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Book Evaluation of Microcircuit Accelerated Test Techniques

Download or read book Evaluation of Microcircuit Accelerated Test Techniques written by G. M. Johnson and published by . This book was released on 1976 with total page 318 pages. Available in PDF, EPUB and Kindle. Book excerpt: The results of an extensive life test matrix demonstrated the general validity and effectiveness of accelerated tests of microcircuits using both temperature and voltage as accelerating stresses. Over 2500 microcircuits from TTL, CMOS and linear technologies were life tested at ambient temperatures between 125C and 285C. In general, bimodal failure distributions, comprised of early (Freak) and late (main) lognormal distributions, were observed. The relationship of median life with junction temperature could be represented with an Arrehenius reaction rate model. Activation energies for the freak distribution ranged from 0.7 eV to 1.3 eV, and in certain instances a short high temperature burn-in to eliminate the freak population results in a dramatic improvement in use-temperature failure rates. Complete high temperature microcircuit life characterization and lot acceptance tests are required to identify economically screenable lots. MIL-STD-883 test methods are proposed for general application of microcircuit high temperature accelerated tests as a new tool for assuring the reliability of semiconductor production lots, and for screening out potential surface related failures. Included in the proposed methods are guidelines for assuring test effectiveness. The inherent effectiveness of accelerated tests can only be assured through careful selection of the life-test circuit configuration, and test temperatures, and the effective analysis of the resulting failure data.

Book Microcircuit Reliability Bibliography

Download or read book Microcircuit Reliability Bibliography written by and published by . This book was released on 1978 with total page 412 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Scientific and Technical Aerospace Reports

Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on with total page 994 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Microcircuit Screening Effectiveness

Download or read book Microcircuit Screening Effectiveness written by Henry C. Rickers and published by . This book was released on 1978 with total page 120 pages. Available in PDF, EPUB and Kindle. Book excerpt: This information is utilized to determine efficiency factors of individual screens/tests and is combined with cost information to assess screening effectiveness and to provide the proper guidance in determining the optimal screening program for any specific situation. (Author).

Book Scientific and Technical Aerospace Reports

Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1981 with total page 1372 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Reliability Abstracts and Technical Reviews

Download or read book Reliability Abstracts and Technical Reviews written by and published by . This book was released on 1966 with total page 556 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Large Scale Integrated Circuits Technology  State of the Art and Prospects

Download or read book Large Scale Integrated Circuits Technology State of the Art and Prospects written by Leo Esaki and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 745 pages. Available in PDF, EPUB and Kindle. Book excerpt: A NATO Advanced Study Institute on "Large Scale Integrated Circuits Technology: State of the Art and Prospects" was held at Ettore Majorana Centre for Scientific Culture, Erice (Italy) on July 15-27, 1981, the first course of the International School of Solid-State Device Research. This volume contains the School Proceedings: fundamentals as well as up-to-date information on each subject presented by qualified authors. The material covered in this volume has been arranged in self-consistent chapters. Therefore, the Proceedings may be used as a suitable textbook or authoritative review for research workers and advanced students in the relevant field. The nascent information society is based on advanced technologies which will revolutionize human abilities to manipulate and communicate information. One of the most important underpinnings for developing such an information society lies in innovations in semiconductor microelectronics. Such innova tions, indeed, are dramatically reducing the cost of transmitting, storing, and processing information with improved performance, ushering in an era charac terized by large scale integration -the subject of this book.

Book Government Reports Announcements   Index

Download or read book Government Reports Announcements Index written by and published by . This book was released on 1976 with total page 798 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Government reports annual index

Download or read book Government reports annual index written by and published by . This book was released on 199? with total page 1196 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Corrosion Abstracts

Download or read book Corrosion Abstracts written by and published by . This book was released on 1978 with total page 564 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Reliability of Electronic Components

Download or read book Reliability of Electronic Components written by Titu I. Bajenescu and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 547 pages. Available in PDF, EPUB and Kindle. Book excerpt: This application-oriented professional book explains why components fail, addressing the needs of engineers who apply reliability principles in design, manufacture, testing and field service. A detailed index, a glossary, acronym lists, reliability dictionaries and a rich specific bibliography complete the book.

Book Reliability Physics 1973

Download or read book Reliability Physics 1973 written by and published by . This book was released on 1973 with total page 332 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Microelectronic Failure Analysis

Download or read book Microelectronic Failure Analysis written by and published by ASM International. This book was released on 2002-01-01 with total page 160 pages. Available in PDF, EPUB and Kindle. Book excerpt: Provides new or expanded coverage on the latest techniques for microelectronic failure analysis. The CD-ROM includes the complete content of the book in fully searchable Adobe Acrobat format. Developed by the Electronic Device Failure Analysis Society (EDFAS) Publications Committee

Book Issues in Nuclear and Plasma Science and Technology  2011 Edition

Download or read book Issues in Nuclear and Plasma Science and Technology 2011 Edition written by and published by ScholarlyEditions. This book was released on 2012-01-09 with total page 477 pages. Available in PDF, EPUB and Kindle. Book excerpt: Issues in Nuclear and Plasma Science and Technology: 2011 Edition is a ScholarlyEditions™ eBook that delivers timely, authoritative, and comprehensive information about Nuclear and Plasma Science and Technology. The editors have built Issues in Nuclear and Plasma Science and Technology: 2011 Edition on the vast information databases of ScholarlyNews.™ You can expect the information about Nuclear and Plasma Science and Technology in this eBook to be deeper than what you can access anywhere else, as well as consistently reliable, authoritative, informed, and relevant. The content of Issues in Nuclear and Plasma Science and Technology: 2011 Edition has been produced by the world’s leading scientists, engineers, analysts, research institutions, and companies. All of the content is from peer-reviewed sources, and all of it is written, assembled, and edited by the editors at ScholarlyEditions™ and available exclusively from us. You now have a source you can cite with authority, confidence, and credibility. More information is available at http://www.ScholarlyEditions.com/.

Book Nondestructive Evaluation of Semiconductor Materials and Devices

Download or read book Nondestructive Evaluation of Semiconductor Materials and Devices written by J. Zemel and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 791 pages. Available in PDF, EPUB and Kindle. Book excerpt: From September 19-29, a NATO Advanced Study Institute on Non destructive Evaluation of Semiconductor Materials and Devices was held at the Villa Tuscolano in Frascati, Italy. A total of 80 attendees and lecturers participated in the program which covered many of the important topics in this field. The subject matter was divided to emphasize the following different types of problems: electrical measurements; acoustic measurements; scanning techniques; optical methods; backscatter methods; x-ray observations; accele rated life tests. It would be difficult to give a full discussion of such an Institute without going through the major points of each speaker. Clearly this is the proper task of the eventual readers of these Proceedings. Instead, it would be preferable to stress some general issues. What came through very clearly is that the measurements of the basic scientists in materials and device phenomena are of sub stantial immediate concern to the device technologies and end users.

Book Research and Technology Program Digest Flash Index

Download or read book Research and Technology Program Digest Flash Index written by and published by . This book was released on 1967 with total page 794 pages. Available in PDF, EPUB and Kindle. Book excerpt: