Download or read book Complete Information Acquisition in Scanning Probe Microscopy written by and published by . This book was released on 2015 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: In the last three decades, scanning probe microscopy (SPM) has emerged as a primary tool for exploring and controlling the nanoworld. A critical part of the SPM measurements is the information transfer from the tip-surface junction to a macroscopic measurement system. This process reduces the many degrees of freedom of a vibrating cantilever to relatively few parameters recorded as images. Similarly, the details of dynamic cantilever response at sub-microsecond time scales of transients, higher-order eigenmodes and harmonics are averaged out by transitioning to millisecond time scale of pixel acquisition. Hence, the amount of information available to the external observer is severely limited, and its selection is biased by the chosen data processing method. Here, we report a fundamentally new approach for SPM imaging based on information theory-type analysis of the data stream from the detector. This approach allows full exploration of complex tip-surface interactions, spatial mapping of multidimensional variability of material s properties and their mutual interactions, and SPM imaging at the information channel capacity limit.
Download or read book Scanning Probe Microscopy written by Ernst Meyer and published by Springer Science & Business Media. This book was released on 2013-03-14 with total page 215 pages. Available in PDF, EPUB and Kindle. Book excerpt: Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.
Download or read book Full Information Acquisition in Scanning Probe Microscopy and Spectroscopy written by and published by . This book was released on 2017 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Apparatus and methods are described for scanning probe microscopy and spectroscopy based on acquisition of full probe response. The full probe response contains valuable information about the probe-sample interaction that is lost in traditional scanning probe microscopy and spectroscopy methods. The full probe response is analyzed post data acquisition using fast Fourier transform and adaptive filtering, as well as multivariate analysis. The full response data is further compressed to retain only statistically significant components before being permanently stored.
Download or read book Scanning Probe Microscopy written by Sergei V. Kalinin and published by Springer Science & Business Media. This book was released on 2007-04-03 with total page 1002 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs.
Download or read book Advances in Scanning Probe Microscopy written by T. Sakurai and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 352 pages. Available in PDF, EPUB and Kindle. Book excerpt: There have been many books published on scanning tunneling microscopy (STM), atomic force microscopy (AFM) and related subjects since Dr. Cerd Binnig and Dr. Heinrich Rohrer invented STM in 1982 and AFM in 1986 at IBM Research Center in Zurich, Switzerland. These two techniques, STM and AFM, now form the core of what has come to be called the 'scanning probe microscopy (SPM)' family. SPM is not just the most powerful microscope for scientists to image atoms on surfaces, but is also becoming an indispensable tool for manipulating atoms and molecules to construct man-made materials and devices. Its impact has been felt in various fields, from surface physics and chemistry to nano-mechanics, nano-electronics and medical science. Its influence will surely extend further as the years go by, beyond the reach of our present imagination, and new research applications will continue to emerge. This book, therefore, is not intended to be a comprehensive review or textbook on SPM. Its aim is to cover only a selected part of the active re search fields of SPM and related topics in which I have been directly involved over the years. These include the basic principles of STM and AFM, and their applications to fullerene film growth, SiC surface reconstructions, MBE (molecular beam epitaxy) growth of CaAs, atomic scale manipulation of Si surfaces and meso scopic work function.
Download or read book Scanning Probe Microscopy written by Adam Foster and published by Springer Science & Business Media. This book was released on 2006-10-14 with total page 292 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today’s simulation techniques and gives examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations used in today’s research, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the instrument's operation is changed by materials properties; theorists will understand how simulations can be directly compared to experimental data.
Download or read book Scanning Probe Microscopy written by Bert Voigtländer and published by Springer. This book was released on 2015-02-24 with total page 375 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.
