Download or read book Defect Recognition and Image Processing in Semiconductors and Devices Proceedings of the 5th INT Conference 6 10 September 1993 Santander Spain written by Juan Jiménez and published by CRC Press. This book was released on 1994-05-26 with total page 448 pages. Available in PDF, EPUB and Kindle. Book excerpt: The fifth in this series of conferences was held in Santander, Spain from 6 to 10 September 1993, and was attended by workers from industry and research institutes worldwide. Device yield is a crucial factor for determining the choice of semiconducting material made by manufacturers, and that choice is based upon a knowledge of how defects might affect a particular substrate, epilayer or base material. The DRIP conference series was instigated to address the mapping of these technologically important defects. Topics covered at the meeting included silicon, and compound semiconductor substrates and epilayers. Methods for defect recognition included tunelling microscopy, inelastic light scattering (Raman), elastic light scattering, photoluminescence mapping, defect characterization, optical probe beams, and effects of defects on devices. The meeting focused in particular on the microscopic nature of as-grown defects: their distribution as a function of growth conditions, and their redistribution under subsequent heat treatments. The conference dealt with the increasing number and sophistication of visualization techniques which map physical properties of defects, and which may in future permit better control of defect engineering. Researchers in solid state or device physics, or electrical engineering will find this volume an invaluable, up to date reference on the latest techniques for the identification of defects, developments in their control, implications for device fabrication, and future directions for the analysis and mapping of semiconductors.

Download or read book Defect Recognition and Image Processing in Semiconductors and Devices written by Juan Jimenez and published by . This book was released on 1994 with total page 417 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Defect Recognition and Image Processing in Semiconductors 1997 written by J. Doneker and published by Routledge. This book was released on 2017-11-22 with total page 524 pages. Available in PDF, EPUB and Kindle. Book excerpt: Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. The book discusses the merits and limits of characterization techniques; standardization; correlations between defects and device performance, including degradation and failure analysis; and the adaptation and application of standard characterization techniques to new materials. It also examines the impressive advances made possible by the increase in the number of nanoscale scanning techniques now available. The book investigates defects in layers and devices, and examines the problems that have arisen in characterizing gallium nitride and silicon carbide.

Download or read book DRIP 5 written by and published by . This book was released on 1993 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Index of Conference Proceedings written by and published by . This book was released on 1994 with total page 976 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Defect Recognition and Image Processing in Semiconductors 1995 written by A.R Mickelson and published by CRC Press. This book was released on 1996-05-30 with total page 288 pages. Available in PDF, EPUB and Kindle. Book excerpt: These proceedings provide an overview of research into defect inhomogeneities semiconductor materials and (as grown) devices. Defect inhomogeneities affect the performance of both as grown and processed semiconductors. A valuable overview of mapping and microscopy techniques for the study of such defects and an insight into the effect of such defects on device performance.

Download or read book The Cumulative Book Index written by and published by . This book was released on 1996 with total page 2166 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Electrical Electronics Abstracts written by and published by . This book was released on 1994 with total page 1084 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Defect Recognition and Image Processing in III V Compounds written by J. P. Fillard and published by Elsevier Publishing Company. This book was released on 1985 with total page 328 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Books in Print written by and published by . This book was released on 1982 with total page 2376 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Subject Guide to Books in Print written by and published by . This book was released on 1996 with total page 2476 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Forthcoming Books written by Rose Arny and published by . This book was released on 1994-04 with total page 1926 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Proceedings of the 17th International Conference on Defects in Semiconductors written by International Conference on Defects in Semiconductors and published by . This book was released on 1994 with total page 673 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Proceedings of the International Conference on Defects in Semiconductors written by International Conference on Defects in Semiconductors and published by . This book was released on 1994 with total page 611 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book The British National Bibliography written by Arthur James Wells and published by . This book was released on 1994 with total page 2000 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Defect Recognition and Image Processing in III V Compounds II written by Eicke R. Weber and published by Elsevier Publishing Company. This book was released on 1987 with total page 340 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Defect Recognition and Image Processing in III V Compounds III written by Tomoya Ogawa and published by . This book was released on 1990 with total page 474 pages. Available in PDF, EPUB and Kindle. Book excerpt: