Download or read book A Gate Equivalent Model for Combinational Logic Network Analysis written by Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory and published by . This book was released on 1973 with total page 30 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book NBS Technical Note written by and published by . This book was released on 1979-08 with total page 52 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Rational Fault Analysis written by Richard Saeks and published by Marcel Dekker. This book was released on 1977 with total page 264 pages. Available in PDF, EPUB and Kindle. Book excerpt: Information on the development of rational procedures for detection, location, & prediction of faults in a variety of systems. Includes a chapter on computer-aided fault analysis.
Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1981 with total page 1370 pages. Available in PDF, EPUB and Kindle. Book excerpt: Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
Download or read book Testing of Digital Systems written by N. K. Jha and published by Cambridge University Press. This book was released on 2003-05-08 with total page 1022 pages. Available in PDF, EPUB and Kindle. Book excerpt: Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
Download or read book Digital System Test and Testable Design written by Zainalabedin Navabi and published by Springer Science & Business Media. This book was released on 2010-12-10 with total page 452 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is about digital system testing and testable design. The concepts of testing and testability are treated together with digital design practices and methodologies. The book uses Verilog models and testbenches for implementing and explaining fault simulation and test generation algorithms. Extensive use of Verilog and Verilog PLI for test applications is what distinguishes this book from other test and testability books. Verilog eliminates ambiguities in test algorithms and BIST and DFT hardware architectures, and it clearly describes the architecture of the testability hardware and its test sessions. Describing many of the on-chip decompression algorithms in Verilog helps to evaluate these algorithms in terms of hardware overhead and timing, and thus feasibility of using them for System-on-Chip designs. Extensive use of testbenches and testbench development techniques is another unique feature of this book. Using PLI in developing testbenches and virtual testers provides a powerful programming tool, interfaced with hardware described in Verilog. This mixed hardware/software environment facilitates description of complex test programs and test strategies.
Download or read book Structural Distinguishability of Fault in Combinational Networks written by Dennis Kong Chao Chia and published by . This book was released on 1969 with total page 162 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Testing and Diagnosis of VLSI and ULSI written by F. Lombardi and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 531 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains a collection of papers presented at the NATO Advanced Study Institute on ·Testing and Diagnosis of VLSI and ULSI" held at Villa Olmo, Como (Italy) June 22 -July 3,1987. High Density technologies such as Very-Large Scale Integration (VLSI), Wafer Scale Integration (WSI) and the not-so-far promises of Ultra-Large Scale Integration (ULSI), have exasperated the problema associated with the testing and diagnosis of these devices and systema. Traditional techniques are fast becoming obsolete due to unique requirements such as limited controllability and observability, increasing execution complexity for test vector generation and high cost of fault simulation, to mention just a few. New approaches are imperative to achieve the highly sought goal of the • three months· turn around cycle time for a state-of-the-art computer chip. The importance of testing and diagnostic processes is of primary importance if costs must be kept at acceptable levels. The objective of this NATO-ASI was to present, analyze and discuss the various facets of testing and diagnosis with respect to both theory and practice. The contents of this volume reflect the diversity of approaches currently available to reduce test and diagnosis time. These approaches are described in a concise, yet clear way by renowned experts of the field. Their contributions are aimed at a wide readership: the uninitiated researcher will find the tutorial chapters very rewarding. The expert wiII be introduced to advanced techniques in a very comprehensive manner.
Download or read book Fault Analysis of Combinational Logic Networks written by Lung-Hsiung Chang and published by . This book was released on 1974 with total page 248 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Large Scale Integration Digital Testing written by T. F. Leedy and published by . This book was released on 1979 with total page 52 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Random Testing of Digital Circuits written by Rene David and published by CRC Press. This book was released on 2020-11-26 with total page 508 pages. Available in PDF, EPUB and Kindle. Book excerpt: "Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "
Download or read book Mixed Design of Integrated Circuits and Systems written by Andrzej Napieralski and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 236 pages. Available in PDF, EPUB and Kindle. Book excerpt: Very fast advances in IC technologies have brought new challenges into the physical design of integrated systems. The emphasis on system performance, in lately developed applications, requires timing and power constraints to be considered at each stage of physical design. The size of ICs is decreasing continuously, and the density of power dissipated in the circuits is growing rapidly. The first challenge is the Information Technology where new materials, devices, telecommunication and multimedia facilities are developed. The second one is the Biomedical Science and Biotechnology. The utilisation of bloodless surgery is possible now because of wide micro-sensors and micro-actuators application. Nowadays, the modern micro systems can be implanted directly into the human body and the medicine can be applied right in the proper time and place in the patient body. The low-power devices are being developed particularly for medical and space applications. This has created for designers in all scientific domains new possibilities which must be handed down to the future generations of designers. In this spirit, we organised the Fourth International Workshop "MIXED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS" in order to provide an international forum for discussion and the exchange of information on education, teaching experiences, training and technology transfer in the area of microelectronics and microsystems.
Download or read book Reliable Computer Systems written by Daniel Siewiorek and published by Digital Press. This book was released on 2014-06-28 with total page 929 pages. Available in PDF, EPUB and Kindle. Book excerpt: Enhance your hardware/software reliability Enhancement of system reliability has been a major concern of computer users and designers ¦ and this major revision of the 1982 classic meets users' continuing need for practical information on this pressing topic. Included are case studies of reliable systems from manufacturers such as Tandem, Stratus, IBM, and Digital, as well as coverage of special systems such as the Galileo Orbiter fault protection system and AT&T telephone switching processors.
Download or read book Design of Logic Systems written by DAVID PROTHEROE DOUGLAS LEWIN and published by Springer. This book was released on 2013-11-21 with total page 713 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Essentials of Electronic Testing for Digital Memory and Mixed Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 690 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Download or read book Reliable Computer Systems written by Daniel P. Siewiorek and published by CRC Press. This book was released on 1998-12-15 with total page 929 pages. Available in PDF, EPUB and Kindle. Book excerpt: This classic reference work is a comprehensive guide to the design, evaluation, and use of reliable computer systems. It includes case studies of reliable systems from manufacturers, such as Tandem, Stratus, IBM, and Digital. It covers special systems such as the Galileo Orbiter fault protection system and AT&T telephone switching system processors
Download or read book Building the Information Society written by Rene Jacquart and published by Springer. This book was released on 2008-04-08 with total page 739 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the context of the 18th IFIP World Computer Congress (WCC’04), and beside the traditional organization of conferences, workshops, tutorials and student forum, it was decided to identify a range of topics of dramatic interest for the building of the Information Society. This has been featured as the "Topical day/session" track of the WCC’04. Topical Sessions have been selected in order to present syntheses, latest developments and/or challenges in different business and technical areas. Building the Information Society provides a deep perspective on domains including: the semantic integration of heterogeneous data, virtual realities and new entertainment, fault tolerance for trustworthy and dependable information infrastructures, abstract interpretation (and its use for verification of program properties), multimodal interaction, computer aided inventing, emerging tools and techniques for avionics certification, bio-, nano-, and information technologies, E-learning, perspectives on ambient intelligence, the grand challenge of building a theory of the Railway domain, open source software in dependable systems, interdependencies of critical infrastructure, social robots, as a challenge for machine intelligence. Building the Information Society comprises the articles produced in support of the Topical Sessions during the IFIP 18th World Computer Congress, which was held in August 2004 in Toulouse, France, and sponsored by the International Federation for Information Processing (IFIP).
