Download or read book Fault tolerance and Reliability Techniques for High density Random access Memories written by Kanad Chakraborty and published by Prentice Hall PTR. This book was released on 2002 with total page 456 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book deals with primarily with reliable and faul-tolerant circuit design and evaluation techniques for RAMS. It examines both the manufacturing faul-tolerance (e.g. self-repair at the time of manufacturing) and online and field-related fault-tolerance (e.g. error-correction). It talks a lot about important techniques and requirements, and explains what needs to be done and why for each of the techniques.

Download or read book Fault Tolerance And Reliability Techniques For High Density Random Access Memories written by Kanad Chakraborty and published by . This book was released on 2002 with total page 426 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book High speed Signal Propagation written by Howard W. Johnson and published by Prentice Hall Professional. This book was released on 2003 with total page 806 pages. Available in PDF, EPUB and Kindle. Book excerpt: This advanced-level reference presents a complete and unified theory of signal propagation for all metallic media from cables to pcb traces to chips. It includes numerous examples, pictures, tables and wide-ranging discussion of the high-speed properties of transmission lines.

Download or read book Essential Electronic Design Automation EDA written by Mark Birnbaum and published by Prentice Hall Professional. This book was released on 2004 with total page 256 pages. Available in PDF, EPUB and Kindle. Book excerpt: & Describes the engineering needs addressed by the individual EDA tools and covers EDA from both the provider and user viewpoints. & & Learn the importance of marketing and business trends in the EDA industry. & & The EDA consortium is made up of major corporations including SUN, HP, and Intel.

Download or read book Signal Integrity written by Eric Bogatin and published by Prentice Hall Professional. This book was released on 2004 with total page 612 pages. Available in PDF, EPUB and Kindle. Book excerpt: This thorough review of the fundamental principles associated with signal integrity provides engineering principles behind signal integrity effects, and applies this understanding to solving problems.

Download or read book Signal Integrity Issues and Printed Circuit Board Design written by Douglas Brooks and published by Prentice Hall Professional. This book was released on 2003 with total page 418 pages. Available in PDF, EPUB and Kindle. Book excerpt: Complicated concepts explained succinctly and in laymen's terms to both experienced and novice PCB designers. Numerous examples allow reader to visualize how high-end software simulators see various types of SI problems and then their solutions. Author is a frequent and recognized seminar leader in the industry.

Download or read book Printed Circuit Board Designer s Reference written by Christopher T. Robertson and published by Prentice Hall Professional. This book was released on 2004 with total page 306 pages. Available in PDF, EPUB and Kindle. Book excerpt: PCB design instruction and reference manual, all in one book, with in-depth explanation of the processes and tools used in modern PCB design Standards, formulas, definitions, and procedures, plus software to tie it all together.

Download or read book Nanoelectronics and Photonics written by Anatoli Korkin and published by Springer Science & Business Media. This book was released on 2008-09-23 with total page 484 pages. Available in PDF, EPUB and Kindle. Book excerpt: Nanoelectronics and Photonics provides a fundamental description of the core elements and problems of advanced and future information technology. The authoritative book collects a series of tutorial chapters from leaders in the field covering fundamental topics from materials to devices and system architecture, and bridges the fundamental laws of physics and chemistry of materials at the atomic scale with device and circuit design and performance requirements.

Download or read book Microelectronic Applications of Chemical Mechanical Planarization written by Yuzhuo Li and published by John Wiley & Sons. This book was released on 2008 with total page 734 pages. Available in PDF, EPUB and Kindle. Book excerpt: An authoritative, systematic, and comprehensive description of current CMP technology Chemical Mechanical Planarization (CMP) provides the greatest degree of planarization of any known technique. The current standard for integrated circuit (IC) planarization, CMP is playing an increasingly important role in other related applications such as microelectromechanical systems (MEMS) and computer hard drive manufacturing. This reference focuses on the chemical aspects of the technology and includes contributions from the foremost experts on specific applications. After a detailed overview of the fundamentals and basic science of CMP, Microelectronic Applications of Chemical Mechanical Planarization: Provides in-depth coverage of a wide range of state-of-the-art technologies and applications Presents information on new designs, capabilities, and emerging technologies, including topics like CMP with nanomaterials and 3D chips Discusses different types of CMP tools, pads for IC CMP, modeling, and the applicability of tribometrology to various aspects of CMP Covers nanotopography, CMP performance and defect profiles, CMP waste treatment, and the chemistry and colloidal properties of the slurries used in CMP Provides a perspective on the opportunities and challenges of the next fifteen years Complete with case studies, this is a valuable, hands-on resource for professionals, including process engineers, equipment engineers, formulation chemists, IC manufacturers, and others. With systematic organization and questions at the end of each chapter to facilitate learning, it is an ideal introduction to CMP and an excellent text for students in advanced graduate courses that cover CMP or related semiconductor manufacturing processes.

Download or read book From ASICs to SOCs written by Farzad Nekoogar and published by Prentice Hall Professional. This book was released on 2003 with total page 224 pages. Available in PDF, EPUB and Kindle. Book excerpt: From ASICs to SOCs: A Practical Approach, by Farzad Nekoogar and Faranak Nekoogar, covers the techniques, principles, and everyday realities of designing ASICs and SOCs. Material includes current issues in the field, front-end and back-end designs, integration of IPs on SOC designs, and low-power design techniques and methodologies. Appropriate for practicing chip designers as well as graduate students in electrical engineering.

