Download or read book Development of Scanning X ray Microscopes for Materials Science Spectromicroscopy at the Advanced Light Source written by and published by . This book was released on 1997 with total page 20 pages. Available in PDF, EPUB and Kindle. Book excerpt: Third generation synchrotron sources of soft x-rays provide an excellent opportunity to apply established x-ray spectroscopic materials analysis techniques to surface imaging on a sub-micron scale. This paper describes an effort underway at the Advanced Light Source (ALS) to pursue this development using Fresnel zone plate lenses. These are used to produce a sub-micron spot of x-rays for use in scanning microscopy. Several groups have developed microscopes using this technique. A specimen is rastered in the focused x-ray spot and a detector signal is acquired as a function of position to generate an image. Spectroscopic capability is added by holding the small spot on a feature of interest and scanning through the spectrum. The authors are pursuing two spectroscopic techniques: Near Edge X-ray Absorption Spectroscopy (NEXAFS), X-ray Photoelectron Spectroscopy (XPS) which together provide a powerful capability for light element analysis in materials science.
Download or read book Scanning Transmission X ray Microscope for Materials Science Spectromicroscopy at the ALS written by and published by . This book was released on 1997 with total page 5 pages. Available in PDF, EPUB and Kindle. Book excerpt: The brightness of the Advanced Light Source will be exploited by several new instruments for materials science spectromicroscopy over the next year or so. The first of these to become operational is a scanning transmission x-ray microscope with which near edge x-ray absorption spectra (NEXAFS) can be measured on spatial features of sub-micron size. Here the authors describe the instrument as it is presently implemented, its capabilities, some studies made to date and the developments to come. The Scanning Transmission X-ray Microscope makes use of a zone plate lens to produce a small x-ray spot with which to perform absorption spectroscopy through thin samples. The x-ray beam from ALS undulator beamline 7.0 emerges into the microscope vessel through a silicon nitride vacuum window 160nm thick and 300[mu]m square. The vessel is filled with helium at atmospheric pressure. The zone plate lens is illuminated 1mm downstream from the vacuum window and forms an image in first order of a pinhole which is 3m upstream in the beamline. An order sorting aperture passes the first order converging light and blocks the unfocused zero order. The sample is at the focus a few mm downstream of the zone plate and mounted from a scanning piezo stage which rasters in x and y so that an image is formed, pixel by pixel, by an intensity detector behind the sample. Absorption spectra are measured point-by-point as the photon energy is scanned by rotating the diffraction grating in the monochromator and changing the undulator gap.
Download or read book Soft X ray Spectromicroscopy Development for Materials Science at the Advanced Light Source written by and published by . This book was released on 1996 with total page 29 pages. Available in PDF, EPUB and Kindle. Book excerpt: Several third generation synchrotron radiation facilities are now operational and the high brightness of these photon sources offers new opportunities for x-ray microscopy. Well developed synchrotron radiation spectroscopy techniques are being applied in new instruments capable of imaging the surface of a material with a spatial resolution smaller than one micron. There are two aspects to this. One is to further the field of surface science by exploring the effects of spatial variations across a surface on a scale not previously accessible to x-ray measurements. The other is to open up new analytical techniques in materials science using x-rays, on a spatial scale comparable to that of the processes or devices to be studied. The development of the spectromicroscopy program at the Advanced Light Source will employ a variety of instruments, some are already operational. Their development and use will be discussed, and recent results will be presented to illustrate their capabilities.
Download or read book Further Development of Soft X ray Scanning Microscopy with Anelliptical Undulator at the Advanced Light Source written by and published by . This book was released on 2003 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Soft x-ray scanning microscopy (1) is under continuing development at the Advanced Light Source. Significant progress has been made implementing new scan control systems in both operational microscopes (2) and they now operate at beam lines 5.3.2 and 11.0.2 with interferometer servo scanning and stabilization. The interferometer servo loop registers the images on a universal x/y coordinate system and locks the x-ray spot on selected features for spectro-microscopic studies. At the present time zone plates are in use with 35nm outer zone width and the imaging spatial resolution is at the diffraction limit of these lenses. Current research programs are underway in areas of polymer chemistry, environmental chemistry and materials science. A dedicated polymer STXM is in operation on a bend magnet beam line (4) and is the subject of a separate article (3) in this issue. Here we focus on the capabilities of STXM at a new beam line that employs an elliptical undulator (5) to give control of the polarization of the x-ray beam. This facility is in the process of commissioning and some results are available, other capabilities will be developed during the first half of 2003.
Download or read book X Ray Microscopy and Spectromicroscopy written by Jürgen Thieme and published by Springer Science & Business Media. This book was released on 2013-11-09 with total page 382 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is based on presentations to the International Conference of X-Ray Micro scopy and Spectromicroscopy, XRM 96, which took place in Wiirzburg, August 19- 23, 1996. The conference also celebrated the lOOth anniversary of the discovery of X rays by Wilhelm Conrad Rontgen on November 8, 1895, in Wiirzburg. This book contains state-of-the-art reviews and up-to-date progress reports in the field of X-ray microscopy and spectromicroscopy, including related new X-ray optics and X-ray sources. It reflects the lively activities within a relatively new field of science which combines the development of new instruments and methods with their applications to numerous topical scientific questions. The applications range from biological and medical topics, colloid physics, and soil sciences to solid-state physics, material sciences, and surface sciences. Their variety demonstrates the interdisci plinary and cooperative character of this field and the growing demand for micro scopic and spectromicroscopic information on the nanometer scale and under specific sample conditions, for example in wet (natural) surroundings or on a solid surface.
Download or read book Scanning Electron Microscopy and X Ray Microanalysis written by Joseph Goldstein and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 830 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA. High resolution imaging has been developed with the aid of an extensive range of field emission gun (FEG) microscopes. The magnification ranges of these instruments now overlap those of the transmission electron microscope. Low-voltage microscopy using the FEG now allows for the observation of noncoated samples. In addition, advances in the develop ment of x-ray wavelength and energy dispersive spectrometers allow for the measurement of low-energy x-rays, particularly from the light elements (B, C, N, 0). In the area of x-ray microanalysis, great advances have been made, particularly with the "phi rho z" [Ij)(pz)] technique for solid samples, and with other quantitation methods for thin films, particles, rough surfaces, and the light elements. In addition, x-ray imaging has advanced from the conventional technique of "dot mapping" to the method of quantitative compositional imaging. Beyond this, new software has allowed the development of much more meaningful displays for both imaging and quantitative analysis results and the capability for integrating the data to obtain specific information such as precipitate size, chemical analysis in designated areas or along specific directions, and local chemical inhomogeneities.
Download or read book XAFS Techniques for Catalysts Nanomaterials and Surfaces written by Yasuhiro Iwasawa and published by Springer. This book was released on 2016-10-19 with total page 545 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is a comprehensive, theoretical, practical, and thorough guide to XAFS spectroscopy. The book addresses XAFS fundamentals such as experiments, theory and data analysis, advanced XAFS methods such as operando XAFS, time-resolved XAFS, spatially resolved XAFS, total-reflection XAFS, high energy resolution XAFS, and practical applications to a variety of catalysts, nanomaterials and surfaces. This book is accessible to a broad audience in academia and industry, and will be a useful guide for researchers entering the subject and graduate students in a wide variety of disciplines.
Download or read book Soft X Rays and Extreme Ultraviolet Radiation written by David Attwood and published by Cambridge University Press. This book was released on 2000 with total page 504 pages. Available in PDF, EPUB and Kindle. Book excerpt: This comprehensive book describes the fundamental properties of soft X-rays and extreme ultraviolet (EUV) radiation and discusses their applications in a wide variety of fields, including EUV lithography for semiconductor chip manufacture and soft X-ray biomicroscopy. The author provides a wealth of useful reference material such as electron binding energies, characteristic emission lines and photo-absorption cross-sections. The book will be of great interest to graduate students and researchers in engineering, physics, chemistry, and the ...
