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Book Modeling Nanowire and Double Gate Junctionless Field Effect Transistors

Download or read book Modeling Nanowire and Double Gate Junctionless Field Effect Transistors written by Farzan Jazaeri and published by Cambridge University Press. This book was released on 2018-03-01 with total page 255 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first book on the topic, this is a comprehensive introduction to the modeling and design of junctionless field effect transistors (FETs). Beginning with a discussion of the advantages and limitations of the technology, the authors also provide a thorough overview of published analytical models for double-gate and nanowire configurations, before offering a general introduction to the EPFL charge-based model of junctionless FETs. Important features are introduced gradually, including nanowire versus double-gate equivalence, technological design space, junctionless FET performances, short channel effects, transcapacitances, asymmetric operation, thermal noise, interface traps, and the junction FET. Additional features compatible with biosensor applications are also discussed. This is a valuable resource for students and researchers looking to understand more about this new and fast developing field.

Book Fabrication and Characterization of High Performance Silicon Nanowire Field Effect Transistors

Download or read book Fabrication and Characterization of High Performance Silicon Nanowire Field Effect Transistors written by Muhammad Maksudur Rahman and published by . This book was released on 2011 with total page 65 pages. Available in PDF, EPUB and Kindle. Book excerpt: Quasi one-dimensional (1-D) field-effect transistors (FET), such as Si nanowire FETs (Si NW-FETs), have shown promise for more aggressive channel length scaling, better electrostatic gate control, higher integration densities and low-power applications. At the same time, an accurate bench-marking of their performance remains a challenging task due to difficulties in definition of the exact channel length, gate capacitance and transconductance. In 1-D Si FETs, one also often observes a significant degradation of their mobility and on/off ratio. The goal of this study is to implement the idea of the FET performance enhancement while simultaneously performing a more rigorous data extraction. To achieve these goals, we fabricated dual-gate undoped Si NW-FETs with various NW diameters The Si NWs are grown by Au-catalyzed vapor-transport For our top-gate NW-FET, the subthreshold swing was determined to be 85-90 mV/decade, whereas the best subthreshold swings for Si NW-FETs until now were ~135-140 mV/decade. We achieved a ON/OFF current ratio of 10 7 due to improved electrostatic control and electron transport conditions inside the channel. This is on the higher end of any ON/OFF ratios thus far reported for NW FETs The hole mobility in our NW-FETs was around 250.400 cm[superscript 2] /Vs, according to different extraction procedures. In our mobility calculations we included the NW silicidation effect, which reduces the effective channel length. We calculated the top gate capacitance using Technology Computer Aided Design (TCAD) Sentaurus simulator, which gives more accurate value of capacitance of the NW over any analytical formulas. Thus we fabricate and rigorously study Si NW.s intrinsic properties which are very important for digital logic circuit application. In the second part of the study, we carried out simulation of Si NW FET devices to shed light on the carrier transport behavior that also explains experimental data.

Book Electrical Characterization and Gate Bias Reliability of Junctionless and Inversion Mode Gate All Around Poly Silicon Nanowire Transistors

Download or read book Electrical Characterization and Gate Bias Reliability of Junctionless and Inversion Mode Gate All Around Poly Silicon Nanowire Transistors written by and published by . This book was released on 2017 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Gate all around Silicon Nanowire Metal oxide semiconductor Field effect Transistors

