Download or read book Combination of Trace and Scan Signals for Debuggability Enhancement in Post silicon Validation written by Kihyuk Han and published by . This book was released on 2013 with total page 232 pages. Available in PDF, EPUB and Kindle. Book excerpt: Pre-silicon verification is an essential part of integrated circuit design to capture functional design errors. Complex simulation, emulation and formal verification tools are used in a virtual environment before the device is manufactured in silicon. However, as the design complexity increases and the design cycle becomes shorter for fast time-to-market, design errors are more likely to escape from the pre-silicon verification and functional bugs are found during the actual operation. Since manufacturing test primarily focuses on the physical defects, post-silicon validation is the final gatekeeper to capture these escaped design bugs. Consequently, post-silicon validation has become a critical path in shortening the development cycle of System-On-Chip(SoC) design. A major challenge in post-silicon validation is the limited observability of internal states caused by the limited storage capacity available for silicon debugging. Since a post-silicon validation operates on a fabricated chip, recording the values of each and every internal signals is not possible. Due to this limitation of post-silicon validation, acquiring the circuit's internal behavior with the limited available resources is a very challenging task in post-silicon validation. There are two main categories to expand the observability: trace and scan signal based approaches. Real time system response during silicon debug can be acquired using a trace signal based technique; however due to the limited space for the trace buffer, the selection of the trace signals is very critical in maximizing the observability of the internal states. The scan based approach provides high observability and requires no additional design overhead; however the designers cannot acquire the real time system response since the circuit operation has to be stopped to transfer the internal states. Recent research has shown that observability can be enhanced if trace and scan signals can be efficiently combined together, compared to the other debugging scenarios where only trace signals are monitored. This dissertation proposes an enhanced and systematic algorithm for the efficient combination of trace and scan signals using restorability values to maximize the observability of internal circuit states. In order to achieve this goal, we first introduce a technique to calculate restorability values accurately by considering both local and global connectivity of the circuit. Based on these restorability values, the dynamic trace signal selection algorithm is proposed to provide a higher number of restored states regardless of the incoming test vectors. Instead of using total restorability values, we separate 0 and 1 restorability values to differentiate the different circuit responses to the different incoming test vectors. Also, the two groups of trace signals can be selected dynamically based on the characteristics of the incoming test vectors to minimize the performance degradation with respect to the different incoming test vectors. Second, we propose a new algorithm to find the optimal number of trace signals, when trace and scan signals are combined together for better observability. Our technique utilizes restorability values and finds the optimal number of trace signals so that the remaining space of trace buffer can be utilized for the scan signals. Observability can be enhanced further with data compression technique. Since the entries of the dictionary are determined from the golden simulation, a high compression ratio can be achieved with little extra hardware overhead. Experimental results on benchmark circuits and a real industry design show that the proposed technique provides a higher number of restored states compared to the existing techniques.
Download or read book Post Silicon Validation and Debug written by Prabhat Mishra and published by Springer. This book was released on 2018-09-01 with total page 394 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a comprehensive coverage of System-on-Chip (SoC) post-silicon validation and debug challenges and state-of-the-art solutions with contributions from SoC designers, academic researchers as well as SoC verification experts. The readers will get a clear understanding of the existing debug infrastructure and how they can be effectively utilized to verify and debug SoCs.
Download or read book Trace Signal Selection for Post silicon Debug written by and published by . This book was released on 2014 with total page 112 pages. Available in PDF, EPUB and Kindle. Book excerpt: Modern technology scaling enables integration of billions of transistors on the same chip. This increase in design complexity makes it difficult to comprehensively validate the design prior to mass production. The main challenge in post-silicon validation is the lack of observability to the internal signals of the manufactured chips. One way to increase this observability is by using Embedded Logic Analyzers (ELAs) which are widely adopted by the industry for the past few years. A core component inside an ELA are trace buffers, which record the signal values corresponding to a small subset of state elements in the design for a few thousand clock cycles. Due to the large area overhead of the trace buffers, only a small fraction of the state elements in the design can be traced online. The signal values of the traced state elements are then used to restore the values of the remaining not-traced state elements. The automated trace signal selection problem focuses on selection of the trace signals in order to maximize the restoration of the remaining state elements within an observation window. In this dissertation, we first propose a hybrid single-mode trace signal selection algorithm which achieves a good balance between solution quality and runtime-scalability. Next, we consider the impact of control signals in the restoration process using the values of the trace signals. We first propose an automated procedure to identify control signals; currently identification of control signals in a design is mostly done manually. However manual identification is not an easy task anymore because of increase in the number of control signals with increase in design complexity as well as automated insertion by CAD tools. We next introduce the trace signal selection problem in the presence of multiple operation modes which occur when control signals take different values. We show existing algorithms which are based on trace signal selection in a single operation mode achieve poor signal restoration over multiple operation modes. In contrast, our proposed algorithm considers restoration over all the operation modes and is therefore able to achieve much higher restoration over all the desired operation modes.
Download or read book Protocol directed Trace Signal Selection for Post silicon Validation written by Abhishek Sharma and published by . This book was released on 2016 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book High Quality Functional Coverage Based Trace Signal Selection for Post silicon Validation written by and published by . This book was released on 2014 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book VLSI Design and Test written by Brajesh Kumar Kaushik and published by Springer. This book was released on 2017-12-21 with total page 820 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
Download or read book Principles of Verifiable RTL Design written by Lionel Bening and published by Springer Science & Business Media. This book was released on 2007-05-08 with total page 297 pages. Available in PDF, EPUB and Kindle. Book excerpt: System designers, computer scientists and engineers have c- tinuously invented and employed notations for modeling, speci- ing, simulating, documenting, communicating, teaching, verifying and controlling the designs of digital systems. Initially these s- tems were represented via electronic and fabrication details. F- lowing C. E. Shannon’s revelation of 1948, logic diagrams and Boolean equations were used to represent digital systems in a fa- ion that de-emphasized electronic and fabrication detail while revealing logical behavior. A small number of circuits were made available to remove the abstraction of these representations when it was desirable to do so. As system complexity grew, block diagrams, timing charts, sequence charts, and other graphic and symbolic notations were found to be useful in summarizing the gross features of a system and describing how it operated. In addition, it always seemed necessary or appropriate to augment these documents with lengthy verbal descriptions in a natural language. While each notation was, and still is, a perfectly valid means of expressing a design, lack of standardization, conciseness, and f- mal definitions interfered with communication and the understa- ing between groups of people using different notations. This problem was recognized early and formal languages began to evolve in the 1950s when I. S. Reed discovered that flip-flop input equations were equivalent to a register transfer equation, and that xvi tor-like notation. Expanding these concepts Reed developed a no- tion that became known as a Register Transfer Language (RTL).
Download or read book Computer Organization and Design RISC V Edition written by David A. Patterson and published by Morgan Kaufmann. This book was released on 2017-05-12 with total page 700 pages. Available in PDF, EPUB and Kindle. Book excerpt: The new RISC-V Edition of Computer Organization and Design features the RISC-V open source instruction set architecture, the first open source architecture designed to be used in modern computing environments such as cloud computing, mobile devices, and other embedded systems. With the post-PC era now upon us, Computer Organization and Design moves forward to explore this generational change with examples, exercises, and material highlighting the emergence of mobile computing and the Cloud. Updated content featuring tablet computers, Cloud infrastructure, and the x86 (cloud computing) and ARM (mobile computing devices) architectures is included. An online companion Web site provides advanced content for further study, appendices, glossary, references, and recommended reading. Features RISC-V, the first such architecture designed to be used in modern computing environments, such as cloud computing, mobile devices, and other embedded systems Includes relevant examples, exercises, and material highlighting the emergence of mobile computing and the cloud
Download or read book Software Defined Radio for Engineers written by Alexander M. Wyglinski and published by Artech House. This book was released on 2018-04-30 with total page 378 pages. Available in PDF, EPUB and Kindle. Book excerpt: Based on the popular Artech House classic, Digital Communication Systems Engineering with Software-Defined Radio, this book provides a practical approach to quickly learning the software-defined radio (SDR) concepts needed for work in the field. This up-to-date volume guides readers on how to quickly prototype wireless designs using SDR for real-world testing and experimentation. This book explores advanced wireless communication techniques such as OFDM, LTE, WLA, and hardware targeting. Readers will gain an understanding of the core concepts behind wireless hardware, such as the radio frequency front-end, analog-to-digital and digital-to-analog converters, as well as various processing technologies. Moreover, this volume includes chapters on timing estimation, matched filtering, frame synchronization message decoding, and source coding. The orthogonal frequency division multiplexing is explained and details about HDL code generation and deployment are provided. The book concludes with coverage of the WLAN toolbox with OFDM beacon reception and the LTE toolbox with downlink reception. Multiple case studies are provided throughout the book. Both MATLAB and Simulink source code are included to assist readers with their projects in the field.
Download or read book Software Testing and Analysis written by Mauro Pezze and published by John Wiley & Sons. This book was released on 2008 with total page 516 pages. Available in PDF, EPUB and Kindle. Book excerpt: Teaches readers how to test and analyze software to achieve an acceptable level of quality at an acceptable cost Readers will be able to minimize software failures, increase quality, and effectively manage costs Covers techniques that are suitable for near-term application, with sufficient technical background to indicate how and when to apply them Provides balanced coverage of software testing & analysis approaches By incorporating modern topics and strategies, this book will be the standard software-testing textbook
Download or read book System on Chip Security written by Farimah Farahmandi and published by Springer Nature. This book was released on 2019-11-22 with total page 295 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes a wide variety of System-on-Chip (SoC) security threats and vulnerabilities, as well as their sources, in each stage of a design life cycle. The authors discuss a wide variety of state-of-the-art security verification and validation approaches such as formal methods and side-channel analysis, as well as simulation-based security and trust validation approaches. This book provides a comprehensive reference for system on chip designers and verification and validation engineers interested in verifying security and trust of heterogeneous SoCs.
Download or read book Machine Learning in VLSI Computer Aided Design written by Ibrahim (Abe) M. Elfadel and published by Springer. This book was released on 2019-03-15 with total page 694 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides readers with an up-to-date account of the use of machine learning frameworks, methodologies, algorithms and techniques in the context of computer-aided design (CAD) for very-large-scale integrated circuits (VLSI). Coverage includes the various machine learning methods used in lithography, physical design, yield prediction, post-silicon performance analysis, reliability and failure analysis, power and thermal analysis, analog design, logic synthesis, verification, and neuromorphic design. Provides up-to-date information on machine learning in VLSI CAD for device modeling, layout verifications, yield prediction, post-silicon validation, and reliability; Discusses the use of machine learning techniques in the context of analog and digital synthesis; Demonstrates how to formulate VLSI CAD objectives as machine learning problems and provides a comprehensive treatment of their efficient solutions; Discusses the tradeoff between the cost of collecting data and prediction accuracy and provides a methodology for using prior data to reduce cost of data collection in the design, testing and validation of both analog and digital VLSI designs. From the Foreword As the semiconductor industry embraces the rising swell of cognitive systems and edge intelligence, this book could serve as a harbinger and example of the osmosis that will exist between our cognitive structures and methods, on the one hand, and the hardware architectures and technologies that will support them, on the other....As we transition from the computing era to the cognitive one, it behooves us to remember the success story of VLSI CAD and to earnestly seek the help of the invisible hand so that our future cognitive systems are used to design more powerful cognitive systems. This book is very much aligned with this on-going transition from computing to cognition, and it is with deep pleasure that I recommend it to all those who are actively engaged in this exciting transformation. Dr. Ruchir Puri, IBM Fellow, IBM Watson CTO & Chief Architect, IBM T. J. Watson Research Center
