Download or read book Defect Recognition and Image Processing in Semiconductors 1997 written by J. Doneker and published by Routledge. This book was released on 2017-11-22 with total page 524 pages. Available in PDF, EPUB and Kindle. Book excerpt: Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. The book discusses the merits and limits of characterization techniques; standardization; correlations between defects and device performance, including degradation and failure analysis; and the adaptation and application of standard characterization techniques to new materials. It also examines the impressive advances made possible by the increase in the number of nanoscale scanning techniques now available. The book investigates defects in layers and devices, and examines the problems that have arisen in characterizing gallium nitride and silicon carbide.

Download or read book Defect Recognition and Image Processing in Semiconductors 1995 written by A.R Mickelson and published by CRC Press. This book was released on 1996-05-30 with total page 288 pages. Available in PDF, EPUB and Kindle. Book excerpt: These proceedings provide an overview of research into defect inhomogeneities semiconductor materials and (as grown) devices. Defect inhomogeneities affect the performance of both as grown and processed semiconductors. A valuable overview of mapping and microscopy techniques for the study of such defects and an insight into the effect of such defects on device performance.

Download or read book Defect Recognition and Image Processing in Semiconductors 1997 written by J. Doneker and published by Routledge. This book was released on 2017-11-22 with total page 746 pages. Available in PDF, EPUB and Kindle. Book excerpt: Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. The book discusses the merits and limits of characterization techniques; standardization; correlations between defects and device performance, including degradation and failure analysis; and the adaptation and application of standard characterization techniques to new materials. It also examines the impressive advances made possible by the increase in the number of nanoscale scanning techniques now available. The book investigates defects in layers and devices, and examines the problems that have arisen in characterizing gallium nitride and silicon carbide.

Download or read book Defect Recognition and Image Processing in Semiconductors and Devices Proceedings of the 5th INT Conference 6 10 September 1993 Santander Spain written by Juan Jiménez and published by CRC Press. This book was released on 1994-05-26 with total page 448 pages. Available in PDF, EPUB and Kindle. Book excerpt: The fifth in this series of conferences was held in Santander, Spain from 6 to 10 September 1993, and was attended by workers from industry and research institutes worldwide. Device yield is a crucial factor for determining the choice of semiconducting material made by manufacturers, and that choice is based upon a knowledge of how defects might affect a particular substrate, epilayer or base material. The DRIP conference series was instigated to address the mapping of these technologically important defects. Topics covered at the meeting included silicon, and compound semiconductor substrates and epilayers. Methods for defect recognition included tunelling microscopy, inelastic light scattering (Raman), elastic light scattering, photoluminescence mapping, defect characterization, optical probe beams, and effects of defects on devices. The meeting focused in particular on the microscopic nature of as-grown defects: their distribution as a function of growth conditions, and their redistribution under subsequent heat treatments. The conference dealt with the increasing number and sophistication of visualization techniques which map physical properties of defects, and which may in future permit better control of defect engineering. Researchers in solid state or device physics, or electrical engineering will find this volume an invaluable, up to date reference on the latest techniques for the identification of defects, developments in their control, implications for device fabrication, and future directions for the analysis and mapping of semiconductors.

Download or read book Defect Recognition and Image Processing in III V Compounds written by J. P. Fillard and published by Elsevier Publishing Company. This book was released on 1985 with total page 328 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Future Energy Conferences and Symposia written by and published by . This book was released on 1995 with total page 842 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Defect Recognition and Image Processing in III V Compounds II written by Eicke R. Weber and published by Elsevier Publishing Company. This book was released on 1987 with total page 340 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Defect Recognition and Image Processing in III V Compounds written by International Symposium on Defect Recognition and Image Processing in III-V Compounds and published by . This book was released on 1985 with total page 306 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Index of Conference Proceedings written by British Library. Document Supply Centre and published by . This book was released on 2002 with total page 696 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Thin Film Materials Processes and Reliability written by Electrochemical Society. Meeting and published by The Electrochemical Society. This book was released on 2001 with total page 232 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Silicon Materials Science and Technology written by and published by . This book was released on 1998 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book written by and published by . This book was released on 1997 with total page 1594 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Kokuritsu Kokkai Toshokan shoz kagaku gijutsu kankei bun kaigiroku mokuroku written by Kokuritsu Kokkai Toshokan (Japan) and published by . This book was released on 1997 with total page 1596 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book Nanostructured and Photoelectrochemical Systems for Solar Photon Conversion written by Mary D. Archer and published by Imperial College Press. This book was released on 2008 with total page 781 pages. Available in PDF, EPUB and Kindle. Book excerpt: In this book, expert authors describe advanced solar photon conversion approaches that promise highly efficient photovoltaic and photoelectrochemical cells with sophisticated architectures on the one hand, and plastic photovoltaic coatings that are inexpensive enough to be disposable on the other. Their leitmotifs include light-induced exciton generation, junction architectures that lead to efficient exciton dissociation, and charge collection by percolation through mesoscale phases. Photocatalysis is closely related to photoelectrochemistry, and the fundamentals of both disciplines are covered in this volume.

Download or read book Recombination Lifetime Measurements in Silicon written by Dinesh C. Gupta and published by ASTM International. This book was released on 1998 with total page 389 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Download or read book The Cumulative Book Index written by and published by . This book was released on 1997 with total page 2312 pages. Available in PDF, EPUB and Kindle. Book excerpt: A world list of books in the English language.

Download or read book Silicon written by Paul Siffert and published by Springer Science & Business Media. This book was released on 2004-07-26 with total page 580 pages. Available in PDF, EPUB and Kindle. Book excerpt: With topics ranging from epitaxy through lattice defects and doping to quantum computation, this book provides a personalized survey of the development and use of silicon, the basis for the revolutionary changes in our lives sometimes called "The Silicon Age." Beginning with the very first developments more than 50 years ago, it reports on all aspects of silicon and silicon technology up to its use in exciting new technologies, including a glance at possible future developments. A team of expert authors, many of them pioneers in the field, have written informative and stimulating contributions that will be of interest to all scientists working with silicon.