Download or read book Circuit level Techniques for Mitigating Radiation induced Degradation of Commercial Microelectronics in Space written by Maximillian Alvarez Holliday and published by . This book was released on 2022 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: The survivability of microelectronic devices in harsh radiation environments has a profound impact on spacecraft reliability and is a limiting factor in our species becoming a multi-planet civilization. Despite recent sociotechnical advancements providing more access to space, the radiation-induced degradation of modern electronic systems continues to dictate overall mission scope, cost, and lifetime. The paradigm of one-off engineering feats comprised of bespoke radiation-hardened circuits no longer fits the increasingly competitive landscape of satellite and small-spacecraft development. To bridge this divide, this thesis describes the development of non-invasive circuit-level techniques for improving the reliability of commercial electronics in space in order to to better equip future spacecraft with the capabilities afforded by modern consumer microelectronics. This dissertation documents the development of two techniques for improving component-level and system-level reliability of commercial electronics in ionizing radiation. The first technique exploits the periodic nature of many space radiation environments to achieve as much as 300% improvement in device lifetime by modulating device power during periods of intense irradiation. Through simulation and subsequent experimental testing using a Cs-137 gamma source, this "dynamic biasing" technique lays the foundation for providing electronic systems a means of intelligently responding to the real-time radiation environment without additional shielding or modifications to individual semiconductor architectures. Next, the design and verification of a second technique is presented which enables improved system-level reliability of commercial electronics by mitigating the single-point failure mode inherent to popular serial communication protocols. A simple external circuit is proposed and evaluated for its effectiveness in digitally isolating one or more devices in the event of failure. We show through simulation and hardware implementation that these isolation schemes are effective at preventing bus-wide failure in the event of peripheral device malfunction for two serial bus protocols, Inter-Integrated Circuit (I2C) and Serial Peripheral Interface (SPI), without requiring additional I/O or processing overhead. The isolation circuits were integrated into the avionics hardware of three small-satellite spacecraft and their operation validated at communication speeds of 400 kHz (fast-mode) for I2C and 5 MHz for SPI before, during, and after inducing device failure on the bus. By eliminating the single-point failure mode of I2C and SPI protocols, the developed isolation techniques were found to significantly reduce the likelihood of system failure for the satellite mission. The last portion of this thesis details the real-world application of the previously described dynamic biasing and serial bus isolation techniques, culminating in an open-source spacecraft avionics platform and two successful on-orbit satellite missions. The design and operating principles of our open-source hardware and software platform for spacecraft development, called PyCubed, is presented and its widespread adoption across the small-satellite community discussed. Application of the PyCubed framework is then detailed in the design and operation of the 2019 "KickSat-2" CubeSat mission which successfully dispensing 105 "femtosatellites, " each weighing less than 100 grams, in low-Earth orbit at an altitude of 300 km. Finally, details and on-orbit data from the 2021 "V-R3x" mission are presented, which involved the development and operation of three 1U CubeSats for coordinated networking and technology demonstrations in low-Earth orbit at an altitude of 500 km.
Download or read book Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices written by Dan M. Fleetwood and published by World Scientific. This book was released on 2004 with total page 354 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metalOCooxideOCosemiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level. Contents: Single Event Effects in Avionics and on the Ground (E Normand); Soft Errors in Commercial Integrated Circuits (R C Baumann); System Level Single Event Upset Mitigation Strategies (W F Heidergott); Space Radiation Effects in Optocouplers (R A Reed et al.); The Effects of Space Radiation Exposure on Power MOSFETs: A Review (K Shenai et al.); Total Dose Effects in Linear Bipolar Integrated Circuits (H J Barnaby); Hardness Assurance for Commercial Microelectronics (R L Pease); Switching Oxide Traps (T R Oldham); Online and Realtime Dosimetry Using Optically Stimulated Luminescence (L Dusseau & J Gasiot); and other articles. Readership: Practitioners, researchers, managers and graduate students in electrical and electronic engineering, semiconductor science and technology, and microelectronics."