Download or read book X ray Microscopy written by Ping-chin Cheng and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 429 pages. Available in PDF, EPUB and Kindle. Book excerpt: In 1979, a conference on x-ray microscopy was organized by the New York Academy of Sciences, and in 1983, the Second Interna tional Symposium on X-ray Imaging was organized by the Akademie der Wissenschaften in Gottingen, Federal Republic of Germany. This volume contains the contributions to the symposium "X-ray Microscopy '86", held in Taipei, Taiwan, the Republic of China in August 1986. This is the first volume which intends to provide up-to date information on x-ray imaging to biologists, therefore, emphasis was given to specimen preparation techniques and image interpreta tion. Specimen preparation represents a major part of every microscopy work, therefore, it should be strongly emphasized in this emerging field of x-ray microscopy. Theoretically, x-ray microscopy offers the potential for the study of unfixed, hydrated biological ma terials. Since very few biological system can be directly observed without specimen preparation, we would like to emphasize that new information on biological specimens can only be obtained if the speci men is properly prepared. In the past decade, many of the published x-ray images were obtained from poorly prepared biological speci mens, mainly air-dried materials. Therefore, one of the goals of this conference is to bring the importance of specimen preparation to the attention of x-ray microscopy community. X-ray microscopy can be subdivided into several major areas. They are the classic x-ray projection microscope, x-ray contact imag ing (microradiography) and the more recent x-ray scanning micro scope, x-ray photoelectron microscope and x-ray imaging microscope.
Download or read book X ray Microscopy written by Chris Jacobsen and published by Cambridge University Press. This book was released on 2019-12-19 with total page 595 pages. Available in PDF, EPUB and Kindle. Book excerpt: Written by a pioneer in the field, this text provides a complete introduction to X-ray microscopy, providing all of the technical background required to use, understand and even develop X-ray microscopes. Starting from the basics of X-ray physics and focusing optics, it goes on to cover imaging theory, tomography, chemical and elemental analysis, lensless imaging, computational methods, instrumentation, radiation damage, and cryomicroscopy, and includes a survey of recent scientific applications. Designed as a 'one-stop' text, it provides a unified notation, and shows how computational methods in different areas are linked with one another. Including numerous derivations, and illustrated with dozens of examples throughout, this is an essential text for academics and practitioners across engineering, the physical sciences and the life sciences who use X-ray microscopy to analyze their specimens, as well as those taking courses in X-ray microscopy.
Download or read book Hard X Ray Scanning Microscope Using Nanofocusing Parabolic Refractive Lenses written by Jens Patommel and published by Cuvillier Verlag. This book was released on 2011-01-24 with total page 164 pages. Available in PDF, EPUB and Kindle. Book excerpt: Hard x rays come along with a variety of extraordinary properties which make them an excellent probe for investigation in science, technology and medicine. Their large attenuation length in matter opens up the possibility to use hard x-rays for non-destructive investigation of the inner structure of specimens. Medical radiography is one important example of exploiting this feature. Since their discovery by W. C. Röntgen in 1895, a large variety of x-ray analytical techniques have been developed and successfully applied, such as x-ray crystallography, reflectometry, fluorescence spectroscopy, x-ray absorption spectroscopy, small angle x-ray scattering, and many more. Each of those methods reveals information about certain physical properties, but usually, these properties are an average over the complete sample region illuminated by the x rays. In order to obtain the spatial distribution of those properties in inhomogeneous samples, scanning microscopy techniques have to be applied, screening the sample with a small x-ray beam. The spatial resolution is limited by the finite size of the beam. The availability of highly brilliant x-ray sources at third generation synchrotron radiation facilities together with the development of enhanced focusing x-ray optics made it possible to generate increasingly small high intense x-ray beams, pushing the spatial resolution down to the sub-100nm range. During this thesis the prototype of a hard x-ray scanning microscope utilizing microstructured nanofocusing lenses was designed, built, and successfully tested. The nanofocusing x-ray lenses were developed by our research group of the Institute of Structural Physics at the Technische Universität Dresden. The prototype instrument was installed at the ESRF beamline ID 13. A wide range of experiments like fluorescence element mapping, fluorescence tomography, x-ray nano-diffraction, coherent x-ray diffraction imaging, and x-ray ptychography were performed as part of this thesis. The hard x-ray scanning microscope provides a stable x-ray beam with a full width at half maximum size of 50–100nm near the focal plane. The nanoprobe was also used for characterization of nanofocusing lenses, crucial to further improve them. Based on the experiences with the prototype, an advanced version of a hard x-ray scanning microscope is under development and will be installed at the PETRA III beamline P06 dedicated as a user instrument for scanning microscopy. This document is organized as follows. A short introduction motivating the necessity for building a hard x-ray scanning microscope is followed by a brief review of the fundamentals of hard x-ray physics with an emphasis on free-space propagation and interaction with matter. After a discussion of the requirements on the x-ray source for the nanoprobe, the main features of synchrotron radiation from an undulator source are shown. The properties of the nanobeam generated by refractive x-ray lenses are treated as well as a two-stage focusing scheme for tailoring size, flux and the lateral coherence properties of the x-ray focus. The design and realization of the microscope setup is addressed, and a selection of experiments performed with the prototype version is presented, before this thesis is finished with a conclusion and an outlook on prospective plans for an improved microscope setup to be installed at PETRA III.
Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1993 with total page 1014 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Soft X ray Optics for Spectromicroscopy at the Advanced Light Source written by and published by . This book was released on 2002 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: A variety of systems for performing spectromicroscopy, spatially resolved spectroscopy, are in operation or under construction at the Advanced Light Source (ALS). For example, part of the program is centered around the surface analysis problems of local semiconductor industries, and this has required the construction of a microscope with wafer handling, fiducialization, optical microscopy, coordinated ion beam etching, and X-ray Photoelectron Spectroscopy (XPS) integrated in this case with Kirkpatrick-Baez (K-B) grazing incidence micro-focusing optics. The microscope is to be used in conjunction with a highly efficient entrance slitless Spherical Grating Monochromator (SGM). The design and expected performance of this instrument will be described, with emphasis on the production of the elliptically curved surfaces of the K-B mirrors by elastic bending of flat mirror substrates. For higher resolution, zone-plate (Z-P) focusing optics are used and one instrument, a Scanning Transmission X-ray Microscope (STXM) is in routine operation on undulator beamline 7.0. A second Z-P based system is being commissioned on the same beamline, and differs from the STXM in that it will operate at Ultra-High Vacuum (UHV) and will be able to perform XPS at 0.1[micro]m spatial resolution. Spatially resolved X-ray Absorption Spectroscopy (XAS) can be performed by imaging electrons photoemitted from a material with a Photo-Emission Electron Microscope (PEEM). The optical requirements of a beamline designed for PEEM are very different to those of micro-focus systems and they give examples of bending magnet and undulator based instruments.
Download or read book Microscopy of Materials written by David Keith Bowen and published by John Wiley & Sons. This book was released on 1975 with total page 330 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Soft X ray Spectromicroscopy and Its Application to Semiconductor Microstructure Characterization written by and published by . This book was released on 2002 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: The universal trend towards device miniaturization has driven the semiconductor industry to develop sophisticated and complex instrumentation for the characterization of microstructures. Many significant problems of relevance to the semiconductor industry cannot be solved with conventional analysis techniques, but can be addressed with soft x-ray spectromicroscopy. An active spectromicroscopy program is being developed at the Advanced Light Source, attracting both the semiconductor industry and the materials science academic community. Examples of spectromicroscopy techniques are presented. An ALS[mu]-XPS spectromicroscopy project is discussed, involving the first microscope completely dedicated and designed for microstructure analysis on patterned silicon wafers.
Download or read book X Ray and Inner Shell Processes written by R.L. Johnson and published by American Inst. of Physics. This book was released on 1999-06-04 with total page 808 pages. Available in PDF, EPUB and Kindle. Book excerpt: Contains papers, lectures, and reports from the September 1996 conference on recent advances in both experimental and theoretical X-ray and inner-shell processes and their applications, with sections on radiation sources, highly charged ions, instrumentation and methods, nuclear scattering, electron
