Download or read book A Practitioner s Guide to Software Test Design written by Lee Copeland and published by Artech House. This book was released on 2004 with total page 328 pages. Available in PDF, EPUB and Kindle. Book excerpt: Written by a leading expert in the field, this unique volume contains current test design approaches and focuses only on software test design. Copeland illustrates each test design through detailed examples and step-by-step instructions.

Download or read book Test and Design for Testability in Mixed Signal Integrated Circuits written by Jose Luis Huertas Díaz and published by Springer Science & Business Media. This book was released on 2010-02-23 with total page 310 pages. Available in PDF, EPUB and Kindle. Book excerpt: Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for developing complex ICs, there is still a lack of structured references presenting the major topics in this area. The aim of this book is to present basic concepts and new ideas in a manner understandable for both professionals and students. Since this is an active research field, a comprehensive state-of-the-art overview is very valuable, introducing the main problems as well as the ways of solution that seem promising, emphasizing their basis, strengths and weaknesses. In essence, several topics are presented in detail. First of all, techniques for the efficient use of DSP-based test and CAD test tools. Standardization is another topic considered in the book, with focus on the IEEE 1149.4. Also addressed in depth is the connecting design and test by means of using high-level (behavioural) description techniques, specific examples are given. Another issue is related to test techniques for well-defined classes of integrated blocks, like data converters and phase-locked-loops. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods. Finally, in Design-for-Testability and Built-In-Self-Test, two other concepts that were taken from digital design, are introduced in an analog context and illustrated for the case of integrated filters. In summary, the purpose of this book is to provide a glimpse on recent research results in the area of testing mixed-signal integrated circuits, specifically in the topics mentioned above. Much of the work reported herein has been performed within cooperative European Research Projects, in which the authors of the different chapters have actively collaborated. It is a representative snapshot of the current state-of-the-art in this emergent field.

Download or read book Digital System Test and Testable Design written by Zainalabedin Navabi and published by Springer Science & Business Media. This book was released on 2010-12-10 with total page 452 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is about digital system testing and testable design. The concepts of testing and testability are treated together with digital design practices and methodologies. The book uses Verilog models and testbenches for implementing and explaining fault simulation and test generation algorithms. Extensive use of Verilog and Verilog PLI for test applications is what distinguishes this book from other test and testability books. Verilog eliminates ambiguities in test algorithms and BIST and DFT hardware architectures, and it clearly describes the architecture of the testability hardware and its test sessions. Describing many of the on-chip decompression algorithms in Verilog helps to evaluate these algorithms in terms of hardware overhead and timing, and thus feasibility of using them for System-on-Chip designs. Extensive use of testbenches and testbench development techniques is another unique feature of this book. Using PLI in developing testbenches and virtual testers provides a powerful programming tool, interfaced with hardware described in Verilog. This mixed hardware/software environment facilitates description of complex test programs and test strategies.

Download or read book Design Driven Testing written by Matt Stephens and published by Apress. This book was released on 2011-01-11 with total page 359 pages. Available in PDF, EPUB and Kindle. Book excerpt: The groundbreaking book Design Driven Testing brings sanity back to the software development process by flipping around the concept of Test Driven Development (TDD)—restoring the concept of using testing to verify a design instead of pretending that unit tests are a replacement for design. Anyone who feels that TDD is “Too Damn Difficult” will appreciate this book. Design Driven Testing shows that, by combining a forward-thinking development process with cutting-edge automation, testing can be a finely targeted, business-driven, rewarding effort. In other words, you’ll learn how to test smarter, not harder. Applies a feedback-driven approach to each stage of the project lifecycle. Illustrates a lightweight and effective approach using a core subset of UML. Follows a real-life example project using Java and Flex/ActionScript. Presents bonus chapters for advanced DDTers covering unit-test antipatterns (and their opposite, “test-conscious” design patterns), and showing how to create your own test transformation templates in Enterprise Architect.

Download or read book Linear Models for Optimal Test Design written by Wim J. van der Linden and published by Springer Science & Business Media. This book was released on 2006-01-01 with total page 421 pages. Available in PDF, EPUB and Kindle. Book excerpt: Wim van der Linden was just given a lifetime achievement award by the National Council on Measurement in Education. There is no one more prominent in the area of educational testing. There are hundreds of computer-based credentialing exams in areas such as accounting, real estate, nursing, and securities, as well as the well-known admissions exams for college, graduate school, medical school, and law school - there is great need on the theory of testing. This book presents the statistical theory and practice behind constructing good tests e.g., how is the first test item selected, how are the next items selected, and when do you have enough items.

Download or read book Practical Test Design written by Istvan Forgacs and published by BCS, The Chartered Institute for IT. This book was released on 2019-08-28 with total page 336 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents the key test design techniques, in line with ISTQB, and explains the why and when of using them, with practical examples and code snippets. How and why the techniques can be combined is covered, as are automated test design methods. Tips and exercises are included throughout the book.

Download or read book VLSI Test Principles and Architectures written by Laung-Terng Wang and published by Elsevier. This book was released on 2006-08-14 with total page 809 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-date coverage of design for testability. - Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. - Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

Download or read book VLSI Design and Test for Systems Dependability written by Shojiro Asai and published by Springer. This book was released on 2018-07-20 with total page 792 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems. The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications. This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.

Download or read book Introduction to Advanced System on Chip Test Design and Optimization written by Erik Larsson and published by Springer Science & Business Media. This book was released on 2005-11-07 with total page 418 pages. Available in PDF, EPUB and Kindle. Book excerpt: Testing of Integrated Circuits is important to ensure the production of fault-free chips. However, testing is becoming cumbersome and expensive due to the increasing complexity of these ICs. Technology development has made it possible to produce chips where a complete system, with an enormous transistor count, operating at a high clock frequency, is placed on a single die - SOC (System-on-Chip). The device size miniaturization leads to new fault types, the increasing clock frequencies enforces testing for timing faults, and the increasing transistor count results in a higher number of possible fault sites. Testing must handle all these new challenges in an efficient manner having a global system perspective. Test design is applied to make a system testable. In a modular core-based environment where blocks of reusable logic, the so called cores, are integrated to a system, test design for each core include: test method selection, test data (stimuli and responses) generation (ATPG), definition of test data storage and partitioning [off-chip as ATE (Automatic Test Equipment) and/or on-chip as BIST (Built-In Self-Test)], wrapper selection and design (IEEE std 1500), TAM (test access mechanism) design, and test scheduling minimizing a cost function whilst considering limitations and constraint. A system test design perspective that takes all the issues above into account is required in order to develop a globally optimized solution. SOC test design and its optimization is the topic of this book. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.

Download or read book Performance Assessments for Adult Education written by National Research Council and published by National Academies Press. This book was released on 2002-08-01 with total page 132 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the United States, the nomenclature of adult education includes adult literacy, adult secondary education, and English for speakers of other languages (ESOL) services provided to undereducated and limited English proficient adults. Those receiving adult education services have diverse reasons for seeking additional education. With the passage of the WIA, the assessment of adult education students became mandatory-regardless of their reasons for seeking services. The law does allow the states and local programs flexibility in selecting the most appropriate assessment for the student. The purpose of the NRC's workshop was to explore issues related to efforts to measure learning gains in adult basic education programs, with a focus on performance-based assessments.

Download or read book Exploratory Software Testing written by James A. Whittaker and published by Pearson Education. This book was released on 2009-08-25 with total page 475 pages. Available in PDF, EPUB and Kindle. Book excerpt: How to Find and Fix the Killer Software Bugs that Evade Conventional Testing In Exploratory Software Testing, renowned software testing expert James Whittaker reveals the real causes of today’s most serious, well-hidden software bugs--and introduces powerful new “exploratory” techniques for finding and correcting them. Drawing on nearly two decades of experience working at the cutting edge of testing with Google, Microsoft, and other top software organizations, Whittaker introduces innovative new processes for manual testing that are repeatable, prescriptive, teachable, and extremely effective. Whittaker defines both in-the-small techniques for individual testers and in-the-large techniques to supercharge test teams. He also introduces a hybrid strategy for injecting exploratory concepts into traditional scripted testing. You’ll learn when to use each, and how to use them all successfully. Concise, entertaining, and actionable, this book introduces robust techniques that have been used extensively by real testers on shipping software, illuminating their actual experiences with these techniques, and the results they’ve achieved. Writing for testers, QA specialists, developers, program managers, and architects alike, Whittaker answers crucial questions such as: • Why do some bugs remain invisible to automated testing--and how can I uncover them? • What techniques will help me consistently discover and eliminate “show stopper” bugs? • How do I make manual testing more effective--and less boring and unpleasant? • What’s the most effective high-level test strategy for each project? • Which inputs should I test when I can’t test them all? • Which test cases will provide the best feature coverage? • How can I get better results by combining exploratory testing with traditional script or scenario-based testing? • How do I reflect feedback from the development process, such as code changes?

Download or read book Design to Test written by John Turino and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 334 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is the second edition of Design to Test. The first edition, written by myself and H. Frank Binnendyk and first published in 1982, has undergone several printings and become a standard in many companies, even in some countries. Both Frank and I are very proud of the success that our customers have had in utilizing the information, all of it still applicable to today's electronic designs. But six years is a long time in any technology field. I therefore felt it was time to write a new edition. This new edition, while retaining the basic testability prin ciples first documented six years ago, contains the latest material on state-of-the-art testability techniques for electronic devices, boards, and systems and has been completely rewritten and up dated. Chapter 15 from the first edition has been converted to an appendix. Chapter 6 has been expanded to cover the latest tech nology devices. Chapter 1 has been revised, and several examples throughout the book have been revised and updated. But some times the more things change, the more they stay the same. All of the guidelines and information presented in this book deal with the three basic testability principles-partitioning, control, and visibility. They have not changed in years. But many people have gotten smarter about how to implement those three basic test ability principles, and it is the aim of this text to enlighten the reader regarding those new (and old) testability implementation techniques.

Download or read book High Performance Memory Testing written by R. Dean Adams and published by Springer Science & Business Media. This book was released on 2005-12-29 with total page 252 pages. Available in PDF, EPUB and Kindle. Book excerpt: Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.

Download or read book Design for Test and Test Optimization Techniques for TSV based 3D Stacked ICs written by Brandon Noia and published by Springer Science & Business Media. This book was released on 2013-11-19 with total page 260 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes innovative techniques to address the testing needs of 3D stacked integrated circuits (ICs) that utilize through-silicon-vias (TSVs) as vertical interconnects. The authors identify the key challenges facing 3D IC testing and present results that have emerged from cutting-edge research in this domain. Coverage includes topics ranging from die-level wrappers, self-test circuits, and TSV probing to test-architecture design, test scheduling, and optimization. Readers will benefit from an in-depth look at test-technology solutions that are needed to make 3D ICs a reality and commercially viable.

Download or read book Essential Software Test Design written by Torbjörn Ryber and published by . This book was released on 2007-12-01 with total page 292 pages. Available in PDF, EPUB and Kindle. Book excerpt: The author is a true test enthusiast who has spoken to several thousand people about testing. The book is the result from many years of teaching test design with the goal of creating a highly useful testbook. It is full of examples from the real world and contains exercises for most of the techniques described. It can be used as class-material or for self studies. From the forewords: This book focuses on test design, and I am glad it does. Design is the intellectual part of testing. It is the puzzle solving part. (James Bach) In this book Torbjorn Ryber has managed to produce a text that is not only useful, but also concise and to-the-point. dEspite beeing kept to a sensible length it still manages to include guest chapters and material from renowned experts in areas such as exploratory testing and combinatorial testing, and understanding is greatly enhanced by the widespreaduse of examples that clearly demonstrates the application of the techniques. (Stuart Reid)

Download or read book Integrated Test Design and Automation written by Hans Buwalda and published by Addison-Wesley Professional. This book was released on 2002 with total page 264 pages. Available in PDF, EPUB and Kindle. Book excerpt: Zero-defect software is the holy grail of all development projects, and sophisticated techniques have now emerged to automate the testing process so that high-quality software can be delivered on time and on budget. This practical guide enables readers to understand and apply the TestFrame method -- an open method developed by the authors and their colleagues that is rapidly becoming a standard in the testing industry. With the aid of this book, readers will learn how to: customize the TestFrame method for their organizationsdevelop reusable testing standardsmake optimum use of automated testing toolsreuse and maintain test products IT managers will learn how to improve the control the test process and assess results, and expert testers will learn effective ways of automating test execution in a structured way. 0201737256B10162001

Download or read book Test System Design written by Christine Tursky and published by Prentice Hall. This book was released on 2000-09-08 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book covers how to design, develop, and implement custom test systems. It's goal is to make the process for engineers involved in designing and building custom test systems and to help them avoid common pitfalls.