Download or read book Analog and Mixed signal Test written by Bapiraju Vinnakota and published by . This book was released on 1998 with total page 296 pages. Available in PDF, EPUB and Kindle. Book excerpt: More and more chips are being designed with both analog and digital circuitry next to each other, which makes testing analog circuitry even more challenging. This comprehensive guide reviews all the potential testing options, helping designers, engineers, CAD developers, and researchers choose the most cost-effective, accurate solutions for both mixed-signal and analog-only testing.

Download or read book Fault Diagnosis of Analog Integrated Circuits written by Prithviraj Kabisatpathy and published by Springer Science & Business Media. This book was released on 2006-01-13 with total page 183 pages. Available in PDF, EPUB and Kindle. Book excerpt: Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits. Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces . Also contains problems that can be used as quiz or homework.

Download or read book Test and Design for Testability in Mixed Signal Integrated Circuits written by Jose Luis Huertas Díaz and published by Springer Science & Business Media. This book was released on 2010-02-23 with total page 310 pages. Available in PDF, EPUB and Kindle. Book excerpt: Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for developing complex ICs, there is still a lack of structured references presenting the major topics in this area. The aim of this book is to present basic concepts and new ideas in a manner understandable for both professionals and students. Since this is an active research field, a comprehensive state-of-the-art overview is very valuable, introducing the main problems as well as the ways of solution that seem promising, emphasizing their basis, strengths and weaknesses. In essence, several topics are presented in detail. First of all, techniques for the efficient use of DSP-based test and CAD test tools. Standardization is another topic considered in the book, with focus on the IEEE 1149.4. Also addressed in depth is the connecting design and test by means of using high-level (behavioural) description techniques, specific examples are given. Another issue is related to test techniques for well-defined classes of integrated blocks, like data converters and phase-locked-loops. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods. Finally, in Design-for-Testability and Built-In-Self-Test, two other concepts that were taken from digital design, are introduced in an analog context and illustrated for the case of integrated filters. In summary, the purpose of this book is to provide a glimpse on recent research results in the area of testing mixed-signal integrated circuits, specifically in the topics mentioned above. Much of the work reported herein has been performed within cooperative European Research Projects, in which the authors of the different chapters have actively collaborated. It is a representative snapshot of the current state-of-the-art in this emergent field.

Download or read book Essentials of Electronic Testing for Digital Memory and Mixed Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 690 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

Download or read book Modeling and Simulation of Mixed Analog Digital Systems written by B. Antao and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 131 pages. Available in PDF, EPUB and Kindle. Book excerpt: Modeling and Simulation of Mixed Analog-Digital Systems brings together in one place important contributions and state-of-the-art research results in this rapidly advancing area. Modeling and Simulation of Mixed Analog-Digital Systems serves as an excellent reference, providing insight into some of the most important issues in the field.

Download or read book Mixed Signal Circuits written by Thomas Noulis and published by CRC Press. This book was released on 2018-09-03 with total page 420 pages. Available in PDF, EPUB and Kindle. Book excerpt: Mixed-Signal Circuits offers a thoroughly modern treatment of integrated circuit design in the context of mixed-signal applications. Featuring chapters authored by leading experts from industry and academia, this book: Discusses signal integrity and large-scale simulation, verification, and testing Demonstrates advanced design techniques that enable digital circuits and sensitive analog circuits to coexist without any compromise Describes the process technology needed to address the performance challenges associated with developing complex mixed-signal circuits Deals with modeling topics, such as reliability, variability, and crosstalk, that define pre-silicon design methodology and trends, and are the focus of companies involved in wireless applications Develops methods to move analog into the digital domain quickly, minimizing and eliminating common trade-offs between performance, power consumption, simulation time, verification, size, and cost Details approaches for very low-power performances, high-speed interfaces, phase-locked loops (PLLs), voltage-controlled oscillators (VCOs), analog-to-digital converters (ADCs), and biomedical filters Delineates the respective parts of a full system-on-chip (SoC), from the digital parts to the baseband blocks, radio frequency (RF) circuitries, electrostatic-discharge (ESD) structures, and built-in self-test (BIST) architectures Mixed-Signal Circuits explores exciting opportunities in wireless communications and beyond. The book is a must for anyone involved in mixed-signal circuit design for future technologies.

Download or read book Analog VHDL written by Andrzej T. Rosinski and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 110 pages. Available in PDF, EPUB and Kindle. Book excerpt: Analog VHDL brings together in one place important contributions and up-to-date research results in this fast moving area. Analog VHDL serves as an excellent reference, providing insight into some of the most challenging research issues in the field.

