Download or read book Electron Beam Imaging of Non crystalline Materials written by and published by CRC Press. This book was released on 1988-01-01 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Electron Crystallography written by Thomas E. Weirich and published by Springer Science & Business Media. This book was released on 2006-08-18 with total page 533 pages. Available in PDF, EPUB and Kindle. Book excerpt: During the last decade we have been witness to several exciting achievements in electron crystallography. This includes structural and charge density studies on organic molecules complicated inorganic and metallic materials in the amorphous, nano-, meso- and quasi-crystalline state and also development of new software, tailor-made for the special needs of electron crystallography. Moreover, these developments have been accompanied by a now available new generation of computer controlled electron microscopes equipped with high-coherent field-emission sources, cryo-specimen holders, ultra-fast CCD cameras, imaging plates, energy filters and even correctors for electron optical distortions. Thus, a fast and semi-automatic data acquisition from small sample areas, similar to what we today know from imaging plates diffraction systems in X-ray crystallography, can be envisioned for the very near future. This progress clearly shows that the contribution of electron crystallography is quite unique, as it enables to reveal the intimate structure of samples with high accuracy but on much smaller samples than have ever been investigated by X-ray diffraction. As a tribute to these tremendous recent achievements, this NATO Advanced Study Institute was devoted to the novel approaches of electron crystallography for structure determination of nanosized materials.
Download or read book Impact of Electron and Scanning Probe Microscopy on Materials Research written by David G. Rickerby and published by Springer Science & Business Media. This book was released on 1999-10-31 with total page 522 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents a coherent synopsis of a rapidly evolving field. Subjects covered include diffraction contrast and defect analysis by conventional TEM lattice imaging, phase contrast and resolution limits in high resolution electron microscopy. Specialised electron diffraction techniques are also covered, as is the application of parallel electron energy loss spectroscopy and scanning transmission EM for subnanometer analysis. Materials analyzed include thin films, interfaces and non-conventional materials. WDS and EDS are treated, with an emphasis on phi(rhoZeta) techniques for the analysis of thin layers and surface films. Theoretical and practical aspects of ESEM are discussed in relation to applications in crystal growth, biomaterials and polymers. Recent developments in SPM are also described. A comprehensive survey of the state of the art in electron and SPM, future research directions and prospective applications in materials engineering.
Download or read book Particles on Surfaces Detection Adhesion and Removal written by Kash L. Mittal and published by CRC Press. This book was released on 2006-05-29 with total page 365 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume chronicles the proceedings of the 9th International Symposium on Particles on Surfaces: Detection, Adhesion and Removal held in Philadelphia, PA, June 2004. The study of particles on surfaces is crucially important in a legion of diverse technological areas, ranging from microelectronics to biomedical to space. This volume contains a total of 21 papers covering many ramifications of particles on surfaces, ranging from detection to removal. All manuscripts were rigorously peer-reviewed and revised, and properly edited before inclusion in this book. The topics covered include: imaging and analysis of macro and nanosize particles and surface features; determination of particles on surfaces; laser inactivation on surfaces; laser-assisted nanofabrication on surfaces; post-CMP cleaning process; pre-gate cleaning; solar panel obscuration in the Martian atmosphere; adhesion and friction of microsized particles; microroughness of textile fibers and capture of particles; factors affecting particle adhesion and removal; various techniques for cleaning or removal of particles from different substrates including laser, combination of laser-induced shockwave and explosive vaporization of liquid, attenuated total internal reflection of laser light, CO2 snow, use of dense phase fluids, use of surfactants and impinging air jet; and removal of sub-100-nm particles.
Download or read book Surface and Interface Characterization by Electron Optical Methods written by Ugo Valdre and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 321 pages. Available in PDF, EPUB and Kindle. Book excerpt: The importance of real space imaging and spatially-resolved spectroscopy in many of the most significant problems of surface and interface behaviour is almost self evident. To join the expertise of the tradi tional surface scientist with that of the electron microscopist has however been a slow and difficult process. In the past few years remarkable progress has been achieved, including the development of new techniques of scanning transmission and reflection imaging as well as low energy microscopy, all carried out in greatly improved vacuum conditions. Most astonishing of all has been the advent of the scanning tunneling electron microscope providing atomic resolution in a manner readily compatible with most surface science diagnostic procedures. The problem of beam damage, though often serious, is increasingly well understood so that we can assess the reliability and usefulness of the results which can now be obtained in catalysis studies and a wide range of surface science applications. These new developments and many others in more established surface techniques are all described in this book, based on lectures given at a NATO Advanced Study Institute held in Erice, Sicily, at Easter 1987. It is regretted that a few lectures on low energy electron diffraction and channeling effects could not be included. Fifteen lecturers from seven different Countries and 67 students from 23 Countries and a wide variety of backgrounds attended the school.
Download or read book Developments in Surface Contamination and Cleaning Volume 12 written by Rajiv Kohli and published by Elsevier. This book was released on 2019-06-08 with total page 276 pages. Available in PDF, EPUB and Kindle. Book excerpt: Developments in Surface Contamination and Cleaning: Methods for Assessment and Verification of Cleanliness of Surfaces and Characterization of Surface Contaminants, Volume Twelve, the latest release in the Developments in Surface Contamination and Cleaning series, provides best practices on determining surface cleanliness. Chapters include an introduction to the nature and size of particles, a discussion of cleanliness levels, detailed coverage of measurement methods, characterization methods and analytical methods for evaluating surfaces, and an overview of analysis methods for various contaminants. As a whole, the series creates a unique and comprehensive knowledge base for those in research and development in a variety of industries. Manufacturing, quality control and procurement specification professionals in the aerospace, automotive, biomedical, defense, energy, manufacturing, microelectronics, optics and xerography industries will find this book to be very helpful. In addition, researchers in an academic setting will also find these volumes excellent source books. Includes an extensive listing, with a description of available methods for the assessment of surface cleanliness Provides a single source of information on methods for verification of surface cleanliness Serves as a guide to the selection, assessment and verification of methods for specific applications
Download or read book Advanced Scanning Electron Microscopy and X Ray Microanalysis written by Patrick Echlin and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 463 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course.
Download or read book Electron Beam Analysis of Materials written by M. H. Loretto and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 218 pages. Available in PDF, EPUB and Kindle. Book excerpt: The examination of materials using electron beam techniques has developed continuously for over twenty years and there are now many different methods of extracting detailed structural and chemical information using electron beams. These techniques which include electron probe microanalysis, trans mission electron microscopy, Auger spectroscopy and scanning electron microscopy have, until recently, developed more or less independently of each other. Thus dedicated instruments designed to optimize the performance for a specific application have been available and correspondingly most of the available textbooks tend to have covered the theory and practice of an individual technique. There appears to be no doubt that dedicated instru ments taken together with the specialized textbooks will continue to be the appropriate approach for some problems. Nevertheless the underlying electron-specimen interactions are common to many techniques and in view of the fact that a range of hybrid instruments is now available it seems appropriate to provide a broad-based text for users of these electron beam facilities. The aim of the present book is therefore to provide, in a reasonably concise form, the material which will allow the practitioner of one or more of the individual techniques to appreciate and to make use of the type of information which can be obtained using other electron beam techniques.
Download or read book Particles on Surfaces Detection Adhesion and Removal Volume 9 written by Kash L. Mittal and published by CRC Press. This book was released on 2006-06-01 with total page 365 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume chronicles the proceedings of the 9th International Symposium on Particles on Surfaces: Detection, Adhesion and Removal held in Philadelphia, PA, June 2004. The study of particles on surfaces is crucially important in a legion of diverse technological areas, ranging from microelectronics to biomedical to space. This volume contains a to
Download or read book Non Crystalline Chalcogenicides written by M.A. Popescu and published by Springer Science & Business Media. This book was released on 2001-11-30 with total page 396 pages. Available in PDF, EPUB and Kindle. Book excerpt: The earliest experimental data on an oxygen-free glass have been published by Schulz-Sellack in 1870 [1]. Later on, in 1902, Wood [2], as well as Meier in 1910 [3], carried out the first researches on the optical properties of vitreous selenium. The interest in the glasses that exhibit transparency in the infrared region of the optical spectrum rose at the beginning of the twentieth century. Firstly were investigated the heavy metal oxides and the transparency limit was extended from (the case of the classical oxide glasses) up to wavelength. In order to extend this limit above the scientists tried the chemical compositions based on the elements of the sixth group of the Periodic Table, the chalcogens: sulphur, selenium and tellurium. The systematic research in the field of glasses based on chalcogens, called chalcogenide glasses, started at the middle of our century. In 1950 Frerichs [4] investigated the glass and published the paper: “New optical glasses transparent in infrared up to 12 . Several years later he started the study of the selenium glass and prepared several binary glasses with sulphur [5]. Glaze and co-workers [6] developed in 1957 the first method for the preparation of the glass at the industrial scale, while Winter-Klein [7] published reports on numerous chalcogenides prepared in the vitreous state.
Download or read book Cryogenic Electron Microscopy and Tomography on Radiation Sensitive Crystalline Materials written by Weijiang Zhou and published by . This book was released on 2022 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Cryogenic electron microscopy (Cryo-EM) has been one of the most exciting technology advancements in biological field in recent years. The idea of freezing samples in liquid nitrogen temperature provides a unique advantage to preserve and observe the object of interest in their native state. The improvements in both electron microscopy related hardware and data processing software enable the retrieval of structural information to atomic details. However, many technical features in electron microscope have not been fully explored for cryo-EM and many other sample systems other than biological specimens could utilize cryo-EM to accelerate their structural characterization research. This dissertation focuses on developing a new cryo-EM based experimental and data processing pipeline to further extend the applications of cryo-EM to broader research fields, where the samples of interest are normally not amenable to conventional electron microscopy methods. There are two common features across the specimens aforementioned: first, they are crystalline materials, meaning they are either single crystals or contain certain degree of periodic structures; second, they are sensitive to electron radiation, thus conventional transmission electron microscopy is not suitable to study such materials due to its high electron radiation damage. To investigate those specimens using cryo-EM, we developed several new methods: customized freezing protocol to preserve the samples from ambient environment; cryogenic focused ion beam milling to prepare electron transparent samples; continuous tilting electron diffraction to solve the atomic structure from single crystals; electron diffraction and high resolution low dose electron imaging to acquire the sub-nanometer structural information in both real-space and Fourier space; electron tomography and automated annotation to recover the morphology of non-biological samples in 3D. Those lead to many unprecedented findings in those representative specimens, which will be described in this dissertation. We anticipate those new technical developments will facilitate the usage of cryo-EM in structural biology, chemical biology, organic chemistry and material science in the near future.
Download or read book Elements of Modern X ray Physics written by Jens Als-Nielsen and published by John Wiley & Sons. This book was released on 2011-04-04 with total page 440 pages. Available in PDF, EPUB and Kindle. Book excerpt: Eagerly awaited, this second edition of a best-selling text comprehensively describes from a modern perspective the basics of x-ray physics as well as the completely new opportunities offered by synchrotron radiation. Written by internationally acclaimed authors, the style of the book is to develop the basic physical principles without obscuring them with excessive mathematics. The second edition differs substantially from the first edition, with over 30% new material, including: A new chapter on non-crystalline diffraction - designed to appeal to the large community who study the structure of liquids, glasses, and most importantly polymers and bio-molecules A new chapter on x-ray imaging - developed in close cooperation with many of the leading experts in the field Two new chapters covering non-crystalline diffraction and imaging Many important changes to various sections in the book have been made with a view to improving the exposition Four-colour representation throughout the text to clarify key concepts Extensive problems after each chapter There is also supplementary book material for this title available online (http://booksupport.wiley.com). Praise for the previous edition: “The publication of Jens Als-Nielsen and Des McMorrow’s Elements of Modern X-ray Physics is a defining moment in the field of synchrotron radiation… a welcome addition to the bookshelves of synchrotron–radiation professionals and students alike.... The text is now my personal choice for teaching x-ray physics…” – Physics Today, 2002
Download or read book Nanodiamonds written by Jean-Charles Arnault and published by William Andrew. This book was released on 2017-04-25 with total page 506 pages. Available in PDF, EPUB and Kindle. Book excerpt: Nanodiamonds: Advanced Material Analysis, Properties and Applications illustrates the complementarity of specific techniques to fully characterize nanodiamonds from their diamond core (crystalline structure, defects, sp2 carbon, impurities, strain) to their surface (surface chemistry, stability of surface groups, reactivity, surface charge, colloidal properties). The relationship between physical and chemical parameters sits at the heart of what this book is about. Recent advances in the synthesis of nanodiamonds either by HPHT or detonation are covered, along with extended characterization of the core and surface of nanodiamonds, focusing on the most advanced experimental tools developed for nanoscale diagnosis. Each technique presented includes presentation of both principles and applications. This combination of advanced characterizations offers readers a better understanding of the relationship that exists between physical and chemical parameters of nanodiamonds and their properties. In particular, the role of structural defects or chemical impurities is illustrated. Toxicity of nanodiamonds for cells is also discussed, as It is an essential issue for their bioapplications. Final sections in the book cover the main promising new advances and applications of nanodiamonds, the formation of hybrids, and their use in polymer and oil composites. Provides a focused analysis of the relationship between the physical, chemical parameters, and properties of nanodiamonds Allows the reader to better understand the material characterization of nanodiamonds and how they can be most successfully used Presents R&D scientists and engineers with the information they need to understand how nanodiamonds can be used to create more efficient products Includes novel applications, for example, the formation of hybrids based on nanodiamonds, that are covered in detail
Download or read book The Principles and Practice of Electron Microscopy written by Ian M. Watt and published by Cambridge University Press. This book was released on 1997-01-30 with total page 506 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first edition of this book was widely praised as an excellent introduction to electron microscopy for materials scientists, physicists, earth and biological scientists. This completely revised new edition contains expanded coverage of existing topics and much new material. The author presents the subject of electron microscopy in a readable way, open both to those inexperienced in the technique, and also to practising electron microscopists. The coverage has been brought completely up to date, whilst retaining descriptions of early classic techniques. Currently live topics such as computer control of microscopes, energy-filtered imaging, cryo- and environmental microscopy, digital imaging, and high resolution scanning and transmission microscopy are all described. The highly praised case studies of the first edition have been expanded to include some interesting new examples. This indispensable guide to electron microscopy, written by an author with thirty years practical experience, will be invaluable to new and experienced electron microscopists in any area of science and technology.
Download or read book Industrial Applications Of Electron Microscopy written by Zhigang Li and published by CRC Press. This book was released on 2002-12-04 with total page 640 pages. Available in PDF, EPUB and Kindle. Book excerpt: Providing proven strategies for solutions to research, development, and production dilemmas, this reference details the instrumentation and underlying principles for utilization of electron microscopy in the manufacturing, automotive, semiconductor, photographic film, pharmaceutical, chemical, mineral, forensic, glass, and pulp and paper industries. The book covers safety, calibration, and troubleshooting techniques, as well as methods in sample preparation and image collection, interpretation, and analysis. It includes contributions from microscopy experts based at major corporations and scientists from universities and major research centers.
Download or read book Scanning Transmission Electron Microscopy written by Alina Bruma and published by CRC Press. This book was released on 2020-12-20 with total page 164 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning Transmission Electron Microscopy is focused on discussing the latest approaches in the recording of high-fidelity quantitative annular dark-field (ADF) data. It showcases the application of machine learning in electron microscopy and the latest advancements in image processing and data interpretation for materials notoriously difficult to analyze using scanning transmission electron microscopy (STEM). It also highlights strategies to record and interpret large electron diffraction datasets for the analysis of nanostructures. This book: Discusses existing approaches for experimental design in the recording of high-fidelity quantitative ADF data Presents the most common types of scintillator-photomultiplier ADF detectors, along with their strengths and weaknesses. Proposes strategies to minimize the introduction of errors from these detectors and avenues for dealing with residual errors Discusses the practice of reliable multiframe imaging, along with the benefits and new experimental opportunities it presents in electron dose or dose-rate management Focuses on supervised and unsupervised machine learning for electron microscopy Discusses open data formats, community-driven software, and data repositories Proposes methods to process information at both global and local scales, and discusses avenues to improve the storage, transfer, analysis, and interpretation of multidimensional datasets Provides the spectrum of possibilities to study materials at the resolution limit by means of new developments in instrumentation Recommends methods for quantitative structural characterization of sensitive nanomaterials using electron diffraction techniques and describes strategies to collect electron diffraction patterns for such materials This book helps academics, researchers, and industry professionals in materials science, chemistry, physics, and related fields to understand and apply computer-science–derived analysis methods to solve problems regarding data analysis and interpretation of materials properties.
Download or read book Handbook of Nanoscopy written by Gustaaf van Tendeloo and published by John Wiley & Sons. This book was released on 2012-12-21 with total page 1484 pages. Available in PDF, EPUB and Kindle. Book excerpt: This completely revised successor to the Handbook of Microscopy supplies in-depth coverage of all imaging technologies from the optical to the electron and scanning techniques. Adopting a twofold approach, the book firstly presents the various technologies as such, before going on to cover the materials class by class, analyzing how the different imaging methods can be successfully applied. It covers the latest developments in techniques, such as in-situ TEM, 3D imaging in TEM and SEM, as well as a broad range of material types, including metals, alloys, ceramics, polymers, semiconductors, minerals, quasicrystals, amorphous solids, among others. The volumes are divided between methods and applications, making this both a reliable reference and handbook for chemists, physicists, biologists, materials scientists and engineers, as well as graduate students and their lecturers.
