Download or read book GB T 16595 2019 Translated English of Chinese Standard GBT 16595 2019 GB T16595 2019 GBT16595 2019 written by https://www.chinesestandard.net and published by https://www.chinesestandard.net. This book was released on 2019-08-17 with total page 10 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Standard specifies grid patterns that can be used to quantitatively describe surface defects on a circular semiconductor wafer. This Standard applies to silicon wafers of which the nominal diameter is 100 mm ~ 200 mm; it also applies to other semiconductor material wafers.