Download or read book Space Microelectronics Volume 2 Integrated Circuit Design for Space Applications written by Anatoly Belous and published by Artech House. This book was released on 2017-07-31 with total page 629 pages. Available in PDF, EPUB and Kindle. Book excerpt: This invaluable second volume of a two-volume set is filled with details about the integrated circuit design for space applications. Various considerations for the selection and application of electronic components for designing spacecraft are discussed. The basic constructions of submicron transistors and schottky diodes during the technological process of production are explored. This book provides details on the energy consumption minimization methods for microelectronic devices. Specific topics include: Features and physical mechanisms of the effect of space radiation on all the main classes of microcircuits, including peculiarities of radiation impact on submicron integrated circuits;Special design, technology, and schematic methods of increasing the resistance to various types of space radiation;Recommendations for choosing research equipment and methods for irradiating various samples;Microcircuit designers on the composition of test elements for the study of the effect of radiation;Microprocessors, circuit boards, logic microcircuits, digital, analog, digital–analog microcircuits manufactured in various technologies (bipolar, CMOS, BiCMOS, SOI);Problems involved with designing high speed microelectronic devices and systems based on SOS-and SOI-structures;System-on-chip and system-in-package and methods for rejection of silicon microcircuits with hidden defects during mass production.
Download or read book Testing at the Speed of Light written by National Academies of Sciences, Engineering, and Medicine and published by National Academies Press. This book was released on 2018-06-08 with total page 89 pages. Available in PDF, EPUB and Kindle. Book excerpt: Spacecraft depend on electronic components that must perform reliably over missions measured in years and decades. Space radiation is a primary source of degradation, reliability issues, and potentially failure for these electronic components. Although simulation and modeling are valuable for understanding the radiation risk to microelectronics, there is no substitute for testing, and an increased use of commercial-off-the- shelf parts in spacecraft may actually increase requirements for testing, as opposed to simulation and modeling. Testing at the Speed of Light evaluates the nation's current capabilities and future needs for testing the effects of space radiation on microelectronics to ensure mission success and makes recommendations on how to provide effective stewardship of the necessary radiation test infrastructure for the foreseeable future.
Download or read book International Aerospace Abstracts written by and published by . This book was released on 1997 with total page 656 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Radiation Tolerant Electronics written by Paul Leroux and published by MDPI. This book was released on 2019-08-26 with total page 210 pages. Available in PDF, EPUB and Kindle. Book excerpt: Research on radiation-tolerant electronics has increased rapidly over the past few years, resulting in many interesting approaches to modeling radiation effects and designing radiation-hardened integrated circuits and embedded systems. This research is strongly driven by the growing need for radiation-hardened electronics for space applications, high-energy physics experiments such as those on the Large Hadron Collider at CERN, and many terrestrial nuclear applications including nuclear energy and nuclear safety. With the progressive scaling of integrated circuit technologies and the growing complexity of electronic systems, their susceptibility to ionizing radiation has raised many exciting challenges, which are expected to drive research in the coming decade. In this book we highlight recent breakthroughs in the study of radiation effects in advanced semiconductor devices, as well as in high-performance analog, mixed signal, RF, and digital integrated circuits. We also focus on advances in embedded radiation hardening in both FPGA and microcontroller systems and apply radiation-hardened embedded systems for cryptography and image processing, targeting space applications.
Download or read book RADECS written by and published by . This book was released on 1997 with total page 638 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1984 with total page 1278 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Space Microelectronics written by and published by . This book was released on 1997 with total page 68 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Proceedings of the Annual AIAA USU Conference on Small Satellites written by and published by . This book was released on with total page 354 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Single Event Effects in Aerospace written by Edward Petersen and published by John Wiley & Sons. This book was released on 2011-10-04 with total page 518 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book introduces the basic concepts necessary to understand Single Event phenomena which could cause random performance errors and catastrophic failures to electronics devices. As miniaturization of electronics components advances, electronics components are more susceptible in the radiation environment. The book includes a discussion of the radiation environments in space and in the atmosphere, radiation rate prediction depending on the orbit to allow electronics engineers to design and select radiation tolerant components and systems, and single event prediction.
