Download or read book Detailed Study of Uncertainties in On wafer Transistor Noise parameter Measurements written by James Randa and published by . This book was released on 2016 with total page 33 pages. Available in PDF, EPUB and Kindle. Book excerpt: This paper uses a Monte Carlo simulation program to explore various aspects of uncertainties associated with the measurement of the noise parameters of transistors on wafers. The dependence of the noise-parameter uncertainties on the different input uncertainties is investigated in detail. Other issues that are considered include the effect of probe losses, the importance (or not) of including input terminations with reflection coefficients as near as possible to the edge of the Smith chart, improvements due to inclusion of an input termination with noise temperature well below ambient, and the effect of including a 'reverse' measurement. We also briefly consider the case of well-matched amplifiers on wafers.
Download or read book Precision Measurement of Microwave Thermal Noise written by James Randa and published by John Wiley & Sons. This book was released on 2022-11-02 with total page 180 pages. Available in PDF, EPUB and Kindle. Book excerpt: Precision Measurement of Microwave Comprehensive resource covering the foundations and analysis of precision noise measurements with a detailed treatment of their uncertainties Precision Measurement of Microwave Thermal Noise presents the basics of precise measurements of thermal noise at microwave frequencies and guides readers through how to evaluate the uncertainties in such measurement. The focus is on measurement methods used at the U.S. National Institute of Standards and Technology (NIST), but the general principles and methods are useful in a wide range of applications. Readers will learn how to perform accurate microwave noise measurements using the respected author’s expertise of calculations to aid understanding of the challenges and solutions. The text covers the background required for the analysis of the measurements and the standards employed to calibrate radiofrequency and microwave radiometers. It also covers measurements of noise temperature (power) and the noise characteristics of amplifiers and transistors. In addition to the usual room-temperature two-port devices, cryogenic devices and multiport amplifiers are also discussed. Finally, the connection of these lab-based measurements to remote-sensing measurement (especially from space) is considered, and possible contributions of the lab-based measurements to remote-sensing applications are discussed. Specific topics and concepts covered in the text include: Noise-temperature standards, covering ambient standards, hot (oven) standards, cryogenic standards, and other standards and noise sources Amplifier noise, covering definition of noise parameters, measurement of noise parameters, uncertainty analysis for noise-parameter measurements, and simulations and strategies On-wafer noise measurements, covering on-wafer microwave formalism, noise temperature, on-wafer noise-parameter measurements, and uncertainties Multiport amplifiers, covering formalism and noise matrix, definition of noise figure for multiports, and degradation of signal-to-noise ratio Containing some introductory material, Precision Measurement of Microwave Thermal Noise is an invaluable resource on the subject for advanced students and all professionals working in (or entering) the field of microwave noise measurements, be it in a standards lab, a commercial lab, or academic research.
Download or read book Uncertainty Analysis for NIST Noise Parameter Measurement written by U.s. Department of Commerce and published by Createspace Independent Publishing Platform. This book was released on 2014-01-21 with total page 36 pages. Available in PDF, EPUB and Kindle. Book excerpt: Some time ago, what is now the Electromagnetics Division of the National Institute of Standards and Technology (NIST) developed the capability to measure noise parameters of amplifiers [1,2]. Recently, modified methods and analysis have been developed and have been applied both to amplifiers [3] and to transistors [4], the latter in an on-wafer environment. For such measurements to be meaningful, the results must be accompanied by corresponding uncertainties.
Download or read book Noise Parameter Uncertainties written by and published by DIANE Publishing. This book was released on with total page 14 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Precision Measurement of Microwave Thermal Noise written by James Randa and published by John Wiley & Sons. This book was released on 2022-11-22 with total page 180 pages. Available in PDF, EPUB and Kindle. Book excerpt: Precision Measurement of Microwave Comprehensive resource covering the foundations and analysis of precision noise measurements with a detailed treatment of their uncertainties Precision Measurement of Microwave Thermal Noise presents the basics of precise measurements of thermal noise at microwave frequencies and guides readers through how to evaluate the uncertainties in such measurement. The focus is on measurement methods used at the U.S. National Institute of Standards and Technology (NIST), but the general principles and methods are useful in a wide range of applications. Readers will learn how to perform accurate microwave noise measurements using the respected author’s expertise of calculations to aid understanding of the challenges and solutions. The text covers the background required for the analysis of the measurements and the standards employed to calibrate radiofrequency and microwave radiometers. It also covers measurements of noise temperature (power) and the noise characteristics of amplifiers and transistors. In addition to the usual room-temperature two-port devices, cryogenic devices and multiport amplifiers are also discussed. Finally, the connection of these lab-based measurements to remote-sensing measurement (especially from space) is considered, and possible contributions of the lab-based measurements to remote-sensing applications are discussed. Specific topics and concepts covered in the text include: Noise-temperature standards, covering ambient standards, hot (oven) standards, cryogenic standards, and other standards and noise sources Amplifier noise, covering definition of noise parameters, measurement of noise parameters, uncertainty analysis for noise-parameter measurements, and simulations and strategies On-wafer noise measurements, covering on-wafer microwave formalism, noise temperature, on-wafer noise-parameter measurements, and uncertainties Multiport amplifiers, covering formalism and noise matrix, definition of noise figure for multiports, and degradation of signal-to-noise ratio Containing some introductory material, Precision Measurement of Microwave Thermal Noise is an invaluable resource on the subject for advanced students and all professionals working in (or entering) the field of microwave noise measurements, be it in a standards lab, a commercial lab, or academic research.