Download or read book Bringing Scanning Probe Microscopy up to Speed written by Stephen C. Minne and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 169 pages. Available in PDF, EPUB and Kindle. Book excerpt: Bringing Scanning Probe Microscopy Up to Speed introduces the principles of scanning probe systems with particular emphasis on techniques for increasing speed. The authors include useful information on the characteristics and limitations of current state-of-the-art machines as well as the properties of the systems that will follow in the future. The basic approach is two-fold. First, fast scanning systems for single probes are treated and, second, systems with multiple probes operating in parallel are presented. The key components of the SPM are the mechanical microcantilever with integrated tip and the systems used to measure its deflection. In essence, the entire apparatus is devoted to moving the tip over a surface with a well-controlled force. The mechanical response of the actuator that governs the force is of the utmost importance since it determines the scanning speed. The mechanical response relates directly to the size of the actuator; smaller is faster. Traditional scanning probe microscopes rely on piezoelectric tubes of centimeter size to move the probe. In future scanning probe systems, the large actuators will be replaced with cantilevers where the actuators are integrated on the beam. These will be combined in arrays of multiple cantilevers with MEMS as the key technology for the fabrication process.
Download or read book Roadmap of Scanning Probe Microscopy written by Seizo Morita and published by Springer Science & Business Media. This book was released on 2006-12-30 with total page 207 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. This book predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately taken and may accelerate research and development on nanotechnology and nanoscience, as well as all in SPM-related fields in the future.
Download or read book Applied Scanning Probe Methods II written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2006-06-22 with total page 456 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rst there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes.
Download or read book Scanning Probe Microscopy and Spectroscopy written by Roland Wiesendanger and published by Cambridge University Press. This book was released on 1994-09-29 with total page 664 pages. Available in PDF, EPUB and Kindle. Book excerpt: The investigation and manipulation of matter on the atomic scale have been revolutionised by scanning tunnelling microscopy and related scanning probe techniques. This book is the first to provide a clear and comprehensive introduction to this subject. Beginning with the theoretical background of scanning tunnelling microscopy, the design and instrumentation of practical STM and associated systems are described in detail, as are the applications of these techniques in fields such as condensed matter physics, chemistry, biology, and nanotechnology. Containing 350 illustrations, and over 1200 references, this unique book represents an ideal introduction to the subject for final-year undergraduates in physics or materials science. It will also be invaluable to graduate students and researchers in any branch of science where scanning probe techniques are used.
Download or read book Applied Scanning Probe Methods XI written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2008-10-22 with total page 281 pages. Available in PDF, EPUB and Kindle. Book excerpt: The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. Real industrial applications are included.
Download or read book Scanning Probe Microscopy written by Roland Wiesendanger and published by Springer Science & Business Media. This book was released on 2013-03-14 with total page 238 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning Probe Microscopy - Analytical Methods provides a comprehensive overview of the analytical methods on the nanometer scale based on scanning probe microscopy and spectroscopy. Numerous examples of applications of the chemical contrast mechanism down to the atomic scale in surface physics and chemistry are discussed with extensive references to original work in the recent literature.
Download or read book Scanning Probe Microscopy and Spectroscopy written by Dawn Bonnell and published by John Wiley & Sons. This book was released on 2000-12-05 with total page 520 pages. Available in PDF, EPUB and Kindle. Book excerpt: A practical introduction to basic theory and contemporary applications across a wide range of research disciplines Over the past two decades, scanning probe microscopies and spectroscopies have gained acceptance as indispensable characterization tools for an array of disciplines. This book provides novices and experienced researchers with a highly accessible treatment of basic theory, alongside detailed examples of current applications of both scanning tunneling and force microscopies and spectroscopies. Like its popular predecessor, Scanning Probe Microscopy and Spectroscopy, Second Edition features contributions from distinguished scientists working in a wide range of specialties at university, commercial, and government research labs around the world. Chapters have been edited for clarity, conciseness, and uniformity of presentation to provide professionals with a concise working reference to scanning probe microscopic and spectroscopic principles, techniques, and practices. This Second Edition has been substantially revised and expanded to reflect important advances and new applications. In addition to numerous examples, the Second Edition features expanded coverage of electrostatic and magnetic force microscopies, near-field optical microscopies, and new applications of buried interfaces in nanomechanics, electrochemistry, and biology. Scanning Probe Microscopy and Spectroscopy, Second Edition is an indispensable working resource for surface scientists, microscopists, and spectroscopists in materials science, chemistry, engineering, biochemistry, physics, and the life sciences. It is also an unparalleled reference text for advanced undergraduates and graduate students in those fields.
