Download or read book Design of a hardware automatic test pattern generation ATPG system written by Nazar Abbas Zaidi and published by . This book was released on 1990 with total page 294 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Test Pattern Generation using Boolean Proof Engines written by Rolf Drechsler and published by Springer Science & Business Media. This book was released on 2009-04-22 with total page 196 pages. Available in PDF, EPUB and Kindle. Book excerpt: In Test Pattern Generation using Boolean Proof Engines, we give an introduction to ATPG. The basic concept and classical ATPG algorithms are reviewed. Then, the formulation as a SAT problem is considered. As the underlying engine, modern SAT solvers and their use on circuit related problems are comprehensively discussed. Advanced techniques for SAT-based ATPG are introduced and evaluated in the context of an industrial environment. The chapters of the book cover efficient instance generation, encoding of multiple-valued logic, usage of various fault models, and detailed experiments on multi-million gate designs. The book describes the state of the art in the field, highlights research aspects, and shows directions for future work.
Download or read book Deterministic Automatic Test Pattern Generation for Built in Self Test System written by Muhammad Nazir Mohammed Khalid and published by . This book was released on 2006 with total page 186 pages. Available in PDF, EPUB and Kindle. Book excerpt: With a great growing use of electronic products in many aspects of society, it is evident that these products must perform reliably. Their reliability depends on the testing whether or not they have been manufactured properly and behave correctly. To ease testing, digital systems are commonly designed with Built-In Self Test facility. For this reason, development of test pattern for BIST based on combination of Linear Feedback Shift Register (LFSR) and deterministic ATPG (DATPG) approach could provide more solutions, such as reduce testing time, high fault coverage and low area overhead. One of the key challenges in BIST is the design of the Test Pattern Generation (TPG) that promised high fault coverage. The test pattern generation can be generated either manually or automatically. Problems related to ATPG are linked to the controllability and observability of the nodes in circuits. As far as the single stuck-at fault model is considered, efficient algorithms have been devised for combinational circuit. To illustrate that, the DATPG algorithm for digital combinational circuit using VHDL language is designed to generate the test patterns. Altera Max+plus II software is used to simulate the DATPG design to achieve the minimum test patterns for digital combinational circuit. The simulation result will be presented in the form of waveform. The results of DATPG for digital combinational circuit show that the sequence of LFSR has been reduced significantly. In BIST application, the minimum test patterns are applied to the adder/substractor (A/S) known as circuit under test (CUT). A parallel A/S is chosen as a CUT due to the simplicity of the circuit architecture. The A/S is used to verify the proposed DATPG performance. Only one basic cell of the parallel A/S is required to determine the test pattern by considering the data flow from one cell to another. Identical test data can then be applied to both A/S inputs simultaneously. By reducing the number of test pattern, the testing time to market and manufacturing time is expected to reduce leading to reduction in the product cost.
Download or read book 1983 IEEE ATPG Workshop Proceedings written by and published by . This book was released on 1983 with total page 152 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Electronic Design Automation for IC System Design Verification and Testing written by Luciano Lavagno and published by CRC Press. This book was released on 2017-12-19 with total page 644 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first of two volumes in the Electronic Design Automation for Integrated Circuits Handbook, Second Edition, Electronic Design Automation for IC System Design, Verification, and Testing thoroughly examines system-level design, microarchitectural design, logic verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for integrated circuit (IC) designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. New to This Edition: Major updates appearing in the initial phases of the design flow, where the level of abstraction keeps rising to support more functionality with lower non-recurring engineering (NRE) costs Significant revisions reflected in the final phases of the design flow, where the complexity due to smaller and smaller geometries is compounded by the slow progress of shorter wavelength lithography New coverage of cutting-edge applications and approaches realized in the decade since publication of the previous edition—these are illustrated by new chapters on high-level synthesis, system-on-chip (SoC) block-based design, and back-annotating system-level models Offering improved depth and modernity, Electronic Design Automation for IC System Design, Verification, and Testing provides a valuable, state-of-the-art reference for electronic design automation (EDA) students, researchers, and professionals.
Download or read book A Study of Automatic Test Pattern Generation Systems written by Kyuchull Kim and published by . This book was released on 1992 with total page 348 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book System level Test and Validation of Hardware Software Systems written by Matteo Sonza Reorda and published by Springer Science & Business Media. This book was released on 2006-03-30 with total page 187 pages. Available in PDF, EPUB and Kindle. Book excerpt: New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-chip (SOC), together with its associated manufacturing problems, represents a real challenge for designers. SOC is also reshaping approaches to test and validation activities. These are beginning to migrate from the traditional register-transfer or gate levels of abstraction to the system level. Until now, test and validation have not been supported by system-level design tools so designers have lacked the infrastructure to exploit all the benefits stemming from the adoption of the system level of abstraction. Research efforts are already addressing this issue. This monograph provides a state-of-the-art overview of the current validation and test techniques by covering all aspects of the subject including: modeling of bugs and defects; stimulus generation for validation and test purposes (including timing errors; design for testability.
Download or read book Advanced Techniques for Embedded Systems Design and Test written by Juan C. López and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 298 pages. Available in PDF, EPUB and Kindle. Book excerpt: As electronic technology reaches the point where complex systems can be integrated on a single chip, and higher degrees of performance can be achieved at lower costs, designers must devise new ways to undertake the laborious task of coping with the numerous, and non-trivial, problems that arise during the conception of such systems. On the other hand, shorter design cycles (so that electronic products can fit into shrinking market windows) put companies, and consequently designers, under pressure in a race to obtain reliable products in the minimum period of time. New methodologies, supported by automation and abstraction, have appeared which have been crucial in making it possible for system designers to take over the traditional electronic design process and embedded systems is one of the fields that these methodologies are mainly targeting. The inherent complexity of these systems, with hardware and software components that usually execute concurrently, and the very tight cost and performance constraints, make them specially suitable to introduce higher levels of abstraction and automation, so as to allow the designer to better tackle the many problems that appear during their design. Advanced Techniques for Embedded Systems Design and Test is a comprehensive book presenting recent developments in methodologies and tools for the specification, synthesis, verification, and test of embedded systems, characterized by the use of high-level languages as a road to productivity. Each specific part of the design process, from specification through to test, is looked at with a constant emphasis on behavioral methodologies. Advanced Techniques for Embedded Systems Design and Test is essential reading for all researchers in the design and test communities as well as system designers and CAD tools developers.
Download or read book Models in Hardware Testing written by Hans-Joachim Wunderlich and published by Springer Science & Business Media. This book was released on 2009-11-12 with total page 263 pages. Available in PDF, EPUB and Kindle. Book excerpt: Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance.
Download or read book System level Test and Validation of Hardware Software Systems written by Zebo Peng and published by Springer Science & Business Media. This book was released on 2005-04-07 with total page 206 pages. Available in PDF, EPUB and Kindle. Book excerpt: New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-chip (SOC), together with its associated manufacturing problems, represents a real challenge for designers. SOC is also reshaping approaches to test and validation activities. These are beginning to migrate from the traditional register-transfer or gate levels of abstraction to the system level. Until now, test and validation have not been supported by system-level design tools so designers have lacked the infrastructure to exploit all the benefits stemming from the adoption of the system level of abstraction. Research efforts are already addressing this issue. This monograph provides a state-of-the-art overview of the current validation and test techniques by covering all aspects of the subject including: modeling of bugs and defects; stimulus generation for validation and test purposes (including timing errors; design for testability.
Download or read book Time Efficient Automatic Test Pattern Generation Systems written by Byungse So and published by . This book was released on 1994 with total page 296 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Design and Test Technology for Dependable Systems on chip written by Raimund Ubar and published by IGI Global. This book was released on 2011-01-01 with total page 550 pages. Available in PDF, EPUB and Kindle. Book excerpt: "This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--
Download or read book High Quality Test Pattern Generation and Boolean Satisfiability written by Stephan Eggersglüß and published by Springer Science & Business Media. This book was released on 2012-02-01 with total page 208 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). A fast and highly fault efficient SAT-based ATPG framework is presented which is also able to generate high-quality delay tests such as robust path delay tests, as well as tests with long propagation paths to detect small delay defects. The aim of the techniques and methodologies presented in this book is to improve SAT-based ATPG, in order to make it applicable in industrial practice. Readers will learn to improve the performance and robustness of the overall test generation process, so that the ATPG algorithm reliably will generate test patterns for most targeted faults in acceptable run time to meet the high fault coverage demands of industry. The techniques and improvements presented in this book provide the following advantages: Provides a comprehensive introduction to test generation and Boolean Satisfiability (SAT); Describes a highly fault efficient SAT-based ATPG framework; Introduces circuit-oriented SAT solving techniques, which make use of structural information and are able to accelerate the search process significantly; Provides SAT formulations for the prevalent delay faults models, in addition to the classical stuck-at fault model; Includes an industrial perspective on the state-of-the-art in the testing, along with SAT; two topics typically distinguished from each other.
Download or read book Cryptographic Hardware and Embedded Systems CHES 2009 written by Christophe Clavier and published by Springer Science & Business Media. This book was released on 2009-08-28 with total page 486 pages. Available in PDF, EPUB and Kindle. Book excerpt: CHES 2009, the 11th workshop on Cryptographic Hardware and Embedded Systems, was held in Lausanne, Switzerland, September 6–9, 2009. The wo- shop was sponsored by the International Association for Cryptologic Research (IACR). The workshop attracted a record number of 148 submissions from 29 co- tries, of which the Program Committee selected 29 for publication in the wo- shop proceedings, resulting in an acceptance rate of 19.6%, the lowest in the history of CHES. The review process followed strict standards: each paper - ceived at least four reviews, and some asmanyaseightreviews.Membersofthe Program Committee were restricted to co-authoring at most two submissions, and their papers were evaluated by an extended number of reviewers. The ProgramCommittee included 53 members representing 20 countries and ?ve continents. These members were carefully selected to represent academia, industry, and government, as well as to include world-class experts in various research ?elds of interest to CHES. The Program Committee was supported by 148 external reviewers. The total number of people contributing to the - view process, including Program Committee members, external reviewers, and Program Co-chairs, exceeded 200. The papers collected in this volume represent cutting-edge worldwide - search in the rapidly growing and evolving area of cryptographic engineering.
Download or read book VLSI Design written by Dr. M. Nagabushanam and published by Sankalp Publication. This book was released on with total page 159 pages. Available in PDF, EPUB and Kindle. Book excerpt: N/A
Download or read book System on Chip Security written by Farimah Farahmandi and published by Springer Nature. This book was released on 2019-11-22 with total page 295 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes a wide variety of System-on-Chip (SoC) security threats and vulnerabilities, as well as their sources, in each stage of a design life cycle. The authors discuss a wide variety of state-of-the-art security verification and validation approaches such as formal methods and side-channel analysis, as well as simulation-based security and trust validation approaches. This book provides a comprehensive reference for system on chip designers and verification and validation engineers interested in verifying security and trust of heterogeneous SoCs.
Download or read book Principles of Verilog Digital Design written by Wen-Long Chin and published by CRC Press. This book was released on 2022-02-27 with total page 678 pages. Available in PDF, EPUB and Kindle. Book excerpt: Covering both the fundamentals and the in-depth topics related to Verilog digital design, both students and experts can benefit from reading this book by gaining a comprehensive understanding of how modern electronic products are designed and implemented. Principles of Verilog Digital Design contains many hands-on examples accompanied by RTL codes that together can bring a beginner into the digital design realm without needing too much background in the subject area. This book has a particular focus on how to transform design concepts into physical implementations using architecture and timing diagrams. Common mistakes a beginner or even an experienced engineer can make are summarized and addressed as well. Beyond the legal details of Verilog codes, the book additionally presents what uses Verilog codes have through some pertinent design principles. Moreover, students reading this book will gain knowledge about system-level design concepts. Several ASIC designs are illustrated in detail as well. In addition to design principles and skills, modern design methodology and how it is carried out in practice today are explored in depth as well.