Download or read book Conference Proceedings written by and published by Virgin Books Limited. This book was released on 1996 with total page 576 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Noise Temperature Measurements on Wafer Classic Reprint written by James Randa and published by Forgotten Books. This book was released on 2017-10-27 with total page 72 pages. Available in PDF, EPUB and Kindle. Book excerpt: Excerpt from Noise Temperature Measurements on Wafer Parameters on wafer, in particular the noise figure of a two - port device, such as some variety of low-noise transistor. The noise figure of a device is a measure of the noise added to the input signal by the device itself. It is determined by measuring the output noise power from the device for different known levels of input noise power. Because the noise figure of a device depends on the impedance of the input source, it must be measured for several different input impedances to characterize that dependence. Alternatively, if there is a single input impedance of interest, for example, 50 0, then the noise figure can be measured at just that one impedance. A good deal of work. About the Publisher Forgotten Books publishes hundreds of thousands of rare and classic books. Find more at www.forgottenbooks.com This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.
Download or read book Noise in Measurements written by Aldert Van der Ziel and published by John Wiley & Sons. This book was released on 1976 with total page 248 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book V band on wafer noise parameter measurements written by and published by . This book was released on 1910 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Different noise parameter measurement methods and receiver requirements are discussed. A set-up for on-wafer V-band noise parameter measurements using so called cold-source method is presented. The operation of the system is demonstrated by showing experimental results of a InP HEMT (58-62 GHz) and a passive component (51-66 GHz).
Download or read book 1996 IEEE MTT S International Microwave Symposium Digest written by Richard G. Ranson and published by . This book was released on 1996 with total page 776 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Publications of the National Institute of Standards and Technology Catalog written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 1992 with total page 400 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Journal of Research of the National Bureau of Standards written by United States. National Bureau of Standards and published by . This book was released on 1975 with total page 588 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book IEEE 1992 Microwave and Millimeter Wave Monolithic Circuits Symposium written by IEEE Microwave Theory and Techniques Society and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 1992 with total page 238 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Comprehensive Remote Sensing written by Shunlin Liang and published by Elsevier. This book was released on 2017-11-08 with total page 3183 pages. Available in PDF, EPUB and Kindle. Book excerpt: Comprehensive Remote Sensing, Nine Volume Set covers all aspects of the topic, with each volume edited by well-known scientists and contributed to by frontier researchers. It is a comprehensive resource that will benefit both students and researchers who want to further their understanding in this discipline. The field of remote sensing has quadrupled in size in the past two decades, and increasingly draws in individuals working in a diverse set of disciplines ranging from geographers, oceanographers, and meteorologists, to physicists and computer scientists. Researchers from a variety of backgrounds are now accessing remote sensing data, creating an urgent need for a one-stop reference work that can comprehensively document the development of remote sensing, from the basic principles, modeling and practical algorithms, to various applications. Fully comprehensive coverage of this rapidly growing discipline, giving readers a detailed overview of all aspects of Remote Sensing principles and applications Contains ‘Layered content’, with each article beginning with the basics and then moving on to more complex concepts Ideal for advanced undergraduates and academic researchers Includes case studies that illustrate the practical application of remote sensing principles, further enhancing understanding
Download or read book On Wafer Calibration Techniques Enabling Accurate Characterization of High Performance Silicon Devices at the Mm Wave Range and Beyond written by Andrej Rumiantsev and published by Electronic Materials and Devic. This book was released on 2019-05-30 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: The increasing demand for more content, services, and security drives the development of high-speed wireless technologies, optical communication, automotive radar, imaging and sensing systems and many other mm-wave and THz applications. S-parameter measurement at mm-wave and sub-mm wave frequencies plays a crucial role in the modern IC design debug. Most importantly, however, is the step of device characterization for development and optimization of device model parameters for new technologies. Accurate characterization of the intrinsic device in its entire operation frequency range becomes extremely important and this task is very challenging. This book presents solutions for accurate mm-wave characterization of advanced semiconductor devices. It guides through the process of development, implementation and verification of the in-situ calibration methods optimized for high-performance silicon technologies. Technical topics discussed in the book include: Specifics of S-parameter measurements of planar structures Complete mathematical solution for lumped-standard based calibration methods, including the transfer Thru-Match-Reflect (TMR) algorithms Design guideline and examples for the on-wafer calibration standards realized in both advanced SiGe BiCMOS and RF CMOS processes Methods for verification of electrical characteristics of calibration standards and accuracy of the in-situ calibration results Comparison of the new technique vs. conventional approaches: the probe-tip calibration and the pad parasitic de-embedding for various device types, geometries and model parameters New aspects of the on-wafer RF measurements at mmWave frequency range and calibration assurance.
Download or read book Semiconductor Measurement Technology written by and published by . This book was released on 1977 with total page 484 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book 1993 IEEE MTT S International Microwave Symposium Digest written by and published by . This book was released on 1993 with total page 470 pages. Available in PDF, EPUB and Kindle. Book excerpt:
