Download or read book Scanning Electron Microscopy and X Ray Microanalysis written by Joseph Goldstein and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 679 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.

Download or read book Handbook of Sample Preparation for Scanning Electron Microscopy and X Ray Microanalysis written by Patrick Echlin and published by Springer Science & Business Media. This book was released on 2011-04-14 with total page 329 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of the incoming electrons go to ground. The formation of the image depends on collecting the different signals that are scattered as a consequence of the high energy beam interacting with the sample. Backscattered electrons and secondary electrons are generated within the primary beam-sample interactive volume and are the two principal signals used to form images. The backscattered electron coefficient ( ? ) increases with increasing atomic number of the specimen, whereas the secondary electron coefficient ( ? ) is relatively insensitive to atomic number. This fundamental diff- ence in the two signals can have an important effect on the way samples may need to be prepared. The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.

Download or read book Electron Microscopy in Mineralogy written by P.E. Champness and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 574 pages. Available in PDF, EPUB and Kindle. Book excerpt: During the last five years transmission electron microscopy (TEM) has added numerous important new data to mineralogy and has considerably changed its outlook. This is partly due to the fact that metallurgists and crystal physicists having solved most of the structural and crystallographic problems in metals have begun to show a widening interest in the much more complicated structures of minerals, and partly to recent progress in experimental techniques, mainly the availability of ion-thinning devices. While electron microscopists have become increasingly interested in minerals (judging from special symposia at recent meetings such as Fifth European Congress on Electron microscopy, Man chester 1972; Eight International Congress on Electron Microscopy, Canberra 1974) mineralogists have realized advantages of the new technique and applied it with increasing frequency. In an effort to coordinate the growing quantity of research, electron microscopy sessions have been included in meetings of mineralogists (e. g. Geological Society of America, Minneapolis, 1972, American Crystallographic Association, Berkeley, 1974). The tremendous response for the TEM symposium which H. -R. Wenk and G. Thomas organized at the Berkeley Conference of the American Crystallographic Association formed the basis for this book. It appeared useful at this stage to summarize the achievements of electron microscopy, scattered in many different journals in several different fields and present them to mineralogists. A group of participants as the Berkeley symposium formed an Editorial Committee and outlined the content of this book.

Download or read book Practical Scanning Electron Microscopy written by Joseph Goldstein and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 598 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. They predicted that three to five might be sold in the first year a commercial SEM was available, and that ten instruments would saturate the marketplace. In 1964, the Cambridge Instruments Stereoscan was introduced into the United States and, in the following decade, over 1200 scanning electron microscopes were sold in the U. S. alone, representing an investment conservatively estimated at $50,000- $100,000 each. Why were the market surveyers wrongil Perhaps because they asked the wrong persons, such as electron microscopists who were using the highly developed transmission electron microscopes of the day, with resolutions from 5-10 A. These scientists could see little application for a microscope that was useful for looking at surfaces with a resolution of only (then) about 200 A. Since that time, many scientists have learned to appreciate that information content in an image may be of more importance than resolution per se. The SEM, with its large depth of field and easily that often require little or no sample prepara interpreted images of samples tion for viewing, is capable of providing significant information about rough samples at magnifications ranging from 50 X to 100,000 X. This range overlaps considerably with the light microscope at the low end, and with the electron microscope at the high end.

Download or read book ASM Metals Reference Book 3rd Edition written by Michael Bauccio and published by ASM International. This book was released on 1993-01-01 with total page 628 pages. Available in PDF, EPUB and Kindle. Book excerpt: This reference book makes it easy for anyone involved in materials selection, or in the design and manufacture of metallic structural components to quickly screen materials for a particular application. Information on practically all ferrous and nonferrous metals including powder metals is presented in tabular form for easy review and comparison between different materials. Included are chemical compositions, physical and mechanical properties, manufacturing processes, applications, pertinent specifications and standards, and test methods. Contents Overview: Glossary of metallurgical terms Selection of structural materials (specifications and standards, life cycle and failure modes, materials properties and design, and properties and applications) Physical data on the elements and alloys Testing and inspection Chemical composition and processing characteristics

Download or read book Principles of Analytical Electron Microscopy written by Joseph Goldstein and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 458 pages. Available in PDF, EPUB and Kindle. Book excerpt: Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization. Significant strides have been made in our understanding of image formation, electron diffraction, and beam/specimen interactions, both in terms of the "physics of the processes" and their practical implementation in modern instruments. It is the intent of the editors and authors of the current text, Principles of Analytical Electron Microscopy, to bring together, in one concise and readily accessible volume, these recent advances in the subject. The text begins with a thorough discussion of fundamentals to lay a foundation for today's state-of-the-art microscopy. All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention. To increase the utility of the volume to a broader cross section of the scientific community, the book's approach is, in general, more descriptive than mathematical. In some areas, however, mathematical concepts are dealt with in depth, increasing the appeal to those seeking a more rigorous treatment of the subject.

Download or read book Electron Microprobe Analysis and Scanning Electron Microscopy in Geology written by S. J. B. Reed and published by Cambridge University Press. This book was released on 2005-08-25 with total page 232 pages. Available in PDF, EPUB and Kindle. Book excerpt: Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

Download or read book Interpretation of Metallographic Structures written by William Rostoker and published by Elsevier. This book was released on 2012-12-02 with total page 297 pages. Available in PDF, EPUB and Kindle. Book excerpt: Interpretation of Metallographic Structures, Third Edition, is concerned with metallography as a metallurgical tool. It is an organized presentation of specimen microstructures, each chosen for its clarity of illustration and each or in groups forming the pretext for discussions of the interrelation between physical metallurgy and metallography. The focus is on structures characteristic in a physical metallurgy sense, with the purpose of demonstrating that logical framework of interpretation can supplant mental storage of infinite variations. The book contains seven chapters and begins with a discussion of polycrystalline structures. This is followed by separate chapters on the metallography of fracture; crystallization processes including dendritic crystallization, peritectic crystallization, and metastable crystallization; solid state transformations; diffusion and transport processes; procedures for measuring metallographic features; and energy dispersive spectography. This book is directed toward the senior student as a preview of the scope of his subject and to the practicing metallurgist as a reintroduction.

Download or read book CRC Handbook of Chemistry and Physics 96th Edition written by William M. Haynes and published by CRC Press. This book was released on 2015-06-09 with total page 2652 pages. Available in PDF, EPUB and Kindle. Book excerpt: Proudly serving the scientific community for over a century, this 96th edition of the CRC Handbook of Chemistry and Physics is an update of a classic reference, mirroring the growth and direction of science. This venerable work continues to be the most accessed and respected scientific reference in the world. An authoritative resource consisting of tables of data and current international recommendations on nomenclature, symbols, and units, its usefulness spans not only the physical sciences but also related areas of biology, geology, and environmental science. The 96th edition of the Handbook includes 18 new or updated tables along with other updates and expansions. A new series highlighting the achievements of some of the major historical figures in chemistry and physics was initiated with the 94th edition. This series is continued with this edition, which is focused on Lord Kelvin, Michael Faraday, John Dalton, and Robert Boyle. This series, which provides biographical information, a list of major achievements, and notable quotations attributed to each of the renowned chemists and physicists, will be continued in succeeding editions. Each edition will feature two chemists and two physicists. The 96th edition now includes a complimentary eBook with purchase of the print version. This reference puts physical property data and mathematical formulas used in labs and classrooms every day within easy reach. New Tables: Section 1: Basic Constants, Units, and Conversion Factors Descriptive Terms for Solubility Section 8: Analytical Chemistry Stationary Phases for Porous Layer Open Tubular Columns Coolants for Cryotrapping Instability of HPLC Solvents Chlorine-Bromine Combination Isotope Intensities Section 16: Health and Safety Information Materials Compatible with and Resistant to 72 Percent Perchloric Acid Relative Dose Ranges from Ionizing Radiation Updated and Expanded Tables Section 6: Fluid Properties Sublimation Pressure of Solids Vapor Pressure of Fluids at Temperatures Below 300 K Section 7: Biochemistry Structure and Functions of Some Common Drugs Section 9: Molecular Structure and Spectroscopy Bond Dissociation Energies Section 11: Nuclear and Particle Physics Summary Tables of Particle Properties Table of the Isotopes Section 14: Geophysics, Astronomy, and Acoustics Major World Earthquakes Atmospheric Concentration of Carbon Dioxide, 1958-2014 Global Temperature Trend, 1880-2014 Section 15: Practical Laboratory Data Dependence of Boiling Point on Pressure Section 16: Health and Safety Information Threshold Limits for Airborne Contaminants

Download or read book An Introduction to Beam Physics written by Martin Berz and published by CRC Press. This book was released on 2014-12-03 with total page 624 pages. Available in PDF, EPUB and Kindle. Book excerpt: The field of beam physics touches many areas of physics, engineering, and the sciences. In general terms, beams describe ensembles of particles with initial conditions similar enough to be treated together as a group so that the motion is a weakly nonlinear perturbation of a chosen reference particle. Particle beams are used in a variety of areas, ranging from electron microscopes, particle spectrometers, medical radiation facilities, powerful light sources, and astrophysics to large synchrotrons and storage rings such as the LHC at CERN. An Introduction to Beam Physics is based on lectures given at Michigan State University’s Department of Physics and Astronomy, the online VUBeam program, the U.S. Particle Accelerator School, the CERN Academic Training Programme, and various other venues. It is accessible to beginning graduate and upper-division undergraduate students in physics, mathematics, and engineering. The book begins with a historical overview of methods for generating and accelerating beams, highlighting important advances through the eyes of their developers using their original drawings. The book then presents concepts of linear beam optics, transfer matrices, the general equations of motion, and the main techniques used for single- and multi-pass systems. Some advanced nonlinear topics, including the computation of aberrations and a study of resonances, round out the presentation.

Download or read book Physical Metallurgy written by R.W. Cahn and published by Elsevier. This book was released on 1996-02-09 with total page 2889 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is the fourth edition of a work which first appeared in 1965. The first edition had approximately one thousand pages in a single volume. This latest volume has almost three thousand pages in 3 volumes which is a fair measure of the pace at which the discipline of physical metallurgy has grown in the intervening 30 years.Almost all the topics previously treated are still in evidence in this version which is approximately 50% bigger than the previous edition. All the chapters have been either totally rewritten by new authors or thoroughly revised and expanded, either by the third-edition authors alone or jointly with new co-authors. Three chapters on new topics have been added, dealing with dry corrosion, oxidation and protection of metal surfaces; the dislocation theory of the mechanical behavior of intermetallic compounds; and (most novel) a chapter on polymer science for metallurgists, which analyses the conceptual mismatch between metallurgists' and polymer scientists' way of looking at materials. Special care has been taken throughout all chapters to incorporate the latest experimental research results and theoretical insights. Several thousand citations to the research and review literature are included in this edition. There is a very detailed subject index, as well as a comprehensive author index.The original version of this book has long been regarded as the standard text in physical metallurgy and this thoroughly rewritten and updated version will retain this status.

Download or read book Electron Energy Loss Spectroscopy in the Electron Microscope written by R.F. Egerton and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 491 pages. Available in PDF, EPUB and Kindle. Book excerpt: to the Second Edition Since the first (1986) edition of this book, the numbers of installations, researchers, and research publications devoted to electron energy-loss spec troscopy (EELS) in the electron microscope have continued to expand. There has been a trend towards intermediate accelerating voltages and field-emission sources, both favorable to energy-loss spectroscopy, and sev eral types of energy-filtering microscope are now available commercially. Data-acquisition hardware and software, based on personal computers, have become more convenient and user-friendly. Among university re searchers, much thought has been given to the interpretation and utilization of near-edge fine structure. Most importantly, there have been many practi cal applications of EELS. This may reflect an increased awareness of the potentialities of the technique, but in many cases it is the result of skill and persistence on the part of the experimenters, often graduate students. To take account of these developments, the book has been extensively revised (over a period of two years) and more than a third of it rewritten. I have made various minor changes to the figures and added about 80 new ones. Except for a few small changes, the notation is the same as in the first edition, with all equations in SI units.

Download or read book Introduction to the Properties of Crystal Surfaces written by J. M. Blakely and published by Elsevier. This book was released on 2013-10-22 with total page 274 pages. Available in PDF, EPUB and Kindle. Book excerpt: Introduction to the Properties of Crystal Surfaces is an introductory text on crystal surfaces and their properties. A variety of phenomena, including electron emission, adsorption and oxidation, adhesion, friction, nucleation and epitaxial growth, and heterogeneous catalysis, are described by considering the details of the atomic and electronic structure in the surface region. This volume is comprised of seven chapters and begins with a discussion on the thermodynamics of surfaces, along with the equilibrium configuration at the intersection of interfaces and the effects of curvature of crystalline surfaces. The next chapter examines the properties of interfaces in multi-component systems, followed by an analysis of experimental measurements of surface tension in solids. The atomic structure of crystal surfaces and some theoretical aspects of surface studies are also considered, and experimental methods in used in such studies are outlined. The final chapter deals with two atomic processes that are involved in a number of reactions at crystal surfaces: surface atomic diffusion and adsorption. This book is intended for senior undergraduates in a materials science type of curriculum or those beginning research work in the field or associated areas.

Download or read book Supported Metals in Catalysis written by James Arthur Anderson and published by World Scientific. This book was released on 2012 with total page 581 pages. Available in PDF, EPUB and Kindle. Book excerpt: With contributions from experts in supported metal catalysis from both the industry and academia, this book presents the latest developments in characterization and application of supported metals in heterogeneous catalysis. In addition to thorough and updated coverage of the traditional aspects of heterogeneous catalysis such as preparation, characterization and use in well-established technologies such as vehicle emission control, the book also includes emerging areas where supported metal catalysis will make significant contributions to future developments, such as fuel cells and fine chemicals synthesis. The second edition of Supported Metals in Catalysis comes complete with new and updated chapters containing important summaries of research in a rapidly evolving field. Very few other books deal with this highly pertinent subject matter and, as such, it is a must-have for anyone working in the field of heterogeneous catalysis.

Download or read book Semiconductor Material and Device Characterization written by Dieter K. Schroder and published by John Wiley & Sons. This book was released on 2015-06-29 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.

Download or read book Introduction to Texture Analysis written by Olaf Engler and published by CRC Press. This book was released on 2024-02-14 with total page 697 pages. Available in PDF, EPUB and Kindle. Book excerpt: Reflecting emerging methods and the evolution of the field, Introduction to Texture Analysis: Macrotexture, Microtexture, and Orientation Mapping keeps mathematics to a minimum in covering both traditional macrotexture analysis and more advanced electron-microscopy-based microtexture analysis. The authors integrate the two techniques and address the subsequent need for a more detailed explanation of philosophy, practice, and analysis associated with texture analysis. The book illustrates approaches to orientation measurement and interpretation and elucidates the fundamental principles on which measurements are based. Thoroughly updated, this Third Edition of a best-seller is a rare introductory-level guide to texture analysis. Discusses terminology associated with orientations, texture, and their representation, as well as the diffraction of radiation, a phenomenon that is the basis for almost all texture analysis. Covers data acquisition, as well as representation and evaluation related to the well-established methods of macrotexture analysis. Updated to include experimental details of the latest transmission or scanning electron microscope-based techniques for microstructure analysis, including electron backscatter diffraction (EBSD). Describes how microtexture data are evaluated and represented and emphasizes the advances in orientation microscopy and mapping, and advanced issues concerning crystallographic aspects of interfaces and connectivity. Offers new and innovative grain boundary descriptions and examples. This book is an ideal tool to help readers in the materials sciences develop a working understanding of the practice and applications of texture.

Download or read book Image Formation in Low voltage Scanning Electron Microscopy written by Ludwig Reimer and published by SPIE Press. This book was released on 1993 with total page 162 pages. Available in PDF, EPUB and Kindle. Book excerpt: While most textbooks about scanning electron microscopy (SEM) cover the high-voltage range from 5-50 keV, this volume considers the special problems in low-voltage SEM and summarizes the differences between LVSEM and conventional SEM. Chapters cover the influence of lens aberrations and design on electron-probe formation; the effect of elastic and inelastic scattering processes on electron diffusion and electron range; charging and radiation damage effects; the dependence of SE yield and the backscattering coefficient on electron energy, surface tilt, and material as well as the angular and energy distributions; and types of image contrast and the differences between LVSEM and conventional SEM modes due to the influence of electron-specimen interactions.