Download or read book Gate all around Silicon Nanowire Metal oxide semiconductor Field effect Transistors written by Pouya Hashemi and published by . This book was released on 2010 with total page 214 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scaling MOSFETs beyond 15 nm gate lengths is extremely challenging using a planar device architecture due to the stringent criteria required for the transistor switching. The top-down fabricated, gate-all-around architecture with a Si nanowire channel is a promising candidate for future technology generations. The gate-all-around geometry enhances the electrostatic control and hence gate length scalability. In addition, it enables use of an undoped channel, which has the potential to minimize threshold voltage variation due to reduced random dopant fluctuations. However, there is little known about carrier mobility in Si nanowire MOSFETs. Because of the different crystal surface orientations, the nanowire sidewalls are expected to influence carrier transport. In addition, sidewall roughness due to non-ideal lithography and etch processes can degrade the carrier transport. Technological performance boosters are thus required to enhance electron and hole transport. Uniaxial strain engineering and maskless hydrogen thermal annealing are investigated in this thesis to enhance carrier mobility in gate-all-around nanowire MOSFETs. Uniaxial tensile stress of about 2 GPa was incorporated for the first time into suspended Si nanowire channels by a novel lateral relaxation and suspension technique. Gate-all-around strained-Si nanowire n- MOSFETs were fabricated with nanowire widths in the range of 8 to 50 nm and 8 nm body thickness, demonstrating near ideal sub-threshold swing and an enhancement in long-channel current drive and transconductance of approximately 2X for strained-Si nanowires compared to control Si nanowires. Lowfield effective mobility of these devices was extracted using split capacitance-voltage measurements and the two-FET method. The analysis indicates electron mobility enhancement for strained-Si nanowires over their unstrained Si counterparts, as well as over planar SOI, specifically at high inversion charge densities. However, the mobility of these nanowires was shown to decrease with decreasing nanowire width, consistent with reported data on unstrained Si nanowires. A simple analytical model was developed to investigate the contribution of the sidewalls to the nanowire width dependence of the electron mobility. A new design and process technology was developed to accurately investigate the hole mobility of gate-all-around Si nanowires. A conformal high-k/metal gate process, enabling uniform gating of the nanowire perimeter, was combined with a maskless hydrogen thermal anneal to reduce sidewall roughness scattering. Using this optimized process, long-channel devices with ideal sub-threshold swing (~60 mV/dec) and enhanced current drive were demonstrated, indicating the excellent quality of the nanowire/high-? interface and low-roughness sidewalls. Capacitance-voltage characteristics of sub-micron-long Si nanowires were accurately measured and verified by quantum-mechanical simulations. Increased effective hole mobility with decreasing nanowire width was observed down to 12 nm for hydrogen annealed nanowires, attributed to the smooth, high-mobility non-(100) sidewalls.

Book A Simulation Study of Silicon Nanowire Field Effect Transistors FETs

Download or read book A Simulation Study of Silicon Nanowire Field Effect Transistors FETs written by and published by . This book was released on 2007 with total page 145 pages. Available in PDF, EPUB and Kindle. Book excerpt: Abstract Silicon planar MOSFETs are approaching their scaling limits. New device designs are being explored to replace the existing planar technology. Among the possible new device designs are Double Gate (DG) FETs, FinFETs, Tri-Gate FETs and Omega- Gate FETs. The Silicon Nanowire Gate All Around (GAA) FET stands out as one of the most promising FET designs due to its maximum gate effect in controlling the short channel effects. Recent developments such as synthesis of highly ordered nanowires and fabrication of nanowires as small as 1nm in diameter have illustrated the progress possible in silicon nanowire technology In this study we have explored the silicon nanowire FET as a possible candidate to replace the currently planar MOSFETs. In this thesis we investigated the silicon nanowire FET device and compared its performance with that of a double gate (DG) FET. The software used for the study assumed quantum-ballistic transport (NanoWire), which was developed at Purdue University. Initially, we presented a comparison of Nanowire FET with DG FET with for devices with same physical parameters. It was seen that superior subthreshold characteristics are exhibited by a silicon nanowire FET. We also conducted an optimization study for the 25 nm node from the ITRS report. The final device was optimized for both High Performance and Low Operating Power applications. A further study on future technology nodes down to the 14 nm node was performed which revealed short channel effects becomes significant at gate lengths ~ 5 nm even for a silicon nanowire device. Finally, a process variation study was conducted in comparison with a FinFET device. It was concluded that a silicon nanowire FET shows less sensitivity to process variation except it has higher sensitivity in variation with the diameter at less than ~4 nm than for FinFET where significant quantum effects set in. Variation with the gate length was found to be much less sensitive for the silicon nanowire FET because of its superior gate control characteristics.

Book Advances in Communication Devices and Networking

Download or read book Advances in Communication Devices and Networking written by Rabindranath Bera and published by Springer Nature. This book was released on 2020-07-27 with total page 502 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book covers recent trends in the field of devices, wireless communication and networking. It gathers selected papers presented at the International Conference on Communication, Devices and Networking (ICCDN 2019), which was organized by the Department of Electronics and Communication Engineering, Sikkim Manipal Institute of Technology, Sikkim, India, on 9–10 December 2019. Gathering cutting-edge research papers prepared by researchers, engineers and industry professionals, it will help young and experienced scientists and developers alike to explore new perspectives, and offer them inspirations on how to address real-world problems in the areas of electronics, communication, devices and networking.

