Download or read book Diffuse X Ray Scattering and Models of Disorder written by Thomas Richard Welberry and published by OUP Oxford. This book was released on 2004-09-09 with total page 281 pages. Available in PDF, EPUB and Kindle. Book excerpt: Diffuse X-ray scattering is a rich (virtually untapped) source of local structural information over and above that obtained by conventional crystal structure determination (crystallography). The main aim in the book is to show how computer simulation of a model crystal provides a general method by which diffuse scattering of all kinds and from all types of materials can be interpreted and analysed. Part I of the book gives a description of the experimental methods used to obtain diffuse scattering data. Part II describes a number of simple stochastic models of disorder, which allows various concepts to be established and enables simple examples to be generated to illustrate key principles. Part III describes example studies of a wide variety of real materials. These examples not only document the development of computer simulation methods for investigating and analysing disorder problems but also provide a resource for helping future researchers recognise the kinds of effects which can occur and for pointing the way to tackling new problems which are encountered.
Download or read book Diffuse X ray Scattering and Models of Disorder written by T. R. Welberry and published by Oxford University Press. This book was released on 2022-05-01 with total page 400 pages. Available in PDF, EPUB and Kindle. Book excerpt: Diffuse X-ray scattering is a rich source of local structural information over and above that obtained by conventional crystal structure determination. The main aim of the book is to show how computer simulation of a model crystal provides a general method by which diffuse scattering of all kinds and from all types of materials can be interpreted and analysed. Since the first edition was published in 2004 there have been major improvements both in the experimental methods for recording diffuse scattering and in our ability to analyse it. The advent of new and better detectors means that fully 3-dimensional diffuse scattering data can be collected routinely for even quite small samples and computational power that is now available has continued its upward trend, meaning modelling calculations inconceivable in 2004 are now routine. The final part of the book traces these recent developments and outlines their future potential in the field.
Download or read book Diffuse X ray Scattering and Models of Disorder written by Thomas Richard Welberry and published by . This book was released on 2004 with total page 266 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Diffuse X Ray Scattering and Models of Disorder written by Thomas Richard Welberry and published by Oxford University Press on Demand. This book was released on 2004-09-09 with total page 281 pages. Available in PDF, EPUB and Kindle. Book excerpt: Diffuse X-ray scattering is a rich (virtually untapped) source of local structural information over and above that obtained by conventional crystallography. The book aims to show how computer simulation of a model crystal provides a general method by which diffuse scattering of all kinds and from all types of materials can be interpreted and analysed.
Download or read book X Ray Diffuse Scattering from Self Organized Mesoscopic Semiconductor Structures written by Martin Schmidbauer and published by Springer Science & Business Media. This book was released on 2004-01-09 with total page 224 pages. Available in PDF, EPUB and Kindle. Book excerpt: This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.
Download or read book Diffuse Scattering and Defect Structure Simulations written by Reinhard B. Neder and published by Oxford University Press. This book was released on 2008-11-20 with total page 239 pages. Available in PDF, EPUB and Kindle. Book excerpt: Understanding the atomic structure of complex and time disordered materials relies upon computer simulations of these structures. This cook book provides a unique mixture of simulation know-how and hands on examples. All related files and the program DISCUS are included on a CDROM with the book.
Download or read book Particle Scattering X Ray Diffraction and Microstructure of Solids and Liquids written by Manfred L. Ristig and published by Springer. This book was released on 2008-01-11 with total page 206 pages. Available in PDF, EPUB and Kindle. Book excerpt: Interesting and new specific results of current theoretical and experimental work in various fields at the frontier of particle scattering and X-ray diffraction are reviewed in this volume. Special emphasis is placed on the study of the microstructure of solids, crystals and liquids, both classically and quantum mechanically. This gives the reader essential insights into the dynamics and properties of these states of matter. The authors address students interested in the physics of quantum solids, crystallography and material science as well as physical chemistry and computational physics.
Download or read book Specular and Diffuse X ray Scattering from Surfaces and Interfaces written by and published by . This book was released on 1991 with total page 4 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray and neutron scattering studies of surfaces and interfaces have become increasingly popular over that last few year due to the recent developments in both scattering techniques and high intensity sources, particularly synchrotron x-ray sources. Although detailed characterization of any interface requires understanding of scattering both at small angles and in the (wide angle) Bragg reflection regime, as shall restrict ourselves here to discussing only the small angle region. Despite fundamental differences in the basic interactions between x-rays (or neutrons) with atoms, most of the analysis of our x-ray scattering results presented here can be used for neutron studies, with minor modifications. Although it should be mentioned here that current synchrotron x-ray sources are several orders of magnitude more intense than neutron sources and as a result for relatively smooth solid surface specular reflectivity can be measured down to 10−9 with x-rays where as for neutrons this value is (approximately) 10−6 before the measured intensity is buried with diffuse scattering and other background. As we shall discuss, this reduces the resolution with which one can determine density profile at an interface. The plan of this talk is as follows. After giving a brief outline of this method, we shall discuss out results on liquid surfaces first, and then we shall analyze specular and diffuse scattering data of multilayer interfaces. Finally we demonstrate a new method of anomalous reflectivity to determine electron density profiles of thin films in a model independent way.
Download or read book X ray Scattering From Semiconductors And Other Materials 3rd Edition written by Paul F Fewster and published by World Scientific. This book was released on 2015-02-12 with total page 510 pages. Available in PDF, EPUB and Kindle. Book excerpt: This third edition has been extended considerably to incorporate more information on instrument influences on the interpretation of X-ray scattering profiles and reciprocal space maps. Another significant inclusion is on the scattering from powder samples, covering a new theoretical approach that explains features that conventional theory cannot. The new edition includes some of the latest methodologies and theoretical treatments, including the latest thinking on dynamical theory and diffuse scattering. Recent advances in detectors also present new opportunities for rapid data collection and some very different approaches in data collection techniques; the possibilities associated with these advances will be included.This edition should be of interest to those who use X-ray scattering to understand more about their samples, so that they can make a better judgment of the parameter and confidence levels in their analyses, and how the combination of instrument, sample and detection should be considered as a whole to ensure this.
Download or read book X ray Scattering From Semiconductors 2nd Edition written by Paul F Fewster and published by World Scientific. This book was released on 2003-07-07 with total page 315 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection.The description is intentionally conceptual so that the reader can grasp the real processes involved. In this way the analysis becomes significantly easier, making the reader aware of misleading artifacts and assisting in the determination of a more complete and reliable analysis. The theory of scattering is very important and is covered in such a way that the assumptions are clear. Greatest emphasis is placed on the dynamical diffraction theory including new developments extending its applicability to reciprocal space mapping and modelling samples with relaxed and distorted interfaces.A practical guide to the measurement of diffraction patterns, including the smearing effects introduced to the measurement, is also presented.
Download or read book Diffuse Scattering of X rays and Neutrons by Fluctuations written by Mikhail Aleksandrovich Krivoglaz and published by . This book was released on 1996 with total page 328 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Diffuse Scattering of X Rays and Neutrons by Fluctuations written by Mikhail A. Krivoglaz and published by Springer. This book was released on 1996 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Mikhail Alexandrovich Krivoglaz died unexpectedly when he was preparing the English edition of his two-volume monograph on diffraction and diffuse scattering of X-rays and neutrons in imperfect crystals. His death was a heavy blow to all who knew him, who had worked with him and to the world science community as a whole. The application of the diffraction techniques for the study of imperfections of crystal structures was the major field of Krivoglaz' work throughout his career in science. He started working in the field in the mid-fifties and since then made fundamental contributions to the theory of real crystals. His results have largely determined the current level of knowledge in this field for more than thirty years. Until the very last days of his life, Krivoglaz continued active studies in the physics of diffraction effects in real crystals. His interest in the theory aided in the explanation of the rapidly advancing experimental studies. The milestones marking important stages of his work were the first monograph on the theory of X-ray and neutron scattering in real crystals which was published in Russian in 1967 (a revised English edition in 1969), and the two-volume mono graph published in Russian in 1983-84 (this edition is the revised translation of the latter).
Download or read book The Chemical Bond in Inorganic Chemistry written by I. David Brown and published by Oxford University Press. This book was released on 2016-09-29 with total page 313 pages. Available in PDF, EPUB and Kindle. Book excerpt: The bond valence model, a description of acid-base bonding, is widely used for analysing and modelling the structures and properties of solids and liquids. Unlike other models of inorganic chemical bonding, the bond valence model is simple, intuitive, and predictive, and is accessible to anyone with a pocket calculator and a secondary school command of chemistry and physics. This new edition of 'The Chemical Bond in Inorganic Chemistry: The Bond Valence Model' shows how chemical properties arise naturally from the conflict between the constraints of chemistry and those of three-dimensional space. The book derives the rules of the bond valence model, as well as those of the traditional covalent, ionic and popular VSEPR models, by identifying the chemical bond with the electrostatic flux linking the bonded atoms. Most of the new edition is devoted to showing how to apply these ideas to real materials including crystals, liquids, glasses and surfaces. The work includes detailed examples of applications, and the final chapter explores the relationship between the flux and quantum theories of the bond.
Download or read book X ray Scattering written by Alicia Esther Ares and published by BoD – Books on Demand. This book was released on 2017-01-25 with total page 230 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray scattering techniques are a family of nondestructive analytical techniques. Using these techniques, scientists obtain information about the crystal structure and chemical and physical properties of materials. Nowadays, different techniques are based on observing the scattered intensity of an X-ray beam hitting a sample as a function of incident and scattered angle, polarization, and wavelength. This book is intended to give overviews of the relevant X-ray scattering techniques, particularly about inelastic X-ray scattering, elastic scattering, grazing-incidence small-angle X-ray scattering, small-angle X-ray scattering, and high-resolution X-ray diffraction, and, finally, applications of X-ray spectroscopy to study different biological systems.
Download or read book X Ray Diffraction written by A. Guinier and published by Courier Corporation. This book was released on 2013-01-17 with total page 404 pages. Available in PDF, EPUB and Kindle. Book excerpt: Exploration of fundamentals of x-ray diffraction theory using Fourier transforms applies general results to various atomic structures, amorphous bodies, crystals, and imperfect crystals. 154 illustrations. 1963 edition.
Download or read book Advances in Imaging and Electron Physics written by and published by Academic Press. This book was released on 2009-06-16 with total page 375 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Updated with contributions from leading international scholars and industry experts Discusses hot topic areas and presents current and future research trends Invaluable reference and guide for physicists, engineers and mathematicians
Download or read book Fundamentals of Amorphous Solids written by Zbigniew H. Stachurski and published by John Wiley & Sons. This book was released on 2015-01-30 with total page 274 pages. Available in PDF, EPUB and Kindle. Book excerpt: Long awaited, this textbook fills the gap for convincing concepts to describe amorphous solids. Adopting a unique approach, the author develops a framework that lays the foundations for a theory of amorphousness. He unravels the scientific mysteries surrounding the topic, replacing rather vague notions of amorphous materials as disordered crystalline solids with the well-founded concept of ideal amorphous solids. A classification of amorphous materials into inorganic glasses, organic glasses, glassy metallic alloys, and thin films sets the scene for the development of the model of ideal amorphous solids, based on topology- and statistics-governed rules of three-dimensional sphere packing, which leads to structures with no short, mid or long-range order. This general model is then concretized to the description of specific compounds in the four fundamental classes of amorphous solids, as well as amorphous polyethylene and poly(methyl)methacrylate, emphasizing its versatility and descriptive power. Finally, he includes example applications to indicate the abundance of amorphous materials in modern-day technology, thus illustrating the importance of a better understanding of their structure and properties. Equally ideal as supplementary reading in courses on crystallography, mineralogy, solid state physics, and materials science where amorphous materials have played only a minor role until now.