Download or read book A Practical Guide to Scanning Probe Microscopy written by Rebecca Howland and published by . This book was released on 1998-06 with total page 74 pages. Available in PDF, EPUB and Kindle. Book excerpt: Provides basic information about scanning probe microscopes (SPMs), which are used in a wide variety of disciplines, including fundamental surface science, routine surface roughness analysis, & spectacular three-dimensional imaging -- from atoms of silicon to micron-sized protrusions on the surface of a living cell. Issues covered in this handbook range from fundamental physics of SPMs to their practical capabilities & instrumentation. Examples of applications are included throughout the text, & several application-specific articles are listed at the end of each chapter.
Download or read book Exploring Scanning Probe Microscopy with MATHEMATICA written by Dror Sarid and published by John Wiley & Sons. This book was released on 2007-02-27 with total page 310 pages. Available in PDF, EPUB and Kindle. Book excerpt: This new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides a complete set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. The result is both a solid professional reference and an advanced-level text, beginning with the basics and moving on to the latest techniques, experiments, and theory. In the section devoted to atomic force microscopy, the author describes the mechanical properties of cantilevers, atomic force microscope tip-sample interactions, and cantilever vibration characteristics. This is followed by an in-depth treatment of theoretical and practical aspects of tunneling phenomena, including metal-insulator-metal tunneling and Fowler-Nordheim field emission. The final section features applications, dealing with, among others, Kelvin and Raman probe microscopy. The self-contained presentation spares researchers valuable time spent hunting through the technical literature for the theoretical results required to understand the models presented. The Mathematica code for all the examples is included in the CD-ROM, affording the freedom to change the values and parameters of specific problems as desired, or even modify the programs themselves to suit various modeling needs.
Download or read book Scanning Probe Microscopy in Industrial Applications written by Dalia G. Yablon and published by John Wiley & Sons. This book was released on 2013-10-24 with total page 337 pages. Available in PDF, EPUB and Kindle. Book excerpt: Describes new state-of-the-science tools and their contribution to industrial R&D With contributions from leading international experts in the field, this book explains how scanning probe microscopy is used in industry, resulting in improved product formulation, enhanced processes, better quality control and assurance, and new business opportunities. Readers will learn about the use of scanning probe microscopy to support R&D efforts in the semiconductor, chemical, personal care product, biomaterial, pharmaceutical, and food science industries, among others. Scanning Probe Microscopy in Industrial Applications emphasizes nanomechanical characterization using scanning probe microscopy. The first half of the book is dedicated to a general overview of nanomechanical characterization methods, offering a complete practical tutorial for readers who are new to the topic. Several chapters include worked examples of useful calculations such as using Hertz mechanics with and without adhesion to model a contact, step-by-step instructions for simulations to guide cantilever selection for an experiment, and data analysis procedures for dynamic contact experiments. The second half of the book describes applications of nanomechanical characterization in industry, including: New formulation development for pharmaceuticals Measurement of critical dimensions and thin dielectric films in the semiconductor industry Effect of humidity and temperature on biomaterials Characterization of polymer blends to guide product formulation in the chemicals sector Unraveling links between food structure and function in the food industry Contributions are based on the authors' thorough review of the current literature as well as their own firsthand experience applying scanning probe microscopy to solve industrial R&D problems. By explaining the fundamentals before advancing to applications, Scanning Probe Microscopy in Industrial Applications offers a complete treatise that is accessible to both novices and professionals. All readers will discover how to apply scanning probe microscopy to build and enhance their R&D efforts.
