Download or read book Excess Noise and Its Relationship to Electromigration in Thin Film Interconnections written by James G. Cottle and published by . This book was released on 1986 with total page 348 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Advances in Electronics and Electron Physics written by and published by Academic Press. This book was released on 1993-11-17 with total page 319 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advances in Electronics and Electron Physics

Download or read book IEEE Proceedings of the Southeastcon written by and published by . This book was released on 1987 with total page 364 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Proceedings International IEEE VLSI Multilevel Interconnection Conference written by and published by . This book was released on 1987 with total page 502 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Effect of Electromigration of 1 f Noise of Thin Film Conductor written by Tuck Pao Djeu and published by . This book was released on 1984 with total page 130 pages. Available in PDF, EPUB and Kindle. Book excerpt:

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Download or read book Microstructural Science for Thin Film Metallizations in Electronic Applications written by John Sanchez and published by Minerals, Metals, & Materials Society. This book was released on 1988 with total page 208 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book IEEE International Integrated Reliability Workshop Final Report written by and published by . This book was released on 1997 with total page 178 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Noise In Physical Systems And 1 f Fluctuations Proceedings Of The 13th International Conference written by Vytautas Bareikis and published by World Scientific. This book was released on 1995-04-26 with total page 770 pages. Available in PDF, EPUB and Kindle. Book excerpt: The volume constitutes the proceedings of the 13th International Conference on Noise in Physical Systems and 1/f Fluctuations (ICNF'95) held in Palanga, Lithuania, in the period 29 May - 3 June 1995.International conference of fluctuation phenomena has a rich history. Previous ones were held in St. Louis (USA, 1993), Kyoto (Japan, 1991), Budapest (Hungary, 1989), Montreal (Canada, 1983), etc. The conference proved to be successful in bringing together specialists in fluctuation phenomena in very different areas, and providing a bridge linking theorists and applied scientists involved in the design of new generation of electronic devices. Correspondingly, the volume covers fundamental aspects of noise in various fields of science and modern technology. Mesoscopic fluctuations, noise in high temperature superconductors, in nanoscale structures, in optoelectronic and microwave devices, fluctuation phenomena in biological systems and human body are in the spotlight.

Download or read book The Physical Properties of Thin Metal Films written by G.P. Zhigal'skii and published by CRC Press. This book was released on 2003-07-10 with total page 234 pages. Available in PDF, EPUB and Kindle. Book excerpt: Thin films of conducting materials, such as metals, alloys and semiconductors are currently in use in many areas of science and technology, particularly in modern integrated circuit microelectronics that require high quality thin films for the manufacture of connection layers, resistors and ohmic contacts. These conducting films are also important for fundamental investigations in physics, radio-physics and physical chemistry. Physical Properties of Thin Metal Films provides a clear presentation of the complex physical properties particular to thin conducting films and includes the necessary theory, confirming experiments and applications. The volume will be an invaluable reference for graduates, engineers and scientists working in the electronics industry and fields of pure and applied science.

Download or read book Proceedings written by and published by . This book was released on 1992 with total page 432 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Handbook of Semiconductor Interconnection Technology written by Geraldine Cogin Shwartz and published by CRC Press. This book was released on 2006-02-22 with total page 533 pages. Available in PDF, EPUB and Kindle. Book excerpt: First introduced about a decade ago, the first edition of the Handbook of Semiconductor Interconnection Technology became widely popular for its thorough, integrated treatment of interconnect technologies and its forward-looking perspective. The field has grown tremendously in the interim and many of the "likely directions" outlined in the first ed

Download or read book Electromigration in Thin Films and Electronic Devices written by Choong-Un Kim and published by . This book was released on 2011 with total page 329 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Microelectronic Reliability Reliability test and diagnostics written by Edward B. Hakim and published by Artech House Publishers. This book was released on 1989 with total page 400 pages. Available in PDF, EPUB and Kindle. Book excerpt: Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought

Download or read book Quantum 1 F Noise Other Low Frequency Fluctuations in Electronic Devices written by American Institute of Physics and published by A I P Press. This book was released on 1993 with total page 216 pages. Available in PDF, EPUB and Kindle. Book excerpt: This text contains the papers from the fifth Symposium in the sequence of quantum 1/f noise. The scope of the conference includes quantum 1/f noise, other low frequency fluctuations in electronic devices and their relation to fundamental 1/f noise.

Download or read book Thin Film Interconnect Electromigration Reliability Determined by Abrupt Changes in Resistance written by Craig Carl Frank Fahrenkrug and published by . This book was released on 1998 with total page 322 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Metallurgical Coatings and Thin Films 1994 written by and published by . This book was released on 1994 with total page 564 pages. Available in PDF, EPUB and Kindle. Book excerpt: