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Book Correction Factor Tables for Four point Probe Resistivity Measurements on Thin  Circular Semiconductor Samples

Download or read book Correction Factor Tables for Four point Probe Resistivity Measurements on Thin Circular Semiconductor Samples written by Lydon J. Swartzendruber and published by . This book was released on 1964 with total page 48 pages. Available in PDF, EPUB and Kindle. Book excerpt: Extensive tables of the geometrical correction factors for four-point probe resistivity measurements on thin, circular semiconductor samples with all surfaces insulating are given, (1) for an in-line probe array displaced radially with points along a diameter, (2) for an in-line probe array displaced radially with the line of points perpendicular to a diameter, and (3) for a displaced square probe array.(Author).

Book Correction Factor Tables for Four point Probe Resistivity Measurements on Thin  Circular Semiconductor Samples

Download or read book Correction Factor Tables for Four point Probe Resistivity Measurements on Thin Circular Semiconductor Samples written by United States. National Bureau of Standards and published by . This book was released on 1964 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Correction Factor Tables for 4 point Probe Resistivity Measurements on Thin  Circular Semiconductor Samples  with List of References

Download or read book Correction Factor Tables for 4 point Probe Resistivity Measurements on Thin Circular Semiconductor Samples with List of References written by and published by . This book was released on 1964 with total page 34 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Correction Factor Tables for Four point Probe Resistivity Measurements on Thin  Circular Semiconductor Samples

Download or read book Correction Factor Tables for Four point Probe Resistivity Measurements on Thin Circular Semiconductor Samples written by Lydon J. Swartzendruber and published by . This book was released on 1964 with total page 46 pages. Available in PDF, EPUB and Kindle. Book excerpt: Extensive tables of the geometrical correction factors for four-point probe resistivity measurements on thin, circular semiconductor samples with all surfaces insulating are given, (1) for an in-line probe array displaced radially with points along a diameter, (2) for an in-line probe array displaced radially with the line of points perpendicular to a diameter, and (3) for a displaced square probe array.(Author).

Book Publications

Download or read book Publications written by United States. National Bureau of Standards and published by . This book was released on 1960 with total page 762 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Publications of the National Bureau of Standards

Download or read book Publications of the National Bureau of Standards written by United States. National Bureau of Standards and published by . This book was released on 1967 with total page 772 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Publications   United States  National Bureau of Standards

Download or read book Publications United States National Bureau of Standards written by United States. National Bureau of Standards and published by . This book was released on 1960 with total page 776 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Publications  July 1960 Through June 1966

Download or read book Publications July 1960 Through June 1966 written by United States. National Bureau of Standards and published by . This book was released on 1967 with total page 770 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Journal of Research of the National Bureau of Standards

Download or read book Journal of Research of the National Bureau of Standards written by and published by . This book was released on 1964 with total page 354 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Journal of Research of the National Bureau of Standards

Download or read book Journal of Research of the National Bureau of Standards written by United States. National Bureau of Standards and published by . This book was released on 1977 with total page 1046 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Journal of Research

    Book Details:
  • Author : United States. National Bureau of Standards
  • Publisher :
  • Release : 1963
  • ISBN :
  • Pages : 744 pages

Download or read book Journal of Research written by United States. National Bureau of Standards and published by . This book was released on 1963 with total page 744 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Semiconductor Measurement Technology

Download or read book Semiconductor Measurement Technology written by Institute for Applied Technology (U.S.). Electronic Technology Division and published by . This book was released on 1973 with total page 332 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Semiconductor Measurement Technology

Download or read book Semiconductor Measurement Technology written by États-Unis. National bureau of standards (1901-1988). and published by . This book was released on 1974 with total page 76 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Measurement techniques for high power semiconductor materials and devices

Download or read book Measurement techniques for high power semiconductor materials and devices written by and published by . This book was released on 1978 with total page 96 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Measurement Techniques for High Power Semiconductor Materials and Devices

Download or read book Measurement Techniques for High Power Semiconductor Materials and Devices written by Center for Electronics and Electrical Engineering (U.S.). Electron Devices Division and published by . This book was released on 1978 with total page 92 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Book Calculations for Comparing Two Point and Four Point Probe Resistivity Measurements on Rectangular Bar Shaped Semiconductor Samples  Classic Reprint

Download or read book Calculations for Comparing Two Point and Four Point Probe Resistivity Measurements on Rectangular Bar Shaped Semiconductor Samples Classic Reprint written by Lydon J. Swartzendruber and published by Forgotten Books. This book was released on 2017-10-29 with total page 32 pages. Available in PDF, EPUB and Kindle. Book excerpt: Excerpt from Calculations for Comparing Two-Point and Four-Point Probe Resistivity Measurements on Rectangular Bar-Shaped Semiconductor Samples Fortran codes are given which enable the calculation of four-point probe correction factors for use with bar shaped samples. Samples with either plated or unplated ends are considered. The errors that arise due to probe misplacement, inaccurate sample size and shape, and non uniform end plating are also considered. Use of the re sults permits accurate comparison of two-point and four point probe resistivity measurements. The codes are in Fortran II language and were written for an ibm 7090 computer. About the Publisher Forgotten Books publishes hundreds of thousands of rare and classic books. Find more at www.forgottenbooks.com This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.