Download or read book Microelectronics Fialure Analysis Desk Reference Seventh Edition written by Tejinder Gandhi and published by ASM International. This book was released on 2019-11-01 with total page 750 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Electronic Device Failure Analysis Society proudly announces the Seventh Edition of the Microelectronics Failure Analysis Desk Reference, published by ASM International. The new edition will help engineers improve their ability to verify, isolate, uncover, and identify the root cause of failures. Prepared by a team of experts, this updated reference offers the latest information on advanced failure analysis tools and techniques, illustrated with numerous real-life examples. This book is geared to practicing engineers and for studies in the major area of power plant engineering. For non-metallurgists, a chapter has been devoted to the basics of material science, metallurgy of steels, heat treatment, and structure-property correlation. A chapter on materials for boiler tubes covers composition and application of different grades of steels and high temperature alloys currently in use as boiler tubes and future materials to be used in supercritical, ultra-supercritical and advanced ultra-supercritical thermal power plants. A comprehensive discussion on different mechanisms of boiler tube failure is the heart of the book. Additional chapters detailing the role of advanced material characterization techniques in failure investigation and the role of water chemistry in tube failures are key contributions to the book.
Download or read book Fabless written by Daniel Nenni and published by Createspace Independent Publishing Platform. This book was released on 2014 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: The purpose of this book is to illustrate the magnificence of the fabless semiconductor ecosystem, and to give credit where credit is due. We trace the history of the semiconductor industry from both a technical and business perspective. We argue that the development of the fabless business model was a key enabler of the growth in semiconductors since the mid-1980s. Because business models, as much as the technology, are what keep us thrilled with new gadgets year after year, we focus on the evolution of the electronics business. We also invited key players in the industry to contribute chapters. These "In Their Own Words" chapters allow the heavyweights of the industry to tell their corporate history for themselves, focusing on the industry developments (both in technology and business models) that made them successful, and how they in turn drive the further evolution of the semiconductor industry.
Download or read book The Art of Hardware Architecture written by Mohit Arora and published by Springer Science & Business Media. This book was released on 2011-10-09 with total page 235 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book highlights the complex issues, tasks and skills that must be mastered by an IP designer, in order to design an optimized and robust digital circuit to solve a problem. The techniques and methodologies described can serve as a bridge between specifications that are known to the designer and RTL code that is final outcome, reducing significantly the time it takes to convert initial ideas and concepts into right-first-time silicon. Coverage focuses on real problems rather than theoretical concepts, with an emphasis on design techniques across various aspects of chip-design.
Download or read book Digital Integrated Circuit Design written by Hubert Kaeslin and published by Cambridge University Press. This book was released on 2008-04-28 with total page 878 pages. Available in PDF, EPUB and Kindle. Book excerpt: This practical, tool-independent guide to designing digital circuits takes a unique, top-down approach, reflecting the nature of the design process in industry. Starting with architecture design, the book comprehensively explains the why and how of digital circuit design, using the physics designers need to know, and no more.
Download or read book Silicon Systems For Wireless Lan written by Zoran Stamenkovic and published by World Scientific. This book was released on 2020-11-27 with total page 430 pages. Available in PDF, EPUB and Kindle. Book excerpt: Today's integrated silicon circuits and systems for wireless communications are of a huge complexity.This unique compendium covers all the steps (from the system-level to the transistor-level) necessary to design, model, verify, implement, and test a silicon system. It bridges the gap between the system-world and the transistor-world (between communication, system, circuit, device, and test engineers).It is extremely important nowadays (and will be more important in the future) for communication, system, and circuit engineers to understand the physical implications of system and circuit solutions based on hardware/software co-design as well as for device and test engineers to cope with the system and circuit requirements in terms of power, speed, and data throughput.Related Link(s)
