Download or read book The Design of a Microprogram Control Unit with Concurrent Error Detection written by Clinton Yu Wong and published by . This book was released on 1983 with total page 142 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Design of a Microprogram Control Unit with Concurrent Error Detection written by Mary M. Yen and published by . This book was released on 1984 with total page 80 pages. Available in PDF, EPUB and Kindle. Book excerpt: This paper presents an integrated approach to the design of a microprogram control unit (MCU) with concurrent error detection (CED) capability for errors generated by VLSI physical failures. The paper first presents the design of a single-chip MCU that comprehensively detects errors due to internal physical failures during its normal operation. The AM2910 microprogram sequencer is used as a functional model for the CED MCU. Lastly, the paper presents a critical evaluation of the actual mask-level layout of the CED MCU design versus a simplex MCU without CED and a CED MCU through duplication and comparison. Additional keywords: Fault tolerant computing; Control systems; Integrated circuits; Bus conductors. (Author).
Download or read book Self Checking and Fault Tolerant Digital Design written by Parag K. Lala and published by Morgan Kaufmann. This book was released on 2001 with total page 238 pages. Available in PDF, EPUB and Kindle. Book excerpt: With VLSI chip transistors getting smaller and smaller, today's digital systems are more complex than ever before. This increased complexity leads to more cross-talk, noise, and other sources of transient errors during normal operation. Traditional off-line testing strategies cannot guarantee detection of these transient faults. And with critical applications relying on faster, more powerful chips, fault-tolerant, self-checking mechanisms must be built in to assure reliable operation. Self-Checking and Fault-Tolerant Digital Design deals extensively with self-checking design techniques and is the only book that emphasizes major techniques for hardware fault tolerance. Graduate students in VLSI design courses as well as practicing designers will appreciate this balanced treatment of the concepts and theory underlying fault tolerance along with the practical techniques used to create fault-tolerant systems. Features: Introduces reliability theory and the importance of maintainability Presents coding and the construction of several error detecting and correcting codes Discusses in depth, the available techniques for fail-safe design of combinational circuits Details checker design techniques for detecting erroneous bits and encoding output of self-checking circuits Demonstrates how to design self-checking sequential circuits, including a technique for fail-safe state machine design
Download or read book Evaluation of Concurrent Error Detection in Microprogrammed Control Units written by Argirios Bailas and published by . This book was released on 1989 with total page 416 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Concurrent Testing of Microprogrammed Control Units and Combinational Logic written by Aloke Guha and published by . This book was released on 1985 with total page 476 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1985 with total page 740 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Masters Theses in the Pure and Applied Sciences written by Wade H. Shafer and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 314 pages. Available in PDF, EPUB and Kindle. Book excerpt: Masters Theses in the Pure and Applied Sciences was first conceived, published, and disseminated by the Center for Information and Numerical Data Analysis and Synthesis (CINDAS) * at Purdue University in 1 957, starting its coverage of theses with the academic year 1955. Beginning with Volume 13, the printing and dissemination phases of the activity were transferred to University Microfilms/Xerox of Ann Arbor, Michigan, with the thought that such an arrangement would be more beneficial to the academic and general scientific and technical community. After five years of this joint undertaking we had concluded that it was in the interest of all con cerned if the printing and distribution of the volumes were handled by an interna tional publishing house to assure improved service and broader dissemination. Hence, starting with Volume 18, Masters Theses in the Pure and Applied Sciences has been disseminated on a worldwide basis by Plenum Publishing Cor poration of New York, and in the same year the coverage was broadened to include Canadian universities. All back issues can also be ordered from Plenum. We have reported in Volume 28 (thesis year 1 983) a total of 10,661 theses titles from 26 Canadian and 197 United States universities. We are sure that this broader base for these titles reported will greatly enhance the value of this important annual reference work. While Volume 28 reports theses submitted in-1983, on occasion, certain univer sities do report theses submitted in previous years but not reported at the time.
Download or read book Fehlertolerierende Rechensysteme Fault Tolerant Computing Systems written by Fevzi Belli and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 401 pages. Available in PDF, EPUB and Kindle. Book excerpt: Dieser Band enthält die 38 Beiträge der 3. GI/ITG/GMA-Fachtagung über "Fehlertolerierende Rechensysteme". Unter den 10 aus dem Ausland eingegangenen Beiträgen sind 4 eingeladene Vorträge. Insgesamt dokumentiert dieser Tagungsband die Entwicklung der Konzeption und Implementierung fehlertoleranter Systeme in den letzten drei Jahren vor allem in Europa. Sämtliche Beiträge sind neue Forschungs- oder Entwicklungsergebnisse, die vom Programmausschuß der Tagung aus 70 eingereichten Beiträgen ausgewählt wurden.
Download or read book Testing and Reliable Design of CMOS Circuits written by Niraj K. Jha and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 239 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the last few years CMOS technology has become increas ingly dominant for realizing Very Large Scale Integrated (VLSI) circuits. The popularity of this technology is due to its high den sity and low power requirement. The ability to realize very com plex circuits on a single chip has brought about a revolution in the world of electronics and computers. However, the rapid advance ments in this area pose many new problems in the area of testing. Testing has become a very time-consuming process. In order to ease the burden of testing, many schemes for designing the circuit for improved testability have been presented. These design for testability techniques have begun to catch the attention of chip manufacturers. The trend is towards placing increased emphasis on these techniques. Another byproduct of the increase in the complexity of chips is their higher susceptibility to faults. In order to take care of this problem, we need to build fault-tolerant systems. The area of fault-tolerant computing has steadily gained in importance. Today many universities offer courses in the areas of digital system testing and fault-tolerant computing. Due to the impor tance of CMOS technology, a significant portion of these courses may be devoted to CMOS testing. This book has been written as a reference text for such courses offered at the senior or graduate level. Familiarity with logic design and switching theory is assumed. The book should also prove to be useful to professionals working in the semiconductor industry.
Download or read book Defect and Fault Tolerance in VLSI Systems written by Robert Aitken and published by . This book was released on 2004 with total page 524 pages. Available in PDF, EPUB and Kindle. Book excerpt: DFT 2004 showcases the latest research results in the in the field of defect and fault tolerance in VLSI systems. Its papers cover yield, defect and fault tolerance, error correction, and circuit/system reliability and dependability.
Download or read book The Evolution of Fault Tolerant Computing written by A. Avizienis and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 467 pages. Available in PDF, EPUB and Kindle. Book excerpt: For the editors of this book, as well as for many other researchers in the area of fault-tolerant computing, Dr. William Caswell Carter is one of the key figures in the formation and development of this important field. We felt that the IFIP Working Group 10.4 at Baden, Austria, in June 1986, which coincided with an important step in Bill's career, was an appropriate occasion to honor Bill's contributions and achievements by organizing a one day "Symposium on the Evolution of Fault-Tolerant Computing" in the honor of William C. Carter. The Symposium, held on June 30, 1986, brought together a group of eminent scientists from all over the world to discuss the evolu tion, the state of the art, and the future perspectives of the field of fault-tolerant computing. Historic developments in academia and industry were presented by individuals who themselves have actively been involved in bringing them about. The Symposium proved to be a unique historic event and these Proceedings, which contain the final versions of the papers presented at Baden, are an authentic reference document.
Download or read book Digest of Technical Papers written by International Conference on Computer-Aided Design and published by . This book was released on 1984 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book VLSI 89 written by Gerald Musgrave and published by . This book was released on 1990 with total page 542 pages. Available in PDF, EPUB and Kindle. Book excerpt: Continuing the tradition established during the last decade, the latest VLSI volume breaks new ground, this time with such topics as Mechatronics and Three-Dimensional Chip Architectures. The selected research papers presented here have each been refereed by six people. Theoreticians in the field present their latest research, while cost-conscious practitioners demonstrate the reality of the field. In other words, the combination of breadth and depth should satisfy the most discerning readers and excite the younger generation, ensuring continued growth of the field.
Download or read book Curriculum for Test Technology written by IEEE Computer Society. Test Technology Committee and published by . This book was released on 1983 with total page 196 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Code Design for Dependable Systems written by Eiji Fujiwara and published by Wiley-Interscience. This book was released on 2006 with total page 728 pages. Available in PDF, EPUB and Kindle. Book excerpt: Written from an engineering standpoint with a focus on practical codes based on their performance and hardware complexit, Matrix Code Design for Dependable Systems emphasizes matrix codes and how they are manipulated. Unlike existing coding theory books, this book does not burden the reader with unnecessary mathematics for polynomial codes.
Download or read book IEEE Frontiers of Engineering and Computing in Health Care written by IEEE Engineering in Medicine and Biology Society. Annual Conference and published by . This book was released on 1985 with total page 688 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book System Fault Diagnostics Reliability and Related Knowledge Based Approaches written by S.G. Tzafestas and published by Springer. This book was released on 1987-08-31 with total page 460 pages. Available in PDF, EPUB and Kindle. Book excerpt: This 2-volume work represents the proceedings of the First European Workshop on Fault Diagnostics, Reliability and Re lated Knowledge-Based Approaches held in the Island of Rho des, Greece (August 3l-September 3, 1986). This Workshop was organized in the framework of a joint research project spon sored by the Commission of the European Communi ties under the Stimulation Action Programme. The principal aim of the Workshop was to bring together people working on the numeric and symbolic (knowledge-based) treatment of reliability and fault diagnosis problems, in order to promote the interaction and exhange of ideas, expe riences and results in this area. The workshop was a real success, with SS papers presen ted and 70 participants. A second Workshop of the same na ture has been decided to be held in Manchester (UMIST), - gland, in April 1987. . The two volumes contain sufficient amount of informa tion which reflects very well the state-of-the-art of the field, and shows the current tendency towards knowledge-ba sed (expert systems) and fault-tolerant approaches. Volume 1 contains the contributions on fault diagnostics and reliability issues (numeric treatment), and Vo·lume 2 the contributions on knowledge~based and fault-tolerant techni ques. We are grateful to the Commission of the European Com munities for having sponsored the Workshop, and to all au thors for their high quality contributions and presenta tions.
