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Book Electrical and Reliability Characterization of Schottky Power Diodes

Download or read book Electrical and Reliability Characterization of Schottky Power Diodes written by Frank M. Gift and published by . This book was released on 1981 with total page 206 pages. Available in PDF, EPUB and Kindle. Book excerpt: This program examined the barrier materials which were available in late 1978. Screening, electrical characterization and step stress testing were performed on six different processes power Schottky rectifiers. The proposed drafts of MIL-S-19500 detail specifications were prepared as part of this project. The data, proposed limits and related discussions are presented in this report. (Author).

Book Scientific and Technical Aerospace Reports

Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1995 with total page 702 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Reliability Evaluation of Schottky Barrier Diode Microcircuits

Download or read book Reliability Evaluation of Schottky Barrier Diode Microcircuits written by E. T. Lewis and published by . This book was released on 1976 with total page 272 pages. Available in PDF, EPUB and Kindle. Book excerpt: The objective of this study has been the analysis and reliability evaluation of modern Schottky Barrier Diode clamped microcircuits for use in high speed digital applications. The selected devices included SSI and MSI integration, single layer metallization, in both the regular and low power versions from two major vendors. All devices in the study utilized a trimetal system consisting of pure aluminum as the main conductor, titanium-tungsten as a barrier metal, and platinum-silicide for the Schottky and ohmic contacts. All devices were subjected to long term high temperature storage and high temperature static operation to establish activation energies and to calculate failure rates at maximum operating temperature ranges. The low power Schottky 54LS00 from both Vendors A and B were additionally subjected to dynamic long term accelerated testing for comparison purposes. Detail construction analysis and electrical characterization, including thermal resistances, were performed on all device types. Units which failed during the performance of life testing were electrically categorized and physically analyzed to establish failure modes and mechanisms. (Author).

Book Reliability Characterisation of Electrical and Electronic Systems

Download or read book Reliability Characterisation of Electrical and Electronic Systems written by and published by Elsevier. This book was released on 2014-12-24 with total page 274 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book takes a holistic approach to reliability engineering for electrical and electronic systems by looking at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliability for a range of devices. The text describes the reliability behavior of electrical and electronic systems. It takes an empirical scientific approach to reliability engineering to facilitate a greater understanding of operating conditions, failure mechanisms and the need for testing for a more realistic characterisation. After introducing the fundamentals and background to reliability theory, the text moves on to describe the methods of reliability analysis and charactersation across a wide range of applications. Takes a holistic approach to reliability engineering Looks at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliability Facilitates a greater understanding of operating conditions, failure mechanisms and the need for testing for a more realistic characterisation

Book Technical Abstract Bulletin

Download or read book Technical Abstract Bulletin written by and published by . This book was released on with total page 912 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Microcircuit Reliability Bibliography

Download or read book Microcircuit Reliability Bibliography written by and published by . This book was released on 1978 with total page 412 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Silicon Carbide Power Devices

Download or read book Silicon Carbide Power Devices written by B Jayant Baliga and published by World Scientific. This book was released on 2006-01-05 with total page 526 pages. Available in PDF, EPUB and Kindle. Book excerpt: Power semiconductor devices are widely used for the control and management of electrical energy. The improving performance of power devices has enabled cost reductions and efficiency increases resulting in lower fossil fuel usage and less environmental pollution. This book provides the first cohesive treatment of the physics and design of silicon carbide power devices with an emphasis on unipolar structures. It uses the results of extensive numerical simulations to elucidate the operating principles of these important devices.

Book Microelectronic Failure Analysis Desk Reference

Download or read book Microelectronic Failure Analysis Desk Reference written by and published by ASM International. This book was released on 2001-01-01 with total page 162 pages. Available in PDF, EPUB and Kindle. Book excerpt: Developed by the Electronic Device Failure Analysis Society (EDFAS) Publications Committee.

Book Extraction of Semiconductor Diode Parameters

Download or read book Extraction of Semiconductor Diode Parameters written by Richard Ocaya and published by Springer Nature. This book was released on with total page 188 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Conduction Mechanisms of Tungsten Diselenide Based Schottky Diodes

Download or read book Conduction Mechanisms of Tungsten Diselenide Based Schottky Diodes written by Achamma Bobby and published by LAP Lambert Academic Publishing. This book was released on 2011-01 with total page 208 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book is a study of physical and electrical behaviour of fabricated p-type WSe2 based Schottky diodes coated with different metals and of different thickness.The book opens with a brief narration on the importance of Schottky barrier diodes alongwith a discussion on transitional metal dichalcogenides with specific emphasis to WSe2. The theoretical aspects of Schottky barriers, the growth technique of WSe2 crystals, its structural and compositional characterizations, determination of type and carrier concentrations, method of fabrication of Schottky diodes etc are provided for background information.The detailed analysis of the electrical characterization of these WSe2 diodes is the main theme of the book. The book winds up wth the summary of the results obtained, the conclusions arrived at and a concise discussion on the prospective work.

Book Microelectronics Failure Analysis

Download or read book Microelectronics Failure Analysis written by and published by ASM International. This book was released on 2004-01-01 with total page 813 pages. Available in PDF, EPUB and Kindle. Book excerpt: For newcomers cast into the waters to sink or swim as well as seasoned professionals who want authoritative guidance desk-side, this hefty volume updates the previous (1999) edition. It contains the work of expert contributors who rallied to the job in response to a committee's call for help (the committee was assigned to the update by the Electron