fabrication of high-density circuits. Reviews the history of radiation-hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation-hardness research.
Download or read book Radiation Effects on Embedded Systems written by Raoul Velazco and published by Springer Science & Business Media. This book was released on 2007-06-19 with total page 273 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume provides an extensive overview of radiation effects on integrated circuits, offering major guidelines for coping with radiation effects on components. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, November 20-25, 2005.
Download or read book Radiation Harden Devices and Circuits for Analog Application written by Chandra Prakash Jain and published by LAP Lambert Academic Publishing. This book was released on 2011-09-01 with total page 96 pages. Available in PDF, EPUB and Kindle. Book excerpt: Reliability of Operating Electronic equipments on board of artificial satellites, spacecrafts, and military aircraft's in extreme environment require radiation hardening. The effects of radiation, both single event and total ionization dose on the phase frequency detector, voltage controlled oscillator, charge pump and filters for PLL application are studied. The focus is on and CMOS based technologies; however, other high performance technologies will be discussed wherever appropriate. The points of concern are single event effects (SEE) and steady state total ionizing dose (TID) IC response. Specific design architecture and techniques are implemented including radiation effects, radiation hardening technique, PLL building blocks and the overall performance to help mitigate radiation effects that degrade PLL performance. This book aims towards the design and analysis of a radiation hardening of all individual components of Rad-hard PLL starting from process simulation and device simulation to Circuit simulation using 0.5um CMOS library.
Download or read book Radiation Hardened Electronics Destined For Severe Nuclear Reactor Environments written by and published by . This book was released on 2016 with total page 76 pages. Available in PDF, EPUB and Kindle. Book excerpt: Post nuclear accident conditions represent a harsh environment for electronics. The full station blackout experience at Fukushima shows the necessity for emergency sensing capabilities in a radiation-enhanced environment. This NEET (Nuclear Energy Enabling Technologies) research project developed radiation hardened by design (RHBD) electronics using commercially available technology that employs commercial off-the-shelf (COTS) devices and present generation circuit fabrication techniques to improve the total ionizing dose (TID) hardness of electronics. Such technology not only has applicability to severe accident conditions but also to facilities throughout the nuclear fuel cycle in which radiation tolerance is required. For example, with TID tolerance to megarads of dose, electronics could be deployed for long-term monitoring, inspection and decontamination missions. The present work has taken a two-pronged approach, specifically, development of both board and application-specific integrated circuit (ASIC) level RHBD techniques. The former path has focused on TID testing of representative microcontroller ICs with embedded flash (eFlash) memory, as well as standalone flash devices that utilize the same fabrication technologies. The standalone flash devices are less complicated, allowing better understanding of the TID response of the crucial circuits. Our TID experiments utilize biased components that are in-situ tested, and in full operation during irradiation. A potential pitfall in the qualification of memory circuits is the lack of rigorous testing of the possible memory states. For this reason, we employ test patterns that include all ones, all zeros, a checkerboard of zeros and ones, an inverse checkerboard, and random data. With experimental evidence of improved radiation response for unbiased versus biased conditions, a demonstration-level board using the COTS devices was constructed. Through a combination of redundancy and power gating, the demonstration board exhibits radiation resilience to over 200 krad. Furthermore, our ASIC microprocessor using RHBD techniques was shown to be fully functional after an exposure of 2.5 Mrad whereas the COTS microcontroller units failed catastrophically at
Download or read book Total dose Radiation Hardness Assurance for Space Electronics written by and published by . This book was released on 1990 with total page 4 pages. Available in PDF, EPUB and Kindle. Book excerpt: An improved standard total-dose test method is described to qualify electronics for a low-dose radiation environment typical of space systems. The method consists of 6°Co irradiation at a dose rate of 1--3 Gy(Si)/s (100--300 rad(Si)/s) and a subsequent 373 K (100°C) bake. New initiatives in radiation hardness assurance are also briefly discussed, including the Qualified Manufacturers List (QML) test methodology and the possible use of 1/f noise measurements as a nondestructive screen for oxide-trap charge related failure. 8 refs.
Download or read book Nuclear Radiation Hardening for Electronic Components written by and published by . This book was released on 1969 with total page 77 pages. Available in PDF, EPUB and Kindle. Book excerpt: This document comprises a survey of the causes and effects of a radiation environment on various electronic components, and the techniques that must be employed to harden these devices against radiation. In applying radiation hardening techniques to electronic equipment and components, the requirement for such hardening often conflicts with both the equipment's electrical performance and physical requirements. Among these requirements are frequency response, device current ratings, switching speed efficiency, weight and volume (size). Thus tradeoffs must be made. Some guidelines are included here for establishing tradeoffs for specific designs.
Download or read book Proceedings of the National Symposium on Natural and Manmade Radiation in Space written by E. A. Warman and published by . This book was released on 1972 with total page 1044 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Radiation Hardening with Overload Switches written by R. L. Russell and published by . This book was released on 1966 with total page 121 pages. Available in PDF, EPUB and Kindle. Book excerpt: An experimental and theoretical study of a family of unique devices and circuits classified as fast overload switches is described. Unique characteristics include nanosecond switching times, triggering by a current or voltage pulse, and inherent hardness to ionizing and damaging nuclear radiation. These devices are similar in function to fuses and circuit breakers. Specific devices investigated as part of this study are the Hypersensor and the Sprague Voltage Sensitive Switch (SVSS). The Hypersensor is normally used as a resettable current sensitive device that switches from a low impedance to a high impedance on the application of an overcurrent pulse. The SVSS is normally a one shot voltage sensitive device that switches from a high impedance to a low impedance with an overvoltage pulse. The switching speed involved in the transitions can be in the range of 10 nanoseconds to 500 nanoseconds for both devices. The devices were tested in a Linac electron environment and in pulsed reactor neutron environments. The devices did not switch in either direction as a result of dose-rate and no neutron degradation of any electrical parameter was observed. Active and passive circuit designs illustrating the utility of these devices for radiation hardening, circumvention and instrumentation are presented. A number of circuit designs ar evaluated experimentally in the radiation environments mentioned above. A design feasibility study and tests of a dose and dose-rate detector are described.