Book Fabrication and Characterization of the Polycrystlline Nanowires Thin Fim Transistor with Novel Gate all around Structure for Non volatie Memories

Download or read book Fabrication and Characterization of the Polycrystlline Nanowires Thin Fim Transistor with Novel Gate all around Structure for Non volatie Memories written by and published by . This book was released on 2010 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Nanowire Field Effect Transistor FET

Download or read book Nanowire Field Effect Transistor FET written by Antonio García-Loureiro and published by . This book was released on 2021 with total page 96 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the last few years, the leading semiconductor industries have introduced multi-gate non-planar transistors into their core business. These are being applied in memories and in logical integrated circuits to achieve better integration on the chip, increased performance, and reduced energy consumption. Intense research is underway to develop these devices further and to address their limitations, in order to continue transistor scaling while further improving performance. This Special Issue looks at recent developments in the field of nanowire field-effect transistors (NW-FETs), covering different aspects of the technology, physics, and modelling of these nanoscale devices.

Book FinFETs and Other Multi Gate Transistors

Download or read book FinFETs and Other Multi Gate Transistors written by J.-P. Colinge and published by Springer Science & Business Media. This book was released on 2008 with total page 350 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book explains the physics and properties of multi-gate field-effect transistors (MuGFETs), how they are made and how circuit designers can use them to improve the performances of integrated circuits. It covers the emergence of quantum effects due to the reduced size of the devices and describes the evolution of the MOS transistor from classical structures to SOI (silicon-on-insulator) and then to MuGFETs.

Book Junctionless Field Effect Transistors

Download or read book Junctionless Field Effect Transistors written by Shubham Sahay and published by John Wiley & Sons. This book was released on 2019-01-28 with total page 615 pages. Available in PDF, EPUB and Kindle. Book excerpt: A comprehensive one-volume reference on current JLFET methods, techniques, and research Advancements in transistor technology have driven the modern smart-device revolution—many cell phones, watches, home appliances, and numerous other devices of everyday usage now surpass the performance of the room-filling supercomputers of the past. Electronic devices are continuing to become more mobile, powerful, and versatile in this era of internet-of-things (IoT) due in large part to the scaling of metal-oxide semiconductor field-effect transistors (MOSFETs). Incessant scaling of the conventional MOSFETs to cater to consumer needs without incurring performance degradation requires costly and complex fabrication process owing to the presence of metallurgical junctions. Unlike conventional MOSFETs, junctionless field-effect transistors (JLFETs) contain no metallurgical junctions, so they are simpler to process and less costly to manufacture.JLFETs utilize a gated semiconductor film to control its resistance and the current flowing through it. Junctionless Field-Effect Transistors: Design, Modeling, and Simulation is an inclusive, one-stop referenceon the study and research on JLFETs This timely book covers the fundamental physics underlying JLFET operation, emerging architectures, modeling and simulation methods, comparative analyses of JLFET performance metrics, and several other interesting facts related to JLFETs. A calibrated simulation framework, including guidance on SentaurusTCAD software, enables researchers to investigate JLFETs, develop new architectures, and improve performance. This valuable resource: Addresses the design and architecture challenges faced by JLFET as a replacement for MOSFET Examines various approaches for analytical and compact modeling of JLFETs in circuit design and simulation Explains how to use Technology Computer-Aided Design software (TCAD) to produce numerical simulations of JLFETs Suggests research directions and potential applications of JLFETs Junctionless Field-Effect Transistors: Design, Modeling, and Simulation is an essential resource for CMOS device design researchers and advanced students in the field of physics and semiconductor devices.

Book Emerging Devices for Low Power and High Performance Nanosystems

Download or read book Emerging Devices for Low Power and High Performance Nanosystems written by Simon Deleonibus and published by CRC Press. This book was released on 2018-12-13 with total page 410 pages. Available in PDF, EPUB and Kindle. Book excerpt: The history of information and communications technologies (ICT) has been paved by both evolutive paths and challenging alternatives, so-called emerging devices and architectures. Their introduction poses the issues of state variable definition, information processing, and process integration in 2D, above IC, and in 3D. This book reviews the capabilities of integrated nanosystems to match low power and high performance either by hybrid and heterogeneous CMOS in 2D/3D or by emerging devices for alternative sensing, actuating, data storage, and processing. The choice of future ICTs will need to take into account not only their energy efficiency but also their sustainability in the global ecosystem.

Book Bias Temperature Instability for Devices and Circuits

Download or read book Bias Temperature Instability for Devices and Circuits written by Tibor Grasser and published by Springer Science & Business Media. This book was released on 2013-10-22 with total page 805 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.