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EBookClubs

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Book Fault Detection in Asynchronous Sequential Circuits

Download or read book Fault Detection in Asynchronous Sequential Circuits written by Jeng-Chuan Kau and published by . This book was released on 1970 with total page 86 pages. Available in PDF, EPUB and Kindle. Book excerpt: "As the asynchronous sequential circuit has become more and more important to digital systems in recent years high reliability and simple maintenance of the circuit is stressed. This paper presents a fault-detection algorithm which will be applicable to most of the practical asynchronous sequential circuits. The asynchronous sequential circuit is treated from the combinatoric point of view. First the minimal set of states, both stable states and unstable states, sufficient to detect all possible faults of the circuit is found from the fault table. Then a test sequence is generated to go through these states. It is assumed that testing outputs can be added. Simple and systematic techniques are also presented for the construction of fault table and the generation of test sequence. The usefulness of this algorithm increases as the density of the stable states associated with the circuit increases"--Abstract, leaf ii.

Book Fault Detection in Asynchronous Sequential Circuit

Download or read book Fault Detection in Asynchronous Sequential Circuit written by Kenneth Chin and published by . This book was released on 1979 with total page 85 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Self Fault Detection in Asynchronous Sequential Circuits

Download or read book Self Fault Detection in Asynchronous Sequential Circuits written by Stanley Ray Groenig and published by . This book was released on 1971 with total page 41 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Fault Detection in Digital Circuits

Download or read book Fault Detection in Digital Circuits written by Arthur D. Friedman and published by Prentice Hall. This book was released on 1971 with total page 252 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Design of Fault Detecting Asynchronous Sequential Circuits

Download or read book Design of Fault Detecting Asynchronous Sequential Circuits written by Dwight Holden Sawin and published by . This book was released on 1971 with total page 48 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Fault Detection in Asynchronous Sequential Machines

Download or read book Fault Detection in Asynchronous Sequential Machines written by Aaron Ashkinazy and published by . This book was released on 1970 with total page 438 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Rational Fault Analysis

Download or read book Rational Fault Analysis written by Richard Saeks and published by Marcel Dekker. This book was released on 1977 with total page 264 pages. Available in PDF, EPUB and Kindle. Book excerpt: Information on the development of rational procedures for detection, location, & prediction of faults in a variety of systems. Includes a chapter on computer-aided fault analysis.

Book Fault Detection in Sequential Circuits

Download or read book Fault Detection in Sequential Circuits written by Edward George Sable and published by . This book was released on 1973 with total page 584 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Fault Diagnosis of Digital Systems

Download or read book Fault Diagnosis of Digital Systems written by Herbert Y. Chang and published by Krieger Publishing Company. This book was released on 1974 with total page 186 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Design of Fault Diagnosable Asynchronous Sequential Circuits

Download or read book Design of Fault Diagnosable Asynchronous Sequential Circuits written by Unchalee Srivanavit and published by . This book was released on 1976 with total page 96 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book A Study of Fault Diagnosis of Sequential Logic Networks

Download or read book A Study of Fault Diagnosis of Sequential Logic Networks written by B. D. Carroll and published by . This book was released on 1974 with total page 25 pages. Available in PDF, EPUB and Kindle. Book excerpt: The research conducted on this project was concerned with the problem of test pattern generation for sequential logic circuits. More specifically, an algorithm was sought for generating test patterns for detecting single stuck-at faults in synchronous sequential circuits containing clocked flip-flop memory elements. In addition to the principal problem stated above, the related problems of test pattern generation for combinational iterative logic arrays and of test pattern generation for multiple faults in combinational logic circuits were also studied. A summary of the results obtained and the conclusions reached on the above problems is given. Suggestions for follow-on studies are discussed. Reprints of all papers published on the project are included in an appendix.

Book Detection of Intermittent Faults in Sequential Circuits

Download or read book Detection of Intermittent Faults in Sequential Circuits written by Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory and published by . This book was released on 1978 with total page 40 pages. Available in PDF, EPUB and Kindle. Book excerpt: Testing for intermittent faults in digital circuits has been given significant attention in the past few years. However, very little theoretical work was done regarding their detection in sequential circuits.

Book Design of Fault Diagnosable Asynchronous Sequential Circuits

Download or read book Design of Fault Diagnosable Asynchronous Sequential Circuits written by Peter Kong-Wing Tung and published by . This book was released on 1975 with total page 57 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book An Algorithm for Automatic Fault Detection in Sequential Circuits

Download or read book An Algorithm for Automatic Fault Detection in Sequential Circuits written by Donald Whitesell Hartman and published by . This book was released on 1968 with total page 180 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Test Generation for Detecting Multiple Stuck Faults in Synchronous Sequential Circuits Using Boolean Difference and Transition Matrix Techniques

Download or read book Test Generation for Detecting Multiple Stuck Faults in Synchronous Sequential Circuits Using Boolean Difference and Transition Matrix Techniques written by Thiep V. Nguyen and published by . This book was released on 1993 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Boolean difference is a mathematical concept which has proved its usefulness in the study of single and multiple stuck-at faults in combinational circuits. This tool of analysis was extended to cover multiple stuck-at faults in synchronous sequential circuits as well. In this dissertation, modifications to previous work are presented, together with the development of a new method for deriving the required shortest test sequence to detect a specified multiple fault. First, the vector Boolean difference technique is utilized to determine the input vector that will produce a difference in output between the fault-free and faulty circuits with both starting in the same initial state. If that detection cannot be achieved immediately, then the state transition matrices of both circuits are combined and used to form a matrix of detecting state pairs. Each of these pairs comprises of the present states of both circuits for which an output difference will be detected by an input vector. The detecting tree is then built leading the two circuits from the same initial state to the first detecting state found to complete the search for the shortest test sequence. Besides being able to identify, at an early stage, faults that are undetectable, this algorithm guarantees the generation of a shortest test sequence, if one exists, for every multiple stuck-at fault in a synchronous sequential circuit having a synchronizing sequence or a known initial state. A computer program was also written as a tool to automatically generate test sequences for detecting single or multiple faults in both combinational and synchronous sequential circuits.