Download or read book High speed Fault Tolerance in Random Access Memories written by Rina Darmawirya and published by . This book was released on 1987 with total page 154 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Journal of Nanoscience and Nanotechnology written by and published by . This book was released on 2007 with total page 1214 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Proceedings written by and published by . This book was released on 2005 with total page 624 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book IBM Journal of Research and Development written by and published by . This book was released on 1984 with total page 812 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Sci tech News written by and published by . This book was released on 2003 with total page 292 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Lightweight Opportunistic Memory Resilience written by Irina Alam and published by . This book was released on 2021 with total page 238 pages. Available in PDF, EPUB and Kindle. Book excerpt: The reliability of memory subsystems is worsening rapidly and needs to be considered as one of the primary design objectives when designing today's computer systems. From on-chip embedded memories in Internet-of-Things (IoT) devices and on-chip caches to off-chip main memories, they have become the limiting factor in the reliability of these computing systems. Today's applications demand large capacity of on-chip or off-chip memory or both. With aggressive technology scaling, coupled with the increase in the total area devoted to memory in a chip, memories are becoming particularly sensitive to manufacturing process variation, environmental operating conditions, and aging-induced wearout. However, the challenge with memory reliability is that the resiliency techniques need to be effective but with minimal overhead. Today's typical error correcting schemes do not take into consideration the data value that they are protecting and are purely based on positional errors. This increases their overheads and makes them too expensive, especially for on-chip memories. Also, the drive for denser off-chip main memories is worsening their reliability. But strengthening today's error correction techniques will result in non-negligible increase in overheads. Hence, this dissertation proposes Lightweight Opportunistic Memory Resilience. We exploit the following three aspects to make memories more reliable with low overheads: (1) Underlying memory fault models, (2) Data value behavior of commonly used applications, and (3) The architecture of the memory itself. We opportunistically exploit these three aspects to provide stronger protection against memory errors. We design novel error detecting and correcting codes and develop several other architectural fault tolerance techniques at minimal overheads compared to the conventional reliability techniques used in today's memories. In part 1 of this dissertation, we address the reliability concerns in lightweight on-chip caches or embedded memories like scratchpads in IoT devices. These memories are becoming larger in size, but needs to be low power. Using standard error correcting codes or traditional row/column sparing to recover from faults are too expensive for them. Here, we leverage the fact that manufacturing defects and aging-induced hard faults usually only affect only a few bits in a memory. These bits, however, inhibit how low of a voltage these chips can be operated at. Traditional software fails even when a small number of bits in a memory are faulty. For the first time, we provide two solutions, FaultLink and SAME-Infer, which help deal with these weak faulty cells in the memory by generating a custom-tailored fault-aware application binary image for each chip. Next, we designed Software-Defined Error Localization Code (SDELC) and Parity++ as lightweight runtime error recovery techniques that leverage the insight that data values have locality in them and certain ranges of data values occur more frequently than others. Conventional ECC is too expensive for these lightweight memories. SDELC uses novel ultra-lightweight error-localizing codes to localize the error to a chunk in the data. It then heuristically recovers from the localized error by exploiting side information about the application's memory contents. Parity++ is a novel unequal message protection scheme that preferentially provides stronger error protection to certain ''special messages". This protection scheme provides Single Error Detection (SED) for all messages and Single Error Correction (SEC) for a subset of special messages. Both these novel codes utilize data value behavior to provide single error correction at 2.5x-4x lower overhead than a conventional hamming single error correcting code. In part 2 of this dissertation, we focus on off-chip main memory technologies. We primarily leverage the details of the memory architecture itself and their dominant fault mechanisms to effectively design reliability schemes. The need for larger main memory capacity in today's workstation or server environments is driving the use of non-volatile memories (NVM) or techniques to enable high density DRAMs. Due to aggressive scaling, the single-bit error rate in DRAMs is steadily increasing and DRAM manufacturers are adopting on-die error correction coding (ECC) schemes, along with within memory controller ECC, to correct single-bit errors in the memory. In COMET we have shown that today's standard on-die ECCs can lead to silent data corruption if not designed correctly. We propose a collaborative on-die and in-controller error correction scheme that prevents double-bit error induced silent data corruption and corrects 99.9997% of these double-bit errors at absolutely no additional storage, latency, and area overheads. Not just DRAMs, reliability is a major concern in most of the emerging NVM technologies. In Compression with Multi-ECC (CME), we propose a new opportunistic compression-based ECC protection scheme for magnetic memory-based main memories. CME compresses every memory line and uses the saved bits to add stronger protection. In some of these NVMs, error rates increase as we try to improve read/write latencies. In PCM-Duplicate, we propose an enhanced PCM architecture that reduces PCM read latency by more than 3x and makes it comparable to that of DRAM. We then use ECC to tolerate the additional errors that arise because of the proposed optimizations. Overall, we have developed a complementary suite of novel methods for tolerating faults and correcting errors in different levels of the memory hierarchy. We exploit the memory architecture and fault mechanisms as well as the application data behavior to tune the proposed solutions to the particular memory characteristics; lightweight solutions for low-cost embedded memories and latency-critical on-chip caches while stronger protection for off-chip main memory subsystems. With memory reliability being a major bottleneck in today's systems, these novel solutions are expected to alleviate this problem, help cope with the unique outcomes of hardware variability in memory systems and provide improved reliability at minimal cost.

Download or read book Records of the 1993 IEEE International Workshop on Memory Testing August 9 10 1993 San Jose California written by Rochit Rajsuman and published by . This book was released on 1993 with total page 168 pages. Available in PDF, EPUB and Kindle. Book excerpt: From the August 1993 workshop in San Jose, California, 26 papers report the latest findings on testing computer memory. The sections include test pattern generation, algorithms, fault models, testing for process defects and yield improvement, and radiation issues and space applications. No subject i