Download or read book Single Event Phenomena written by G.C. Messenger and published by Springer Science & Business Media. This book was released on 2013-11-27 with total page 367 pages. Available in PDF, EPUB and Kindle. Book excerpt: This monograph is written for neophytes, students, and practitioners to aid in their understanding of single event phenomena. It attempts to collect the highlights as well as many of the more detailed aspects of this field into an entity that portrays the theoretical as well as the practical applications of this subject. Those who claim that "theory" is not for them can skip over the earlier chapters dealing with the fundamental and theoretical portions and find what they need in the way of hands-on guidelines and pertinent formulas in the later chapters. Perhaps, after a time they will return to peruse the earlier chapters for a more complete rendition and appreciation of the subject matter. It is felt that the reader should have some acquaintance with the electronics of semiconductors and devices, some broad atomic physics introduction, as well as a respectable level of mathematics through calculus, including simple differential equations. A large part of the preceding can be obtained informally, through job experience, self-study, evening classes, as well as from a formal college curriculum.
Download or read book The Physics of Space Security written by David Wright and published by . This book was released on 2005 with total page 198 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Latchup in CMOS Technology written by R.R. Troutman and published by Springer Science & Business Media. This book was released on 1986-04-30 with total page 270 pages. Available in PDF, EPUB and Kindle. Book excerpt: Why a book on Iatchup? Latchup has been, and continues to be, a potentially serious CMOS reliability concern. This concern is becoming more widespread with the ascendency of CMOS as the dominant VLSI technology, particularly as parasitic bipolar characteristics continue to improve at ever smaller dimensions on silicon wafers with ever lower defect densities. Although many successful parts have been marketed, latchup solutions have often been ad hoc. Although latchup avoidance techniques have been previously itemized, there has been little quantitative evaluation of prior latchup fixes. What is needed is a more general, more systematic treatment of the latchup problem. Because of the wide variety of CMOS technologies and the long term interest in latchup, some overall guiding principles are needed. Appreciating the variety of possible triggering mechanisms is key to a real understanding of latchup. This work reviews the origin of each and its effect on the parasitic structure. Each triggering mechanism is classified according to a new taxonomy.
Download or read book Bias Temperature Instability for Devices and Circuits written by Tibor Grasser and published by Springer Science & Business Media. This book was released on 2013-10-22 with total page 805 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.
Download or read book Semiconductor Detector Systems written by Helmuth Spieler and published by OUP Oxford. This book was released on 2005-08-25 with total page 513 pages. Available in PDF, EPUB and Kindle. Book excerpt: Semiconductor sensors patterned at the micron scale combined with custom-designed integrated circuits have revolutionized semiconductor radiation detector systems. Designs covering many square meters with millions of signal channels are now commonplace in high-energy physics and the technology is finding its way into many other fields, ranging from astrophysics to experiments at synchrotron light sources and medical imaging. This book is the first to present a comprehensive discussion of the many facets of highly integrated semiconductor detector systems, covering sensors, signal processing, transistors and circuits, low-noise electronics, and radiation effects. The diversity of design approaches is illustrated in a chapter describing systems in high-energy physics, astronomy, and astrophysics. Finally a chapter "Why things don't work" discusses common pitfalls. Profusely illustrated, this book provides a unique reference in a key area of modern science.
Download or read book Guidelines and Metrics for Assessing Space System Cost Estimates written by Bernard Fox and published by RAND Corporation. This book was released on 2008 with total page 268 pages. Available in PDF, EPUB and Kindle. Book excerpt: 1. Introduction / 2. Space system fundamentals / 3. Reviewing a cost estimate / 4. Space vehicle cost crosschecks / 5. Common issues in estimating space programs / 6. Resources for space system cost estimation / 7. Recommendations.