Download or read book Information Technology written by Ricardo Reis and published by Springer. This book was released on 2006-04-11 with total page 337 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains a selection of tutorials on hot topics in information technology, which were presented at the IFIP World Computer Congress. WCC2004 took place at the Centre de Congrès Pierre Baudis, in Toulouse, France, from 22 to 27 August 2004. The 11 chapters included in the book were chosen from tutorials proposals submitted to WCC2004. These papers report on several important and state-of-the-art topics on information technology such as: Quality of Service in Information Networks Risk-Driven Development of Security-Critical Systems Using UMLsec Developing Portable Software Formal Reasoning About Systems, Software and Hardware Using Functionals, Predicates and Relations The Problematic of Distributed Systems Supervision Software Rejuvenation - Modeling and Analysis Test and Design-for-Test of Mixed-Signal Integrated Circuits Web Services Applications of Multi-Agent Systems Discrete Event Simulation Human-Centered Automation We hereby would like to thank IFIP and more specifically WCC2004 Tutorials Committee and the authors for their contribution. We also would like to thank the congress organizers who have done a great job. Ricardo Reis Editor QUALITY OF SERVICE IN INFORMATION NETWORKS Augusto Casaca IST/INESC, R. Alves Redol, 1000-029, Lisboa, Portugal. Abstract: This article introduces the problems concerned with the provision of end-- end quality of service in IP networks, which are the basis of information networks, describes the existing solutions for that provision and presents some of the current research items on the subject. Key words: Information networks, IP networks, Integrated Services, Differentiated Services, Multiprotocol Label Switching, UMTS.

Download or read book Design for Maintainability written by Louis J. Gullo and published by John Wiley & Sons. This book was released on 2021-02-23 with total page 400 pages. Available in PDF, EPUB and Kindle. Book excerpt: How to design for optimum maintenance capabilities and minimize the repair time Design for Maintainability offers engineers a wide range of tools and techniques for incorporating maintainability into the design process for complex systems. With contributions from noted experts on the topic, the book explains how to design for optimum maintenance capabilities while simultaneously minimizing the time to repair equipment. The book contains a wealth of examples and the most up-to-date maintainability design practices that have proven to result in better system readiness, shorter downtimes, and substantial cost savings over the entire system life cycle, thereby, decreasing the Total Cost of Ownership. Design for Maintainability offers a wealth of design practices not covered in typical engineering books, thus allowing readers to think outside the box when developing maintainability design requirements. The books principles and practices can help engineers to dramatically improve their ability to compete in global markets and gain widespread customer satisfaction. This important book: Offers a complete overview of maintainability engineering as a system engineering discipline Includes contributions from authors who are recognized leaders in the field Contains real-life design examples, both good and bad, from various industries Presents realistic illustrations of good maintainability design principles Provides discussion of the interrelationships between maintainability with other related disciplines Explores trending topics in technologies Written for design and logistics engineers and managers, Design for Maintainability is a comprehensive resource containing the most reliable and innovative techniques for improving maintainability when designing a system or product.

Download or read book Test and Diagnosis of Analogue Mixed signal and RF Integrated Circuits written by Yichuang Sun and published by IET. This book was released on 2008-05-30 with total page 411 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of those areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students.

Download or read book Digital Circuit Testing written by Francis C. Wong and published by Elsevier. This book was released on 2012-12-02 with total page 248 pages. Available in PDF, EPUB and Kindle. Book excerpt: Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.

Download or read book Computer Aided Design of Analog Integrated Circuits and Systems written by Rob A. Rutenbar and published by John Wiley & Sons. This book was released on 2002-05-06 with total page 773 pages. Available in PDF, EPUB and Kindle. Book excerpt: The tools and techniques you need to break the analog design bottleneck! Ten years ago, analog seemed to be a dead-end technology. Today, System-on-Chip (SoC) designs are increasingly mixed-signal designs. With the advent of application-specific integrated circuits (ASIC) technologies that can integrate both analog and digital functions on a single chip, analog has become more crucial than ever to the design process. Today, designers are moving beyond hand-crafted, one-transistor-at-a-time methods. They are using new circuit and physical synthesis tools to design practical analog circuits; new modeling and analysis tools to allow rapid exploration of system level alternatives; and new simulation tools to provide accurate answers for analog circuit behaviors and interactions that were considered impossible to handle only a few years ago. To give circuit designers and CAD professionals a better understanding of the history and the current state of the art in the field, this volume collects in one place the essential set of analog CAD papers that form the foundation of today's new analog design automation tools. Areas covered are: * Analog synthesis * Symbolic analysis * Analog layout * Analog modeling and analysis * Specialized analog simulation * Circuit centering and yield optimization * Circuit testing Computer-Aided Design of Analog Integrated Circuits and Systems is the cutting-edge reference that will be an invaluable resource for every semiconductor circuit designer and CAD professional who hopes to break the analog design bottleneck.

