Download or read book Failure Analysis of Minuteman Integrated Circuit Failures written by P. J. Besser and published by . This book was released on 1968 with total page 183 pages. Available in PDF, EPUB and Kindle. Book excerpt: This program was devoted to the determination of the failure modes and to a study of the failure mechanisms in integrated circuits used in the Minuteman II control and guidance system. In-depth failure analyses were performed on 114 rejects from system equipment and 75 failures from vendor burn-in tests. Analytical and procedural techniques not ordinarily used in routine failure analysis were applied and evaluated on this program. The in-depth analysis identified the major device failure modes as (1) excessive surface leakage current, (2) cracked die, (3) oxide dielectric defects (pinholes), and (4) die-to-header bond failures. Localization of certain failure modes to particular part types and vendors along with device usage in system must be considered in assessing the relative importance of the failure modes. The results were compared with data from routine analysis and from the Component Quality Assurance Program. A thorough radiographic examination was performed on a group of 292 devices which had retested good upon submission to in-house analysis. The examination showed that 5 percent of the sample had movable metallic particles included in the package, and a total of 29 percent had some potential reliability hazard. A similar examination of 4,999 production parts revealed an incidence of 0.4 percent with included movable particles. It is felt that the results of this program demonstrate the value of conducting a more extensive routine failure analysis. (Author).
Download or read book Failure Analysis of Integrated Circuits written by Lawrence C. Wagner and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 256 pages. Available in PDF, EPUB and Kindle. Book excerpt: This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.
Download or read book Technical Abstract Bulletin written by and published by . This book was released on with total page 992 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Minuteman written by David Stumpf and published by University of Arkansas Press. This book was released on 2021-02-26 with total page 595 pages. Available in PDF, EPUB and Kindle. Book excerpt: In Minuteman: A Technical History of the Missile That Defined American Nuclear Warfare, David K. Stumpf demystifies the intercontinental ballistic missile program that was conceived at the end of the Eisenhower administration as a key component of the US nuclear strategy of massive retaliation. Although its nuclear warhead may have lacked power relative to that of the Titan II, the Minuteman more than made up for this in terms of numbers and readiness to launch—making it the ultimate ICBM. Minuteman offers a fascinating look at the technological breakthroughs necessary to field this weapon system that has served as a powerful component of the strategic nuclear triad for more than half a century. With exacting detail, Stumpf examines the construction of launch and launch control facilities; innovations in solid propellant, lightweight inertial guidance systems, and lightweight reentry vehicle development; and key flight tests and operational flight programs—all while situating the Minuteman program in the context of world events. In doing so, the author reveals how the historic missile has adapted to changing defense strategies—from counterforce to mutually assured destruction to sufficiency.
Download or read book Microcircuit Reliability Bibliography written by and published by . This book was released on 1974 with total page 888 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Reliability Abstracts and Technical Reviews written by and published by . This book was released on 1966 with total page 556 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Electrical Contacts 1969 written by and published by . This book was released on 1969 with total page 296 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Microelectronic Failure Analysis written by Richard J. Ross and published by ASM International(OH). This book was released on 1999 with total page 664 pages. Available in PDF, EPUB and Kindle. Book excerpt: Forty-seven papers on electronics failure analysis provide an overview for newcomers to the field and a reference tool for the experienced analyst. Topics include electron/ion bean-based techniques, deprocessing and sample preparation, and physical/chemical defect characterization. For the fourth ed
Download or read book Proceedings written by and published by . This book was released on 1972 with total page 910 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1977 with total page 1160 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book 1966 Annual Symposium on Reliability written by and published by . This book was released on 1966 with total page 782 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Government Reports Annual Index written by and published by . This book was released on 1978 with total page 1068 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Failure Analysis of Semiconductor Integrated Circuits written by Peter John Holmes and published by . This book was released on 1968 with total page 38 pages. Available in PDF, EPUB and Kindle. Book excerpt: The techniques of failure analysis on integrated circuits in various encapsulations are outlined, and a number of actual failures are described. Some of the tests available are potentially more destructive or more liable to give ambiguous results with integrated circuits than with individual transistors. The continued prevalence of bonding faults and other defects of manufacture is noteworthy, and suggests that mere knowledge of what can go wrong is unlikely to make much impact on the reliability problem unless it results in positively improved process controls. (Author).
Download or read book Physics of Failure in Electronics written by Morton E. Goldberg and published by . This book was released on 1965 with total page 696 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Proceedings 1966 Electronic Components Conference Washington D C written by and published by . This book was released on 1966 with total page 494 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Department of Defense Appropriations for 1975 written by United States. Congress. House. Committee on Appropriations and published by . This book was released on 1974 with total page 1412 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Department of Defense Appropriations for 1975 written by U.S. Congress. House. Committee on Appropriations and published by . This book was released on 1974 with total page 1412 pages. Available in PDF, EPUB and Kindle. Book excerpt:
