Download or read book Cross layer Soft Error Analysis and Mitigation at Nanoscale Technologies written by Mojtaba Ebrahimi and published by . This book was released on 2016 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Cross Layer Reliability of Computing Systems written by Giorgio Di Natale and published by Institution of Engineering and Technology. This book was released on 2020-03-28 with total page 328 pages. Available in PDF, EPUB and Kindle. Book excerpt: Reliability has always been a major concern in designing computing systems. However, the increasing complexity of such systems has led to a situation where efforts for assuring reliability have become extremely costly, both for the design of solutions for the mitigation of possible faults, and for the reliability assessment of such techniques. Cross-layer reliability is fast becoming the preferred solution. In a cross-layer resilient system, physical and circuit level techniques can mitigate low-level faults. Hardware redundancy can be used to manage errors at the hardware architecture layer. Eventually, software implemented error detection and correction mechanisms can manage those errors that escaped the lower layers of the stack. This book presents state-of-the-art solutions for increasing the resilience of computing systems, both at single levels of abstraction and multi-layers. The book begins by addressing design techniques to improve the resilience of computing systems, covering the logic layer, the architectural layer and the software layer. The second part of the book focuses on cross-layer resilience, including coverage of physical stress, reliability assessment approaches, fault injection at the ISA level, analytical modelling for cross-later resiliency, and stochastic methods. Cross-Layer Reliability of Computing Systems is a valuable resource for researchers, postgraduate students and professional computer architects focusing on the dependability of computing systems.
Download or read book High level Estimation and Exploration of Reliability for Multi Processor System on Chip written by Zheng Wang and published by Springer. This book was released on 2017-06-23 with total page 210 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures.
Download or read book Soft Error Analysis and Mitigation in Circuits Involving C elements written by Norhuzaimin Bin Julai and published by . This book was released on 2015 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: A SEU or soft error is defined as a temporary error on digital electronics due to the effect of radiation. Such an error can cause system failure, e.g. a deadlock in an asynchronous system or production of incorrect outputs due to data corruption. The first part of this thesis studies the impact of process variation, temperature, voltage and size scaling within the same process on the vulnerability of the nodes of C-element circuits. The objectives are to identify vulnerable to SEU nodes inside a C-element and to find the critical charge needed to flip the output from low to high (0-1) and high to low (1-0) on different implementations of C-elements. In the second part, a framework to compute the SEU error rates is developed. The error rates of circuits are a trade-off between the size of the transistors and the total area of vulnerability. Comparisons of the vulnerability of different configurations of a C-element are made, and error rates are calculated. The third part focuses on soft error mitigation for single and dual rail latches. The latches are able to detect and correct errors due to SEU. The functionalities of the solutions have been validated by simulation. A comprehensive analysis of the performance of the latches under variations of the process and temperature are presented. The fourth part focuses on testing of the new latches. The objective is to design complex systems and incorporate both single rail and dual rail latches in the systems. Errors are injected in the latches and the functionality of the error correcting latches towards the SEU errors are observed at their outputs. The framework to compute error rates and soft error mitigation developed in this thesis can be used by designers in predicting the occurrence of soft error and mitigating soft error in systems.
Download or read book Soft Errors in Modern Electronic Systems written by Michael Nicolaidis and published by Springer. This book was released on 2012-11-05 with total page 318 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry experts in reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.
Download or read book Dependable Multicore Architectures at Nanoscale written by Marco Ottavi and published by Springer. This book was released on 2017-08-28 with total page 294 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides comprehensive coverage of the dependability challenges in today's advanced computing systems. It is an in-depth discussion of all the technological and design-level techniques that may be used to overcome these issues and analyzes various dependability-assessment methods. The impact of individual application scenarios on the definition of challenges and solutions is considered so that the designer can clearly assess the problems and adjust the solution based on the specifications in question. The book is composed of three sections, beginning with an introduction to current dependability challenges arising in complex computing systems implemented with nanoscale technologies, and of the effect of the application scenario. The second section details all the fault-tolerance techniques that are applicable in the manufacture of reliable advanced computing devices. Different levels, from technology-level fault avoidance to the use of error correcting codes and system-level checkpointing are introduced and explained as applicable to the different application scenario requirements. Finally the third section proposes a roadmap of future trends in and perspectives on the dependability and manufacturability of advanced computing systems from the special point of view of industrial stakeholders. Dependable Multicore Architectures at Nanoscale showcases the original ideas and concepts introduced into the field of nanoscale manufacturing and systems reliability over nearly four years of work within COST Action IC1103 MEDIAN, a think-tank with participants from 27 countries. Academic researchers and graduate students working in multi-core computer systems and their manufacture will find this book of interest as will industrial design and manufacturing engineers working in VLSI companies.
Download or read book Dependable Embedded Systems written by Jörg Henkel and published by Springer Nature. This book was released on 2020-12-09 with total page 606 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems.
Download or read book VLSI Design for Reliability and Security in Nanoscale Technology written by Milad Maleki and published by . This book was released on 2016 with total page 104 pages. Available in PDF, EPUB and Kindle. Book excerpt: As VLSI technology scales into the nanometer domain, and with the emergence of Internet-of-Things/Cyber-Physical Systems, VLSI systems are subject to growing variability and reliability challenges and security threats. Specifically, increasingly significant parametric variations from the manufacturing process, runtime system and surrounding environment lead to prevalent component performance variations, logic stage timing violations and system malfunction. IoT/CPS components are further subject to network attacks, physical attacks and supply chain attacks. Automotive electronics is one exemplary domain, which entails high level of both reliability and security. My dissertation work includes development of several timing error-resilient/adaptive performance VLSI design and security threat mitigation techniques. Specifically, in the first part of my dissertation, I propose a minimum-intrusion variable-latency VLSI design methodology based on completion prediction and clock gating. Traditional synchronous VLSI design requires that all computations in a logic stage complete in one clock cycle. Alternatively, by allowing computations in a logic stage to complete in a variable number of clock cycles, variable-latency design provides relaxed timing constraints for average performance, area and power consumption optimization. Proposed methodology involves signal probability based statistical timing analysis, determination of the logic computation latency, design of a prediction unit and a clock gating mechanism. In addition, I suggest an application-specific cross-layer analysis methodology. I further improve the methodology by addition of a timing-error detection mechanism to the prediction-based design. I present a performance variation model and propose a timing error rate estimation strategy based on statistical timing analysis. As opposed to detection and correction-based design paradigms which invoke considerable area and power overheads and face a number of circuit-level implementation problems, proposed prediction and detection-based variable-latency design methodology reduces the computation latency with relatively minimal cost. Concurrent checking or online monitoring methods are system-level techniques that conventionally incorporated for transient and intermittent fault detection. In the next part of the dissertation I present a hardware-based concurrent control-flow checking scheme for detection of software or hardware Trojan-based code injection attacks or dynamic integrity verification. I integrate a cipher-based hash-function in order to generate instruction sequence signature at runtime to protect against invalidation and circumvention attacks. In the final part of the dissertation, I propose and present a lightweight hardware-based Reconfigurable Reversible Computing (RRC) encryption/Decryption scheme. Suggested cryptography scheme achieve moving target defense and obfuscation through reconfigurability. One possible application of proposed scheme is the cipher-based hash function used in instruction sequence signature generation of proposed concurrent control-flow checking technique. Suggested scheme can be used as a standalone cryptographic module, or an addition to an existing scheme in order to mitigate side-channel attack treats. Furthermore, I present a Carbon Nanotube (CNT) crossbar-based nanoscale-computing platform as a more cost-effective alternative for secure implementation of cryptographic primitives. By incorporating CNT crossbar-based reconfigurable technology, minimal overhead to counteract supply chain, cryptanalysis and side-channel attacks is achieved. I compare suggested CNT-based reconfigurable reversible computing cryptographic scheme with FPGA and CMOS-based implementation of AES in hardware cost and attack complexity.
Download or read book TinyML written by Pete Warden and published by O'Reilly Media. This book was released on 2019-12-16 with total page 504 pages. Available in PDF, EPUB and Kindle. Book excerpt: Deep learning networks are getting smaller. Much smaller. The Google Assistant team can detect words with a model just 14 kilobytes in size—small enough to run on a microcontroller. With this practical book you’ll enter the field of TinyML, where deep learning and embedded systems combine to make astounding things possible with tiny devices. Pete Warden and Daniel Situnayake explain how you can train models small enough to fit into any environment. Ideal for software and hardware developers who want to build embedded systems using machine learning, this guide walks you through creating a series of TinyML projects, step-by-step. No machine learning or microcontroller experience is necessary. Build a speech recognizer, a camera that detects people, and a magic wand that responds to gestures Work with Arduino and ultra-low-power microcontrollers Learn the essentials of ML and how to train your own models Train models to understand audio, image, and accelerometer data Explore TensorFlow Lite for Microcontrollers, Google’s toolkit for TinyML Debug applications and provide safeguards for privacy and security Optimize latency, energy usage, and model and binary size
Download or read book Resistive Random Access Memory RRAM written by Shimeng Yu and published by Springer Nature. This book was released on 2022-06-01 with total page 71 pages. Available in PDF, EPUB and Kindle. Book excerpt: RRAM technology has made significant progress in the past decade as a competitive candidate for the next generation non-volatile memory (NVM). This lecture is a comprehensive tutorial of metal oxide-based RRAM technology from device fabrication to array architecture design. State-of-the-art RRAM device performances, characterization, and modeling techniques are summarized, and the design considerations of the RRAM integration to large-scale array with peripheral circuits are discussed. Chapter 2 introduces the RRAM device fabrication techniques and methods to eliminate the forming process, and will show its scalability down to sub-10 nm regime. Then the device performances such as programming speed, variability control, and multi-level operation are presented, and finally the reliability issues such as cycling endurance and data retention are discussed. Chapter 3 discusses the RRAM physical mechanism, and the materials characterization techniques to observe the conductive filaments and the electrical characterization techniques to study the electronic conduction processes. It also presents the numerical device modeling techniques for simulating the evolution of the conductive filaments as well as the compact device modeling techniques for circuit-level design. Chapter 4 discusses the two common RRAM array architectures for large-scale integration: one-transistor-one-resistor (1T1R) and cross-point architecture with selector. The write/read schemes are presented and the peripheral circuitry design considerations are discussed. Finally, a 3D integration approach is introduced for building ultra-high density RRAM array. Chapter 5 is a brief summary and will give an outlook for RRAM’s potential novel applications beyond the NVM applications.
Download or read book NANO CHIPS 2030 written by Boris Murmann and published by Springer Nature. This book was released on 2020-06-08 with total page 597 pages. Available in PDF, EPUB and Kindle. Book excerpt: In this book, a global team of experts from academia, research institutes and industry presents their vision on how new nano-chip architectures will enable the performance and energy efficiency needed for AI-driven advancements in autonomous mobility, healthcare, and man-machine cooperation. Recent reviews of the status quo, as presented in CHIPS 2020 (Springer), have prompted the need for an urgent reassessment of opportunities in nanoelectronic information technology. As such, this book explores the foundations of a new era in nanoelectronics that will drive progress in intelligent chip systems for energy-efficient information technology, on-chip deep learning for data analytics, and quantum computing. Given its scope, this book provides a timely compendium that hopes to inspire and shape the future of nanoelectronics in the decades to come.
Download or read book Soft Error Mechanisms Modeling and Mitigation written by Selahattin Sayil and published by Springer. This book was released on 2016-02-25 with total page 112 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time.
Download or read book Nanotechnology in Space written by Maria Letizia Terranova and published by CRC Press. This book was released on 2021-09-15 with total page 262 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents selected topics on nanotechnological applications in the strategic sector of space. It showcases some current activities and multidisciplinary approaches that have given an unprecedented control of matter at the nanoscale and will enable it to withstand the unique space environment. It focuses on the outstanding topic of dual-use nanotechnologies, illustrating the mutual benefits of key enabling materials that can be used successfully both on earth and in space. It highlights the importance of space as a strategic sector in the global economy, with ever-increasing related businesses worldwide. In this light, it dedicates a chapter to the analysis of current and future markets for space-related nanotechnological products and applications.
Download or read book Encyclopedia of Information Science and Technology written by Mehdi Khosrow-Pour and published by IGI Global Snippet. This book was released on 2009 with total page 4292 pages. Available in PDF, EPUB and Kindle. Book excerpt: "This set of books represents a detailed compendium of authoritative, research-based entries that define the contemporary state of knowledge on technology"--Provided by publisher.
Download or read book Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices written by Ronald D Schrimpf and published by World Scientific. This book was released on 2004-07-29 with total page 349 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.
Download or read book Renewable Energy Sources and Climate Change Mitigation written by Ottmar Edenhofer and published by Cambridge University Press. This book was released on 2011-11-21 with total page 1088 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Intergovernmental Panel on Climate Change Special Report (IPCC-SRREN) assesses the potential role of renewable energy in the mitigation of climate change. It covers the six most important renewable energy sources - bioenergy, solar, geothermal, hydropower, ocean and wind energy - as well as their integration into present and future energy systems. It considers the environmental and social consequences associated with the deployment of these technologies, and presents strategies to overcome technical as well as non-technical obstacles to their application and diffusion. SRREN brings a broad spectrum of technology-specific experts together with scientists studying energy systems as a whole. Prepared following strict IPCC procedures, it presents an impartial assessment of the current state of knowledge: it is policy relevant but not policy prescriptive. SRREN is an invaluable assessment of the potential role of renewable energy for the mitigation of climate change for policymakers, the private sector, and academic researchers.
Download or read book Nanotechnology Research Directions IWGN Workshop Report written by R.S. Williams and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 367 pages. Available in PDF, EPUB and Kindle. Book excerpt: energy production, environmental management, transportation, communication, computation, and education. As the twenty-first century unfolds, nanotechnology's impact on the health, wealth, and security of the world's people is expected to be at least as significant as the combined influences in this century of antibiotics, the integrated circuit, and human-made polymers. Dr. Neal Lane, Advisor to the President for Science and Technology and former National Science Foundation (NSF) director, stated at a Congressional hearing in April 1998, "If I were asked for an area of science and engineering that will most likely produce the breakthroughs of tomorrow, I would point to nanoscale science and engineering. " Recognizing this potential, the White House Office of Science and Technology Policy (OSTP) and the Office of Management and Budget (OMB) have issued a joint memorandum to Federal agency heads that identifies nanotechnology as a research priority area for Federal investment in fiscal year 2001. This report charts "Nanotechnology Research Directions," as developed by the Interagency W orking Group on Nano Science, Engineering, and Technology (IWGN) of the National Science and Technology Council (NSTC). The report incorporates the views of leading experts from government, academia, and the private sector. It reflects the consensus reached at an IWGN-sponsored workshop held on January 27-29, 1999, and detailed in contributions submitted thereafter by members of the V. S. science and engineering community. (See Appendix A for a list of contributors.