Download or read book Fault Detection Supervision and Safety of Technical Processes 2003 SAFEPROCESS 2003 written by Marcel Staroswiecki and published by Elsevier. This book was released on 2004-02-27 with total page 1210 pages. Available in PDF, EPUB and Kindle. Book excerpt: A three-volume work bringing together papers presented at 'SAFEPROCESS 2003', including four plenary papers on statistical, physical-model-based and logical-model-based approaches to fault detection and diagnosis, as well as 178 regular papers.

Download or read book Advances in Electronic Testing written by Dimitris Gizopoulos and published by Springer Science & Business Media. This book was released on 2006-01-22 with total page 431 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.

Download or read book VLSI Signal Processing Technology written by Magdy A. Bayoumi and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 242 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is the first in a set of forthcoming books focussed on state-of-the-art development in the VLSI Signal Processing area. It is a response to the tremendous research activities taking place in that field. These activities have been driven by two factors: the dramatic increase in demand for high speed signal processing, especially in consumer elec tronics, and the evolving microelectronic technologies. The available technology has always been one of the main factors in determining al gorithms, architectures, and design strategies to be followed. With every new technology, signal processing systems go through many changes in concepts, design methods, and implementation. The goal of this book is to introduce the reader to the main features of VLSI Signal Processing and the ongoing developments in this area. The focus of this book is on: • Current developments in Digital Signal Processing (DSP) pro cessors and architectures - several examples and case studies of existing DSP chips are discussed in Chapter 1. • Features and requirements of image and video signal processing architectures - both applications specific integrated circuits (ASICs) and programmable image processors are studied in Chapter 2. • New market areas for signal processing - especially in consumer electronics such as multimedia, teleconferencing, and movie on demand. • Impact of arithmetic circuitry on the performance of DSP pro cessors - several topics are discussed in Chapter 3 such as: number representation, arithmetic algorithms and circuits, and implementa tion.

Download or read book Case Based Reasoning Research and Development written by Kevin D. Ashley and published by Springer Science & Business Media. This book was released on 2003-06-11 with total page 749 pages. Available in PDF, EPUB and Kindle. Book excerpt: The International Conference on Case-Based Reasoning (ICCBR) is the pree- nent international meeting on case-based reasoning (CBR). ICCBR 2003 (http://www.iccbr.org/iccbr03/)isthe?fthinthisseriesofbiennialinter- tional conferences highlighting the most signi?cant contributions to the ?eld of CBR.TheconferencetookplacefromJune23throughJune26,2003attheN- wegian University of Science and Technology in Trondheim, Norway. Previous ICCBR conferences have been held in Vancouver, Canada (2001), Seeon, G- many (1999), Providence, Rhode Island, USA (1997), and Sesimbra, Portugal (1995). Day 1 of ICCBR 2003, Industry Day, provided hands-on experiences utilizing CBR in cutting-edge knowledge-management applications (e.g., help-desks,- business, and diagnostics). Day 2 featured topical workshops on CBR in the healthsciences,theimpactoflife-cyclemodelsonCBRsystems,mixed-initiative CBR, predicting time series with cases, and providing assistance with structured vs. unstructured cases. Days 3 and 4 comprised presentations and posters on theoretical and applied CBR research and deployed CBR applications, as well as invited talks from three distinguished scholars: David Leake, Indiana University, H ́ ector Munoz-Avila, ̃ Lehigh University, and Ellen Rilo?, University of Utah. The presentations and posters covered a wide range of CBR topics of in- rest both to practitioners and researchers, including case representation, si- larity, retrieval, adaptation, case library maintenance, multi-agent collaborative systems, data mining, soft computing, recommender systems, knowledge ma- gement, legal reasoning, software reuse and music.

Download or read book System on Chip Test Architectures written by Laung-Terng Wang and published by Morgan Kaufmann. This book was released on 2010-07-28 with total page 893 pages. Available in PDF, EPUB and Kindle. Book excerpt: Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. - Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. - Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. - Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. - Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. - Practical problems at the end of each chapter for students.